Meirer, Florian
 Distribuzione geografica
Continente #
NA - Nord America 3.926
EU - Europa 3.868
AS - Asia 1.886
SA - Sud America 403
AF - Africa 37
Continente sconosciuto - Info sul continente non disponibili 13
OC - Oceania 4
Totale 10.137
Nazione #
US - Stati Uniti d'America 3.831
RU - Federazione Russa 2.211
SG - Singapore 750
DE - Germania 371
BR - Brasile 329
CN - Cina 322
SE - Svezia 268
VN - Vietnam 252
UA - Ucraina 237
HK - Hong Kong 227
GB - Regno Unito 152
FI - Finlandia 146
FR - Francia 107
IN - India 93
NL - Olanda 90
IE - Irlanda 67
IT - Italia 60
CA - Canada 51
EE - Estonia 37
BD - Bangladesh 32
KR - Corea 31
JP - Giappone 30
IL - Israele 29
MX - Messico 28
AR - Argentina 27
PL - Polonia 25
CZ - Repubblica Ceca 22
BE - Belgio 19
ES - Italia 19
IR - Iran 18
EC - Ecuador 13
ZA - Sudafrica 13
EU - Europa 12
IQ - Iraq 11
SA - Arabia Saudita 11
LT - Lituania 9
PK - Pakistan 9
VE - Venezuela 9
PY - Paraguay 8
TR - Turchia 8
AT - Austria 7
ID - Indonesia 7
KZ - Kazakistan 7
MY - Malesia 7
TW - Taiwan 7
AE - Emirati Arabi Uniti 6
MA - Marocco 6
UZ - Uzbekistan 6
CL - Cile 5
DZ - Algeria 5
JM - Giamaica 5
PH - Filippine 5
BO - Bolivia 4
HU - Ungheria 4
RO - Romania 4
AU - Australia 3
BY - Bielorussia 3
CO - Colombia 3
JO - Giordania 3
KE - Kenya 3
OM - Oman 3
UY - Uruguay 3
AZ - Azerbaigian 2
BH - Bahrain 2
BZ - Belize 2
DK - Danimarca 2
DO - Repubblica Dominicana 2
EG - Egitto 2
LB - Libano 2
PA - Panama 2
PE - Perù 2
PT - Portogallo 2
RS - Serbia 2
SN - Senegal 2
TT - Trinidad e Tobago 2
AL - Albania 1
AO - Angola 1
BF - Burkina Faso 1
CH - Svizzera 1
CI - Costa d'Avorio 1
DM - Dominica 1
ET - Etiopia 1
GE - Georgia 1
GT - Guatemala 1
MD - Moldavia 1
MM - Myanmar 1
MZ - Mozambico 1
NP - Nepal 1
NZ - Nuova Zelanda 1
PR - Porto Rico 1
PS - Palestinian Territory 1
SI - Slovenia 1
SY - Repubblica araba siriana 1
TM - Turkmenistan 1
UG - Uganda 1
XK - ???statistics.table.value.countryCode.XK??? 1
Totale 10.137
Città #
Chandler 497
San Jose 461
Jacksonville 460
Singapore 420
Council Bluffs 361
Ashburn 281
Hong Kong 222
Moscow 137
Dallas 134
Wilmington 132
The Dalles 99
Beijing 95
Dong Ket 90
Boardman 76
Helsinki 74
Ann Arbor 67
Dublin 67
Hefei 67
Kronberg 63
Ho Chi Minh City 60
Dearborn 58
Lauterbourg 55
Southend 54
Santa Clara 50
Los Angeles 44
New York 42
Munich 39
Phoenix 37
Hanoi 35
Woodbridge 35
Pune 33
Shanghai 25
Tokyo 24
São Paulo 23
Frankfurt am Main 22
Brooklyn 20
Augusta 18
Brno 18
Brussels 17
Toronto 17
Seattle 16
Warsaw 16
Chicago 15
San Mateo 14
Trento 14
Houston 13
London 13
Groot-ammers 12
Montreal 12
Da Nang 11
Falkenstein 11
Mexico City 11
Rio de Janeiro 11
Stockholm 11
Manchester 10
Orem 10
Portland 10
Sunnyvale 10
Buffalo 9
Denver 9
Hanover 9
Secaucus 9
Amsterdam 8
Miami 8
Poplar 8
Rome 8
Chennai 7
Guangzhou 7
Johannesburg 7
Kyiv 7
Mountain View 7
Quito 7
Redwood City 7
Roubaix 7
San Francisco 7
Turku 7
Atlanta 6
Boston 6
Brasília 6
Charlotte 6
Dhaka 6
Nuremberg 6
Ottawa 6
Wroclaw 6
Belo Horizonte 5
Bologna 5
Des Moines 5
Falls Church 5
Goiânia 5
Guarulhos 5
Hải Dương 5
Porto Alegre 5
Riyadh 5
Saint Petersburg 5
Tashkent 5
Calgary 4
Caracas 4
Gloucester 4
Haiphong 4
Jeddah 4
Totale 5.010
Nome #
Regular nano-void formation on Ge films on Si using Sn ion implantation through silicon nitride caps 263
Characterization of junction activation and deactivation using non-equilibrium annealing: Solid phase epitaxy, spike annealing, laser annealing 228
