IRIS Institutional Research Information System

Iacob, Erica
 Distribuzione geografica
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Continente #
NA - Nord America 4.358
EU - Europa 2.497
AS - Asia 1.279
Continente sconosciuto - Info sul continente non disponibili 20
SA - Sud America 5
AF - Africa 4
OC - Oceania 4
Totale 8.167
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Nazione #
US - Stati Uniti d'America 4.305
DE - Germania 572
UA - Ucraina 444
SE - Svezia 393
SG - Singapore 309
HK - Hong Kong 291
IN - India 279
FI - Finlandia 272
IT - Italia 238
IE - Irlanda 175
CN - Cina 153
VN - Vietnam 137
GB - Regno Unito 133
RU - Federazione Russa 79
FR - Francia 67
BE - Belgio 39
CA - Canada 39
KR - Corea 27
CZ - Repubblica Ceca 22
IR - Iran 20
EU - Europa 19
JP - Giappone 19
IL - Israele 18
NL - Olanda 16
MX - Messico 11
LT - Lituania 9
ES - Italia 7
CH - Svizzera 6
TW - Taiwan 6
PL - Polonia 4
TR - Turchia 4
AU - Australia 3
AZ - Azerbaigian 3
BD - Bangladesh 3
BG - Bulgaria 3
GR - Grecia 3
MD - Moldavia 3
PK - Pakistan 3
SK - Slovacchia (Repubblica Slovacca) 3
AT - Austria 2
EC - Ecuador 2
EG - Egitto 2
LV - Lettonia 2
SI - Slovenia 2
A1 - Anonimo 1
AE - Emirati Arabi Uniti 1
AL - Albania 1
AM - Armenia 1
BO - Bolivia 1
BR - Brasile 1
BZ - Belize 1
CL - Cile 1
CR - Costa Rica 1
KG - Kirghizistan 1
KZ - Kazakistan 1
MA - Marocco 1
MY - Malesia 1
NZ - Nuova Zelanda 1
PA - Panama 1
PH - Filippine 1
PT - Portogallo 1
RO - Romania 1
SA - Arabia Saudita 1
SC - Seychelles 1
Totale 8.167
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Città #
Chandler 1.012
Jacksonville 874
Hong Kong 287
Singapore 255
Wilmington 201
Boardman 190
Ashburn 179
Dublin 175
Helsinki 159
Dong Ket 137
Kronberg 135
Trento 133
Ann Arbor 115
Dearborn 114
Woodbridge 71
Brooklyn 70
Santa Clara 56
Beijing 51
New York 48
Brussels 39
Munich 39
Pune 39
Phoenix 38
Shanghai 34
Los Angeles 29
San Mateo 29
Seattle 28
Southend 28
Toronto 25
Houston 24
Brno 20
Augusta 16
Falls Church 14
Hanover 14
Norwalk 14
Cheyenne 13
Mountain View 13
Redwood City 12
Tokyo 12
Mexico City 11
Miami 11
Saint Petersburg 11
Guangzhou 10
Ottawa 9
Portland 9
Secaucus 9
Auburn Hills 8
Leawood 8
Zanjan 8
Hefei 7
Nanjing 7
Rome 7
Ardabil 6
Bologna 6
Taipei 6
Falkenstein 5
Frankfurt am Main 5
Gunzenhausen 5
Hamburg 5
London 5
Milan 5
Gif-sur-yvette 4
Laion 4
Malakoff 4
Mezzocorona 4
Redmond 4
Zurich 4
Amsterdam 3
Baku 3
Barcelona 3
Bolzano 3
Bratislava 3
Costa Mesa 3
Dallas 3
Grado 3
Henderson 3
Kunming 3
Newark 3
Sacramento 3
St Petersburg 3
Suzhou 3
Winnipeg 3
Andover 2
Atlanta 2
Bari 2
Bengaluru 2
Bozen 2
Castelló de la Plana 2
Central District 2
Chengdu 2
Espoo 2
Guayaquil 2
Inglewood 2
Irving 2
Islamabad 2
Lausanne 2
Ljubljana 2
Madrid 2
Marano Di Napoli 2
Menlo Park 2
Totale 5.010
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Nome #
Regular nano-void formation on Ge films on Si using Sn ion implantation through silicon nitride caps 145
Applicazioni della spettrometria di massa a materiali e tecniche di ultima generazione 114
D-SIMS and ToF-SIMS quantitative depth profiles comparison on ultra thin oxynitrides 104
Boron Ultra Low Energy SIMS Depth Profiling Improved by Rotating Stage 103
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 100
Analytical methodology development for Silicon rich oxide chemical physical characterization 94
Nanoscale friction of graphene oxide over glass-fibre and polystyrene 93
Key role of molecular kinetic energy in early stages of pentacene island growth 92
D-Sims and TOF-SIMS quantitative depth profiles on ultra thin oxinitrides 87
Numerical/experimental strategies to infer enhanced liquid thermal conductivity and roughness in laser powder-bed fusion processes 87
Development of nano-roughness under SIMS ion sputtering of germanium surfaces 86
Development of nanotopography during SIMS characterization of thin films of Ge1−xSnx alloy 85
SiO2-SnO2 transparent glass-ceramics activated by rare earth ions 84
Ultra low energy Boron ion implants in silicon analyzed by not-oxydizing O2+ bombardment and synchrotron radiation grazing incidence x-ray fluorescence 83
Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants 82
