Calliari, Lucia
 Distribuzione geografica
Continente #
NA - Nord America 4.451
EU - Europa 2.239
AS - Asia 619
Continente sconosciuto - Info sul continente non disponibili 37
AF - Africa 4
SA - Sud America 4
Totale 7.354
Nazione #
US - Stati Uniti d'America 4.332
DE - Germania 535
SE - Svezia 459
UA - Ucraina 433
FI - Finlandia 254
HK - Hong Kong 155
IE - Irlanda 138
GB - Regno Unito 136
VN - Vietnam 128
CA - Canada 119
IN - India 106
CN - Cina 102
IT - Italia 79
RU - Federazione Russa 79
SG - Singapore 64
BE - Belgio 57
EU - Europa 37
IR - Iran 29
FR - Francia 26
JP - Giappone 25
BG - Bulgaria 12
CZ - Repubblica Ceca 12
IL - Israele 6
PL - Polonia 5
BR - Brasile 4
DZ - Algeria 4
LT - Lituania 4
RO - Romania 4
KR - Corea 2
LV - Lettonia 2
PT - Portogallo 2
CH - Svizzera 1
HR - Croazia 1
ID - Indonesia 1
TR - Turchia 1
Totale 7.354
Città #
Chandler 1.016
Jacksonville 913
Wilmington 252
Ashburn 227
Hong Kong 155
Ann Arbor 148
Boardman 137
Dublin 137
Dong Ket 128
Helsinki 126
Kronberg 124
Dearborn 114
Woodbridge 86
Mcallen 79
Munich 75
Montréal 74
Brooklyn 71
Seattle 65
Trento 59
Brussels 57
Pune 52
Singapore 51
Phoenix 46
Toronto 38
Houston 36
Beijing 33
New York 31
Shanghai 31
Leawood 21
Los Angeles 16
Tokyo 16
Moscow 15
Redwood City 14
San Mateo 14
Monmouth Junction 13
Mountain View 13
Falkenstein 12
Miami 12
Norwalk 12
Saint Petersburg 12
Ardabil 10
Hanover 10
Augusta 9
Brno 9
Santa Clara 9
Ageo 8
Zanjan 8
Falls Church 7
Nanjing 7
Guangzhou 6
Redmond 6
Andover 5
Kunming 5
London 5
Portland 5
Auburn Hills 4
Cologne 4
Hefei 4
Kish 4
Sacramento 4
Buffalo 3
Des Moines 3
Fremont 3
Gunzenhausen 3
Inglewood 3
Olomouc 3
Rome 3
Secaucus 3
Winnipeg 3
Costa Mesa 2
Dallas 2
Fairfield 2
Frankfurt am Main 2
Hachenburg 2
Ottawa 2
Palermo 2
Riga 2
Rio de Janeiro 2
Speyer 2
Wuhan 2
Baotou 1
Bolzano 1
Braga 1
Bristol 1
Brunico 1
Bucharest 1
Chambersburg 1
Dumfries 1
Easton 1
Florianópolis 1
Galway 1
Genova 1
Gif-sur-yvette 1
Grugliasco 1
Hangzhou 1
Harbin 1
Henderson 1
Jaipur 1
Jakarta 1
Jastrebarsko 1
Totale 4.729
Nome #
A study of capacitance-voltage characteristics of amorphous carbon multilayer nanostructures 331
Amorphous carbon films PACVD in CH4-CO2 under pulsed and continous substrate bias conditions 95
Chemical and microstructural characterisation of silicon-containing carbon films 90
Improved H2 production rate by hydrolysis of Ammonia Borane using quaternary alloy catalysts 90
Characterization of Pristine and Functionalized Graphene on Metal Surfaces by Electron Spectroscopy 89
Joint experimental and computational study of aluminum 87
Nanostructures to boost material properties 87
Measuring the energy of the graphite pi + sigma plasmon peak 81
AES and core level photoemission in the study of a -C and a-C:H 80
Core-level photoemission from nanocluster-matrix composites: Au clusters in amorphous carbon 76
Effective Medium Theory for REELS Analysis of Amorphous Carbon Films 74
Plasmonic Scattering by Silver Nanoparticles for Silicon Solar Cells: Modelling and Experimental Results 74
PECVD of a-C:H films in CH4-CO2 plasma 74
Effect of Si on the Electronic Structure of Sputter-Deposited C Films: An Electron Spectrocopy Study 73
Joint experimental and computational study of silicon dioxide electron energy loss spectra 73
X-Ray and UV Valence Band Photoemission of Carbon Films 71
Composition and structure of a-C:Au nanocomposites obtained by physicalvapour deposition 70
The Influence of Metal Nanoparticle Size Distribution in Photoelectron Spectroscopy 70
a-C/Me (Me=Pt, Au) Nanocomposite Films for Electrochemical Gas Sensors 69
Modeling and Characterization of Antireflection Coatings with Embedded Silver Nanoparticles for Silicon Solar Cells 69
H content determination at the (1 0 0) surface of homoepitaxial diamond by Elastic Peak Electron Spectroscopy 68