Deactivation of sub-melt laser annealed arsenic ultra shallow junctions in silicon during subsequent thermal treatment 222
Dynamic SIMS Application for Characterization of Advanced Doping Schemes in Semiconductors 222
Formation of arsenolite crystals at room temperature after very high dose arsenic implantation in silicon 217
Multi-technique characterization of arsenic and boron ultra low energy implants in silicon within the ANNA consortium. 215
2D and 3D chemical imaging of Li-ion battery electrodes at nanoscale resolution 215
Deactivation of submelt laser annealed arsenic ultrashallow junctions in silicon during subsequent thermal treatment 206
A new spectrometer for grazing incidence X-ray fluorescence for the characterization of Arsenic implants and Hf based high-k layers 206
Time-dependent observations of arsenic ultra shallow junctions formed by AsH3 Plasma Immersion Ion Implantation and Deposition in Silicon 198
Characterization of As Implants and Hf Layer with a new Spectrometer for Grazing Incidence XRF 197
Formation of arsenic rich silicon oxide under plasma immersion ion implantation and laser annealing 190
Surface evolution of very high dose arsenic implants in silicon formed by plasma immersion ion implantation – a long term study 190
Evolution of arsenic in high fluence plasma immersion ion implanted silicon: Behavior of the as-implanted surface 190
JGIXA — A software package for the calculation and fitting of grazing incidence X-ray fluorescence and X-ray reflectivity data for the characterization of nanometer-layers and ultra-shallow-implants 181
Bone material quality in transiliac bone biopsies of postmenopausal osteoporotic women after 3 years of strontium ranelate treatment 177
Assessment of chemical species of lead accumulated in tidemarks of human articular cartilage by X-ray absorption near-edge structure analysis 176
Complementary metrology within a European joint laboratory 174
Characterization of Junction Activation and Deactivation Using non-Equilibrium 174
Application of synchrotron-radiation-induced TXRF-XANES for arsenic speciation in cucumber (Cucumis sativus L.) xylem sap 173
3D elemental sensitive imaging using transmission X-ray microscopy 169
Feasibility study of SR-TXRF-XANES analysis for iron contaminations on a silicon wafer surface 168
Developments in TXRF analysis 165
Grazing Incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for characterization of ultra shallow arsenic distribution in silicon. 163
Phase retrieval using polychromatic illumination for transmission X-ray microscopy 161
Characterization of atmospheric aerosols using SR-TXRF and Fe K-edge TXRF-XANES 159
Multi-technique characterization of arsenic ultra shallow junctions in silicon within the ANNA consortium. 159
Influence of the sample morphology on total reflection X-ray fluorescence analysis 156
Grazing exit versus grazing incidence geometry for x-ray absorption near edge structure analysis of arsenic traces 152
Observation of point defect injection from electrical de-activation of arsenic ultra-shallow distributions formed by ultra-low energy ion implantation and laser sub-melt annealing 151
Multi-variate analysis of ToF-SIMS images of ancient ceramics 151
Parameter study of self-absorption effects in Total Reflection X-ray Fluorescence–X-ray Absorption Near Edge Structure analysis of arsenic 150
Mesoscale phase distribution in single particles of LiFePO4 following lithium deintercalation 150
Synchrotron radiation induced TXRF- a critical review 146
