IRIS Institutional Research Information System

Meirer, Florian
 Distribuzione geografica
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Continente #
NA - Nord America 2.813
EU - Europa 2.003
AS - Asia 1.370
SA - Sud America 349
AF - Africa 26
Continente sconosciuto - Info sul continente non disponibili 13
OC - Oceania 4
Totale 6.578
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Nazione #
US - Stati Uniti d'America 2.739
SG - Singapore 581
RU - Federazione Russa 558
DE - Germania 315
BR - Brasile 300
SE - Svezia 261
CN - Cina 236
UA - Ucraina 235
HK - Hong Kong 172
FI - Finlandia 142
GB - Regno Unito 136
VN - Vietnam 119
NL - Olanda 88
IN - India 82
IE - Irlanda 66
IT - Italia 51
CA - Canada 43
EE - Estonia 36
IL - Israele 29
KR - Corea 29
FR - Francia 26
JP - Giappone 24
CZ - Repubblica Ceca 22
MX - Messico 22
BD - Bangladesh 20
BE - Belgio 18
IR - Iran 18
AR - Argentina 17
PL - Polonia 14
EC - Ecuador 13
ES - Italia 13
EU - Europa 12
ZA - Sudafrica 10
LT - Lituania 9
IQ - Iraq 7
AE - Emirati Arabi Uniti 6
PY - Paraguay 6
SA - Arabia Saudita 6
TR - Turchia 6
TW - Taiwan 6
AT - Austria 5
KZ - Kazakistan 5
MA - Marocco 5
MY - Malesia 5
UZ - Uzbekistan 5
VE - Venezuela 5
DZ - Algeria 4
AU - Australia 3
BO - Bolivia 3
JM - Giamaica 3
PK - Pakistan 3
BY - Bielorussia 2
BZ - Belize 2
CO - Colombia 2
EG - Egitto 2
HU - Ungheria 2
JO - Giordania 2
KE - Kenya 2
OM - Oman 2
PH - Filippine 2
TT - Trinidad e Tobago 2
AZ - Azerbaigian 1
CH - Svizzera 1
CL - Cile 1
DM - Dominica 1
ET - Etiopia 1
ID - Indonesia 1
LB - Libano 1
MZ - Mozambico 1
NP - Nepal 1
NZ - Nuova Zelanda 1
PA - Panama 1
PE - Perù 1
RO - Romania 1
RS - Serbia 1
SI - Slovenia 1
SN - Senegal 1
TM - Turkmenistan 1
UY - Uruguay 1
XK - ???statistics.table.value.countryCode.XK??? 1
Totale 6.578
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Città #
Chandler 497
Jacksonville 459
Singapore 369
Ashburn 200
Hong Kong 170
Moscow 137
Wilmington 132
Dallas 130
Dong Ket 90
Beijing 85
Boardman 76
The Dalles 73
Helsinki 70
Ann Arbor 67
Hefei 67
Dublin 66
Kronberg 63
Dearborn 58
Southend 54
Santa Clara 40
Munich 39
New York 36
Woodbridge 35
Phoenix 34
Pune 33
Shanghai 24
Los Angeles 23
São Paulo 23
Brooklyn 19
Tokyo 19
Augusta 18
Brno 18
Brussels 17
Toronto 17
Seattle 16
San Mateo 14
Trento 14
London 13
Groot-ammers 12
Houston 12
Falkenstein 11
Montreal 10
Rio de Janeiro 10
Sunnyvale 10
Warsaw 10
Chicago 9
Hanover 9
Mexico City 9
Denver 8
Ho Chi Minh City 8
Portland 8
Rome 8
Secaucus 8
Stockholm 8
Frankfurt am Main 7
Kyiv 7
Miami 7
Mountain View 7
Quito 7
Redwood City 7
San Francisco 7
Turku 7
Amsterdam 6
Boston 6
Brasília 6
Buffalo 6
Manchester 6
Ottawa 6
Atlanta 5
Belo Horizonte 5
Bologna 5
Falls Church 5
Goiânia 5
Hanoi 5
Johannesburg 5
Saint Petersburg 5
Charlotte 4
Chennai 4
Dhaka 4
Gloucester 4
Guarulhos 4
Leawood 4
Norwalk 4
Orem 4
Porto Alegre 4
Salvador 4
Tashkent 4
Tianjin 4
Vancouver 4
Banqiao 3
Betim 3
Calgary 3
Chengdu 3
Ciudad del Este 3
Cochabamba 3
Columbus 3
Council Bluffs 3
Delhi 3
Des Moines 3
Guayaquil 3
Totale 3.682
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Nome #
Regular nano-void formation on Ge films on Si using Sn ion implantation through silicon nitride caps 203
Multi-technique characterization of arsenic and boron ultra low energy implants in silicon within the ANNA consortium. 156
Formation of arsenolite crystals at room temperature after very high dose arsenic implantation in silicon 156
2D and 3D chemical imaging of Li-ion battery electrodes at nanoscale resolution 151
Dynamic SIMS Application for Characterization of Advanced Doping Schemes in Semiconductors 147
Time-dependent observations of arsenic ultra shallow junctions formed by AsH3 Plasma Immersion Ion Implantation and Deposition in Silicon 142
Characterization of junction activation and deactivation using non-equilibrium annealing: Solid phase epitaxy, spike annealing, laser annealing 140
A new spectrometer for grazing incidence X-ray fluorescence for the characterization of Arsenic implants and Hf based high-k layers 139
Characterization of As Implants and Hf Layer with a new Spectrometer for Grazing Incidence XRF 138
Deactivation of sub-melt laser annealed arsenic ultra shallow junctions in silicon during subsequent thermal treatment 137
Surface evolution of very high dose arsenic implants in silicon formed by plasma immersion ion implantation – a long term study 132
Deactivation of submelt laser annealed arsenic ultrashallow junctions in silicon during subsequent thermal treatment 125
JGIXA — A software package for the calculation and fitting of grazing incidence X-ray fluorescence and X-ray reflectivity data for the characterization of nanometer-layers and ultra-shallow-implants 122
Evolution of arsenic in high fluence plasma immersion ion implanted silicon: Behavior of the as-implanted surface 121
Characterization of Junction Activation and Deactivation Using non-Equilibrium 119
Bone material quality in transiliac bone biopsies of postmenopausal osteoporotic women after 3 years of strontium ranelate treatment 115
Assessment of chemical species of lead accumulated in tidemarks of human articular cartilage by X-ray absorption near-edge structure analysis 115
