IRIS Institutional Research Information System

Iacob, Erica
 Distribuzione geografica
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Continente #
EU - Europa 8.803
NA - Nord America 7.167
AS - Asia 4.381
SA - Sud America 936
AF - Africa 98
Continente sconosciuto - Info sul continente non disponibili 20
OC - Oceania 7
Totale 21.412
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Nazione #
US - Stati Uniti d'America 6.967
RU - Federazione Russa 5.168
SG - Singapore 1.526
DE - Germania 916
BR - Brasile 796
CN - Cina 730
HK - Hong Kong 714
VN - Vietnam 625
UA - Ucraina 458
SE - Svezia 438
FI - Finlandia 391
IN - India 368
IT - Italia 354
GB - Regno Unito 248
FR - Francia 245
IE - Irlanda 181
NL - Olanda 156
CA - Canada 104
MX - Messico 67
JP - Giappone 64
IQ - Iraq 48
PL - Polonia 48
AR - Argentina 46
ES - Italia 44
BD - Bangladesh 43
BE - Belgio 43
ZA - Sudafrica 42
TR - Turchia 37
KR - Corea 32
LT - Lituania 26
CZ - Repubblica Ceca 24
IL - Israele 24
IR - Iran 21
EC - Ecuador 20
SA - Arabia Saudita 20
EU - Europa 19
VE - Venezuela 19
PK - Pakistan 18
CO - Colombia 15
MA - Marocco 14
ID - Indonesia 13
AE - Emirati Arabi Uniti 12
UY - Uruguay 11
UZ - Uzbekistan 10
KE - Kenya 9
AT - Austria 8
CL - Cile 8
JM - Giamaica 8
JO - Giordania 8
PE - Perù 8
PY - Paraguay 8
TN - Tunisia 8
AZ - Azerbaigian 7
CH - Svizzera 7
LB - Libano 7
PH - Filippine 7
TW - Taiwan 7
AU - Australia 6
AL - Albania 5
BG - Bulgaria 5
BO - Bolivia 5
EG - Egitto 5
KG - Kirghizistan 5
KZ - Kazakistan 5
NP - Nepal 5
BH - Bahrain 4
DO - Repubblica Dominicana 4
PT - Portogallo 4
RS - Serbia 4
SK - Slovacchia (Repubblica Slovacca) 4
AM - Armenia 3
BA - Bosnia-Erzegovina 3
CR - Costa Rica 3
DZ - Algeria 3
ET - Etiopia 3
GR - Grecia 3
LV - Lettonia 3
MD - Moldavia 3
MT - Malta 3
MY - Malesia 3
PA - Panama 3
RO - Romania 3
SN - Senegal 3
TH - Thailandia 3
AO - Angola 2
BZ - Belize 2
CG - Congo 2
DM - Dominica 2
HU - Ungheria 2
OM - Oman 2
PS - Palestinian Territory 2
QA - Qatar 2
SI - Slovenia 2
A1 - Anonimo 1
BB - Barbados 1
CI - Costa d'Avorio 1
CY - Cipro 1
DK - Danimarca 1
EE - Estonia 1
GE - Georgia 1
Totale 21.393
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Città #
Chandler 1.012
Jacksonville 877
Singapore 833
San Jose 825
Hong Kong 695
Ashburn 479
Moscow 329
Beijing 242
Dallas 241
Munich 240
Helsinki 228
The Dalles 221
Boardman 216
Wilmington 202
Trento 191
Dublin 180
Ho Chi Minh City 154
New York 150
Hefei 143
Los Angeles 142
Dong Ket 137
Kronberg 135
Hanoi 127
Ann Arbor 115
Dearborn 114
Lauterbourg 109
Brooklyn 107
Santa Clara 90
São Paulo 76
Woodbridge 71
Phoenix 55
Turku 50
Tokyo 49
Houston 44
Brussels 43
Pune 41
Shanghai 39
Frankfurt am Main 38
Orem 38
Toronto 36
Rio de Janeiro 34
Warsaw 34
Seattle 33
London 29
San Mateo 29
Haiphong 28
Southend 28
Da Nang 27
Johannesburg 26
Atlanta 25
Falkenstein 25
Montreal 25
Stockholm 23
Chennai 22
Mexico City 22
Poplar 22
Boston 21
Brno 20
Council Bluffs 19
Baghdad 18
Belo Horizonte 18
Augusta 17
Denver 17
Rome 17
Brasília 16
St Petersburg 16
Bologna 15
Hanover 15
San Francisco 15
Falls Church 14
Miami 14
Norwalk 14
Secaucus 14
Cheyenne 13
Guangzhou 13
Mountain View 13
Porto Alegre 13
Salvador 13
Ankara 12
Chicago 12
Erbil 12
Hillsboro 12
Manchester 12
Querétaro 12
Redwood City 12
Hải Dương 11
Mumbai 11
Nuremberg 11
Ottawa 11
Saint Petersburg 11
Columbus 10
Guayaquil 10
New Delhi 10
Tianjin 10
Amsterdam 9
Curitiba 9
Montevideo 9
Nairobi 9
Nanjing 9
Portland 9
Totale 10.124
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Nome #
X-ray Photoelectron Spectroscopy of Nitrided Silicon-Silicon Oxide Interface 388
Assessment of SnO2-nanocrystal-based luminescent glass-ceramic waveguides for integrated photonics 323
Analytical methodology development for Silicon rich oxide chemical physical characterization 263
Applicazioni della spettrometria di massa a materiali e tecniche di ultima generazione 256
D-SIMS and ToF-SIMS quantitative depth profiles comparison on ultra thin oxynitrides 254
Regular nano-void formation on Ge films on Si using Sn ion implantation through silicon nitride caps 253
Boron Ultra Low Energy SIMS Depth Profiling Improved by Rotating Stage 247
Analytical Methodology Development for Silicon-rich-oxide Chemical and Physical Characterization 231
Aza-crown-ether functionalized graphene oxide for gas sensing and cation trapping applications 227
Combined XPS, SIMS and AFM analysis of silicon nanocrystals embedded in silicon oxide layers 221