Multi-technique characterization of arsenic ultra shallow junctions in silicon within the ANNA consortium 146
Solid phase epitaxial re-growth of Sn ion implanted germanium thin films 143
Adaptation of a commercial total reflection X-ray fluorescence system for wafer surface analysis equipped with a new generation of silicon drift detector 142
Grazing incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for the characterization of ultrashallow arsenic distribution in silicon 139
X-Ray Analysis using Synchrotron Radiation 138
Trace element analysis of airport related aerosols using SR-TXRF 137
ToF-SIMS and TXM analysis of ancient ceramics 136
Iron speciation in human cancer cells by K-edge TXRF-XANES 135
Total Reflection X-ray Fluorescence attachment module modified for analysis in vacuum 134
Nanostructure and phase imaging of ancient ceramics using full field hard x-ray microscopy 134
Observation of Point defect injection from electrical de-activation of Arsenic ultra-shallow distributions formed by ultra-low energy ion implantation and laser sub-melt annealing 133
Speciation of copper and zinc in size-fractionated atmospheric particulate matter using total reflection mode X-ray absorption near-edge structure spectrometry 131
Iron speciation in human cancer cell lines by K-edge SRTXRF-XANES 131
TOF-SIMS and TXM analysis of ancient ceramics 129
Modelling shallow dopant distributions as layered samples for grazing incidence x-ray fluorescence analysis 128
Synchrotron radiation-induced total reflection X-ray fluorescence analysis 127
Hard X-ray Full Field Nano-imaging of Bone and Nanowires at SSRL 127
Spectrometer for Grazing Incidence XRF: Characterization of As Implants and Hf Layers 127
TXRF using laboratory sources and Synchrotron radiation 126
Study of dinuclear Rh(II) complexes of phenylalanine derivatives as potential anticancer agents by using X-ray fluorescence and X-ray absorption 125
Nanoscale X-Ray Microscopic Imaging of Mammalian Mineralized Tissue 123
Transmission X-Ray Microscopy for Full-Field Nano Imaging of Biomaterials 122
TXM-Wizard: a program for advanced data collection and evaluation in full-field transmission X-ray microscopy 122
Grazing Incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for characterization of ultra shallow arsenic distribution in silicon 121
Increased strontium uptake in trabecular bone of ovariectomized calcium deficient rats treated with strontium ranelate or strontium chloride 120
Iron overload of human colon adenocarcinoma cells studied by synchrotron-based X-ray techniques 120
Speciation of Pb in the tidemark of human articular Cartilage 116
Iron speciation in human cancer cells by K-edge TXRF-XANES 115
Hard X-Ray Nanotomography of Catalytic Solids at Work 112
Three-dimensional imaging of chemical phase transformations at the nanoscale with full-field transmission X-ray microscopy 109
Iron speciation in human cancer cells by K-edge total reflection X-ray fluorescence-X-ray absorption near edge structure analysis 108
Totale 10.170
Categoria #
all - tutte 43.363
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 43.363


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/2022331 14 6 7 38 17 6 11 67 22 23 22 98
2022/2023923 20 71 21 164 56 153 7 91 223 68 37 12
2023/2024567 72 36 53 16 62 45 48 77 15 73 6 64
2024/20251.737 30 41 218 53 18 16 59 97 631 211 255 108
2025/20264.566 160 219 300 284 190 181 665 1.798 219 267 224 59
2026/2027185 185 0 0 0 0 0 0 0 0 0 0 0
Totale 10.170