Feasibility study of SR-TXRF-XANES analysis for iron contaminations on a silicon wafer surface 113
3D elemental sensitive imaging using transmission X-ray microscopy 113
Formation of arsenic rich silicon oxide under plasma immersion ion implantation and laser annealing 113
Developments in TXRF analysis 111
Complementary metrology within a European joint laboratory 110
Influence of the sample morphology on total reflection X-ray fluorescence analysis 107
Mesoscale phase distribution in single particles of LiFePO4 following lithium deintercalation 107
Application of synchrotron-radiation-induced TXRF-XANES for arsenic speciation in cucumber (Cucumis sativus L.) xylem sap 104
Characterization of atmospheric aerosols using SR-TXRF and Fe K-edge TXRF-XANES 104
Grazing Incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for characterization of ultra shallow arsenic distribution in silicon. 103
Multi-technique characterization of arsenic ultra shallow junctions in silicon within the ANNA consortium. 101
Grazing exit versus grazing incidence geometry for x-ray absorption near edge structure analysis of arsenic traces 98
Phase retrieval using polychromatic illumination for transmission X-ray microscopy 98
Multi-variate analysis of ToF-SIMS images of ancient ceramics 95
Multi-technique characterization of arsenic ultra shallow junctions in silicon within the ANNA consortium 92
Synchrotron radiation induced TXRF- a critical review 91
X-Ray Analysis using Synchrotron Radiation 91
Observation of point defect injection from electrical de-activation of arsenic ultra-shallow distributions formed by ultra-low energy ion implantation and laser sub-melt annealing 91
Adaptation of a commercial total reflection X-ray fluorescence system for wafer surface analysis equipped with a new generation of silicon drift detector 89
Parameter study of self-absorption effects in Total Reflection X-ray Fluorescence–X-ray Absorption Near Edge Structure analysis of arsenic 88
Iron speciation in human cancer cells by K-edge TXRF-XANES 88
Iron speciation in human cancer cell lines by K-edge SRTXRF-XANES 88
Trace element analysis of airport related aerosols using SR-TXRF 87
Solid phase epitaxial re-growth of Sn ion implanted germanium thin films 87
Modelling shallow dopant distributions as layered samples for grazing incidence x-ray fluorescence analysis 87
ToF-SIMS and TXM analysis of ancient ceramics 87
Spectrometer for Grazing Incidence XRF: Characterization of As Implants and Hf Layers 87
Nanostructure and phase imaging of ancient ceramics using full field hard x-ray microscopy 86
Total Reflection X-ray Fluorescence attachment module modified for analysis in vacuum 85
Grazing incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for the characterization of ultrashallow arsenic distribution in silicon 84
TOF-SIMS and TXM analysis of ancient ceramics 83
Synchrotron radiation-induced total reflection X-ray fluorescence analysis 81
Nanoscale X-Ray Microscopic Imaging of Mammalian Mineralized Tissue 81
Speciation of copper and zinc in size-fractionated atmospheric particulate matter using total reflection mode X-ray absorption near-edge structure spectrometry 81
TXRF using laboratory sources and Synchrotron radiation 80
Observation of Point defect injection from electrical de-activation of Arsenic ultra-shallow distributions formed by ultra-low energy ion implantation and laser sub-melt annealing 80
Speciation of Pb in the tidemark of human articular Cartilage 79
Hard X-ray Full Field Nano-imaging of Bone and Nanowires at SSRL 78
Study of dinuclear Rh(II) complexes of phenylalanine derivatives as potential anticancer agents by using X-ray fluorescence and X-ray absorption 78
TXM-Wizard: a program for advanced data collection and evaluation in full-field transmission X-ray microscopy 75
Iron overload of human colon adenocarcinoma cells studied by synchrotron-based X-ray techniques 75
Iron speciation in human cancer cells by K-edge total reflection X-ray fluorescence-X-ray absorption near edge structure analysis 74
Iron speciation in human cancer cells by K-edge TXRF-XANES 73
Three-dimensional imaging of chemical phase transformations at the nanoscale with full-field transmission X-ray microscopy 72
Grazing Incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for characterization of ultra shallow arsenic distribution in silicon 72
Increased strontium uptake in trabecular bone of ovariectomized calcium deficient rats treated with strontium ranelate or strontium chloride 72
Hard X-Ray Nanotomography of Catalytic Solids at Work 71
Transmission X-Ray Microscopy for Full-Field Nano Imaging of Biomaterials 63
Totale 6.611
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Categoria #
all - tutte 36.318
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 36.318
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021449 0 0 0 0 0 7 78 3 11 174 41 135
2021/2022331 14 6 7 38 17 6 11 67 22 23 22 98
2022/2023923 20 71 21 164 56 153 7 91 223 68 37 12
2023/2024567 72 36 53 16 62 45 48 77 15 73 6 64
2024/20251.737 30 41 218 53 18 16 59 97 631 211 255 108
2025/20261.192 160 219 300 284 190 39 0 0 0 0 0 0
Totale 6.611