IRIS Institutional Research Information System

Lazzeri, Paolo
 Distribuzione geografica
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Continente #
NA - Nord America 3.994
EU - Europa 3.423
AS - Asia 1.681
SA - Sud America 379
AF - Africa 45
Continente sconosciuto - Info sul continente non disponibili 33
Totale 9.555
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Nazione #
US - Stati Uniti d'America 3.860
RU - Federazione Russa 1.958
SG - Singapore 601
DE - Germania 364
BR - Brasile 307
CN - Cina 275
IN - India 243
VN - Vietnam 232
SE - Svezia 231
UA - Ucraina 201
IT - Italia 157
HK - Hong Kong 149
FI - Finlandia 125
FR - Francia 91
GB - Regno Unito 89
CA - Canada 86
NL - Olanda 65
IE - Irlanda 63
AR - Argentina 28
IR - Iran 25
MX - Messico 24
BD - Bangladesh 21
JP - Giappone 20
PL - Polonia 19
ES - Italia 18
ZA - Sudafrica 18
IQ - Iraq 17
KR - Corea 16
EC - Ecuador 13
EU - Europa 12
CO - Colombia 11
TR - Turchia 11
PK - Pakistan 9
AE - Emirati Arabi Uniti 8
BE - Belgio 8
SA - Arabia Saudita 8
CH - Svizzera 7
JO - Giordania 7
LT - Lituania 7
UZ - Uzbekistan 7
DZ - Algeria 6
SC - Seychelles 6
CR - Costa Rica 5
IL - Israele 5
MA - Marocco 5
PY - Paraguay 5
AT - Austria 4
AZ - Azerbaigian 4
CL - Cile 4
HN - Honduras 4
PH - Filippine 4
SK - Slovacchia (Repubblica Slovacca) 4
GT - Guatemala 3
JM - Giamaica 3
KE - Kenya 3
SV - El Salvador 3
TN - Tunisia 3
TW - Taiwan 3
UY - Uruguay 3
VE - Venezuela 3
AM - Armenia 2
BG - Bulgaria 2
BO - Bolivia 2
EG - Egitto 2
GR - Grecia 2
ID - Indonesia 2
KZ - Kazakistan 2
MD - Moldavia 2
PE - Perù 2
RS - Serbia 2
TH - Thailandia 2
TT - Trinidad e Tobago 2
AL - Albania 1
AW - Aruba 1
BH - Bahrain 1
BW - Botswana 1
CZ - Repubblica Ceca 1
GY - Guiana 1
HT - Haiti 1
KG - Kirghizistan 1
KW - Kuwait 1
LA - Repubblica Popolare Democratica del Laos 1
LB - Libano 1
LY - Libia 1
MY - Malesia 1
NI - Nicaragua 1
PA - Panama 1
PT - Portogallo 1
RO - Romania 1
SY - Repubblica araba siriana 1
XK - ???statistics.table.value.countryCode.XK??? 1
YE - Yemen 1
Totale 9.535
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Città #
San Jose 440
Jacksonville 393
Chandler 377
Council Bluffs 355
Singapore 341
Ashburn 215
Hong Kong 145
Moscow 138
Dallas 111
Boardman 103
The Dalles 103
Wilmington 101
Beijing 100
Ho Chi Minh City 65
Dublin 64
New York 58
Hefei 57
Dearborn 56
Dong Ket 56
Helsinki 55
Los Angeles 55
Kronberg 54
Munich 54
Lauterbourg 50
Hanoi 39
Trento 39
Santa Clara 38
Woodbridge 38
Houston 37
Toronto 32
Brooklyn 28
Phoenix 28
Buffalo 26
Seattle 25
São Paulo 22
Ann Arbor 20
Frankfurt am Main 20
Montreal 20
Denver 17
Rome 16
Tokyo 16
Warsaw 16
Turku 15
Rio de Janeiro 14
Augusta 13
Da Nang 13
Pune 13
London 12
San Mateo 12
Atlanta 11
Garland 11
North Easton 11
Norwalk 11
Tampa 11
Honolulu 10
Milan 10
Chennai 9
Haiphong 9
North Bergen 9
Zanjan 9
Belo Horizonte 8
Brussels 8
Manchester 8
Miami 8
Poplar 8
Redwood City 8
Chicago 7
Falkenstein 7
Guayaquil 7
Mountain View 7
Mumbai 7
Orlando 7
Queens 7
San Francisco 7
Secaucus 7
Shanghai 7
Amsterdam 6
Brasília 6
Johannesburg 6
Orem 6
Owings Mills 6
Portland 6
Princeton 6
Tianjin 6
Amman 5
Auburn Hills 5
Baghdad 5
Berlin 5
Boston 5
Calgary 5
Caxias do Sul 5
Curitiba 5
Delhi 5
Erbil 5
Falls Church 5
Guangzhou 5
Guarulhos 5
Hamburg 5
Hanover 5
Istanbul 5
Totale 4.472
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Nome #
Vitalità e caratterizzazione chimico-fisica dei pollini come indicatori di inquinamento atmosferico 285
D-SIMS and ToF-SIMS quantitative depth profiles comparison on ultra thin oxynitrides 284
Applicazioni della spettrometria di massa a materiali e tecniche di ultima generazione 283
Arsenic Shallow Implant Characterization by Magnetic Sector and TOF-SIMS Instruments 238
Arsenic shallow implant characterization by magnetic sector and time of flight SIMS instruments 232
Fabrication by rf-sputtering processing of Er3+ / Yb3+ codoped silica-titania planar waveguides 219
Highly sensitive detection of inorganic contamination 218
Damage of ultralow k materials during photoresist mask stripping process 210
Functional and Chemical Characterization of pollen for environmental quality assessment 209
Chemical and morphological characterization of nanoporous silica low-k dielectrics etched in fluorocarbon plasmas 205
Caratterizzazione chimica di pollini tramite imaging ToF-SIMS e TXRF per indagini ambientali 204
Highly Sensitive Detection of Inorganic Contamination 199
Caratterizzazione chimico-fisica e funzionale di pollini per indagini ambientali 194
Morphology structure and interfaces in the preparation of films by SUMBE for gas sensing 193
Thin Film Transformations and Volatile Products in the Formation of Nanoporous Low-K PMSSQ-based Dielectric 191
