IRIS Institutional Research Information System

Meirer, Florian
 Distribuzione geografica
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Continente #
EU - Europa 3.856
NA - Nord America 3.455
AS - Asia 1.876
SA - Sud America 397
AF - Africa 37
Continente sconosciuto - Info sul continente non disponibili 13
OC - Oceania 4
Totale 9.638
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Nazione #
US - Stati Uniti d'America 3.364
RU - Federazione Russa 2.211
SG - Singapore 747
DE - Germania 371
BR - Brasile 328
CN - Cina 319
SE - Svezia 268
VN - Vietnam 252
UA - Ucraina 237
HK - Hong Kong 224
GB - Regno Unito 152
FI - Finlandia 146
FR - Francia 107
IN - India 93
NL - Olanda 90
IE - Irlanda 67
IT - Italia 57
CA - Canada 49
EE - Estonia 36
BD - Bangladesh 31
KR - Corea 31
JP - Giappone 30
IL - Israele 29
MX - Messico 28
PL - Polonia 25
AR - Argentina 24
CZ - Repubblica Ceca 22
BE - Belgio 18
ES - Italia 18
IR - Iran 18
EC - Ecuador 13
ZA - Sudafrica 13
EU - Europa 12
IQ - Iraq 11
SA - Arabia Saudita 11
LT - Lituania 9
PK - Pakistan 9
VE - Venezuela 9
PY - Paraguay 8
TR - Turchia 8
AT - Austria 7
ID - Indonesia 7
KZ - Kazakistan 7
MY - Malesia 7
TW - Taiwan 7
AE - Emirati Arabi Uniti 6
MA - Marocco 6
UZ - Uzbekistan 6
DZ - Algeria 5
PH - Filippine 5
BO - Bolivia 4
CL - Cile 4
HU - Ungheria 4
JM - Giamaica 4
AU - Australia 3
BY - Bielorussia 3
CO - Colombia 3
JO - Giordania 3
KE - Kenya 3
OM - Oman 3
AZ - Azerbaigian 2
BH - Bahrain 2
BZ - Belize 2
DO - Repubblica Dominicana 2
EG - Egitto 2
LB - Libano 2
PA - Panama 2
PE - Perù 2
RO - Romania 2
RS - Serbia 2
SN - Senegal 2
TT - Trinidad e Tobago 2
UY - Uruguay 2
AO - Angola 1
BF - Burkina Faso 1
CH - Svizzera 1
CI - Costa d'Avorio 1
DK - Danimarca 1
DM - Dominica 1
ET - Etiopia 1
GE - Georgia 1
MD - Moldavia 1
MM - Myanmar 1
MZ - Mozambico 1
NP - Nepal 1
NZ - Nuova Zelanda 1
PR - Porto Rico 1
PS - Palestinian Territory 1
SI - Slovenia 1
SY - Repubblica araba siriana 1
TM - Turkmenistan 1
UG - Uganda 1
XK - ???statistics.table.value.countryCode.XK??? 1
Totale 9.638
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Città #
Chandler 497
Jacksonville 459
San Jose 429
Singapore 419
Ashburn 270
Hong Kong 219
Moscow 137
Dallas 132
Wilmington 132
The Dalles 99
Beijing 94
Dong Ket 90
Boardman 76
Helsinki 74
Ann Arbor 67
Dublin 67
Hefei 67
Kronberg 63
Ho Chi Minh City 60
Dearborn 58
Lauterbourg 55
Southend 54
Santa Clara 45
Los Angeles 41
New York 40
Munich 39
Phoenix 36
Hanoi 35
Woodbridge 35
Pune 33
Shanghai 25
Tokyo 24
São Paulo 23
Frankfurt am Main 22
Brooklyn 19
Augusta 18
Brno 18
Brussels 17
Toronto 17
Seattle 16
Warsaw 16
San Mateo 14
Trento 14
London 13
Chicago 12
Groot-ammers 12
Houston 12
Montreal 12
Da Nang 11
Falkenstein 11
Mexico City 11
Rio de Janeiro 11
Stockholm 11
Manchester 10
Orem 10
Portland 10
Sunnyvale 10
Denver 9
Hanover 9
Secaucus 9
Amsterdam 8
Miami 8
Poplar 8
Rome 8
Buffalo 7
Chennai 7
Guangzhou 7
Johannesburg 7
Kyiv 7
Mountain View 7
Quito 7
Redwood City 7
Roubaix 7
San Francisco 7
Turku 7
Atlanta 6
Boston 6
Brasília 6
Dhaka 6
Nuremberg 6
Ottawa 6
Wroclaw 6
Belo Horizonte 5
Bologna 5
Charlotte 5
Des Moines 5
Falls Church 5
Goiânia 5
Guarulhos 5
Hải Dương 5
Porto Alegre 5
Riyadh 5
Saint Petersburg 5
Tashkent 5
Calgary 4
Caracas 4
Council Bluffs 4
Gloucester 4
Haiphong 4
Jeddah 4
Totale 4.583
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Nome #
Regular nano-void formation on Ge films on Si using Sn ion implantation through silicon nitride caps 254
Characterization of junction activation and deactivation using non-equilibrium annealing: Solid phase epitaxy, spike annealing, laser annealing 220