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 217
Quality management system and accreditation of measurements in a surface science laboratory. The case study of MiNALab. 216
Analytical methodology development for SRO chemical physical characterization 214
Activated dopant effect on low energy SIMS depth profiling 212
D-Sims and TOF-SIMS quantitative depth profiles on ultra thin oxinitrides 207
Development of nanotopography during SIMS characterization of thin films of Ge1−xSnx alloy 207
Development of nano-roughness under SIMS ion sputtering of Germanium surfaces 204
An experimental/ab-initio study on carbon nanotubes fibers for application in high-performing sporting goods. 204
Nanotensile tests, microscopy characterization and atomistic simulations of carbon nanotubes fibers 204
Combined XPS, SIMS and AFM analysis of silicon nano-crystals embedded in silicon oxide layers 201
SiO2-SnO2 transparent glass-ceramics activated by rare earth ions 201
Nanoscale friction of graphene oxide over glass-fibre and polystyrene 200
Key role of molecular kinetic energy in early stages of pentacene island growth 199
Decoration of graphite nanoplatelets with Nb2O5 deposited by radio frequency sputtering 196
Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants" 194
Development of nano-roughness under SIMS ion sputtering of germanium surfaces 194
Quality management system and accreditation of measurements in a surface science laboratory: the case study of MiNALab 194
Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants 193
Fermentation based carbon nanotube multifunctional bionic composites 190
Structural phase-dependent resistivity of intrinsic-extrinsic co-doped transparent titanium dioxide films 190
Tribological characteristics of few-layer graphene over Ni grain and interface boundaries 189
Multigas detection by Diode Laser-Photoacoustic Resolution Spectroscopy 187
Controling the early stages of pentacene growth by supersonic molecular beam deposition 186
Boron ultra low energy SIMS depth profiling improved by rotating stage 186
Ultra low energy Boron ion implants in silicon analyzed by not-oxydizing O2+ bombardment and synchrotron radiation grazing incidence x-ray fluorescence 185
Damage of ultralow k materials during photoresist mask stripping process 184
Numerical/experimental strategies to infer enhanced liquid thermal conductivity and roughness in laser powder-bed fusion processes 184
Air Stable Nickel-Decorated Black Phosphorus and Its Room-Temperature Chemiresistive Gas Sensor Capabilities 184
ispettiva di sorveglianza 04-05 Luglio 2013 180
Optimization of a Low-Power Chemoresistive Gas Sensor: Predictive Thermal Modelling and Mechanical Failure Analysis 179
Chemical and morphological characterization of nanoporous silica low-k dielectrics etched in fluorocarbon plasmas 178
Experimental study by Secondary Ion Mass Spectrometry focused on the relationship between hardness and sputtering rate in hard coatings 177
Flexible photonics: RF-sputtering fabrication of glass-based systems operating under mechanical deformation conditions 177
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 176
ispettiva di sorveglianza 6-7 giugno 2012. 176
Resonant photoacoustic simultaneous detection of methane and ethylene by means of a 1.63 um diode laser 175
AFM and Raman study of graphene deposited on silicon surfaces nanostructured by ion beam irradiation 175
Morphology structure and interfaces in the preparation of films by SUMBE for gas sensing 174
Friction and adhesion of different structural defects of graphene 169
Nanofabrication of self-organized periodic ripples by ion beam sputtering 168
Growth of titanium dioxide films by cluster supersonic beams for VOC sensing applications 167
Nanostructures by assembling clusters and molecules from supersonic beams: A novel approach for gas sensing devices 167
Investigation of charges-driven interactions between graphene and different SiO2 surfaces 167
XPS and SIMS Depth Profiling of Chlorine in High-Temperature Oxynitrides 165
Ultralow energy boron implants in silicon characterization by nonoxidizing secondary ion mass spectrometry analysis and soft x-ray grazing incidence x-ray fluorescence techniques 165
Secondary ion mass spectrometry characterization of deuterated GaAsN films on GaAs 165
SiO2-P2O5-HfO2-Al2O3-Na2O glasses activated by Er3+ ions: From bulk sample to planar waveguide fabricated by rf-sputtering 165
Ultra shallow junction analysis for technology nodes beyond 65nm 165
