IRIS Institutional Research Information System

Iacob, Erica
 Distribuzione geografica
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Continente #
NA - Nord America 4.767
EU - Europa 4.245
AS - Asia 2.124
SA - Sud America 397
AF - Africa 28
Continente sconosciuto - Info sul continente non disponibili 20
OC - Oceania 4
Totale 11.585
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Nazione #
US - Stati Uniti d'America 4.690
RU - Federazione Russa 1.352
DE - Germania 742
SG - Singapore 627
HK - Hong Kong 571
UA - Ucraina 446
SE - Svezia 399
FI - Finlandia 369
BR - Brasile 365
CN - Cina 348
IN - India 288
IT - Italia 255
IE - Irlanda 177
GB - Regno Unito 152
NL - Olanda 151
VN - Vietnam 138
FR - Francia 69
CA - Canada 51
BE - Belgio 43
KR - Corea 27
CZ - Repubblica Ceca 24
JP - Giappone 21
IR - Iran 20
EU - Europa 19
MX - Messico 19
IL - Israele 18
LT - Lituania 17
AR - Argentina 10
ES - Italia 10
TR - Turchia 10
BD - Bangladesh 9
IQ - Iraq 9
MA - Marocco 8
ZA - Sudafrica 8
CH - Svizzera 6
TW - Taiwan 6
CO - Colombia 5
UZ - Uzbekistan 5
AT - Austria 4
AZ - Azerbaigian 4
EC - Ecuador 4
KG - Kirghizistan 4
PK - Pakistan 4
PL - Polonia 4
UY - Uruguay 4
AM - Armenia 3
AU - Australia 3
BG - Bulgaria 3
GR - Grecia 3
KE - Kenya 3
MD - Moldavia 3
RS - Serbia 3
SK - Slovacchia (Repubblica Slovacca) 3
SN - Senegal 3
VE - Venezuela 3
AE - Emirati Arabi Uniti 2
AL - Albania 2
BO - Bolivia 2
BZ - Belize 2
EG - Egitto 2
LV - Lettonia 2
NP - Nepal 2
PA - Panama 2
PE - Perù 2
PT - Portogallo 2
SI - Slovenia 2
TN - Tunisia 2
A1 - Anonimo 1
BA - Bosnia-Erzegovina 1
CL - Cile 1
CR - Costa Rica 1
DZ - Algeria 1
GE - Georgia 1
GT - Guatemala 1
JM - Giamaica 1
JO - Giordania 1
KZ - Kazakistan 1
MY - Malesia 1
NZ - Nuova Zelanda 1
OM - Oman 1
PH - Filippine 1
PS - Palestinian Territory 1
PY - Paraguay 1
RO - Romania 1
SA - Arabia Saudita 1
SC - Seychelles 1
Totale 11.585
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Città #
Chandler 1.012
Jacksonville 875
Hong Kong 567
Singapore 362
Moscow 327
Helsinki 221
Wilmington 202
Boardman 190
Ashburn 188
Dublin 177
Munich 177
The Dalles 159
Hefei 143
Dong Ket 137
Trento 137
Kronberg 135
Ann Arbor 115
Dearborn 114
Beijing 87
Brooklyn 81
Woodbridge 71
Santa Clara 65
New York 56
Brussels 43
Los Angeles 39
Phoenix 39
Pune 39
Shanghai 37
Turku 35
Seattle 30
San Mateo 29
Southend 28
Toronto 28
Houston 25
São Paulo 25
Falkenstein 24
Brno 20
Rio de Janeiro 19
Augusta 16
London 16
Hanover 15
Falls Church 14
Norwalk 14
Tokyo 14
Cheyenne 13
Mountain View 13
Mexico City 12
Miami 12
Redwood City 12
Belo Horizonte 11
Ottawa 11
Saint Petersburg 11
Guangzhou 10
Brasília 9
Portland 9
San Francisco 9
Secaucus 9
Auburn Hills 8
Council Bluffs 8
Leawood 8
Zanjan 8
Boston 7
Dallas 7
Frankfurt am Main 7
Nanjing 7
Rome 7
Salvador 7
Stockholm 7
Ardabil 6
Bologna 6
Milan 6
Porto Alegre 6
Taipei 6
Amsterdam 5
Atlanta 5
Campinas 5
Gunzenhausen 5
Hamburg 5
Baku 4
Bishkek 4
Charlotte 4
Gif-sur-yvette 4
Goiânia 4
Guarulhos 4
Laion 4
Malakoff 4
Mezzocorona 4
Olomouc 4
Recife 4
Redmond 4
Tashkent 4
Zhengzhou 4
Zurich 4
Baghdad 3
Barcelona 3
Bengaluru 3
Bolzano 3
Bratislava 3
Campo Grande 3
Casablanca 3
Totale 6.505
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Nome #
X-ray Photoelectron Spectroscopy of Nitrided Silicon-Silicon Oxide Interface 309
Assessment of SnO2-nanocrystal-based luminescent glass-ceramic waveguides for integrated photonics 228
Regular nano-void formation on Ge films on Si using Sn ion implantation through silicon nitride caps 174
Applicazioni della spettrometria di massa a materiali e tecniche di ultima generazione 141
D-SIMS and ToF-SIMS quantitative depth profiles comparison on ultra thin oxynitrides 135
Boron Ultra Low Energy SIMS Depth Profiling Improved by Rotating Stage 131
Analytical methodology development for Silicon rich oxide chemical physical characterization 127
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 127
Nanoscale friction of graphene oxide over glass-fibre and polystyrene 118
Key role of molecular kinetic energy in early stages of pentacene island growth 114
SiO2-SnO2 transparent glass-ceramics activated by rare earth ions 114
D-Sims and TOF-SIMS quantitative depth profiles on ultra thin oxinitrides 113
Analytical methodology development for SRO chemical physical characterization 112
