Iacob, Erica
Iacob, Erica
MNF
Activated dopant effect on low energy SIMS depth profiling
2005-01-01 Barozzi, Mario; Giubertoni, Damiano; S., Pederzoli; Anderle, Mariano; Iacob, Erica; Bersani, Massimo
AFM and Raman study of graphene deposited on silicon surfaces nanostructured by ion beam irradiation
2020-01-01 Dell'Anna, Rossana; Iacob, Erica; Tripathi, Manoj; Dalton, Alan; Böttger, Roman; Pepponi, Giancarlo
Air Stable Nickel-Decorated Black Phosphorus and Its Room-Temperature Chemiresistive Gas Sensor Capabilities
2021-01-01 Valt, Matteo; Caporali, Maria; Fabbri, Barbara; Gaiardo, Andrea; Krik, Soufiane; Iacob, Erica; Vanzetti, Lia Emanuela; Malag(`(u)), Cesare; Banchelli, Martina; D'Andrea, Cristiano; Serrano-Ruiz, Manuel; Vanni, Matteo; Peruzzini, Maurizio; Guidi, Vincenzo
An experimental/ab-initio study on carbon nanotubes fibers for application in high-performing sporting goods.
2013-01-01 Maria F., Pantano; Vesselin, Shanov; Mark J., Schulz; Fedrizzi, Michele; Iacob, Erica; Bersani, Massimo; Taioli, Simone; Silvio A., Beccara; Pugno, Nicola
Analytical methodology development for Silicon rich oxide chemical physical characterization
2007-01-01 Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Anderle, Mariano; Pucker, Georg; Kompocholis, Constantine
Analytical Methodology Development for Silicon-rich-oxide Chemical and Physical Characterization
2007-01-01 Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Anderle, Mariano; Pucker, Georg; C., Kompocholis
Analytical methodology development for SRO chemical physical characterization
2006-01-01 Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Pucker, Georg; C., Kompocholis
Applicazioni della spettrometria di massa a materiali e tecniche di ultima generazione
2000-01-01 Bersani, Massimo; M., Sbetti; Lazzeri, Paolo; Giubertoni, Damiano; Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Anderle, Mariano
Assessment of SnO2-nanocrystal-based luminescent glass-ceramic waveguides for integrated photonics
2021-01-01 Tran, Thi Ngoc Lam; Armellini, Cristina; Varas, Stefano; Carpentiero, Alessandro; Chiappini, Andrea; Głuchowski, Paweł; Iacob, Erica; Ischia, Gloria; Scotognella, Francesco; Bollani, Monica; Lukowiak, Anna; Righini, Giancarlo C.; Ferrari, Maurizio; Chiasera, Alessandro
Aza-crown-ether functionalized graphene oxide for gas sensing and cation trapping applications
2019-01-01 Valt, M; Fabbri, B; Gaiardo, A; Gherardi, S; Casotti, D; Cruciani, G; Pepponi, G; Vanzetti, L; Iacob, E; Malagù, C; Bellutti, P; Guidi, V
Boron Ultra Low Energy SIMS Depth Profiling Improved by Rotating Stage
2006-01-01 Bersani, Massimo; Giubertoni, Damiano; Iacob, Erica; Barozzi, Mario; S., Pederzoli; Vanzetti, Lia Emanuela; M., Anderle
Boron ultra low energy SIMS depth profiling improved by rotating stage
2005-01-01 Giubertoni, Damiano; Iacob, Erica; Barozzi, Mario; S., Pederzoli; Vanzetti, Lia Emanuela; Anderle, Mariano; Bersani, Massimo
Chemical and morphological characterization of nanoporous silica low-k dielectrics etched in fluorocarbon plasmas
2004-01-01 Lazzeri, Paolo; Anderle, Mariano; X., Hua; Iacob, Erica; C. K., Inoki; P., Jiang; T. S., Kuan; G. S., Oehrlein
Combined XPS, SIMS and AFM analysis of silicon nano-crystals embedded in silicon oxide layers
2007-01-01 Vanzetti, Lia Emanuela; Barozzi, Mario; Iacob, Erica; Bersani, Massimo; Pucker, Georg; Bellutti, Pierluigi
Combined XPS, SIMS and AFM analysis of silicon nanocrystals embedded in silicon oxide layers
2008-01-01 Vanzetti, Lia Emanuela; Barozzi, Mario; Iacob, Erica; Bersani, Massimo; Pucker, Georg; Bellutti, Pierluigi
Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants
2006-01-01 Giubertoni, Damiano; Bersani, Massimo; Barozzi, Mario; S., Pederzoli; Iacob, Erica; J., van den Berg; M., Werner
Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants"
2005-01-01 Giubertoni, Damiano; Bersani, Massimo; Barozzi, Mario; S., Pederzoli; Iacob, Erica; J. A., van den Berg; M., Werner
Controling the early stages of pentacene growth by supersonic molecular beam deposition
2007-01-01 Yu, Wu; Tullio, Toccoli; Norbert, Koch; Iacob, Erica; Alessia, Pallaoro; Petra, Rudolf; Iannotta, Salvatore
D-SIMS and ToF-SIMS quantitative depth profiles comparison on ultra thin oxynitrides
2003-01-01 Bersani, Massimo; Giubertoni, Damiano; Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Anderle, Mariano; Lazzeri, Paolo; B., Crivelli; F., Zanderigo
D-Sims and TOF-SIMS quantitative depth profiles on ultra thin oxinitrides
2001-01-01 Bersani, Massimo; Giubertoni, Damiano; Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Anderle, Mariano; P., Lazzeri; B., Crivelli; F., Zanderigo
