IRIS Institutional Research Information System

Iacob, Erica
 Distribuzione geografica
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Continente #
NA - Nord America 4.145
EU - Europa 2.407
AS - Asia 952
Continente sconosciuto - Info sul continente non disponibili 20
AF - Africa 3
OC - Oceania 3
SA - Sud America 3
Totale 7.533
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Nazione #
US - Stati Uniti d'America 4.109
DE - Germania 539
UA - Ucraina 443
SE - Svezia 392
IN - India 279
FI - Finlandia 260
IT - Italia 230
HK - Hong Kong 221
IE - Irlanda 173
CN - Cina 137
VN - Vietnam 137
GB - Regno Unito 128
SG - Singapore 78
RU - Federazione Russa 77
FR - Francia 67
BE - Belgio 33
KR - Corea 27
CA - Canada 24
CZ - Repubblica Ceca 22
IR - Iran 20
EU - Europa 19
JP - Giappone 19
IL - Israele 17
NL - Olanda 14
MX - Messico 11
ES - Italia 6
TW - Taiwan 6
CH - Svizzera 5
TR - Turchia 4
AU - Australia 3
GR - Grecia 3
MD - Moldavia 3
AT - Austria 2
AZ - Azerbaigian 2
BG - Bulgaria 2
EC - Ecuador 2
EG - Egitto 2
PL - Polonia 2
SI - Slovenia 2
SK - Slovacchia (Repubblica Slovacca) 2
A1 - Anonimo 1
AE - Emirati Arabi Uniti 1
BR - Brasile 1
BZ - Belize 1
LT - Lituania 1
MY - Malesia 1
PH - Filippine 1
PK - Pakistan 1
PT - Portogallo 1
SA - Arabia Saudita 1
SC - Seychelles 1
Totale 7.533
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Città #
Chandler 1.012
Jacksonville 874
Hong Kong 218
Wilmington 201
Boardman 179
Ashburn 177
Dublin 173
Helsinki 149
Dong Ket 137
Kronberg 135
Trento 132
Ann Arbor 115
Dearborn 114
Woodbridge 71
Brooklyn 70
Singapore 53
Beijing 51
New York 45
Pune 39
Phoenix 38
Brussels 33
Shanghai 33
San Mateo 29
Seattle 28
Southend 28
Houston 24
Los Angeles 23
Brno 20
Toronto 19
Augusta 16
Santa Clara 15
Falls Church 14
Hanover 14
Munich 14
Norwalk 14
Cheyenne 13
Mountain View 13
Redwood City 12
Tokyo 12
Mexico City 11
Miami 11
Saint Petersburg 11
Guangzhou 9
Portland 9
Auburn Hills 8
Leawood 8
Secaucus 8
Zanjan 8
Hefei 7
Nanjing 7
Rome 7
Ardabil 6
Bologna 6
Taipei 6
Falkenstein 5
Gunzenhausen 5
Hamburg 5
Gif-sur-yvette 4
Laion 4
London 4
Malakoff 4
Mezzocorona 4
Redmond 4
Amsterdam 3
Barcelona 3
Bolzano 3
Costa Mesa 3
Dallas 3
Grado 3
Henderson 3
Kunming 3
Milan 3
Sacramento 3
St Petersburg 3
Suzhou 3
Winnipeg 3
Zurich 3
Andover 2
Atlanta 2
Baku 2
Bari 2
Bengaluru 2
Bozen 2
Bratislava 2
Castelló de la Plana 2
Central District 2
Chengdu 2
Guayaquil 2
Inglewood 2
Irving 2
Lausanne 2
Ljubljana 2
Marano Di Napoli 2
Menlo Park 2
Nagold 2
Nanchang 2
North Bergen 2
Nuremberg 2
Olomouc 2
Parma 2
Totale 4.606
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Nome #
Regular nano-void formation on Ge films on Si using Sn ion implantation through silicon nitride caps 135
Boron Ultra Low Energy SIMS Depth Profiling Improved by Rotating Stage 95
Applicazioni della spettrometria di massa a materiali e tecniche di ultima generazione 94
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 93
D-SIMS and ToF-SIMS quantitative depth profiles comparison on ultra thin oxynitrides 92
Analytical methodology development for Silicon rich oxide chemical physical characterization 88
Numerical/experimental strategies to infer enhanced liquid thermal conductivity and roughness in laser powder-bed fusion processes 86
Nanoscale friction of graphene oxide over glass-fibre and polystyrene 85
Key role of molecular kinetic energy in early stages of pentacene island growth 84
Development of nano-roughness under SIMS ion sputtering of germanium surfaces 82
Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants 81
Ultra low energy Boron ion implants in silicon analyzed by not-oxydizing O2+ bombardment and synchrotron radiation grazing incidence x-ray fluorescence 79
SiO2-SnO2 transparent glass-ceramics activated by rare earth ions 79
D-Sims and TOF-SIMS quantitative depth profiles on ultra thin oxinitrides 77
Analytical Methodology Development for Silicon-rich-oxide Chemical and Physical Characterization 75
Analytical methodology development for SRO chemical physical characterization 75
XPS and SIMS Depth Profiling of Chlorine in High-Temperature Oxynitrides 74
