IRIS Institutional Research Information System

Iacob, Erica
 Distribuzione geografica
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Continente #
NA - Nord America 10.167
EU - Europa 9.089
AS - Asia 4.501
SA - Sud America 967
Continente sconosciuto - Info sul continente non disponibili 233
AF - Africa 110
OC - Oceania 8
Totale 25.075
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Nazione #
US - Stati Uniti d'America 9.852
RU - Federazione Russa 5.172
SG - Singapore 1.549
DE - Germania 933
BR - Brasile 808
CN - Cina 772
HK - Hong Kong 727
VN - Vietnam 634
IT - Italia 507
SE - Svezia 501
UA - Ucraina 458
FI - Finlandia 391
IN - India 368
GB - Regno Unito 260
FR - Francia 254
IE - Irlanda 185
NL - Olanda 165
CA - Canada 162
MX - Messico 76
JP - Giappone 69
AR - Argentina 51
IQ - Iraq 48
PL - Polonia 48
BD - Bangladesh 47
ES - Italia 45
BE - Belgio 43
ZA - Sudafrica 42
TR - Turchia 38
KR - Corea 35
IL - Israele 28
LT - Lituania 26
CZ - Repubblica Ceca 25
EC - Ecuador 24
SA - Arabia Saudita 22
IR - Iran 21
VE - Venezuela 21
CO - Colombia 20
EU - Europa 19
PK - Pakistan 18
CR - Costa Rica 15
ID - Indonesia 15
MA - Marocco 14
AE - Emirati Arabi Uniti 13
SC - Seychelles 12
JM - Giamaica 11
UY - Uruguay 11
KE - Kenya 10
PE - Perù 10
UZ - Uzbekistan 10
CL - Cile 9
PH - Filippine 9
TW - Taiwan 9
AT - Austria 8
GT - Guatemala 8
HN - Honduras 8
JO - Giordania 8
LB - Libano 8
PY - Paraguay 8
TN - Tunisia 8
AU - Australia 7
AZ - Azerbaigian 7
CH - Svizzera 7
NO - Norvegia 7
SV - El Salvador 7
AL - Albania 6
BG - Bulgaria 6
MY - Malesia 6
NP - Nepal 6
BO - Bolivia 5
EG - Egitto 5
GR - Grecia 5
KG - Kirghizistan 5
KZ - Kazakistan 5
BH - Bahrain 4
DO - Repubblica Dominicana 4
PT - Portogallo 4
RS - Serbia 4
SK - Slovacchia (Repubblica Slovacca) 4
AM - Armenia 3
BA - Bosnia-Erzegovina 3
BB - Barbados 3
BZ - Belize 3
DZ - Algeria 3
EE - Estonia 3
ET - Etiopia 3
LV - Lettonia 3
MD - Moldavia 3
MT - Malta 3
PA - Panama 3
QA - Qatar 3
RO - Romania 3
SN - Senegal 3
TH - Thailandia 3
TT - Trinidad e Tobago 3
AO - Angola 2
AW - Aruba 2
CG - Congo 2
DM - Dominica 2
GP - Guadalupe 2
HR - Croazia 2
Totale 24.832
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Città #
San Jose 1.067
Chandler 1.012
Council Bluffs 990
Jacksonville 881
Singapore 840
Hong Kong 704
Ashburn 541
Moscow 329
Dallas 275
Beijing 254
Munich 247
Helsinki 228
The Dalles 221
Boardman 216
Trento 211
Wilmington 208
New York 203
Los Angeles 183
Dublin 181
Ho Chi Minh City 159
Hefei 143
Dong Ket 137
Kronberg 135
Hanoi 128
Santa Clara 125
Ann Arbor 115
Dearborn 115
Brooklyn 114
Lauterbourg 109
Phoenix 88
São Paulo 78
Woodbridge 71
Houston 62
Tokyo 53
Turku 50
Toronto 45
Brussels 43
Buffalo 42
Pune 41
Orem 40
Frankfurt am Main 39
North Bergen 39
Shanghai 39
Seattle 38
Atlanta 37
Garland 37
Montreal 37
Rio de Janeiro 34
Warsaw 34
Tampa 33
London 31
Chicago 29
San Mateo 29
Haiphong 28
Mexico City 28
Rome 28
Southend 28
Da Nang 27
Johannesburg 26
Boston 25
Falkenstein 25
Stockholm 23
Chennai 22
Miami 22
Poplar 22
San Francisco 22
Brno 20
Baghdad 18
Belo Horizonte 18
Denver 18
Norwalk 18
Augusta 17
Brasília 17
Bologna 16
St Petersburg 16
Columbus 15
Hanover 15
Secaucus 15
Falls Church 14
Milan 14
Queens 14
Charlotte 13
Cheyenne 13
Guangzhou 13
Lawrenceville 13
Manchester 13
Mountain View 13
North Easton 13
Porto Alegre 13
Salvador 13
Ankara 12
Erbil 12
Hillsboro 12
Las Vegas 12
Ottawa 12
Querétaro 12
Redwood City 12
Guayaquil 11
Hải Dương 11
Lavis 11
Totale 11.945
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Nome #
X-ray Photoelectron Spectroscopy of Nitrided Silicon-Silicon Oxide Interface 407
Assessment of SnO2-nanocrystal-based luminescent glass-ceramic waveguides for integrated photonics 350
Analytical methodology development for Silicon rich oxide chemical physical characterization 292
D-SIMS and ToF-SIMS quantitative depth profiles comparison on ultra thin oxynitrides 288
Applicazioni della spettrometria di massa a materiali e tecniche di ultima generazione 283
Regular nano-void formation on Ge films on Si using Sn ion implantation through silicon nitride caps 283
Boron Ultra Low Energy SIMS Depth Profiling Improved by Rotating Stage 281
Analytical Methodology Development for Silicon-rich-oxide Chemical and Physical Characterization 271
Aza-crown-ether functionalized graphene oxide for gas sensing and cation trapping applications 260
Combined XPS, SIMS and AFM analysis of silicon nanocrystals embedded in silicon oxide layers 247
