The near surface region microstructure of a PACVD a-C:H film is investigated by probing the occupied electron states by electron energy loss spectroscopy (EELS) in the low loss region, C KVV Auger emission, C1s photoemission, X-ray and UV excited valence band (VB) photoemission. The film, deposited under pulsed bias voltage, is described as a hydrogenated amorphous carbon material, possibly involving a small amount (a few at.%) of oxygen. The C electron states are dominantly sp3 hybridized, with H stabilizing the associated tetrahedral bond. A maximum of ¡Ö35% sp2 bonded carbons exists in the system. The sp2 sites do not gather into extended p bonded graphite-like structures, thereby allowing the existence of a large (¡Ý1.8 eV) energy gap. The presence of H explains the mass density (¡Ö1.7 g/cm3) and hardness (¡Ö10 GPa) of the .lm which both classify it, in spite of the high sp3 fraction, at the border between soft and hard a-C:H materials. Hydrogenated amorphous carbon films; X-ray photoelectron spectroscopy; UV photoelectron spectroscopy; Auger electron spectroscopy; Electron energy loss spectroscopy; Surface structure
An electron spectroscopy study of a-C:H films produced by PACVD in a CH4-CO2 gas mixture
Calliari, Lucia;Filippi, Massimiliano;Gottardi, Gloria;Bensaada Laidani, Nadhira;Anderle, Mariano
2005-01-01
Abstract
The near surface region microstructure of a PACVD a-C:H film is investigated by probing the occupied electron states by electron energy loss spectroscopy (EELS) in the low loss region, C KVV Auger emission, C1s photoemission, X-ray and UV excited valence band (VB) photoemission. The film, deposited under pulsed bias voltage, is described as a hydrogenated amorphous carbon material, possibly involving a small amount (a few at.%) of oxygen. The C electron states are dominantly sp3 hybridized, with H stabilizing the associated tetrahedral bond. A maximum of ¡Ö35% sp2 bonded carbons exists in the system. The sp2 sites do not gather into extended p bonded graphite-like structures, thereby allowing the existence of a large (¡Ý1.8 eV) energy gap. The presence of H explains the mass density (¡Ö1.7 g/cm3) and hardness (¡Ö10 GPa) of the .lm which both classify it, in spite of the high sp3 fraction, at the border between soft and hard a-C:H materials. Hydrogenated amorphous carbon films; X-ray photoelectron spectroscopy; UV photoelectron spectroscopy; Auger electron spectroscopy; Electron energy loss spectroscopy; Surface structureI documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