Dynamic SIMS Application for Characterization of Advanced Doping Schemes in Semiconductors 215
Deactivation of sub-melt laser annealed arsenic ultra shallow junctions in silicon during subsequent thermal treatment 214
Formation of arsenolite crystals at room temperature after very high dose arsenic implantation in silicon 210
2D and 3D chemical imaging of Li-ion battery electrodes at nanoscale resolution 207
Multi-technique characterization of arsenic and boron ultra low energy implants in silicon within the ANNA consortium. 206
Deactivation of submelt laser annealed arsenic ultrashallow junctions in silicon during subsequent thermal treatment 196
A new spectrometer for grazing incidence X-ray fluorescence for the characterization of Arsenic implants and Hf based high-k layers 196
Time-dependent observations of arsenic ultra shallow junctions formed by AsH3 Plasma Immersion Ion Implantation and Deposition in Silicon 190
Characterization of As Implants and Hf Layer with a new Spectrometer for Grazing Incidence XRF 188
Formation of arsenic rich silicon oxide under plasma immersion ion implantation and laser annealing 184
Surface evolution of very high dose arsenic implants in silicon formed by plasma immersion ion implantation – a long term study 183
Evolution of arsenic in high fluence plasma immersion ion implanted silicon: Behavior of the as-implanted surface 183
JGIXA — A software package for the calculation and fitting of grazing incidence X-ray fluorescence and X-ray reflectivity data for the characterization of nanometer-layers and ultra-shallow-implants 170
Assessment of chemical species of lead accumulated in tidemarks of human articular cartilage by X-ray absorption near-edge structure analysis 169
Characterization of Junction Activation and Deactivation Using non-Equilibrium 168
Bone material quality in transiliac bone biopsies of postmenopausal osteoporotic women after 3 years of strontium ranelate treatment 166
Complementary metrology within a European joint laboratory 165
Feasibility study of SR-TXRF-XANES analysis for iron contaminations on a silicon wafer surface 162
3D elemental sensitive imaging using transmission X-ray microscopy 162
Application of synchrotron-radiation-induced TXRF-XANES for arsenic speciation in cucumber (Cucumis sativus L.) xylem sap 158
Developments in TXRF analysis 158
Grazing Incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for characterization of ultra shallow arsenic distribution in silicon. 157
Characterization of atmospheric aerosols using SR-TXRF and Fe K-edge TXRF-XANES 154
Influence of the sample morphology on total reflection X-ray fluorescence analysis 149
Multi-technique characterization of arsenic ultra shallow junctions in silicon within the ANNA consortium. 149
Grazing exit versus grazing incidence geometry for x-ray absorption near edge structure analysis of arsenic traces 144
Phase retrieval using polychromatic illumination for transmission X-ray microscopy 144
Parameter study of self-absorption effects in Total Reflection X-ray Fluorescence–X-ray Absorption Near Edge Structure analysis of arsenic 143
Mesoscale phase distribution in single particles of LiFePO4 following lithium deintercalation 141
Multi-variate analysis of ToF-SIMS images of ancient ceramics 141
Observation of point defect injection from electrical de-activation of arsenic ultra-shallow distributions formed by ultra-low energy ion implantation and laser sub-melt annealing 140
