Lazzeri, Paolo
 Distribuzione geografica
Continente #
EU - Europa 3.372
NA - Nord America 2.903
AS - Asia 1.665
SA - Sud America 374
AF - Africa 39
Continente sconosciuto - Info sul continente non disponibili 13
Totale 8.366
Nazione #
US - Stati Uniti d'America 2.823
RU - Federazione Russa 1.958
SG - Singapore 596
DE - Germania 361
BR - Brasile 307
CN - Cina 274
IN - India 243
VN - Vietnam 232
SE - Svezia 205
UA - Ucraina 201
HK - Hong Kong 149
IT - Italia 144
FI - Finlandia 125
FR - Francia 88
GB - Regno Unito 87
NL - Olanda 65
IE - Irlanda 63
CA - Canada 54
AR - Argentina 26
IR - Iran 25
MX - Messico 21
BD - Bangladesh 20
PL - Polonia 19
ZA - Sudafrica 18
ES - Italia 17
IQ - Iraq 17
JP - Giappone 17
KR - Corea 13
EC - Ecuador 12
EU - Europa 12
TR - Turchia 11
CO - Colombia 9
PK - Pakistan 9
BE - Belgio 8
AE - Emirati Arabi Uniti 7
JO - Giordania 7
LT - Lituania 7
SA - Arabia Saudita 7
UZ - Uzbekistan 7
CH - Svizzera 6
DZ - Algeria 6
IL - Israele 5
MA - Marocco 5
PY - Paraguay 5
AT - Austria 4
AZ - Azerbaigian 4
CL - Cile 4
PH - Filippine 4
SK - Slovacchia (Repubblica Slovacca) 4
KE - Kenya 3
TN - Tunisia 3
TW - Taiwan 3
UY - Uruguay 3
VE - Venezuela 3
AM - Armenia 2
BG - Bulgaria 2
BO - Bolivia 2
EG - Egitto 2
GR - Grecia 2
ID - Indonesia 2
KZ - Kazakistan 2
MD - Moldavia 2
PE - Perù 2
TH - Thailandia 2
TT - Trinidad e Tobago 2
AL - Albania 1
BH - Bahrain 1
BW - Botswana 1
CZ - Repubblica Ceca 1
GY - Guiana 1
HN - Honduras 1
JM - Giamaica 1
KG - Kirghizistan 1
KW - Kuwait 1
LB - Libano 1
LY - Libia 1
MY - Malesia 1
PA - Panama 1
PT - Portogallo 1
RS - Serbia 1
SY - Repubblica araba siriana 1
XK - ???statistics.table.value.countryCode.XK??? 1
YE - Yemen 1
Totale 8.366
Città #
Jacksonville 391
Chandler 377
San Jose 345
Singapore 338
Ashburn 208
Hong Kong 145
Moscow 138
Boardman 103
The Dalles 102
Beijing 100
Wilmington 99
Dallas 97
Ho Chi Minh City 65
Dublin 63
Hefei 57
Dearborn 56
Dong Ket 56
Helsinki 55
Kronberg 54
Munich 53
Lauterbourg 50
Hanoi 39
New York 39
Trento 38
Woodbridge 38
Los Angeles 36
Santa Clara 28
Toronto 28
Houston 27
Brooklyn 25
Seattle 25
Phoenix 22
São Paulo 22
Ann Arbor 20
Frankfurt am Main 20
Rome 16
Warsaw 16
Turku 15
Denver 14
Montreal 14
Rio de Janeiro 14
Tokyo 14
Augusta 13
Da Nang 13
Pune 13
Council Bluffs 12
London 12
San Mateo 12
Norwalk 10
Chennai 9
Haiphong 9
Zanjan 9
Belo Horizonte 8
Brussels 8
Milan 8
Poplar 8
Redwood City 8
Atlanta 7
Falkenstein 7
Guayaquil 7
Mountain View 7
Mumbai 7
Secaucus 7
Shanghai 7
Amsterdam 6
Brasília 6
Johannesburg 6
Orem 6
Owings Mills 6
Portland 6
Tianjin 6
Amman 5
Auburn Hills 5
Baghdad 5
Caxias do Sul 5
Curitiba 5
Delhi 5
Erbil 5
Falls Church 5
Guangzhou 5
Guarulhos 5
Hamburg 5
Hanover 5
Istanbul 5
Leawood 5
Manaus 5
Manchester 5
Miami 5
Saint Petersburg 5
Salvador 5
San Francisco 5
Tashkent 5
Ankara 4
Berlin 4
Boston 4
Cape Town 4
Dhaka 4
Hillsboro 4
Lahore 4
Mexico City 4
Totale 3.842
Nome #
Vitalità e caratterizzazione chimico-fisica dei pollini come indicatori di inquinamento atmosferico 266
Applicazioni della spettrometria di massa a materiali e tecniche di ultima generazione 256
D-SIMS and ToF-SIMS quantitative depth profiles comparison on ultra thin oxynitrides 254
Arsenic Shallow Implant Characterization by Magnetic Sector and TOF-SIMS Instruments 215
Arsenic shallow implant characterization by magnetic sector and time of flight SIMS instruments 210
Highly sensitive detection of inorganic contamination 198
Fabrication by rf-sputtering processing of Er3+ / Yb3+ codoped silica-titania planar waveguides 194
Functional and Chemical Characterization of pollen for environmental quality assessment 186
Damage of ultralow k materials during photoresist mask stripping process 184
Caratterizzazione chimica di pollini tramite imaging ToF-SIMS e TXRF per indagini ambientali 181
Chemical and morphological characterization of nanoporous silica low-k dielectrics etched in fluorocarbon plasmas 178
Caratterizzazione chimico-fisica e funzionale di pollini per indagini ambientali 177
Morphology structure and interfaces in the preparation of films by SUMBE for gas sensing 174
Highly Sensitive Detection of Inorganic Contamination 174
Thin Film Transformations and Volatile Products in the Formation of Nanoporous Low-K PMSSQ-based Dielectric 169
Enhanced spectroscopic properties at 1.5 um in Er3+ / Yb+3 activated silica-titania planar waveguides fabricated by rf-sputtering 169
Enhanced spectroscopic properties at 1.5 micron in Er3+/Yb3+ -activated silica-titania planar waveguides fabricated by rf-sputtering 167
