Dark and illuminated capacitance–voltage (C–V) characteristics and admittance measurements were carried out on multilayer carbon structures.The latter were produced by depositing ultrathin amorphous carbon layers with different optical band gaps on a monocrystalline boron-doped silicon substrate.The carbon layers were grown either by magnetron sputtering (MS) of a graphite target in argon or by plasma ion beam deposition (IBD) in cyclohexane.The structures were characterised by X-ray reflectivity (XRR). With respect to their electrical properties, it was shown that light strongly affects both the C–V-characteristics and the admittance.The results were interpreted in terms of the energy levels in these amorphous carbon multilayer structures

A study of capacitance-voltage characteristics of amorphous carbon multilayer nanostructures

Baranov, Alexandr;Calliari, Lucia;Speranza, Giorgio
2004

Abstract

Dark and illuminated capacitance–voltage (C–V) characteristics and admittance measurements were carried out on multilayer carbon structures.The latter were produced by depositing ultrathin amorphous carbon layers with different optical band gaps on a monocrystalline boron-doped silicon substrate.The carbon layers were grown either by magnetron sputtering (MS) of a graphite target in argon or by plasma ion beam deposition (IBD) in cyclohexane.The structures were characterised by X-ray reflectivity (XRR). With respect to their electrical properties, it was shown that light strongly affects both the C–V-characteristics and the admittance.The results were interpreted in terms of the energy levels in these amorphous carbon multilayer structures
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11582/2200
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
social impact