IRIS Institutional Research Information System

Iacob, Erica
 Distribuzione geografica
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Continente #
EU - Europa 8.824
NA - Nord America 7.766
AS - Asia 4.441
SA - Sud America 941
AF - Africa 98
Continente sconosciuto - Info sul continente non disponibili 20
OC - Oceania 7
Totale 22.097
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Nazione #
US - Stati Uniti d'America 7.554
RU - Federazione Russa 5.168
SG - Singapore 1.541
DE - Germania 917
BR - Brasile 801
CN - Cina 759
HK - Hong Kong 721
VN - Vietnam 631
UA - Ucraina 458
SE - Svezia 438
FI - Finlandia 391
IT - Italia 371
IN - India 368
GB - Regno Unito 248
FR - Francia 245
IE - Irlanda 181
NL - Olanda 157
CA - Canada 109
MX - Messico 72
JP - Giappone 65
IQ - Iraq 48
PL - Polonia 48
AR - Argentina 46
ES - Italia 45
BD - Bangladesh 44
BE - Belgio 43
ZA - Sudafrica 42
TR - Turchia 37
KR - Corea 32
LT - Lituania 26
CZ - Repubblica Ceca 24
IL - Israele 24
IR - Iran 21
EC - Ecuador 20
SA - Arabia Saudita 20
EU - Europa 19
VE - Venezuela 19
PK - Pakistan 18
CO - Colombia 15
MA - Marocco 14
ID - Indonesia 13
AE - Emirati Arabi Uniti 12
UY - Uruguay 11
UZ - Uzbekistan 10
JM - Giamaica 9
KE - Kenya 9
AT - Austria 8
CL - Cile 8
JO - Giordania 8
PE - Perù 8
PY - Paraguay 8
TN - Tunisia 8
AZ - Azerbaigian 7
CH - Svizzera 7
LB - Libano 7
PH - Filippine 7
TW - Taiwan 7
AU - Australia 6
NP - Nepal 6
AL - Albania 5
BG - Bulgaria 5
BO - Bolivia 5
EG - Egitto 5
KG - Kirghizistan 5
KZ - Kazakistan 5
BH - Bahrain 4
DO - Repubblica Dominicana 4
GR - Grecia 4
PT - Portogallo 4
RS - Serbia 4
SK - Slovacchia (Repubblica Slovacca) 4
AM - Armenia 3
BA - Bosnia-Erzegovina 3
CR - Costa Rica 3
DZ - Algeria 3
ET - Etiopia 3
LV - Lettonia 3
MD - Moldavia 3
MT - Malta 3
MY - Malesia 3
PA - Panama 3
RO - Romania 3
SN - Senegal 3
TH - Thailandia 3
AO - Angola 2
BZ - Belize 2
CG - Congo 2
DM - Dominica 2
HN - Honduras 2
HU - Ungheria 2
OM - Oman 2
PS - Palestinian Territory 2
QA - Qatar 2
SI - Slovenia 2
A1 - Anonimo 1
BB - Barbados 1
CI - Costa d'Avorio 1
CY - Cipro 1
DK - Danimarca 1
EE - Estonia 1
Totale 22.078
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Città #
Chandler 1.012
San Jose 937
Jacksonville 877
Singapore 835
Hong Kong 701
Ashburn 490
Council Bluffs 391
Moscow 329
Beijing 251
Dallas 245
Munich 240
Helsinki 228
The Dalles 221
Boardman 216
Wilmington 202
Trento 191
Dublin 180
Ho Chi Minh City 158
New York 150
Los Angeles 146
Hefei 143
Dong Ket 137
Kronberg 135
Hanoi 127
Ann Arbor 115
Dearborn 114
Lauterbourg 109
Brooklyn 108
Santa Clara 94
São Paulo 77
Woodbridge 71
Phoenix 56
Turku 50
Tokyo 49
Houston 45
Brussels 43
Pune 41
Orem 40
Shanghai 39
Frankfurt am Main 38
Toronto 36
Rio de Janeiro 34
Seattle 34
Warsaw 34
London 29
San Mateo 29
Atlanta 28
Haiphong 28
Montreal 28
Southend 28
Da Nang 27
Mexico City 27
Johannesburg 26
Falkenstein 25
Stockholm 23
Chennai 22
Poplar 22
Boston 21
Brno 20
Rome 20
Baghdad 18
Belo Horizonte 18
Augusta 17
Denver 17
Brasília 16
Miami 16
St Petersburg 16
Bologna 15
Hanover 15
San Francisco 15
Chicago 14
Falls Church 14
Norwalk 14
Secaucus 14
Cheyenne 13
Guangzhou 13
Mountain View 13
Porto Alegre 13
Salvador 13
Ankara 12
Buffalo 12
Erbil 12
Hillsboro 12
Manchester 12
Querétaro 12
Redwood City 12
Hải Dương 11
Mumbai 11
Nuremberg 11
Ottawa 11
Saint Petersburg 11
Columbus 10
Guayaquil 10
New Delhi 10
Tianjin 10
Amsterdam 9
Curitiba 9
Montevideo 9
Nairobi 9
Nanjing 9
Totale 10.680
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Nome #
X-ray Photoelectron Spectroscopy of Nitrided Silicon-Silicon Oxide Interface 392
Assessment of SnO2-nanocrystal-based luminescent glass-ceramic waveguides for integrated photonics 327
Analytical methodology development for Silicon rich oxide chemical physical characterization 267
D-SIMS and ToF-SIMS quantitative depth profiles comparison on ultra thin oxynitrides 261
Applicazioni della spettrometria di massa a materiali e tecniche di ultima generazione 260
Regular nano-void formation on Ge films on Si using Sn ion implantation through silicon nitride caps 259
Boron Ultra Low Energy SIMS Depth Profiling Improved by Rotating Stage 250
Analytical Methodology Development for Silicon-rich-oxide Chemical and Physical Characterization 239
Aza-crown-ether functionalized graphene oxide for gas sensing and cation trapping applications 233
Combined XPS, SIMS and AFM analysis of silicon nanocrystals embedded in silicon oxide layers 226