Caratterizzazione chimico-fisica e funzionale di pollini per indagini ambientali - relazione lavoro 2002 166
Ultra Shallow Depth Profiling by Secondary Ion Mass Spectrometry Techniques 163
Advances in Trace Metal Contaminant Analysis by Laser-SNMS 160
Characterization of trace metal contaminants on Si by laser-SNMS 156
ToF-SIMS and XPS charcterisation of urban aerosols for pollution studies 151
Advances in trace metal contaminant analysis by laser-SNMS 151
Plasma-Surface Interactions of Model Polymers for Advanced Photoresists Using C4F8/Ar Discharges and Energetic Ion Beams 151
Application of 118-nm postionization mass spectrometry to the detection of organic compounds on silicon surface 148
On the photoresist stripping and damage of ultralow k dielectric materials using remote H2- and D2-based discharges 138
UNUSUAL FE-RICH FRAMBOIDS from DEVONIAN CARBONATE MOUNDS (HAMAR LAGHDAD RIDGE, MOROCCO) INVESTIGATED BY HR-SEM and ToF-SIMS: FOSSIL OAM-SRB CONSORTIA ANALOGUES? 138
Pollen Viability for Air Pollution Bio-Monitoring 137
Porosity- induced effects during C4F8/90% Ar plasma etching of silica-based ultralow-k dielectrics 137
ToF-SIMS studies of nanoporous PMSSQ materials: Kinetics and reactions in the processing of low-K dielectrics for ULSI applications 136
SIMS and ToF-SIMS Quantitative Depth profiles Comparison on Ultra Thin Oxynitrides: Ultimate Depth Resolution Analyses 135
UNUSUAL FE-RICH FRAMBOIDS FROM DEVONIAN CARBONATE MOUNDS (SAHARA DESERT, MOROCCO) INVESTIGATED BY HR-SEM AND TOF-SIMS: FOSSIL ANALOGUES OF MOA-SRB CONSORTIA? 135
Surface investigation of archeological glasses by secondary ion mass spectrometry 135
The use of spin coated txrf reference samples for TOF-SIMS metal contaminants quantification on silicon wafers 134
Materials Tranformation and kinetics in the formation of porous low-k polymer dielectrics for advanced interconnect technology 134
Homogeneity study of traces in pine pollen with SR-μXRF 133
ToF-SIMS study of adhesive residuals on device contact pads after wafer taping and backgrinding 129
ToF-SIMS quantification of trace metal contaminants on silicon wafer: RSF's evaluation and characterization of wet cleaning processes 128
Total reflection X-ray fluorescence analysis of pollen as an indicator for atmospheric pollution 125
Er3+ / Yb3+ codoped silica-titania planar waveguides prepared by rf-sputtering 124
SURFACE INVESTIGATIONS OF ARCHAEOLOGICAL GLASSES BY SECONDARY ION MASS SPECTROMETRY 124
Quantitative Evaluation of Iron at the Silicon Surface after Wet Cleaning Treatments 123
Investigation of surface modifications of 193 and 248 nm photoresist materials during low-pressure plasma etching 121
Material Characterization and the Formation of Nanoporous PMSSQ Low-K Dielectrics 120
Influence of crucible material and source alloy composition on thermally evaporated indium tin oxide layers 118
Plasma-surface interactions of nanoporous silica during plasma-based pattern transfer using C4F8 and C4F8 /Ar gas mixtures 115
Interactions of photoresist stripping plasmas with nanoporous organo-silicate ultra low dielectric constant dielectrics 113
ToF-SIMS and AFM studies of low-k dielectric etching in fluorocarbon plasmas 113
Quantitative Evaluation of iron at the silicon surface after wet cleaning treatments 112
Studies of plasma surface interactions during short time plasma etching of 193 and 248 nm photoresist materials 112
ToF-SIMS Study of Adhesive Residuals on Device Contact Pads after Wafer Taping and Backgrinding 110
Tof-Sims and XPS Characterization of urban aerosols for pollution studies 106
Material characterization and the formation of nanoporous PMSSQ low-k dielectrics 104
Integration of Benzocyclobutene Polymers and Silicon Micromachined Structures Using Anisotropic Wet Etching J. Vac. Sci. Technol. B 103
To-F-SIMS and XPS characterization of urban aerosols for pollution studies 98
Rivelazione di contaminanti metallici su silicio tramite laser-SNMS 98
Totale 8.386
Categoria #
all - tutte 35.106
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 35.106


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021263 0 0 0 0 0 0 0 0 0 143 33 87
2021/2022230 19 1 7 43 8 5 6 38 21 26 20 36
2022/2023753 16 54 13 129 42 138 12 57 185 61 32 14
2023/2024528 45 13 69 29 29 56 23 80 17 118 0 49
2024/20251.502 11 12 126 52 32 17 77 64 593 183 230 105
2025/20263.632 182 212 243 281 129 164 549 1.515 200 157 0 0
Totale 8.386