IRIS Institutional Research Information System

Iacob, Erica
 Distribuzione geografica
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Continente #
NA - Nord America 5.904
EU - Europa 4.616
AS - Asia 3.193
SA - Sud America 823
AF - Africa 68
Continente sconosciuto - Info sul continente non disponibili 20
OC - Oceania 4
Totale 14.628
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Nazione #
US - Stati Uniti d'America 5.743
RU - Federazione Russa 1.369
SG - Singapore 1.161
DE - Germania 814
BR - Brasile 723
HK - Hong Kong 610
CN - Cina 573
UA - Ucraina 456
SE - Svezia 415
FI - Finlandia 384
IN - India 338
IT - Italia 337
VN - Vietnam 216
GB - Regno Unito 213
IE - Irlanda 178
NL - Olanda 155
CA - Canada 94
FR - Francia 85
JP - Giappone 53
MX - Messico 45
BE - Belgio 43
PL - Polonia 39
AR - Argentina 36
ES - Italia 35
ZA - Sudafrica 34
KR - Corea 30
TR - Turchia 30
BD - Bangladesh 28
IQ - Iraq 27
LT - Lituania 26
CZ - Repubblica Ceca 24
IL - Israele 23
IR - Iran 21
EU - Europa 19
EC - Ecuador 16
VE - Venezuela 13
MA - Marocco 11
PK - Pakistan 11
SA - Arabia Saudita 10
UY - Uruguay 10
CO - Colombia 8
UZ - Uzbekistan 8
AE - Emirati Arabi Uniti 7
AT - Austria 7
KE - Kenya 7
CH - Svizzera 6
ID - Indonesia 6
JM - Giamaica 6
PY - Paraguay 6
TW - Taiwan 6
PE - Perù 5
AZ - Azerbaigian 4
BG - Bulgaria 4
EG - Egitto 4
KG - Kirghizistan 4
KZ - Kazakistan 4
NP - Nepal 4
TN - Tunisia 4
AL - Albania 3
AM - Armenia 3
AU - Australia 3
BH - Bahrain 3
BO - Bolivia 3
CL - Cile 3
CR - Costa Rica 3
GR - Grecia 3
MD - Moldavia 3
MT - Malta 3
PA - Panama 3
RS - Serbia 3
SK - Slovacchia (Repubblica Slovacca) 3
SN - Senegal 3
BZ - Belize 2
DM - Dominica 2
DO - Repubblica Dominicana 2
DZ - Algeria 2
LB - Libano 2
LV - Lettonia 2
MY - Malesia 2
OM - Oman 2
PS - Palestinian Territory 2
PT - Portogallo 2
SI - Slovenia 2
A1 - Anonimo 1
AO - Angola 1
BA - Bosnia-Erzegovina 1
BB - Barbados 1
ET - Etiopia 1
GE - Georgia 1
GP - Guadalupe 1
GT - Guatemala 1
JO - Giordania 1
KW - Kuwait 1
NZ - Nuova Zelanda 1
PH - Filippine 1
QA - Qatar 1
RO - Romania 1
SC - Seychelles 1
TT - Trinidad e Tobago 1
Totale 14.628
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Città #
Chandler 1.012
Jacksonville 875
Singapore 745
Hong Kong 605
Ashburn 375
Moscow 328
Munich 240
Dallas 239
Helsinki 221
Beijing 216
Boardman 216
Wilmington 202
Trento 191
Dublin 177
The Dalles 173
Hefei 143
Dong Ket 137
Kronberg 135
New York 135
Ann Arbor 115
Dearborn 114
Los Angeles 111
Brooklyn 103
Santa Clara 83
Woodbridge 71
São Paulo 66
Phoenix 52
Turku 50
Brussels 43
Tokyo 42
Pune 40
Houston 39
Shanghai 37
Seattle 32
Rio de Janeiro 31
Toronto 31
San Mateo 29
Warsaw 29
Southend 28
London 25
Falkenstein 24
Montreal 23
Stockholm 23
Atlanta 22
Ho Chi Minh City 22
Johannesburg 21
Mexico City 21
Brno 20
Hanoi 20
Boston 19
Poplar 19
Orem 18
Augusta 17
Belo Horizonte 17
Council Bluffs 16
Brasília 15
Chennai 15
Hanover 15
Bologna 14
Falls Church 14
Norwalk 14
Rome 14
Secaucus 14
St Petersburg 14
Cheyenne 13
Mountain View 13
Denver 12
Miami 12
Redwood City 12
Salvador 12
San Francisco 12
Guangzhou 11
Hillsboro 11
Manchester 11
Ottawa 11
Porto Alegre 11
Saint Petersburg 11
Baghdad 10
Chicago 10
Columbus 10
Mumbai 10
Ankara 9
Frankfurt am Main 9
Portland 9
Querétaro 9
Amsterdam 8
Auburn Hills 8
Curitiba 8
Leawood 8
Montevideo 8
Zanjan 8
Erbil 7
Goiânia 7
Nairobi 7
Nanjing 7
Tashkent 7
Tianjin 7
Vancouver 7
Ardabil 6
Campinas 6
Totale 8.304
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Nome #
X-ray Photoelectron Spectroscopy of Nitrided Silicon-Silicon Oxide Interface 330
Assessment of SnO2-nanocrystal-based luminescent glass-ceramic waveguides for integrated photonics 264
Regular nano-void formation on Ge films on Si using Sn ion implantation through silicon nitride caps 203
D-SIMS and ToF-SIMS quantitative depth profiles comparison on ultra thin oxynitrides 188
Applicazioni della spettrometria di massa a materiali e tecniche di ultima generazione 187
Analytical methodology development for Silicon rich oxide chemical physical characterization 183
Boron Ultra Low Energy SIMS Depth Profiling Improved by Rotating Stage 162
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 161
Analytical methodology development for SRO chemical physical characterization 156
SiO2-SnO2 transparent glass-ceramics activated by rare earth ions 147
Analytical Methodology Development for Silicon-rich-oxide Chemical and Physical Characterization 146
Key role of molecular kinetic energy in early stages of pentacene island growth 145