Multigas detection by Diode Laser-Photoacoustic Resolution Spectroscopy 74
Experience of accreditation in a surface science laboratory 74
Resonant photoacoustic simultaneous detection of methane and ethylene by means of a 1.63 um diode laser 73
Tribological characteristics of few-layer graphene over Ni grain and interface boundaries 73
Gas sensing application of hibrid nanostructures synthesized by supersonic beams 72
Aza-crown-ether functionalized graphene oxide for gas sensing and cation trapping applications 72
Development of nanotopography during SIMS characterization of thin films of Ge1−xSnx alloy 71
Deph profiling and quantification of chlorine and nitrogen in oxynitrides obtained by HTO process 70
Multilayer silicon rich oxy-nitride films characterization by SIMS, VASE and AFM 70
Combined XPS, SIMS and AFM analysis of silicon nano-crystals embedded in silicon oxide layers 69
Secondary ion mass spectrometry characterization of deuterated GaAsN films on GaAs 68
Experimental study by Secondary Ion Mass Spectrometry focused on the relationship between hardness and sputtering rate in hard coatings 68
ToF-SIMS and XPS charcterisation of urban aerosols for pollution studies 67
Damage of ultralow k materials during photoresist mask stripping process 67
Development of nano-roughness under SIMS ion sputtering of Germanium surfaces 67
Decoration of graphite nanoplatelets with Nb2O5 deposited by radio frequency sputtering 67
Ultra low energy Boron implants in silicon characterization by not-oxidizing secondary ion mass spectrometry analysis and soft-ray grazing incidence x-ray fluorescence techniques. 66
SIMS RSFs in silicon for positive secondary ions with O2+ 1keV at 63° incidence sputtering beam and Zalar rotation. 66
Combined XPS, SIMS and AFM analysis of silicon nanocrystals embedded in silicon oxide layers 66
Growth of titanium dioxide films by cluster supersonic beams for VOC sensing applications 66
Nanofabrication of self-organized periodic ripples by ion beam sputtering 66
Structural phase-dependent resistivity of intrinsic-extrinsic co-doped transparent titanium dioxide films 66
ToF-SIMS and AFM studies of low-k dielectric etching in fluorocarbon plasmas 65
Ultra shallow junction analysis for technology nodes beyond 65nm 65
Controling the early stages of pentacene growth by supersonic molecular beam deposition 64
Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants" 64
Activated dopant effect on low energy SIMS depth profiling 64
Quality management system and accreditation of measurements in a surface science laboratory: the case study of MiNALab 64
Optimization of a Low-Power Chemoresistive Gas Sensor: Predictive Thermal Modelling and Mechanical Failure Analysis 64
Ultralow energy boron implants in silicon characterization by nonoxidizing secondary ion mass spectrometry analysis and soft x-ray grazing incidence x-ray fluorescence techniques 63
Depth measurements of etch-pits in GaN with shape reconstruction from SEM images 63
Chemical and morphological characterization of nanoporous silica low-k dielectrics etched in fluorocarbon plasmas 63
Ultra shallow Boron junctions in silicon characterization by secondary ion mass spectrometry and synchrotron radiation grazing incidence x-ray fluorescence techniques 62
Study of Organosilicon Plasma Polymer Used in Composite Layers with Biomedical Application 62
SiO2-P2O5-HfO2-Al2O3-Na2O glasses activated by Er3+ ions: From bulk sample to planar waveguide fabricated by rf-sputtering 62
In situ sputtering rate measurement by laser interferometer applied to SIMS analyses 61
Study of Plasma Polymer Structures to Induce Composite Layers 61
An experimental/ab-initio study on carbon nanotubes fibers for application in high-performing sporting goods. 61
Surface plasmon resonance based on molecularly imprinted nanoparticles for the picomolar detection of the iron regulating hormone Hepcidin-25 61
AFM and Raman study of graphene deposited on silicon surfaces nanostructured by ion beam irradiation 61
Effect of Nanodiamond Particles Incorporation in Hydroxyapatite Coatings 60