Nanotensile tests, microscopy characterization and atomistic simulations of carbon nanotubes fibers 82
Analytical Methodology Development for Silicon-rich-oxide Chemical and Physical Characterization 80
Multigas detection by Diode Laser-Photoacoustic Resolution Spectroscopy 79
Analytical methodology development for SRO chemical physical characterization 79
XPS and SIMS Depth Profiling of Chlorine in High-Temperature Oxynitrides 78
Resonant photoacoustic simultaneous detection of methane and ethylene by means of a 1.63 um diode laser 78
Experience of accreditation in a surface science laboratory 77
Nanofabrication of self-organized periodic ripples by ion beam sputtering 76
Tribological characteristics of few-layer graphene over Ni grain and interface boundaries 76
Gas sensing application of hibrid nanostructures synthesized by supersonic beams 75
Quality management system and accreditation of measurements in a surface science laboratory. The case study of MiNALab. 75
Multilayer silicon rich oxy-nitride films characterization by SIMS, VASE and AFM 74
ToF-SIMS and AFM studies of low-k dielectric etching in fluorocarbon plasmas 74
Combined XPS, SIMS and AFM analysis of silicon nano-crystals embedded in silicon oxide layers 74
Ultra shallow junction analysis for technology nodes beyond 65nm 74
Aza-crown-ether functionalized graphene oxide for gas sensing and cation trapping applications 74
Secondary ion mass spectrometry characterization of deuterated GaAsN films on GaAs 73
Development of nano-roughness under SIMS ion sputtering of Germanium surfaces 73
Combined XPS, SIMS and AFM analysis of silicon nanocrystals embedded in silicon oxide layers 73
ispettiva di sorveglianza 04-05 Luglio 2013 73
Experimental study by Secondary Ion Mass Spectrometry focused on the relationship between hardness and sputtering rate in hard coatings 73
Decoration of graphite nanoplatelets with Nb2O5 deposited by radio frequency sputtering 73
Deph profiling and quantification of chlorine and nitrogen in oxynitrides obtained by HTO process 72
Damage of ultralow k materials during photoresist mask stripping process 72
Ultra shallow Boron junctions in silicon characterization by secondary ion mass spectrometry and synchrotron radiation grazing incidence x-ray fluorescence techniques 72
An experimental/ab-initio study on carbon nanotubes fibers for application in high-performing sporting goods. 72
Growth of titanium dioxide films by cluster supersonic beams for VOC sensing applications 71
Structural phase-dependent resistivity of intrinsic-extrinsic co-doped transparent titanium dioxide films 71
SIMS RSFs in silicon for positive secondary ions with O2+ 1keV at 63° incidence sputtering beam and Zalar rotation. 70
ToF-SIMS and XPS charcterisation of urban aerosols for pollution studies 69
Activated dopant effect on low energy SIMS depth profiling 69
Quality management system and accreditation of measurements in a surface science laboratory: the case study of MiNALab 69
Chemical and morphological characterization of nanoporous silica low-k dielectrics etched in fluorocarbon plasmas 69
Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants" 68
Ultra low energy Boron implants in silicon characterization by not-oxidizing secondary ion mass spectrometry analysis and soft-ray grazing incidence x-ray fluorescence techniques. 68
X-ray Photoelectron Spectroscopy of Nitrided Silicon-Silicon Oxide Interface 68
Optimization of a Low-Power Chemoresistive Gas Sensor: Predictive Thermal Modelling and Mechanical Failure Analysis 68
Controling the early stages of pentacene growth by supersonic molecular beam deposition 67
Ultralow energy boron implants in silicon characterization by nonoxidizing secondary ion mass spectrometry analysis and soft x-ray grazing incidence x-ray fluorescence techniques 67
ispettiva di sorveglianza 6-7 giugno 2012. 67
Study of Organosilicon Plasma Polymer Used in Composite Layers with Biomedical Application 65
Boron ultra low energy SIMS depth profiling improved by rotating stage 65
SiO2-P2O5-HfO2-Al2O3-Na2O glasses activated by Er3+ ions: From bulk sample to planar waveguide fabricated by rf-sputtering 65