An experimental/ab-initio study on carbon nanotubes fibers for application in high-performing sporting goods. 143
Nanotensile tests, microscopy characterization and atomistic simulations of carbon nanotubes fibers 143
Combined XPS, SIMS and AFM analysis of silicon nanocrystals embedded in silicon oxide layers 143
Nanoscale friction of graphene oxide over glass-fibre and polystyrene 142
Combined XPS, SIMS and AFM analysis of silicon nano-crystals embedded in silicon oxide layers 140
D-Sims and TOF-SIMS quantitative depth profiles on ultra thin oxinitrides 140
Aza-crown-ether functionalized graphene oxide for gas sensing and cation trapping applications 139
Activated dopant effect on low energy SIMS depth profiling 138
Fermentation based carbon nanotube multifunctional bionic composites 138
Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants 137
Development of nanotopography during SIMS characterization of thin films of Ge1−xSnx alloy 137
Multigas detection by Diode Laser-Photoacoustic Resolution Spectroscopy 136
Quality management system and accreditation of measurements in a surface science laboratory. The case study of MiNALab. 134
Tribological characteristics of few-layer graphene over Ni grain and interface boundaries 134
Development of nano-roughness under SIMS ion sputtering of Germanium surfaces 133
Development of nano-roughness under SIMS ion sputtering of germanium surfaces 132
Decoration of graphite nanoplatelets with Nb2O5 deposited by radio frequency sputtering 132
Boron ultra low energy SIMS depth profiling improved by rotating stage 130
Structural phase-dependent resistivity of intrinsic-extrinsic co-doped transparent titanium dioxide films 130
Resonant photoacoustic simultaneous detection of methane and ethylene by means of a 1.63 um diode laser 129
Quality management system and accreditation of measurements in a surface science laboratory: the case study of MiNALab 128
Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants" 127
Numerical/experimental strategies to infer enhanced liquid thermal conductivity and roughness in laser powder-bed fusion processes 127
Controling the early stages of pentacene growth by supersonic molecular beam deposition 126
Damage of ultralow k materials during photoresist mask stripping process 126
ispettiva di sorveglianza 04-05 Luglio 2013 124
Experimental study by Secondary Ion Mass Spectrometry focused on the relationship between hardness and sputtering rate in hard coatings 124
Ultra low energy Boron ion implants in silicon analyzed by not-oxydizing O2+ bombardment and synchrotron radiation grazing incidence x-ray fluorescence 123
Optimization of a Low-Power Chemoresistive Gas Sensor: Predictive Thermal Modelling and Mechanical Failure Analysis 123
SiO2-P2O5-HfO2-Al2O3-Na2O glasses activated by Er3+ ions: From bulk sample to planar waveguide fabricated by rf-sputtering 122
Morphology structure and interfaces in the preparation of films by SUMBE for gas sensing 122
Chemical and morphological characterization of nanoporous silica low-k dielectrics etched in fluorocarbon plasmas 119
Growth of titanium dioxide films by cluster supersonic beams for VOC sensing applications 118
Nanofabrication of self-organized periodic ripples by ion beam sputtering 118
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 117
Flexible photonics: RF-sputtering fabrication of glass-based systems operating under mechanical deformation conditions 117
Air Stable Nickel-Decorated Black Phosphorus and Its Room-Temperature Chemiresistive Gas Sensor Capabilities 117
AFM and Raman study of graphene deposited on silicon surfaces nanostructured by ion beam irradiation 116
Experience of accreditation in a surface science laboratory 115
ispettiva di sorveglianza 6-7 giugno 2012. 115
Investigation of charges-driven interactions between graphene and different SiO2 surfaces 114
XPS and SIMS Depth Profiling of Chlorine in High-Temperature Oxynitrides 113
Secondary ion mass spectrometry characterization of deuterated GaAsN films on GaAs 112
Ultra shallow Boron junctions in silicon characterization by secondary ion mass spectrometry and synchrotron radiation grazing incidence x-ray fluorescence techniques 111
Nanostructures by assembling clusters and molecules from supersonic beams: A novel approach for gas sensing devices 111
ToF-SIMS and AFM studies of low-k dielectric etching in fluorocarbon plasmas 110
ToF-SIMS and XPS charcterisation of urban aerosols for pollution studies 108