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Activated dopant effect on low energy SIMS depth profiling | 1-gen-2005 | Barozzi, Mario; Giubertoni, Damiano; S., Pederzoli; Anderle, Mariano; Iacob, Erica; Bersani, Massimo | |
| AFM and Raman study of graphene deposited on silicon surfaces nanostructured by ion beam irradiation | 1-gen-2020 | Dell'Anna, Rossana; Iacob, Erica; Tripathi, Manoj; Dalton, Alan; Böttger, Roman; Pepponi, Giancarlo | |
| Air Stable Nickel-Decorated Black Phosphorus and Its Room-Temperature Chemiresistive Gas Sensor Capabilities | 1-gen-2021 | Valt, Matteo; Caporali, Maria; Fabbri, Barbara; Gaiardo, Andrea; Krik, Soufiane; Iacob, Erica; Vanzetti, Lia Emanuela; Malag(`(u)), Cesare; Banchelli, Martina; D'Andrea, Cristiano; Serrano-Ruiz, Manuel; Vanni, Matteo; Peruzzini, Maurizio; Guidi, Vincenzo | |
| An experimental/ab-initio study on carbon nanotubes fibers for application in high-performing sporting goods. | 1-gen-2013 | Maria F., Pantano; Vesselin, Shanov; Mark J., Schulz; Fedrizzi, Michele; Iacob, Erica; Bersani, Massimo; Taioli, Simone; Silvio A., Beccara; Pugno, Nicola | |
| Analytical methodology development for Silicon rich oxide chemical physical characterization | 1-gen-2007 | Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Anderle, Mariano; Pucker, Georg; Kompocholis, Constantine | |
| Analytical Methodology Development for Silicon-rich-oxide Chemical and Physical Characterization | 1-gen-2007 | Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Anderle, Mariano; Pucker, Georg; C., Kompocholis | |
| Analytical methodology development for SRO chemical physical characterization | 1-gen-2006 | Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Pucker, Georg; C., Kompocholis | |
| Applicazioni della spettrometria di massa a materiali e tecniche di ultima generazione | 1-gen-2000 | Bersani, Massimo; M., Sbetti; Lazzeri, Paolo; Giubertoni, Damiano; Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Anderle, Mariano | |
| Assessment of SnO2-nanocrystal-based luminescent glass-ceramic waveguides for integrated photonics | 1-gen-2021 | Tran, Thi Ngoc Lam; Armellini, Cristina; Varas, Stefano; Carpentiero, Alessandro; Chiappini, Andrea; Głuchowski, Paweł; Iacob, Erica; Ischia, Gloria; Scotognella, Francesco; Bollani, Monica; Lukowiak, Anna; Righini, Giancarlo C.; Ferrari, Maurizio; Chiasera, Alessandro | |
| Aza-crown-ether functionalized graphene oxide for gas sensing and cation trapping applications | 1-gen-2019 | Valt, M; Fabbri, B; Gaiardo, A; Gherardi, S; Casotti, D; Cruciani, G; Pepponi, G; Vanzetti, L; Iacob, E; Malagù, C; Bellutti, P; Guidi, V | |
| Boron Ultra Low Energy SIMS Depth Profiling Improved by Rotating Stage | 1-gen-2006 | Bersani, Massimo; Giubertoni, Damiano; Iacob, Erica; Barozzi, Mario; S., Pederzoli; Vanzetti, Lia Emanuela; M., Anderle | |
| Boron ultra low energy SIMS depth profiling improved by rotating stage | 1-gen-2005 | Giubertoni, Damiano; Iacob, Erica; Barozzi, Mario; S., Pederzoli; Vanzetti, Lia Emanuela; Anderle, Mariano; Bersani, Massimo | |
| Chemical and morphological characterization of nanoporous silica low-k dielectrics etched in fluorocarbon plasmas | 1-gen-2004 | Lazzeri, Paolo; Anderle, Mariano; X., Hua; Iacob, Erica; C. K., Inoki; P., Jiang; T. S., Kuan; G. S., Oehrlein | |
| Combined XPS, SIMS and AFM analysis of silicon nano-crystals embedded in silicon oxide layers | 1-gen-2007 | Vanzetti, Lia Emanuela; Barozzi, Mario; Iacob, Erica; Bersani, Massimo; Pucker, Georg; Bellutti, Pierluigi | |
| Combined XPS, SIMS and AFM analysis of silicon nanocrystals embedded in silicon oxide layers | 1-gen-2008 | Vanzetti, Lia Emanuela; Barozzi, Mario; Iacob, Erica; Bersani, Massimo; Pucker, Georg; Bellutti, Pierluigi | |
| Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants | 1-gen-2006 | Giubertoni, Damiano; Bersani, Massimo; Barozzi, Mario; S., Pederzoli; Iacob, Erica; J., van den Berg; M., Werner | |
| Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants" | 1-gen-2005 | Giubertoni, Damiano; Bersani, Massimo; Barozzi, Mario; S., Pederzoli; Iacob, Erica; J. A., van den Berg; M., Werner | |
| Controling the early stages of pentacene growth by supersonic molecular beam deposition | 1-gen-2007 | Yu, Wu; Tullio, Toccoli; Norbert, Koch; Iacob, Erica; Alessia, Pallaoro; Petra, Rudolf; Iannotta, Salvatore | |
| D-SIMS and ToF-SIMS quantitative depth profiles comparison on ultra thin oxynitrides | 1-gen-2003 | Bersani, Massimo; Giubertoni, Damiano; Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Anderle, Mariano; Lazzeri, Paolo; B., Crivelli; F., Zanderigo | |
| D-Sims and TOF-SIMS quantitative depth profiles on ultra thin oxinitrides | 1-gen-2001 | Bersani, Massimo; Giubertoni, Damiano; Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Anderle, Mariano; P., Lazzeri; B., Crivelli; F., Zanderigo |