Nanotensile tests, microscopy characterization and atomistic simulations of carbon nanotubes fibers 112
Analytical Methodology Development for Silicon-rich-oxide Chemical and Physical Characterization 111
Numerical/experimental strategies to infer enhanced liquid thermal conductivity and roughness in laser powder-bed fusion processes 108
Aza-crown-ether functionalized graphene oxide for gas sensing and cation trapping applications 108
Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants 107
Development of nano-roughness under SIMS ion sputtering of germanium surfaces 107
Development of nanotopography during SIMS characterization of thin films of Ge1−xSnx alloy 107
Tribological characteristics of few-layer graphene over Ni grain and interface boundaries 107
ispettiva di sorveglianza 04-05 Luglio 2013 106
Combined XPS, SIMS and AFM analysis of silicon nano-crystals embedded in silicon oxide layers 105
Combined XPS, SIMS and AFM analysis of silicon nanocrystals embedded in silicon oxide layers 105
Ultra low energy Boron ion implants in silicon analyzed by not-oxydizing O2+ bombardment and synchrotron radiation grazing incidence x-ray fluorescence 105
SiO2-P2O5-HfO2-Al2O3-Na2O glasses activated by Er3+ ions: From bulk sample to planar waveguide fabricated by rf-sputtering 105
Multigas detection by Diode Laser-Photoacoustic Resolution Spectroscopy 104
Quality management system and accreditation of measurements in a surface science laboratory. The case study of MiNALab. 104
Resonant photoacoustic simultaneous detection of methane and ethylene by means of a 1.63 um diode laser 102
Damage of ultralow k materials during photoresist mask stripping process 101
An experimental/ab-initio study on carbon nanotubes fibers for application in high-performing sporting goods. 100
Development of nano-roughness under SIMS ion sputtering of Germanium surfaces 99
Nanofabrication of self-organized periodic ripples by ion beam sputtering 99
Experimental study by Secondary Ion Mass Spectrometry focused on the relationship between hardness and sputtering rate in hard coatings 99
Controling the early stages of pentacene growth by supersonic molecular beam deposition 97
Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants" 97
Quality management system and accreditation of measurements in a surface science laboratory: the case study of MiNALab 97
Decoration of graphite nanoplatelets with Nb2O5 deposited by radio frequency sputtering 97
Chemical and morphological characterization of nanoporous silica low-k dielectrics etched in fluorocarbon plasmas 97
Experience of accreditation in a surface science laboratory 96
ispettiva di sorveglianza 6-7 giugno 2012. 96
Investigation of charges-driven interactions between graphene and different SiO2 surfaces 96
Growth of titanium dioxide films by cluster supersonic beams for VOC sensing applications 95
XPS and SIMS Depth Profiling of Chlorine in High-Temperature Oxynitrides 94
Gas sensing application of hibrid nanostructures synthesized by supersonic beams 94
Structural phase-dependent resistivity of intrinsic-extrinsic co-doped transparent titanium dioxide films 94
Optimization of a Low-Power Chemoresistive Gas Sensor: Predictive Thermal Modelling and Mechanical Failure Analysis 94
ToF-SIMS and AFM studies of low-k dielectric etching in fluorocarbon plasmas 93
Secondary ion mass spectrometry characterization of deuterated GaAsN films on GaAs 93
Activated dopant effect on low energy SIMS depth profiling 93
Morphology structure and interfaces in the preparation of films by SUMBE for gas sensing 93
Deph profiling and quantification of chlorine and nitrogen in oxynitrides obtained by HTO process 91
Boron ultra low energy SIMS depth profiling improved by rotating stage 91
Rotating stage and shallow depth profiling on Cameca SC-Ultra apparatus 90
Flexible photonics: RF-sputtering fabrication of glass-based systems operating under mechanical deformation conditions 90
Ultra shallow Boron junctions in silicon characterization by secondary ion mass spectrometry and synchrotron radiation grazing incidence x-ray fluorescence techniques 89
Multilayer silicon rich oxy-nitride films characterization by SIMS, VASE and AFM 88
SIMS RSFs in silicon for positive secondary ions with O2+ 1keV at 63° incidence sputtering beam and Zalar rotation. 88
Ultra shallow junction analysis for technology nodes beyond 65nm 88