Quality management system and accreditation of measurements in a surface science laboratory. The case study of MiNALab. 220
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 220
Analytical methodology development for SRO chemical physical characterization 219
Activated dopant effect on low energy SIMS depth profiling 216
Development of nanotopography during SIMS characterization of thin films of Ge1−xSnx alloy 212
D-Sims and TOF-SIMS quantitative depth profiles on ultra thin oxinitrides 210
Development of nano-roughness under SIMS ion sputtering of Germanium surfaces 209
SiO2-SnO2 transparent glass-ceramics activated by rare earth ions 208
Combined XPS, SIMS and AFM analysis of silicon nano-crystals embedded in silicon oxide layers 207
An experimental/ab-initio study on carbon nanotubes fibers for application in high-performing sporting goods. 207
Nanotensile tests, microscopy characterization and atomistic simulations of carbon nanotubes fibers 207
Decoration of graphite nanoplatelets with Nb2O5 deposited by radio frequency sputtering 203
Nanoscale friction of graphene oxide over glass-fibre and polystyrene 203
Key role of molecular kinetic energy in early stages of pentacene island growth 202
Fermentation based carbon nanotube multifunctional bionic composites 199
Development of nano-roughness under SIMS ion sputtering of germanium surfaces 198
Quality management system and accreditation of measurements in a surface science laboratory: the case study of MiNALab 198
Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants 197
Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants" 196
Structural phase-dependent resistivity of intrinsic-extrinsic co-doped transparent titanium dioxide films 194
Controling the early stages of pentacene growth by supersonic molecular beam deposition 193
Tribological characteristics of few-layer graphene over Ni grain and interface boundaries 193
Boron ultra low energy SIMS depth profiling improved by rotating stage 190
Ultra low energy Boron ion implants in silicon analyzed by not-oxydizing O2+ bombardment and synchrotron radiation grazing incidence x-ray fluorescence 190
Damage of ultralow k materials during photoresist mask stripping process 189
Air Stable Nickel-Decorated Black Phosphorus and Its Room-Temperature Chemiresistive Gas Sensor Capabilities 189
Multigas detection by Diode Laser-Photoacoustic Resolution Spectroscopy 188
Numerical/experimental strategies to infer enhanced liquid thermal conductivity and roughness in laser powder-bed fusion processes 188
Chemical and morphological characterization of nanoporous silica low-k dielectrics etched in fluorocarbon plasmas 187
Optimization of a Low-Power Chemoresistive Gas Sensor: Predictive Thermal Modelling and Mechanical Failure Analysis 185
ispettiva di sorveglianza 04-05 Luglio 2013 184
Resonant photoacoustic simultaneous detection of methane and ethylene by means of a 1.63 um diode laser 183
Flexible photonics: RF-sputtering fabrication of glass-based systems operating under mechanical deformation conditions 183
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 182
AFM and Raman study of graphene deposited on silicon surfaces nanostructured by ion beam irradiation 182
Experimental study by Secondary Ion Mass Spectrometry focused on the relationship between hardness and sputtering rate in hard coatings 181
Morphology structure and interfaces in the preparation of films by SUMBE for gas sensing 181
ispettiva di sorveglianza 6-7 giugno 2012. 180
Nanofabrication of self-organized periodic ripples by ion beam sputtering 176
Friction and adhesion of different structural defects of graphene 175
Secondary ion mass spectrometry characterization of deuterated GaAsN films on GaAs 172
Growth of titanium dioxide films by cluster supersonic beams for VOC sensing applications 172
Nanostructures by assembling clusters and molecules from supersonic beams: A novel approach for gas sensing devices 172
Investigation of charges-driven interactions between graphene and different SiO2 surfaces 172
XPS and SIMS Depth Profiling of Chlorine in High-Temperature Oxynitrides 170
Influence of changes in the resistivity of the sample surface on ultra-shallow SIMS profiles for arsenic 170
SiO2-P2O5-HfO2-Al2O3-Na2O glasses activated by Er3+ ions: From bulk sample to planar waveguide fabricated by rf-sputtering 170
Experience of accreditation in a surface science laboratory 169
Design, fabrication and assessment of an optomechanical sensor for pressure and vibration detection using flexible glass multilayers 169