Development of nanotopography during SIMS characterization of thin films of Ge1−xSnx alloy 243
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 242
Activated dopant effect on low energy SIMS depth profiling 240
Analytical methodology development for SRO chemical physical characterization 239
Quality management system and accreditation of measurements in a surface science laboratory. The case study of MiNALab. 239
D-Sims and TOF-SIMS quantitative depth profiles on ultra thin oxinitrides 235
Development of nano-roughness under SIMS ion sputtering of Germanium surfaces 230
Nanotensile tests, microscopy characterization and atomistic simulations of carbon nanotubes fibers 230
SiO2-SnO2 transparent glass-ceramics activated by rare earth ions 229
Combined XPS, SIMS and AFM analysis of silicon nano-crystals embedded in silicon oxide layers 228
An experimental/ab-initio study on carbon nanotubes fibers for application in high-performing sporting goods. 228
Nanoscale friction of graphene oxide over glass-fibre and polystyrene 228
Decoration of graphite nanoplatelets with Nb2O5 deposited by radio frequency sputtering 225
Development of nano-roughness under SIMS ion sputtering of germanium surfaces 223
Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants" 222
Air Stable Nickel-Decorated Black Phosphorus and Its Room-Temperature Chemiresistive Gas Sensor Capabilities 222
Ultra low energy Boron ion implants in silicon analyzed by not-oxydizing O2+ bombardment and synchrotron radiation grazing incidence x-ray fluorescence 220
Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants 218
Key role of molecular kinetic energy in early stages of pentacene island growth 218
Fermentation based carbon nanotube multifunctional bionic composites 218
Quality management system and accreditation of measurements in a surface science laboratory: the case study of MiNALab 217
Tribological characteristics of few-layer graphene over Ni grain and interface boundaries 215
Damage of ultralow k materials during photoresist mask stripping process 214
Structural phase-dependent resistivity of intrinsic-extrinsic co-doped transparent titanium dioxide films 214
Boron ultra low energy SIMS depth profiling improved by rotating stage 213
Resonant photoacoustic simultaneous detection of methane and ethylene by means of a 1.63 um diode laser 208
Numerical/experimental strategies to infer enhanced liquid thermal conductivity and roughness in laser powder-bed fusion processes 208
Controling the early stages of pentacene growth by supersonic molecular beam deposition 207
Optimization of a Low-Power Chemoresistive Gas Sensor: Predictive Thermal Modelling and Mechanical Failure Analysis 207
Flexible photonics: RF-sputtering fabrication of glass-based systems operating under mechanical deformation conditions 207
Chemical and morphological characterization of nanoporous silica low-k dielectrics etched in fluorocarbon plasmas 205
Multigas detection by Diode Laser-Photoacoustic Resolution Spectroscopy 204
Experimental study by Secondary Ion Mass Spectrometry focused on the relationship between hardness and sputtering rate in hard coatings 204
AFM and Raman study of graphene deposited on silicon surfaces nanostructured by ion beam irradiation 204
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 203
ispettiva di sorveglianza 04-05 Luglio 2013 201
Secondary ion mass spectrometry characterization of deuterated GaAsN films on GaAs 198
Nanofabrication of self-organized periodic ripples by ion beam sputtering 197
Friction and adhesion of different structural defects of graphene 196
Growth of titanium dioxide films by cluster supersonic beams for VOC sensing applications 194
ispettiva di sorveglianza 6-7 giugno 2012. 193
Morphology structure and interfaces in the preparation of films by SUMBE for gas sensing 193
Nanostructures by assembling clusters and molecules from supersonic beams: A novel approach for gas sensing devices 191
Investigation of charges-driven interactions between graphene and different SiO2 surfaces 190
Design, fabrication and assessment of an optomechanical sensor for pressure and vibration detection using flexible glass multilayers 190
Influence of changes in the resistivity of the sample surface on ultra-shallow SIMS profiles for arsenic 189
Ultra shallow junction analysis for technology nodes beyond 65nm 188
ToF-SIMS and AFM studies of low-k dielectric etching in fluorocarbon plasmas 187