Influence of changes in the resistivity of the sample surface on ultra-shallow SIMS profiles for arsenic 106
Rotating stage and shallow depth profiling on Cameca SC-Ultra apparatus 106
Gas sensing application of hibrid nanostructures synthesized by supersonic beams 106
Design, fabrication and assessment of an optomechanical sensor for pressure and vibration detection using flexible glass multilayers 106
Multilayer silicon rich oxy-nitride films characterization by SIMS, VASE and AFM 105
In situ sputtering rate measurement by laser interferometer applied to SIMS analyses 105
Depth measurements of etch-pits in GaN with shape reconstruction from SEM images 105
Effect of Nanodiamond Particles Incorporation in Hydroxyapatite Coatings 105
Ultra shallow junction analysis for technology nodes beyond 65nm 105
SIMS RSFs in silicon for positive secondary ions with O2+ 1keV at 63° incidence sputtering beam and Zalar rotation. 104
Friction and adhesion of different structural defects of graphene 103
Ultralow energy boron implants in silicon characterization by nonoxidizing secondary ion mass spectrometry analysis and soft x-ray grazing incidence x-ray fluorescence techniques 102
Visita ispettiva annuale di sorveglianza Accredia 102
Multilayer silicon rich oxy-nitride films characterization by SIMS, VASE and AFM 100
Study of Organosilicon Plasma Polymer Used in Composite Layers with Biomedical Application 100
Deph profiling and quantification of chlorine and nitrogen in oxynitrides obtained by HTO process 99
Ultra low energy Boron implants in silicon characterization by not-oxidizing secondary ion mass spectrometry analysis and soft-ray grazing incidence x-ray fluorescence techniques. 99
Graphene as Barrier to Prevent Volume Increment of Air Bubbles over Silicone Polymer in Aqueous Environment 99
ToF-SIMS study of adhesive residuals on device contact pads after wafer taping and backgrinding 98
Functionalized ZnO Microbelt as Improved CO Sensor 98
Surface characterization of polydimethylsiloxane: An AFM study 97
Depth profiling and quantification of chlorine and nitrogen in oxynitrides obtained by HTO process 96
Plasma-Surface Interactions of Model Polymers for Advanced Photoresists Using C4F8/Ar Discharges and Energetic Ion Beams 95
Quality management system and accreditation of measurements on scientific high-level technological laboratory. The case study of MiNALab 93
Free-Standing Graphene Oxide and Carbon Nanotube Hybrid Papers with Enhanced Electrical and Mechanical Performance and Their Synergy in Polymer Laminates 93
Surface wet-ability modifications of thin PECVD silicon nitride layers by 40 keV surface argon ion treatments 92
TiN/STO/TiN MIMcaps nanolayers on silicon characterized by SIMS and AFM 91
Sample topography developed by sputtering in a Cameca instruments: an AFM and SEM study 91
Effects of Plasma Etch and Stripping on ULK Materials” Future Fab International 19 (2005) 86-89 91
Porosity- induced effects during C4F8/90% Ar plasma etching of silica-based ultralow-k dielectrics 90
Study of Plasma Polymer Structures to Induce Composite Layers 90
Surface plasmon resonance based on molecularly imprinted nanoparticles for the picomolar detection of the iron regulating hormone Hepcidin-25 90
Enhanced photorefractivity and rare-earth photoluminescence in SnO2 nanocrystals-based photonic glass-ceramics 90
Ultra thin oxynitride profiles by XPS etch-back analyses 89
Surface investigation of archeological glasses by secondary ion mass spectrometry 88
Nitride Silicon-Silicon Dioxide Interface: Electrical and Phisico-Chemical Characterization by Complementary Surface Techniques 88
Induced roughness by low energy ion bombardment 88
Photon management in SiO2-SnO2:Yb3+ hybrid 1D microcavity 87
Sample topography developed by sputtering in Cameca instruments 87
Solid phase epitaxial re-growth of Sn ion implanted germanium thin films 87
XPS and SIMS Depth Profiling of Chlorine in Oxynitrides Obtained by HTO Process 87
Totale 12.158
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Categoria #
all - tutte 79.932
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 79.932
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021812 0 0 0 0 0 56 159 16 18 290 69 204
2021/2022705 24 25 13 102 22 21 16 137 48 38 98 161
2022/20231.968 47 161 54 345 105 333 21 158 477 143 87 37
2023/20241.318 137 67 139 68 87 158 63 153 31 221 12 182
2024/20254.273 25 75 405 125 283 86 238 256 1.465 466 567 282
2025/20262.865 438 566 625 695 440 101 0 0 0 0 0 0
Totale 14.840