Ultralow energy boron implants in silicon characterization by nonoxidizing secondary ion mass spectrometry analysis and soft x-ray grazing incidence x-ray fluorescence techniques 168
Ultra shallow junction analysis for technology nodes beyond 65nm 168
ToF-SIMS and AFM studies of low-k dielectric etching in fluorocarbon plasmas 162
Ultra shallow Boron junctions in silicon characterization by secondary ion mass spectrometry and synchrotron radiation grazing incidence x-ray fluorescence techniques 162
Gas sensing application of hibrid nanostructures synthesized by supersonic beams 161
In situ sputtering rate measurement by laser interferometer applied to SIMS analyses 159
SIMS RSFs in silicon for positive secondary ions with O2+ 1keV at 63° incidence sputtering beam and Zalar rotation. 158
Graphene as Barrier to Prevent Volume Increment of Air Bubbles over Silicone Polymer in Aqueous Environment 157
Ultra low energy Boron implants in silicon characterization by not-oxidizing secondary ion mass spectrometry analysis and soft-ray grazing incidence x-ray fluorescence techniques. 156
ToF-SIMS and XPS charcterisation of urban aerosols for pollution studies 155
Plasma-Surface Interactions of Model Polymers for Advanced Photoresists Using C4F8/Ar Discharges and Energetic Ion Beams 154
Multilayer silicon rich oxy-nitride films characterization by SIMS, VASE and AFM 150
Enhanced photorefractivity and rare-earth photoluminescence in SnO2 nanocrystals-based photonic glass-ceramics 150
Depth measurements of etch-pits in GaN with shape reconstruction from SEM images 149
Study of Organosilicon Plasma Polymer Used in Composite Layers with Biomedical Application 149
Depth profiling and quantification of chlorine and nitrogen in oxynitrides obtained by HTO process 148
Rotating stage and shallow depth profiling on Cameca SC-Ultra apparatus 148
Multilayer silicon rich oxy-nitride films characterization by SIMS, VASE and AFM 146
Photon management in SiO2-SnO2:Yb3+ hybrid 1D microcavity 145
Porosity- induced effects during C4F8/90% Ar plasma etching of silica-based ultralow-k dielectrics 145
Ultra thin oxynitride profiles by XPS etch-back analyses 145
Sample topography developed by sputtering in a Cameca instruments: an AFM and SEM study 144
Free-Standing Graphene Oxide and Carbon Nanotube Hybrid Papers with Enhanced Electrical and Mechanical Performance and Their Synergy in Polymer Laminates 144
Deph profiling and quantification of chlorine and nitrogen in oxynitrides obtained by HTO process 143
Effect of Nanodiamond Particles Incorporation in Hydroxyapatite Coatings 143
Surface characterization of polydimethylsiloxane: An AFM study 142
Functionalized ZnO Microbelt as Improved CO Sensor 142
Solid phase epitaxial re-growth of Sn ion implanted germanium thin films 140
Ultrathin Multilayer Dielectrics Analyses by XPS wet-etching and SIMS profile 138
Visita ispettiva annuale di sorveglianza Accredia 138
Surface investigation of archeological glasses by secondary ion mass spectrometry 138
Effects of Plasma Etch and Stripping on ULK Materials” Future Fab International 19 (2005) 86-89 137
XPS and SIMS Depth Profiling of Chlorine in Oxynitrides Obtained by HTO Process 137
Nitride Silicon-Silicon Dioxide Interface: Electrical and Phisico-Chemical Characterization by Complementary Surface Techniques 135
TiN/STO/TiN MIMcaps nanolayers on silicon characterized by SIMS and AFM 134
The role of incidence angle in the morphology evolution of Ge surfaces irradiated by medium-energy Au ions 134
ToF-SIMS study of adhesive residuals on device contact pads after wafer taping and backgrinding 133
Graphene Confers Ultralow Friction on Nanogear Cogs 133
Sample topography developed by sputtering in Cameca instruments 132
TiN/STO/TiN MIMcaps nanolayers on silicon characterized by SIMS and AFM 131
MCs+ and MCs2+ Molecular Ions Emission from Transition Metal Silicides 131
Totale 18.058
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Categoria #
all - tutte 94.418
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 94.418
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021204 0 0 0 0 0 0 0 0 0 0 0 204
2021/2022705 24 25 13 102 22 21 16 137 48 38 98 161
2022/20231.968 47 161 54 345 105 333 21 158 477 143 87 37
2023/20241.318 137 67 139 68 87 158 63 153 31 221 12 182
2024/20254.273 25 75 405 125 283 86 238 256 1.465 466 567 282
2025/202610.335 438 566 625 695 440 389 1.468 4.118 507 500 514 75
Totale 22.310