IRIS Institutional Research Information System

Iacob, Erica
 Distribuzione geografica
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Continente #
EU - Europa 8.923
NA - Nord America 8.466
AS - Asia 4.459
SA - Sud America 950
Continente sconosciuto - Info sul continente non disponibili 233
AF - Africa 98
OC - Oceania 7
Totale 23.136
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Nazione #
US - Stati Uniti d'America 8.241
RU - Federazione Russa 5.168
SG - Singapore 1.544
DE - Germania 918
BR - Brasile 803
CN - Cina 767
HK - Hong Kong 723
VN - Vietnam 634
SE - Svezia 479
UA - Ucraina 458
IT - Italia 419
FI - Finlandia 391
IN - India 368
GB - Regno Unito 248
FR - Francia 246
IE - Irlanda 181
NL - Olanda 162
CA - Canada 115
MX - Messico 75
JP - Giappone 65
AR - Argentina 49
IQ - Iraq 48
PL - Polonia 48
ES - Italia 45
BD - Bangladesh 44
BE - Belgio 43
ZA - Sudafrica 42
TR - Turchia 37
KR - Corea 32
LT - Lituania 26
CZ - Repubblica Ceca 24
IL - Israele 24
EC - Ecuador 21
IR - Iran 21
SA - Arabia Saudita 20
VE - Venezuela 20
EU - Europa 19
PK - Pakistan 18
CO - Colombia 17
ID - Indonesia 15
MA - Marocco 14
AE - Emirati Arabi Uniti 12
UY - Uruguay 11
JM - Giamaica 10
UZ - Uzbekistan 10
KE - Kenya 9
AT - Austria 8
CL - Cile 8
JO - Giordania 8
PE - Perù 8
PY - Paraguay 8
TN - Tunisia 8
AZ - Azerbaigian 7
CH - Svizzera 7
LB - Libano 7
PH - Filippine 7
TW - Taiwan 7
AL - Albania 6
AU - Australia 6
NP - Nepal 6
BG - Bulgaria 5
BO - Bolivia 5
EG - Egitto 5
GR - Grecia 5
KG - Kirghizistan 5
KZ - Kazakistan 5
BH - Bahrain 4
CR - Costa Rica 4
DO - Repubblica Dominicana 4
PT - Portogallo 4
RS - Serbia 4
SK - Slovacchia (Repubblica Slovacca) 4
AM - Armenia 3
BA - Bosnia-Erzegovina 3
DZ - Algeria 3
ET - Etiopia 3
HN - Honduras 3
LV - Lettonia 3
MD - Moldavia 3
MT - Malta 3
MY - Malesia 3
PA - Panama 3
RO - Romania 3
SN - Senegal 3
TH - Thailandia 3
AO - Angola 2
BZ - Belize 2
CG - Congo 2
DM - Dominica 2
GT - Guatemala 2
HU - Ungheria 2
NO - Norvegia 2
OM - Oman 2
PS - Palestinian Territory 2
QA - Qatar 2
SI - Slovenia 2
A1 - Anonimo 1
BB - Barbados 1
CI - Costa d'Avorio 1
CY - Cipro 1
Totale 22.904
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Città #
Chandler 1.012
San Jose 940
Council Bluffs 912
Jacksonville 878
Singapore 837
Hong Kong 703
Ashburn 499
Moscow 329
Beijing 253
Dallas 252
Munich 240
Helsinki 228
The Dalles 221
Boardman 216
Wilmington 204
Trento 203
Dublin 180
Ho Chi Minh City 159
New York 155
Los Angeles 154
Hefei 143
Dong Ket 137
Kronberg 135
Hanoi 128
Ann Arbor 115
Dearborn 114
Lauterbourg 109
Brooklyn 108
Santa Clara 103
São Paulo 78
Phoenix 72
Woodbridge 71
Turku 50
Tokyo 49
Houston 47
Brussels 43
Pune 41
Orem 40
Shanghai 39
Frankfurt am Main 38
Seattle 36
Toronto 36
Rio de Janeiro 34
Warsaw 34
London 29
Montreal 29
San Mateo 29
Atlanta 28
Haiphong 28
Mexico City 28
Southend 28
Da Nang 27
Johannesburg 26
Falkenstein 25
Stockholm 23
Boston 22
Chennai 22
Poplar 22
Rome 21
Brno 20
Baghdad 18
Belo Horizonte 18
Augusta 17
Denver 17
Brasília 16
Chicago 16
Miami 16
St Petersburg 16
Bologna 15
Hanover 15
San Francisco 15
Falls Church 14
Norwalk 14
Secaucus 14
Cheyenne 13
Guangzhou 13
Mountain View 13
Porto Alegre 13
Salvador 13
Ankara 12
Buffalo 12
Erbil 12
Hillsboro 12
Manchester 12
Querétaro 12
Redwood City 12
Hải Dương 11
Milan 11
Mumbai 11
Nuremberg 11
Ottawa 11
Saint Petersburg 11
Columbus 10
Guayaquil 10
New Delhi 10
Tianjin 10
Amsterdam 9
Curitiba 9
Montevideo 9
Nairobi 9
Totale 11.294
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Nome #
X-ray Photoelectron Spectroscopy of Nitrided Silicon-Silicon Oxide Interface 396
Assessment of SnO2-nanocrystal-based luminescent glass-ceramic waveguides for integrated photonics 333
Analytical methodology development for Silicon rich oxide chemical physical characterization 274
D-SIMS and ToF-SIMS quantitative depth profiles comparison on ultra thin oxynitrides 271
Regular nano-void formation on Ge films on Si using Sn ion implantation through silicon nitride caps 267
Applicazioni della spettrometria di massa a materiali e tecniche di ultima generazione 266
Boron Ultra Low Energy SIMS Depth Profiling Improved by Rotating Stage 257
Analytical Methodology Development for Silicon-rich-oxide Chemical and Physical Characterization 250
Aza-crown-ether functionalized graphene oxide for gas sensing and cation trapping applications 243
Combined XPS, SIMS and AFM analysis of silicon nanocrystals embedded in silicon oxide layers 232