Auger depth-profiling of silicon dioxide on silicon: a Factor Analysis study 68
Reflection electron energy loss spectroscopy: role of the Bethe–Born factor 68
Role of core levels ionization in the electron induced dissociation of silicon dioxide 68
Ar+-Implantation Effects on the Interfacial Properties of the WC/TI-6Al-4V System 67
N+-implantation induced enhanced adhesion of amorphous-SiC films deposited on stainless steel 67
Auger electron spectroscopy and x-ray diffraction studies of Ti-Si layers synthesised by ion implantation 67
Light-opals interaction modeling by direct numerical solution of Maxwell's equations 67
Mixed ab initio quantum mechanical and Monte Carlo calculations of secondary emission from SiO2 nanoclusters 67
An electron spectroscopy study of a-C :H under thermal annealing 67
Plasmon peak inhomogeneous broadening in reflection electron energy loss spectroscopy from carbon materials 66
Amorphous carbon films PACVD in CH4-CO2 under pulsed and continuous substrate bias conditions 66
Monte Carlo simulations of measured electron energy-loss spectra of diamond and graphite: Role of dielectric-response models 66
Thick and homogeneous surface layers obtained by reactive ion-beam-enhanced deposition 65
Valence electron states in Gd-silicides via Si L2,3VV Auger line-shape analysis 65
Laser-driven acceleration of protons from hydrogenated annealed silicon targets 64
Characterization of Carbon and Zirconia Films Deposited on Polycarbonate for Scratch-Proof Coating Applications 64
On a dielectric approach to understand Electron Energy Loss Spectra from carbon materials 63
Agglomeration at Si/Au interfaces: A study with Spatially Resolved Auger Line-shape Spectroscopy 63
Electron beam irradiation of hydrogenated amorphous carbon films 62
Auger line-shape analysis of porous silicon: experiment and theory 62
Kinetic Isotope Effect in the Hydrogenation and Deuteration of Graphene 62
A propos du rôle sensibilisateur du SnCl2 dans l'argenture du verre 61
Effect of ion mixing on the wear behaviour of silver 61
Ageing effects of thin films prepared by ion beam assisted deposition: a multitechnique characterization 61
Auger Quantitative Analysis of Brass Via Target Factor Analysis 61
Ca-silicides as prototypical systems for modelling the electron states at the Si(111)/Yb interface: A Si L2,3VV Auger line-shape investigation 61
An electron spectroscopy study of a-C:H films produced by PACVD in a CH4-CO2 gas mixture 61
Thin film a-C/Pt nanocomposite catalysts for toxic gas sensors 60
A new photoemission approach to atomic diffusion along high conductivity paths: An application to Cu in Cd 60
Spectroscopic investigation of electroluminescent porous silicon 60
Assessment of spectroscopic methods for the characterization of DLC films deposited by PECVD 60
Energy-Aware Gas Sensing Using Wireless Sensor Networks 60
Erbium-doped thin amorphous carbon films prepared by mixed CVD-sputtering 59
Evaluation of several methods to measure the relative abundance of sp2 and sp3 hybridised atoms in carbon materials 58
Comparison between Monte Carlo and experimental aluminum and silicon electron energy loss spectra 58
Annealing of CVD un-doped diamond: a photoemission investigation 57
Boron valence states in the Fe-B system: an Auger line-shape investigation 57
Composition changes in Ar+-implanted SiC: an attempt to distinguish ballistic and chemical effects 57
Chemical and compositional changes induced by N+ implantation in amorphous SiC films 57
Electron spectroscopies and inelastic processes in nanoclusters and solids: Theory and experiment 57
Towards a quantitative evaluation of sp2/sp3 ratio in C-based systems 56
Segregation of impurities at grain boundaries and other compositional inhomogeneities in chill-casted silicon ingots 56
