IRIS Institutional Research Information System

Lazzeri, Paolo
 Distribuzione geografica
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Continente #
NA - Nord America 1.828
EU - Europa 1.026
AS - Asia 583
Continente sconosciuto - Info sul continente non disponibili 12
AF - Africa 2
SA - Sud America 1
Totale 3.452
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Nazione #
US - Stati Uniti d'America 1.804
DE - Germania 265
IN - India 203
SE - Svezia 198
UA - Ucraina 194
SG - Singapore 117
HK - Hong Kong 114
FI - Finlandia 101
IT - Italia 90
IE - Irlanda 62
VN - Vietnam 56
CN - Cina 47
GB - Regno Unito 43
RU - Federazione Russa 31
IR - Iran 25
CA - Canada 23
FR - Francia 18
EU - Europa 12
KR - Corea 9
BE - Belgio 6
JP - Giappone 6
CH - Svizzera 5
IL - Israele 4
ES - Italia 3
SK - Slovacchia (Repubblica Slovacca) 3
GR - Grecia 2
NL - Olanda 2
PL - Polonia 2
ZA - Sudafrica 2
BO - Bolivia 1
CZ - Repubblica Ceca 1
MX - Messico 1
PH - Filippine 1
TW - Taiwan 1
Totale 3.452
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Città #
Jacksonville 391
Chandler 377
Hong Kong 114
Wilmington 98
Ashburn 95
Singapore 94
Boardman 82
Dublin 62
Dearborn 56
Dong Ket 56
Kronberg 54
Helsinki 46
Woodbridge 38
Munich 26
Houston 24
Seattle 24
Beijing 23
Ann Arbor 20
Toronto 20
Phoenix 19
Trento 17
Los Angeles 16
Brooklyn 14
Santa Clara 14
Augusta 13
Pune 13
San Mateo 12
New York 11
Norwalk 10
Rome 9
Zanjan 9
Redwood City 8
Mountain View 7
Shanghai 7
Brussels 6
Owings Mills 6
Portland 6
Auburn Hills 5
Falls Church 5
Hamburg 5
Leawood 5
Miami 5
Saint Petersburg 5
Hanover 4
Secaucus 4
Tokyo 4
Ardabil 3
Baselga di Pinè 3
Bratislava 3
Falkenstein 3
Milan 3
Ottawa 3
Saint-Etienne 3
Tappahannock 3
Verona 3
Andover 2
Des Moines 2
Florence 2
Frankfurt am Main 2
Gif-sur-yvette 2
Guangzhou 2
Irving 2
Kunming 2
Nantong 2
Perugia 2
Siena 2
Turin 2
Vado Ligure 2
Varese 2
Amsterdam 1
Berlin 1
Bisceglie 1
Bologna 1
Brno 1
Buffalo 1
Castelló de la Plana 1
Champaign 1
Cheyenne 1
Città Di Castello 1
Cologne 1
Duncan 1
Grand Rapids 1
Hebei 1
Hefei 1
Henderson 1
Kakogawa 1
Kirkland 1
Kish 1
Krasnoyarsk 1
La Paz 1
Lausanne 1
León 1
London 1
Manila 1
Marburg 1
Messina 1
Mexico City 1
Monmouth Junction 1
Moscow 1
Mumbai 1
Totale 2.025
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Nome #
Vitalità e caratterizzazione chimico-fisica dei pollini come indicatori di inquinamento atmosferico 153
Applicazioni della spettrometria di massa a materiali e tecniche di ultima generazione 114
D-SIMS and ToF-SIMS quantitative depth profiles comparison on ultra thin oxynitrides 104
Highly sensitive detection of inorganic contamination 88
Thin Film Transformations and Volatile Products in the Formation of Nanoporous Low-K PMSSQ-based Dielectric 87
Arsenic shallow implant characterization by magnetic sector and time of flight SIMS instruments 85
Arsenic Shallow Implant Characterization by Magnetic Sector and TOF-SIMS Instruments 81
Functional and Chemical Characterization of pollen for environmental quality assessment 77
Caratterizzazione chimica di pollini tramite imaging ToF-SIMS e TXRF per indagini ambientali 76
Fabrication by rf-sputtering processing of Er3+ / Yb3+ codoped silica-titania planar waveguides 75
Caratterizzazione chimico-fisica e funzionale di pollini per indagini ambientali - relazione lavoro 2002 74
Highly Sensitive Detection of Inorganic Contamination 73
Ultra Shallow Depth Profiling by Secondary Ion Mass Spectrometry Techniques 72
Damage of ultralow k materials during photoresist mask stripping process 72
Caratterizzazione chimico-fisica e funzionale di pollini per indagini ambientali 70
ToF-SIMS and XPS charcterisation of urban aerosols for pollution studies 69
Chemical and morphological characterization of nanoporous silica low-k dielectrics etched in fluorocarbon plasmas 69
On the photoresist stripping and damage of ultralow k dielectric materials using remote H2- and D2-based discharges 68
Investigation of surface modifications of 193 and 248 nm photoresist materials during low-pressure plasma etching 65
Enhanced spectroscopic properties at 1.5 um in Er3+ / Yb+3 activated silica-titania planar waveguides fabricated by rf-sputtering 65