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 227
Analytical methodology development for SRO chemical physical characterization 225
Quality management system and accreditation of measurements in a surface science laboratory. The case study of MiNALab. 225
Activated dopant effect on low energy SIMS depth profiling 221
Development of nanotopography during SIMS characterization of thin films of Ge1−xSnx alloy 219
D-Sims and TOF-SIMS quantitative depth profiles on ultra thin oxinitrides 218
Combined XPS, SIMS and AFM analysis of silicon nano-crystals embedded in silicon oxide layers 215
SiO2-SnO2 transparent glass-ceramics activated by rare earth ions 215
Development of nano-roughness under SIMS ion sputtering of Germanium surfaces 214
An experimental/ab-initio study on carbon nanotubes fibers for application in high-performing sporting goods. 212
Nanotensile tests, microscopy characterization and atomistic simulations of carbon nanotubes fibers 211
Nanoscale friction of graphene oxide over glass-fibre and polystyrene 211
Decoration of graphite nanoplatelets with Nb2O5 deposited by radio frequency sputtering 209
Key role of molecular kinetic energy in early stages of pentacene island growth 207
Fermentation based carbon nanotube multifunctional bionic composites 207
Development of nano-roughness under SIMS ion sputtering of germanium surfaces 205
Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants 204
Quality management system and accreditation of measurements in a surface science laboratory: the case study of MiNALab 203
Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants" 202
Structural phase-dependent resistivity of intrinsic-extrinsic co-doped transparent titanium dioxide films 201
Controling the early stages of pentacene growth by supersonic molecular beam deposition 199
Tribological characteristics of few-layer graphene over Ni grain and interface boundaries 199
Boron ultra low energy SIMS depth profiling improved by rotating stage 197
Ultra low energy Boron ion implants in silicon analyzed by not-oxydizing O2+ bombardment and synchrotron radiation grazing incidence x-ray fluorescence 197
Multigas detection by Diode Laser-Photoacoustic Resolution Spectroscopy 195
Numerical/experimental strategies to infer enhanced liquid thermal conductivity and roughness in laser powder-bed fusion processes 195
Chemical and morphological characterization of nanoporous silica low-k dielectrics etched in fluorocarbon plasmas 194
Air Stable Nickel-Decorated Black Phosphorus and Its Room-Temperature Chemiresistive Gas Sensor Capabilities 194
Damage of ultralow k materials during photoresist mask stripping process 192
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 192
Resonant photoacoustic simultaneous detection of methane and ethylene by means of a 1.63 um diode laser 191
AFM and Raman study of graphene deposited on silicon surfaces nanostructured by ion beam irradiation 191
Optimization of a Low-Power Chemoresistive Gas Sensor: Predictive Thermal Modelling and Mechanical Failure Analysis 191
Flexible photonics: RF-sputtering fabrication of glass-based systems operating under mechanical deformation conditions 191
ispettiva di sorveglianza 04-05 Luglio 2013 188
Experimental study by Secondary Ion Mass Spectrometry focused on the relationship between hardness and sputtering rate in hard coatings 187
Morphology structure and interfaces in the preparation of films by SUMBE for gas sensing 184
ispettiva di sorveglianza 6-7 giugno 2012. 183
Friction and adhesion of different structural defects of graphene 182
Nanofabrication of self-organized periodic ripples by ion beam sputtering 181
Investigation of charges-driven interactions between graphene and different SiO2 surfaces 179
Secondary ion mass spectrometry characterization of deuterated GaAsN films on GaAs 178
Nanostructures by assembling clusters and molecules from supersonic beams: A novel approach for gas sensing devices 178
Growth of titanium dioxide films by cluster supersonic beams for VOC sensing applications 177
SiO2-P2O5-HfO2-Al2O3-Na2O glasses activated by Er3+ ions: From bulk sample to planar waveguide fabricated by rf-sputtering 176
Design, fabrication and assessment of an optomechanical sensor for pressure and vibration detection using flexible glass multilayers 175
XPS and SIMS Depth Profiling of Chlorine in High-Temperature Oxynitrides 174
Influence of changes in the resistivity of the sample surface on ultra-shallow SIMS profiles for arsenic 174