Diamond film nano-abrasives obtained by anodic arc 55
Direct observation of a dispersionless impurity band in hydrogenated graphene 55
Energy loss of electrons backscattered from solids: measured and calculated spectra for Al and Si 55
The graphite Core-Valence-Valence Auger Spectrum 54
Formation of vanadium silicide by high dose ion implantation 54
On the use of elastic peak electron spectroscopy (EPES) tomeasure the H content of hydrogenated amorphous carbon films 54
XPS study of a-C:Au nanocomposites for catalytic applications 53
Computational and experimental study of pi and pi + sigma plasmon loss spectra for low energy (<1000 eV) electrons impinging on highly oriented pyrolitic graphite (HOPG) 53
Real time investigation of the initial stages of a-C films growth 52
X-ray reflectivity study of the early stages of a-C:H film growth 51
Ion beam enhanced deposition and dynamic ion mixing for surface modification 51
Many-body effects at the Si L2,3VV Auger line-shape: The case of Ca silicides 51
Electron irradiation of silicon dioxide: a non-destructive measurement of the in-depth induced compositional changes 51
Spectromicroscopy of the metastable Au/Si(111) interface studied by means of synchrotron radiation 51
Plasmonic Scattering by Metal Nanoparticles for Solar Cells 51
Investigation of the structural properties of thin amorphous carbon films and bilayer structures 50
Erbium Photoluminescence in Hydrogenated Amorphous Carbon 50
The graphite Valence Band electronic structure: a combined Core-Valence-Valence Auger and Valence Band Photoemission study 49
Preferential effects in electron irradiated silicon dioxide 49
Mechanical and Structural properties of Ni-C Films Obtained by R.F. Sputtering 49
Anion-specific surface valence band-states in heteropolar semiconductors: the case of GaP(110) and InP(110) 48
Improvement of mechanical properties of a-C:H by silicon addition 48
Development of DLC film technology for electronic application 48
Energy efficient planar catalytic sensor for methane measurement 48
Formation of BN by nitrogen ion implantation of boron deposits 47
Depth-Profiling Via X-Ray Photoemission and Auger Spectroscopies of N+ Implanted Tungsten Carbides Grown on the Ti-6Al-4V Alloy 47
Electron bombardement effects on light emitting porous Silicon 47
Partial intensity approach for quantitative analysis of reflection-electron-energy-loss spectra 46
Spectroscopic Characterization of Hard Carbon and Carbon-Based Films 46
Analisi della forma di riga Auger in transizioni del tipo core-valenza-valenza (CVV): la transizione L2,3VV del silicio 45
Structure and optical properties of TiN films prepared by dc sputtering and by ion beam assisted deposition 45
Quenching the surface electronic structure of P-containing III-V semiconductors via ordered (1x1) Sb overlayers: a P L2,3VV Auger line-shape analysis 45
Electron and positron spectroscopies for carbon films characterization 45
Momentum transfer effects in near surface Electron Energy Loss 45
Photoemission investigation on the oxidation of Si(111)-Ag interfaces and its relation to the interface structure 44
Overlayer-induced Auger line-shape changes: the case of the P L2,3VV transition at the InP(110)/Sb interface 44
Thermodynamic Effects on Ion-beam Mixing in SiC-Metal Systems 44
Totale 6.323
Categoria #
all - tutte 44.702
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 44.702


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20201.070 0 0 10 27 178 100 166 34 171 102 171 111
2020/20211.372 189 37 153 82 137 53 156 7 9 268 71 210
2021/2022705 42 14 16 143 11 9 14 111 47 52 93 153
2022/20231.867 53 146 50 342 118 303 16 156 457 140 67 19
2023/20241.081 112 54 111 60 89 145 64 173 43 137 2 91
2024/202596 31 65 0 0 0 0 0 0 0 0 0 0
Totale 7.434