Pollen Viability for Air Pollution Bio-Monitoring 63
The use of spin coated txrf reference samples for TOF-SIMS metal contaminants quantification on silicon wafers 63
UNUSUAL FE-RICH FRAMBOIDS FROM DEVONIAN CARBONATE MOUNDS (SAHARA DESERT, MOROCCO) INVESTIGATED BY HR-SEM AND TOF-SIMS: FOSSIL ANALOGUES OF MOA-SRB CONSORTIA? 63
UNUSUAL FE-RICH FRAMBOIDS from DEVONIAN CARBONATE MOUNDS (HAMAR LAGHDAD RIDGE, MOROCCO) INVESTIGATED BY HR-SEM and ToF-SIMS: FOSSIL OAM-SRB CONSORTIA ANALOGUES? 61
Advances in trace metal contaminant analysis by laser-SNMS 60
ToF-SIMS studies of nanoporous PMSSQ materials: Kinetics and reactions in the processing of low-K dielectrics for ULSI applications 60
Enhanced spectroscopic properties at 1.5 micron in Er3+/Yb3+ -activated silica-titania planar waveguides fabricated by rf-sputtering 60
Surface investigation of archeological glasses by secondary ion mass spectrometry 60
Advances in Trace Metal Contaminant Analysis by Laser-SNMS 59
Quantitative Evaluation of Iron at the Silicon Surface after Wet Cleaning Treatments 58
ToF-SIMS study of adhesive residuals on device contact pads after wafer taping and backgrinding 58
Homogeneity study of traces in pine pollen with SR-μXRF 58
Plasma-Surface Interactions of Model Polymers for Advanced Photoresists Using C4F8/Ar Discharges and Energetic Ion Beams 57
Porosity- induced effects during C4F8/90% Ar plasma etching of silica-based ultralow-k dielectrics 56
SIMS and ToF-SIMS Quantitative Depth profiles Comparison on Ultra Thin Oxynitrides: Ultimate Depth Resolution Analyses 56
Characterization of trace metal contaminants on Si by laser-SNMS 56
Materials Tranformation and kinetics in the formation of porous low-k polymer dielectrics for advanced interconnect technology 55
Morphology structure and interfaces in the preparation of films by SUMBE for gas sensing 55
ToF-SIMS quantification of trace metal contaminants on silicon wafer: RSF's evaluation and characterization of wet cleaning processes 54
Plasma-surface interactions of nanoporous silica during plasma-based pattern transfer using C4F8 and C4F8 /Ar gas mixtures 54
Application of 118-nm postionization mass spectrometry to the detection of organic compounds on silicon surface 54
Influence of crucible material and source alloy composition on thermally evaporated indium tin oxide layers 51
Total reflection X-ray fluorescence analysis of pollen as an indicator for atmospheric pollution 47
Rivelazione di contaminanti metallici su silicio tramite laser-SNMS 47
Integration of Benzocyclobutene Polymers and Silicon Micromachined Structures Using Anisotropic Wet Etching J. Vac. Sci. Technol. B 46
Material Characterization and the Formation of Nanoporous PMSSQ Low-K Dielectrics 46
SURFACE INVESTIGATIONS OF ARCHAEOLOGICAL GLASSES BY SECONDARY ION MASS SPECTROMETRY 45
ToF-SIMS and AFM studies of low-k dielectric etching in fluorocarbon plasmas 45
Interactions of photoresist stripping plasmas with nanoporous organo-silicate ultra low dielectric constant dielectrics 44
Studies of plasma surface interactions during short time plasma etching of 193 and 248 nm photoresist materials 44
Material characterization and the formation of nanoporous PMSSQ low-k dielectrics 43
Tof-Sims and XPS Characterization of urban aerosols for pollution studies 42
ToF-SIMS Study of Adhesive Residuals on Device Contact Pads after Wafer Taping and Backgrinding 40
Quantitative Evaluation of iron at the silicon surface after wet cleaning treatments 37
To-F-SIMS and XPS characterization of urban aerosols for pollution studies 35
Totale 3.469
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Categoria #
all - tutte 20.786
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 20.786
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020593 0 0 0 0 71 33 70 6 63 259 60 31
2020/2021575 64 0 57 34 58 26 62 10 1 143 33 87
2021/2022230 19 1 7 43 8 5 6 38 21 26 20 36
2022/2023753 16 54 13 129 42 138 12 57 185 61 32 14
2023/2024528 45 13 69 29 29 56 23 80 17 118 0 49
2024/2025217 11 12 126 52 16 0 0 0 0 0 0 0
Totale 3.469