Adaptation of a commercial total reflection X-ray fluorescence system for wafer surface analysis equipped with a new generation of silicon drift detector 138
Synchrotron radiation induced TXRF- a critical review 137
Multi-technique characterization of arsenic ultra shallow junctions in silicon within the ANNA consortium 137
Solid phase epitaxial re-growth of Sn ion implanted germanium thin films 137
Grazing incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for the characterization of ultrashallow arsenic distribution in silicon 134
Trace element analysis of airport related aerosols using SR-TXRF 132
ToF-SIMS and TXM analysis of ancient ceramics 130
Iron speciation in human cancer cells by K-edge TXRF-XANES 129
X-Ray Analysis using Synchrotron Radiation 129
Nanostructure and phase imaging of ancient ceramics using full field hard x-ray microscopy 128
Total Reflection X-ray Fluorescence attachment module modified for analysis in vacuum 127
Speciation of copper and zinc in size-fractionated atmospheric particulate matter using total reflection mode X-ray absorption near-edge structure spectrometry 125
Iron speciation in human cancer cell lines by K-edge SRTXRF-XANES 125
Observation of Point defect injection from electrical de-activation of Arsenic ultra-shallow distributions formed by ultra-low energy ion implantation and laser sub-melt annealing 124
Synchrotron radiation-induced total reflection X-ray fluorescence analysis 122
Hard X-ray Full Field Nano-imaging of Bone and Nanowires at SSRL 122
Modelling shallow dopant distributions as layered samples for grazing incidence x-ray fluorescence analysis 122
TOF-SIMS and TXM analysis of ancient ceramics 122
Spectrometer for Grazing Incidence XRF: Characterization of As Implants and Hf Layers 121
TXRF using laboratory sources and Synchrotron radiation 119
Transmission X-Ray Microscopy for Full-Field Nano Imaging of Biomaterials 115
Study of dinuclear Rh(II) complexes of phenylalanine derivatives as potential anticancer agents by using X-ray fluorescence and X-ray absorption 115
Nanoscale X-Ray Microscopic Imaging of Mammalian Mineralized Tissue 114
Increased strontium uptake in trabecular bone of ovariectomized calcium deficient rats treated with strontium ranelate or strontium chloride 114
TXM-Wizard: a program for advanced data collection and evaluation in full-field transmission X-ray microscopy 114
Grazing Incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for characterization of ultra shallow arsenic distribution in silicon 113
Iron overload of human colon adenocarcinoma cells studied by synchrotron-based X-ray techniques 112
Iron speciation in human cancer cells by K-edge TXRF-XANES 111
Speciation of Pb in the tidemark of human articular Cartilage 108
Hard X-Ray Nanotomography of Catalytic Solids at Work 104
Three-dimensional imaging of chemical phase transformations at the nanoscale with full-field transmission X-ray microscopy 103
Iron speciation in human cancer cells by K-edge total reflection X-ray fluorescence-X-ray absorption near edge structure analysis 102
Totale 9.671
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Categoria #
all - tutte 40.888
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 40.888
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021350 0 0 0 0 0 0 0 0 0 174 41 135
2021/2022331 14 6 7 38 17 6 11 67 22 23 22 98
2022/2023923 20 71 21 164 56 153 7 91 223 68 37 12
2023/2024567 72 36 53 16 62 45 48 77 15 73 6 64
2024/20251.737 30 41 218 53 18 16 59 97 631 211 255 108
2025/20264.252 160 219 300 284 190 181 665 1.798 219 236 0 0
Totale 9.671