ToF-SIMS and XPS charcterisation of urban aerosols for pollution studies 87
Visita ispettiva annuale di sorveglianza Accredia 87
AFM and Raman study of graphene deposited on silicon surfaces nanostructured by ion beam irradiation 87
Ultralow energy boron implants in silicon characterization by nonoxidizing secondary ion mass spectrometry analysis and soft x-ray grazing incidence x-ray fluorescence techniques 86
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 86
Fermentation based carbon nanotube multifunctional bionic composites 86
Nanostructures by assembling clusters and molecules from supersonic beams: A novel approach for gas sensing devices 85
Air Stable Nickel-Decorated Black Phosphorus and Its Room-Temperature Chemiresistive Gas Sensor Capabilities 84
In situ sputtering rate measurement by laser interferometer applied to SIMS analyses 83
Ultra low energy Boron implants in silicon characterization by not-oxidizing secondary ion mass spectrometry analysis and soft-ray grazing incidence x-ray fluorescence techniques. 83
Effect of Nanodiamond Particles Incorporation in Hydroxyapatite Coatings 83
Study of Organosilicon Plasma Polymer Used in Composite Layers with Biomedical Application 83
Influence of changes in the resistivity of the sample surface on ultra-shallow SIMS profiles for arsenic 82
Depth measurements of etch-pits in GaN with shape reconstruction from SEM images 82
Multilayer silicon rich oxy-nitride films characterization by SIMS, VASE and AFM 81
Sample topography developed by sputtering in a Cameca instruments: an AFM and SEM study 81
ToF-SIMS study of adhesive residuals on device contact pads after wafer taping and backgrinding 79
Surface plasmon resonance based on molecularly imprinted nanoparticles for the picomolar detection of the iron regulating hormone Hepcidin-25 79
Study of Plasma Polymer Structures to Induce Composite Layers 78
Surface wet-ability modifications of thin PECVD silicon nitride layers by 40 keV surface argon ion treatments 78
Functionalized ZnO Microbelt as Improved CO Sensor 78
Design, fabrication and assessment of an optomechanical sensor for pressure and vibration detection using flexible glass multilayers 78
Plasma-Surface Interactions of Model Polymers for Advanced Photoresists Using C4F8/Ar Discharges and Energetic Ion Beams 77
Depth profiling and quantification of chlorine and nitrogen in oxynitrides obtained by HTO process 77
Porosity- induced effects during C4F8/90% Ar plasma etching of silica-based ultralow-k dielectrics 76
Surface investigation of archeological glasses by secondary ion mass spectrometry 76
Surface characterization of polydimethylsiloxane: An AFM study 76
Nitride Silicon-Silicon Dioxide Interface: Electrical and Phisico-Chemical Characterization by Complementary Surface Techniques 74
Effects of Plasma Etch and Stripping on ULK Materials” Future Fab International 19 (2005) 86-89 74
Induced roughness by low energy ion bombardment 74
Graphene as Barrier to Prevent Volume Increment of Air Bubbles over Silicone Polymer in Aqueous Environment 74
XPS and SIMS Depth Profiling of Chlorine in Oxynitrides Obtained by HTO Process 74
Study of Hydroxyapatite / Detonation NanoDiamond Composite Layers 74
Effect of Nanodiamond Particles Incorporation in Hydroxyapatite Coatings 73
TiN/STO/TiN MIMcaps nanolayers on silicon characterized by SIMS and AFM 73
TiN/STO/TiN MIMcaps nanolayers on silicon characterized by SIMS and AFM 73
Sample topography developed by sputtering in Cameca instruments 72
Study of plasma polymer structures to induce composite layers 72
Ultra thin oxynitride profiles by XPS etch-back analyses 72
MCs+ and MCs2+ Molecular Ions Emission from Transition Metal Silicides 72
TiN/STO/TiN MIMcaps nanolayers on silicon characterized by SIMS and AFM 69
Totale 9.693
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Categoria #
all - tutte 68.229
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 68.229
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/202078 0 0 0 0 0 0 0 0 0 0 0 78
2020/20211.340 162 6 135 74 151 56 159 16 18 290 69 204
2021/2022705 24 25 13 102 22 21 16 137 48 38 98 161
2022/20231.968 47 161 54 345 105 333 21 158 477 143 87 37
2023/20241.318 137 67 139 68 87 158 63 153 31 221 12 182
2024/20254.095 25 75 405 125 283 86 238 256 1.465 466 567 104
Totale 11.797