Design, fabrication and assessment of an optomechanical sensor for pressure and vibration detection using flexible glass multilayers 164
Influence of changes in the resistivity of the sample surface on ultra-shallow SIMS profiles for arsenic 162
Ultra shallow Boron junctions in silicon characterization by secondary ion mass spectrometry and synchrotron radiation grazing incidence x-ray fluorescence techniques 161
Gas sensing application of hibrid nanostructures synthesized by supersonic beams 158
ToF-SIMS and AFM studies of low-k dielectric etching in fluorocarbon plasmas 157
In situ sputtering rate measurement by laser interferometer applied to SIMS analyses 155
Experience of accreditation in a surface science laboratory 154
Ultra low energy Boron implants in silicon characterization by not-oxidizing secondary ion mass spectrometry analysis and soft-ray grazing incidence x-ray fluorescence techniques. 153
Graphene as Barrier to Prevent Volume Increment of Air Bubbles over Silicone Polymer in Aqueous Environment 153
ToF-SIMS and XPS charcterisation of urban aerosols for pollution studies 151
SIMS RSFs in silicon for positive secondary ions with O2+ 1keV at 63° incidence sputtering beam and Zalar rotation. 151
Plasma-Surface Interactions of Model Polymers for Advanced Photoresists Using C4F8/Ar Discharges and Energetic Ion Beams 150
Multilayer silicon rich oxy-nitride films characterization by SIMS, VASE and AFM 147
Depth profiling and quantification of chlorine and nitrogen in oxynitrides obtained by HTO process 147
Enhanced photorefractivity and rare-earth photoluminescence in SnO2 nanocrystals-based photonic glass-ceramics 146
Rotating stage and shallow depth profiling on Cameca SC-Ultra apparatus 145
Study of Organosilicon Plasma Polymer Used in Composite Layers with Biomedical Application 144
Depth measurements of etch-pits in GaN with shape reconstruction from SEM images 143
Deph profiling and quantification of chlorine and nitrogen in oxynitrides obtained by HTO process 142
Ultra thin oxynitride profiles by XPS etch-back analyses 142
Effect of Nanodiamond Particles Incorporation in Hydroxyapatite Coatings 141
Multilayer silicon rich oxy-nitride films characterization by SIMS, VASE and AFM 140
Surface characterization of polydimethylsiloxane: An AFM study 139
Photon management in SiO2-SnO2:Yb3+ hybrid 1D microcavity 138
Functionalized ZnO Microbelt as Improved CO Sensor 138
Free-Standing Graphene Oxide and Carbon Nanotube Hybrid Papers with Enhanced Electrical and Mechanical Performance and Their Synergy in Polymer Laminates 138
Porosity- induced effects during C4F8/90% Ar plasma etching of silica-based ultralow-k dielectrics 137
Sample topography developed by sputtering in a Cameca instruments: an AFM and SEM study 137
Solid phase epitaxial re-growth of Sn ion implanted germanium thin films 137
Surface investigation of archeological glasses by secondary ion mass spectrometry 135
Visita ispettiva annuale di sorveglianza Accredia 134
XPS and SIMS Depth Profiling of Chlorine in Oxynitrides Obtained by HTO Process 134
Ultrathin Multilayer Dielectrics Analyses by XPS wet-etching and SIMS profile 132
Nitride Silicon-Silicon Dioxide Interface: Electrical and Phisico-Chemical Characterization by Complementary Surface Techniques 132
Sample topography developed by sputtering in Cameca instruments 130
TiN/STO/TiN MIMcaps nanolayers on silicon characterized by SIMS and AFM 130
Effects of Plasma Etch and Stripping on ULK Materials” Future Fab International 19 (2005) 86-89 130
ToF-SIMS study of adhesive residuals on device contact pads after wafer taping and backgrinding 129
Graphene Confers Ultralow Friction on Nanogear Cogs 129
Induced roughness by low energy ion bombardment 128
TiN/STO/TiN MIMcaps nanolayers on silicon characterized by SIMS and AFM 127
Surface wet-ability modifications of thin PECVD silicon nitride layers by 40 keV surface argon ion treatments 127
Totale 17.582
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Categoria #
all - tutte 89.878
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 89.878
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021563 0 0 0 0 0 0 0 0 0 290 69 204
2021/2022705 24 25 13 102 22 21 16 137 48 38 98 161
2022/20231.968 47 161 54 345 105 333 21 158 477 143 87 37
2023/20241.318 137 67 139 68 87 158 63 153 31 221 12 182
2024/20254.273 25 75 405 125 283 86 238 256 1.465 466 567 282
2025/20269.650 438 566 625 695 440 389 1.468 4.118 507 404 0 0
Totale 21.625