Meirer, Florian

Meirer, Florian  

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Risultati 1 - 20 di 65 (tempo di esecuzione: 0.023 secondi).
Titolo Data di pubblicazione Autore(i) File
2D and 3D chemical imaging of Li-ion battery electrodes at nanoscale resolution 1-gen-2011 Meirer, Florian; Andrews, J. C.; Cabana, J.; Dell'Anna, Rossana; Liu, Y.; Metha, A.; Pianetta, P.
3D elemental sensitive imaging using transmission X-ray microscopy 1-gen-2012 Yijin, Liu; Meirer, Florian; Junyue, Wang; Guillermo, Requena; Phillip, Williams; Johanna, Nelson; Apurva, Mehta; Joy C., Andrews; Piero, Pianetta
A new spectrometer for grazing incidence X-ray fluorescence for the characterization of Arsenic implants and Hf based high-k layers 1-gen-2010 D., Ingerle; Meirer, Florian; N., Zoeger; Pepponi, Giancarlo; Giubertoni, Damiano; G., Steinhauser; P., Wobrauschek; C., Streli
Adaptation of a commercial total reflection X-ray fluorescence system for wafer surface analysis equipped with a new generation of silicon drift detector 1-gen-2006 S., Pahlke; Meirer, Florian; P., Wobrauschek; C., Streli; G., Peter Westphal; C., Mantler
Application of synchrotron-radiation-induced TXRF-XANES for arsenic speciation in cucumber (Cucumis sativus L.) xylem sap 1-gen-2007 Meirer, Florian; Pepponi, Giancarlo; Christina, Streli; Peter, Wobrauschek; Viktor Gabor, Mihucz; Gyula, Zaray; Viktoria, Czech; Jose, Broekaert; Ursula, Fittschen; Gerald, Falkenberg
Assessment of chemical species of lead accumulated in tidemarks of human articular cartilage by X-ray absorption near-edge structure analysis 1-gen-2011 Meirer, Florian; B., Pemmer; Pepponi, Giancarlo; N., Zoeger; P., Wobrauschek; S., Sprio; A., Tampieri; J., Goettlicher; R., Steininger; S., Mangold; P., Roschger; A., Berzlanovich; J. G., Hofstaetter; C., Streli
Bone material quality in transiliac bone biopsies of postmenopausal osteoporotic women after 3 years of strontium ranelate treatment 1-gen-2009 Paul, Roschger; I., Manjubala; N., Zoeger; Meirer, Florian; R., Simon; C., Li; N., Fratzl Zelman; Bm, Misof; Ep, Paschalis; C., Streli; P., Fratzl; K., Klaushofer
Characterization of As Implants and Hf Layer with a new Spectrometer for Grazing Incidence XRF 1-gen-2009 C., Streli; D., Ingerle; Meirer, Florian; N., Zoeger; Pepponi, Giancarlo; Giubertoni, Damiano; P., Wobrauschek; C., Streli
Characterization of atmospheric aerosols using SR-TXRF and Fe K-edge TXRF-XANES 1-gen-2008 Ursula, Fittschen; Meirer, Florian; Christina, Streli; Peter, Wobrauschek; Julian, Thiele; Gerald, Falkenberg; Pepponi, Giancarlo
Characterization of Junction Activation and Deactivation Using non-Equilibrium 1-gen-2009 Bersani, Massimo; Pepponi, Giancarlo; Giubertoni, Damiano; Gennaro, Salvatore; M. A., Sahiner; S. P., Kelty; M., Kah; K. J., Kirkby; R., Doherty; M. A., Foad; Meirer, Florian; C., Streli; J. C., Woicik; P., Piane
Characterization of junction activation and deactivation using non-equilibrium annealing: Solid phase epitaxy, spike annealing, laser annealing 1-gen-2009 Massimo Bersani; Giancarlo Pepponi; Damiano Giubertoni; Salvatore Gennaro; Mehmet Sahiner; Stephen Kelty; Max Kah; K.J. Kirkby; Roisin Doherty; Majeed Foad; Florian Meirer; Christina Streli; Joseph Woicik; P. Pianetta
Complementary metrology within a European joint laboratory 1-gen-2009 A., Nutsch; B., Beckhoff; R., Altmann; Jaap van den, Berg; Giubertoni, Damiano; P., Hoenicke; Bersani, Massimo; A., Leibold; Meirer, Florian; M., Mueller; Pepponi, Giancarlo; M., Otto; P., Petrik; M., Reading; L., Pfitzner; H., Ryssel
Deactivation of sub-melt laser annealed arsenic ultra shallow junctions in silicon during subsequent thermal treatment 1-gen-2009 Giubertoni, Damiano; Pepponi, Giancarlo; M. A., Sahiner; S. P., Kelty; M., Kah; K. J., Kirkby; Meirer, Florian; Gennaro, Salvatore; R., Doherty; M. A., Foad; J. C., Woicik; C., Streli; Bersani, Massimo; P., Pianetta
Deactivation of submelt laser annealed arsenic ultrashallow junctions in silicon during subsequent thermal treatment 1-gen-2010 Giubertoni, Damiano; Pepponi, Giancarlo; Mehmet Alper, Sahiner; Stephen P., Kelty; Gennaro, Salvatore; Bersani, Massimo; Max, Kah; Karen J., Kirkby; Roisin, Doherty; Majeed A., Foad; Meirer, Florian; C., Streli; Joseph C., Woicik; Piero, Pianetta
Developments in TXRF analysis 1-gen-2009 C., Streli; Meirer, Florian; P., Wobrauschek; Pepponi, Giancarlo
Dynamic SIMS Application for Characterization of Advanced Doping Schemes in Semiconductors 1-gen-2013 Giubertoni, Damiano; Demenev, Evgeny; Meirer, Florian; Bersani, Massimo
Evolution of arsenic in high fluence plasma immersion ion implanted silicon: Behavior of the as-implanted surface 1-gen-2015 Vishwanath, V.; Demenev, Evgeny; Giubertoni, Damiano; Vanzetti, Lia Emanuela; Koh, A. L.; Steinhauser, G.; Pepponi, Giancarlo; Bersani, Massimo; Meirer, Florian; Foad, M. A.
Feasibility study of SR-TXRF-XANES analysis for iron contaminations on a silicon wafer surface 1-gen-2008 Meirer, Florian; Christina, Streli; Pepponi, Giancarlo; Peter, Wobrauschek; M., Zaitz; C., Horntrich; Gerald, Falkenberg
Formation of arsenic rich silicon oxide under plasma immersion ion implantation and laser annealing 1-gen-2012 Meirer, Florian; Demenev, Evgeny; Giubertoni, Damiano; Gennaro, Salvatore; Vanzetti, Lia Emanuela; Pepponi, Giancarlo; Bersani, Massimo; M. A., Sahiner; G., Steinhauser; M. A., Foad; J. C., Woicik; A., Mehta; P., Pianetta
Formation of arsenolite crystals at room temperature after very high dose arsenic implantation in silicon 1-gen-2012 Meirer, Florian; Giubertoni, Damiano; Demenev, Evgeny; Vanzetti, Lia Emanuela; Gennaro, Salvatore; Fedrizzi, Michele; Pepponi, Giancarlo; A., Mehta; P., Pianetta; G., Steinhauser; V., Vishwanath; M., Foad; Bersani, Massimo