Ultra shallow junction analysis for technology nodes beyond 65nm 174
Ultralow energy boron implants in silicon characterization by nonoxidizing secondary ion mass spectrometry analysis and soft x-ray grazing incidence x-ray fluorescence techniques 173
Experience of accreditation in a surface science laboratory 173
ToF-SIMS and AFM studies of low-k dielectric etching in fluorocarbon plasmas 166
Ultra shallow Boron junctions in silicon characterization by secondary ion mass spectrometry and synchrotron radiation grazing incidence x-ray fluorescence techniques 166
Gas sensing application of hibrid nanostructures synthesized by supersonic beams 166
In situ sputtering rate measurement by laser interferometer applied to SIMS analyses 165
SIMS RSFs in silicon for positive secondary ions with O2+ 1keV at 63° incidence sputtering beam and Zalar rotation. 164
Graphene as Barrier to Prevent Volume Increment of Air Bubbles over Silicone Polymer in Aqueous Environment 163
Ultra low energy Boron implants in silicon characterization by not-oxidizing secondary ion mass spectrometry analysis and soft-ray grazing incidence x-ray fluorescence techniques. 161
Plasma-Surface Interactions of Model Polymers for Advanced Photoresists Using C4F8/Ar Discharges and Energetic Ion Beams 160
ToF-SIMS and XPS charcterisation of urban aerosols for pollution studies 159
Enhanced photorefractivity and rare-earth photoluminescence in SnO2 nanocrystals-based photonic glass-ceramics 159
Photon management in SiO2-SnO2:Yb3+ hybrid 1D microcavity 156
Multilayer silicon rich oxy-nitride films characterization by SIMS, VASE and AFM 154
Porosity- induced effects during C4F8/90% Ar plasma etching of silica-based ultralow-k dielectrics 153
Depth measurements of etch-pits in GaN with shape reconstruction from SEM images 153
Depth profiling and quantification of chlorine and nitrogen in oxynitrides obtained by HTO process 152
Rotating stage and shallow depth profiling on Cameca SC-Ultra apparatus 152
Study of Organosilicon Plasma Polymer Used in Composite Layers with Biomedical Application 151
Free-Standing Graphene Oxide and Carbon Nanotube Hybrid Papers with Enhanced Electrical and Mechanical Performance and Their Synergy in Polymer Laminates 151
Multilayer silicon rich oxy-nitride films characterization by SIMS, VASE and AFM 150
Ultra thin oxynitride profiles by XPS etch-back analyses 150
Effect of Nanodiamond Particles Incorporation in Hydroxyapatite Coatings 149
Deph profiling and quantification of chlorine and nitrogen in oxynitrides obtained by HTO process 148
Sample topography developed by sputtering in a Cameca instruments: an AFM and SEM study 148
Surface characterization of polydimethylsiloxane: An AFM study 148
Functionalized ZnO Microbelt as Improved CO Sensor 147
Ultrathin Multilayer Dielectrics Analyses by XPS wet-etching and SIMS profile 146
Solid phase epitaxial re-growth of Sn ion implanted germanium thin films 146
Visita ispettiva annuale di sorveglianza Accredia 143
Effects of Plasma Etch and Stripping on ULK Materials” Future Fab International 19 (2005) 86-89 143
Graphene Confers Ultralow Friction on Nanogear Cogs 143
Surface investigation of archeological glasses by secondary ion mass spectrometry 141
Nitride Silicon-Silicon Dioxide Interface: Electrical and Phisico-Chemical Characterization by Complementary Surface Techniques 141
The role of incidence angle in the morphology evolution of Ge surfaces irradiated by medium-energy Au ions 140
XPS and SIMS Depth Profiling of Chlorine in Oxynitrides Obtained by HTO Process 140
Sample topography developed by sputtering in Cameca instruments 138
TiN/STO/TiN MIMcaps nanolayers on silicon characterized by SIMS and AFM 137
TiN/STO/TiN MIMcaps nanolayers on silicon characterized by SIMS and AFM 137
ToF-SIMS study of adhesive residuals on device contact pads after wafer taping and backgrinding 137
Study of Plasma Polymer Structures to Induce Composite Layers 136
Totale 18.653
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Categoria #
all - tutte 98.028
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 98.028
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/2022681 0 25 13 102 22 21 16 137 48 38 98 161
2022/20231.968 47 161 54 345 105 333 21 158 477 143 87 37
2023/20241.318 137 67 139 68 87 158 63 153 31 221 12 182
2024/20254.273 25 75 405 125 283 86 238 256 1.465 466 567 282
2025/202610.389 438 566 625 695 440 389 1.468 4.118 507 500 514 129
2026/2027772 454 318 0 0 0 0 0 0 0 0 0 0
Totale 23.136