Boron ultra low energy SIMS depth profiling improved by rotating stage 60
Investigation of charges-driven interactions between graphene and different SiO2 surfaces 60
Multilayer silicon rich oxy-nitride films characterization by SIMS, VASE and AFM 59
X-ray Photoelectron Spectroscopy of Nitrided Silicon-Silicon Oxide Interface 59
Rotating stage and shallow depth profiling on Cameca SC-Ultra apparatus 59
Nanotensile tests, microscopy characterization and atomistic simulations of carbon nanotubes fibers 59
Fermentation based carbon nanotube multifunctional bionic composites 59
Quality management system and accreditation of measurements in a surface science laboratory. The case study of MiNALab. 58
ToF-SIMS study of adhesive residuals on device contact pads after wafer taping and backgrinding 58
Sample topography developed by sputtering in a Cameca instruments: an AFM and SEM study 57
Surface investigation of archeological glasses by secondary ion mass spectrometry 57
Nanostructures by assembling clusters and molecules from supersonic beams: A novel approach for gas sensing devices 57
Effects of Plasma Etch and Stripping on ULK Materials” Future Fab International 19 (2005) 86-89 56
ispettiva di sorveglianza 04-05 Luglio 2013 56
Porosity- induced effects during C4F8/90% Ar plasma etching of silica-based ultralow-k dielectrics 55
Study of plasma polymer structures to induce composite layers 55
Flexible photonics: RF-sputtering fabrication of glass-based systems operating under mechanical deformation conditions 55
Influence of changes in the resistivity of the sample surface on ultra-shallow SIMS profiles for arsenic 54
Plasma-Surface Interactions of Model Polymers for Advanced Photoresists Using C4F8/Ar Discharges and Energetic Ion Beams 54
Visita ispettiva annuale di sorveglianza Accredia 54
Study of Hydroxyapatite / Detonation NanoDiamond Composite Layers 54
TiN/STO/TiN MIMcaps nanolayers on silicon characterized by SIMS and AFM 53
Depth profiling and quantification of chlorine and nitrogen in oxynitrides obtained by HTO process 53
Surface wet-ability modifications of thin PECVD silicon nitride layers by 40 keV surface argon ion treatments 53
Effect of Nanodiamond Particles Incorporation in Hydroxyapatite Coatings 52
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 52
Nitride Silicon-Silicon Dioxide Interface: Electrical and Phisico-Chemical Characterization by Complementary Surface Techniques 52
XPS and SIMS Depth Profiling of Chlorine in Oxynitrides Obtained by HTO Process 52
Morphology structure and interfaces in the preparation of films by SUMBE for gas sensing 52
Graphene as Barrier to Prevent Volume Increment of Air Bubbles over Silicone Polymer in Aqueous Environment 51
Sample topography developed by sputtering in Cameca instruments 50
Ultra thin oxynitride profiles by XPS etch-back analyses 50
TiN/STO/TiN MIMcaps nanolayers on silicon characterized by SIMS and AFM 50
Solid phase epitaxial re-growth of Sn ion implanted germanium thin films 50
Induced roughness by low energy ion bombardment 50
MCs+ and MCs2+ Molecular Ions Emission from Transition Metal Silicides 49
Ultrathin Multilayer Dielectrics Analyses by XPS wet-etching and SIMS profile 47
Visita ispettiva annuale di sorveglianza Accredia 47
In situ sputtering rate measurement by laser interferometer applied to SIMS analyses 47
ispettiva di sorveglianza 6-7 giugno 2012. 47
SIMS analytical conditions optimized to reduce the morphology induced by sputtering with an oblique O2+ beam 46
Functionalized ZnO Microbelt as Improved CO Sensor 46
Totale 6.426
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Categoria #
all - tutte 47.971
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 47.971
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20201.251 0 126 13 13 157 86 159 12 145 309 153 78
2020/20211.340 162 6 135 74 151 56 159 16 18 290 69 204
2021/2022705 24 25 13 102 22 21 16 137 48 38 98 161
2022/20231.968 47 161 54 345 105 333 21 158 477 143 87 37
2023/20241.318 137 67 139 68 87 158 63 153 31 221 12 182
2024/202543 25 18 0 0 0 0 0 0 0 0 0 0
Totale 7.745