Investigation of charges-driven interactions between graphene and different SiO2 surfaces 65
Depth measurements of etch-pits in GaN with shape reconstruction from SEM images 64
Effect of Nanodiamond Particles Incorporation in Hydroxyapatite Coatings 64
Surface plasmon resonance based on molecularly imprinted nanoparticles for the picomolar detection of the iron regulating hormone Hepcidin-25 64
AFM and Raman study of graphene deposited on silicon surfaces nanostructured by ion beam irradiation 64
Visita ispettiva annuale di sorveglianza Accredia 63
In situ sputtering rate measurement by laser interferometer applied to SIMS analyses 62
Multilayer silicon rich oxy-nitride films characterization by SIMS, VASE and AFM 62
Study of Plasma Polymer Structures to Induce Composite Layers 62
Fermentation based carbon nanotube multifunctional bionic composites 62
Rotating stage and shallow depth profiling on Cameca SC-Ultra apparatus 61
Nanostructures by assembling clusters and molecules from supersonic beams: A novel approach for gas sensing devices 61
Flexible photonics: RF-sputtering fabrication of glass-based systems operating under mechanical deformation conditions 61
Sample topography developed by sputtering in a Cameca instruments: an AFM and SEM study 60
Surface investigation of archeological glasses by secondary ion mass spectrometry 60
Study of plasma polymer structures to induce composite layers 59
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 59
Effects of Plasma Etch and Stripping on ULK Materials” Future Fab International 19 (2005) 86-89 59
ToF-SIMS study of adhesive residuals on device contact pads after wafer taping and backgrinding 58
Surface wet-ability modifications of thin PECVD silicon nitride layers by 40 keV surface argon ion treatments 58
Functionalized ZnO Microbelt as Improved CO Sensor 58
XPS and SIMS Depth Profiling of Chlorine in Oxynitrides Obtained by HTO Process 58
Effect of Nanodiamond Particles Incorporation in Hydroxyapatite Coatings 57
Plasma-Surface Interactions of Model Polymers for Advanced Photoresists Using C4F8/Ar Discharges and Energetic Ion Beams 57
Porosity- induced effects during C4F8/90% Ar plasma etching of silica-based ultralow-k dielectrics 56
Influence of changes in the resistivity of the sample surface on ultra-shallow SIMS profiles for arsenic 56
Depth profiling and quantification of chlorine and nitrogen in oxynitrides obtained by HTO process 56
TiN/STO/TiN MIMcaps nanolayers on silicon characterized by SIMS and AFM 55
Nitride Silicon-Silicon Dioxide Interface: Electrical and Phisico-Chemical Characterization by Complementary Surface Techniques 55
Morphology structure and interfaces in the preparation of films by SUMBE for gas sensing 55
Study of Hydroxyapatite / Detonation NanoDiamond Composite Layers 55
Graphene as Barrier to Prevent Volume Increment of Air Bubbles over Silicone Polymer in Aqueous Environment 54
Air Stable Nickel-Decorated Black Phosphorus and Its Room-Temperature Chemiresistive Gas Sensor Capabilities 54
Sample topography developed by sputtering in Cameca instruments 53
Ultra thin oxynitride profiles by XPS etch-back analyses 52
TiN/STO/TiN MIMcaps nanolayers on silicon characterized by SIMS and AFM 52
Solid phase epitaxial re-growth of Sn ion implanted germanium thin films 52
MCs+ and MCs2+ Molecular Ions Emission from Transition Metal Silicides 52
Induced roughness by low energy ion bombardment 51
Assessment of SnO2-nanocrystal-based luminescent glass-ceramic waveguides for integrated photonics 51
Ultrathin Multilayer Dielectrics Analyses by XPS wet-etching and SIMS profile 50
In situ sputtering rate measurement by laser interferometer applied to SIMS analyses 50
Totale 6.963
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Categoria #
all - tutte 53.071
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 53.071
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20201.099 0 0 0 0 157 86 159 12 145 309 153 78
2020/20211.340 162 6 135 74 151 56 159 16 18 290 69 204
2021/2022705 24 25 13 102 22 21 16 137 48 38 98 161
2022/20231.968 47 161 54 345 105 333 21 158 477 143 87 37
2023/20241.318 137 67 139 68 87 158 63 153 31 221 12 182
2024/2025677 25 75 405 125 47 0 0 0 0 0 0 0
Totale 8.379