Ultralow energy boron implants in silicon characterization by nonoxidizing secondary ion mass spectrometry analysis and soft x-ray grazing incidence x-ray fluorescence techniques 185
SiO2-P2O5-HfO2-Al2O3-Na2O glasses activated by Er3+ ions: From bulk sample to planar waveguide fabricated by rf-sputtering 185
XPS and SIMS Depth Profiling of Chlorine in High-Temperature Oxynitrides 182
Experience of accreditation in a surface science laboratory 182
Graphene as Barrier to Prevent Volume Increment of Air Bubbles over Silicone Polymer in Aqueous Environment 182
Ultra shallow Boron junctions in silicon characterization by secondary ion mass spectrometry and synchrotron radiation grazing incidence x-ray fluorescence techniques 181
Plasma-Surface Interactions of Model Polymers for Advanced Photoresists Using C4F8/Ar Discharges and Energetic Ion Beams 180
Ultra low energy Boron implants in silicon characterization by not-oxidizing secondary ion mass spectrometry analysis and soft-ray grazing incidence x-ray fluorescence techniques. 180
Enhanced photorefractivity and rare-earth photoluminescence in SnO2 nanocrystals-based photonic glass-ceramics 179
In situ sputtering rate measurement by laser interferometer applied to SIMS analyses 178
Gas sensing application of hibrid nanostructures synthesized by supersonic beams 177
Photon management in SiO2-SnO2:Yb3+ hybrid 1D microcavity 173
SIMS RSFs in silicon for positive secondary ions with O2+ 1keV at 63° incidence sputtering beam and Zalar rotation. 173
Multilayer silicon rich oxy-nitride films characterization by SIMS, VASE and AFM 170
Free-Standing Graphene Oxide and Carbon Nanotube Hybrid Papers with Enhanced Electrical and Mechanical Performance and Their Synergy in Polymer Laminates 170
Ultra thin oxynitride profiles by XPS etch-back analyses 168
ToF-SIMS and XPS charcterisation of urban aerosols for pollution studies 167
Multilayer silicon rich oxy-nitride films characterization by SIMS, VASE and AFM 165
Porosity- induced effects during C4F8/90% Ar plasma etching of silica-based ultralow-k dielectrics 164
Depth measurements of etch-pits in GaN with shape reconstruction from SEM images 164
Depth profiling and quantification of chlorine and nitrogen in oxynitrides obtained by HTO process 163
Sample topography developed by sputtering in a Cameca instruments: an AFM and SEM study 162
Rotating stage and shallow depth profiling on Cameca SC-Ultra apparatus 162
Effect of Nanodiamond Particles Incorporation in Hydroxyapatite Coatings 161
Study of Organosilicon Plasma Polymer Used in Composite Layers with Biomedical Application 161
Surface characterization of polydimethylsiloxane: An AFM study 159
Functionalized ZnO Microbelt as Improved CO Sensor 159
Deph profiling and quantification of chlorine and nitrogen in oxynitrides obtained by HTO process 158
Solid phase epitaxial re-growth of Sn ion implanted germanium thin films 157
Effects of Plasma Etch and Stripping on ULK Materials” Future Fab International 19 (2005) 86-89 157
Graphene Confers Ultralow Friction on Nanogear Cogs 156
Nitride Silicon-Silicon Dioxide Interface: Electrical and Phisico-Chemical Characterization by Complementary Surface Techniques 155
Ultrathin Multilayer Dielectrics Analyses by XPS wet-etching and SIMS profile 154
Visita ispettiva annuale di sorveglianza Accredia 154
The role of incidence angle in the morphology evolution of Ge surfaces irradiated by medium-energy Au ions 154
XPS and SIMS Depth Profiling of Chlorine in Oxynitrides Obtained by HTO Process 154
Surface investigation of archeological glasses by secondary ion mass spectrometry 153
Sample topography developed by sputtering in Cameca instruments 150
TiN/STO/TiN MIMcaps nanolayers on silicon characterized by SIMS and AFM 149
Multiscale structured germanium nanoripples as templates for bioactive surfaces 149
TiN/STO/TiN MIMcaps nanolayers on silicon characterized by SIMS and AFM 148
MCs+ and MCs2+ Molecular Ions Emission from Transition Metal Silicides 148
Totale 20.104
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Categoria #
all - tutte 104.617
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 104.617
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/2022643 0 0 0 102 22 21 16 137 48 38 98 161
2022/20231.968 47 161 54 345 105 333 21 158 477 143 87 37
2023/20241.318 137 67 139 68 87 158 63 153 31 221 12 182
2024/20254.273 25 75 405 125 283 86 238 256 1.465 466 567 282
2025/202610.389 438 566 625 695 440 389 1.468 4.118 507 500 514 129
2026/20272.711 454 440 812 1.005 0 0 0 0 0 0 0 0
Totale 25.075