Enhanced spectroscopic properties at 1.5 um in Er3+ / Yb+3 activated silica-titania planar waveguides fabricated by rf-sputtering 191
Caratterizzazione chimico-fisica e funzionale di pollini per indagini ambientali - relazione lavoro 2002 188
Enhanced spectroscopic properties at 1.5 micron in Er3+/Yb3+ -activated silica-titania planar waveguides fabricated by rf-sputtering 186
Advances in Trace Metal Contaminant Analysis by Laser-SNMS 181
Plasma-Surface Interactions of Model Polymers for Advanced Photoresists Using C4F8/Ar Discharges and Energetic Ion Beams 180
Characterization of trace metal contaminants on Si by laser-SNMS 179
Ultra Shallow Depth Profiling by Secondary Ion Mass Spectrometry Techniques 178
Advances in trace metal contaminant analysis by laser-SNMS 174
Application of 118-nm postionization mass spectrometry to the detection of organic compounds on silicon surface 170
ToF-SIMS and XPS charcterisation of urban aerosols for pollution studies 167
Porosity- induced effects during C4F8/90% Ar plasma etching of silica-based ultralow-k dielectrics 164
Pollen Viability for Air Pollution Bio-Monitoring 159
UNUSUAL FE-RICH FRAMBOIDS FROM DEVONIAN CARBONATE MOUNDS (SAHARA DESERT, MOROCCO) INVESTIGATED BY HR-SEM AND TOF-SIMS: FOSSIL ANALOGUES OF MOA-SRB CONSORTIA? 159
On the photoresist stripping and damage of ultralow k dielectric materials using remote H2- and D2-based discharges 158
UNUSUAL FE-RICH FRAMBOIDS from DEVONIAN CARBONATE MOUNDS (HAMAR LAGHDAD RIDGE, MOROCCO) INVESTIGATED BY HR-SEM and ToF-SIMS: FOSSIL OAM-SRB CONSORTIA ANALOGUES? 157
The use of spin coated txrf reference samples for TOF-SIMS metal contaminants quantification on silicon wafers 156
ToF-SIMS studies of nanoporous PMSSQ materials: Kinetics and reactions in the processing of low-K dielectrics for ULSI applications 154
Surface investigation of archeological glasses by secondary ion mass spectrometry 153
Homogeneity study of traces in pine pollen with SR-μXRF 153
ToF-SIMS quantification of trace metal contaminants on silicon wafer: RSF's evaluation and characterization of wet cleaning processes 152
SIMS and ToF-SIMS Quantitative Depth profiles Comparison on Ultra Thin Oxynitrides: Ultimate Depth Resolution Analyses 151
Materials Tranformation and kinetics in the formation of porous low-k polymer dielectrics for advanced interconnect technology 151
Studies of plasma surface interactions during short time plasma etching of 193 and 248 nm photoresist materials 147
ToF-SIMS study of adhesive residuals on device contact pads after wafer taping and backgrinding 146
SURFACE INVESTIGATIONS OF ARCHAEOLOGICAL GLASSES BY SECONDARY ION MASS SPECTROMETRY 145
Er3+ / Yb3+ codoped silica-titania planar waveguides prepared by rf-sputtering 143
Total reflection X-ray fluorescence analysis of pollen as an indicator for atmospheric pollution 143
Quantitative Evaluation of Iron at the Silicon Surface after Wet Cleaning Treatments 140
Material Characterization and the Formation of Nanoporous PMSSQ Low-K Dielectrics 140
Investigation of surface modifications of 193 and 248 nm photoresist materials during low-pressure plasma etching 138
Influence of crucible material and source alloy composition on thermally evaporated indium tin oxide layers 134
Plasma-surface interactions of nanoporous silica during plasma-based pattern transfer using C4F8 and C4F8 /Ar gas mixtures 131
Interactions of photoresist stripping plasmas with nanoporous organo-silicate ultra low dielectric constant dielectrics 130
ToF-SIMS and AFM studies of low-k dielectric etching in fluorocarbon plasmas 130
Quantitative Evaluation of iron at the silicon surface after wet cleaning treatments 130
ToF-SIMS Study of Adhesive Residuals on Device Contact Pads after Wafer Taping and Backgrinding 128
Tof-Sims and XPS Characterization of urban aerosols for pollution studies 127
Material characterization and the formation of nanoporous PMSSQ low-k dielectrics 126
Integration of Benzocyclobutene Polymers and Silicon Micromachined Structures Using Anisotropic Wet Etching J. Vac. Sci. Technol. B 120
To-F-SIMS and XPS characterization of urban aerosols for pollution studies 118
Rivelazione di contaminanti metallici su silicio tramite laser-SNMS 114
Totale 9.555
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Categoria #
all - tutte 40.548
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 40.548
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/2022203 0 0 0 43 8 5 6 38 21 26 20 36
2022/2023753 16 54 13 129 42 138 12 57 185 61 32 14
2023/2024528 45 13 69 29 29 56 23 80 17 118 0 49
2024/20251.502 11 12 126 52 32 17 77 64 593 183 230 105
2025/20263.882 182 212 243 281 129 164 549 1.515 200 175 198 34
2026/2027919 167 153 309 290 0 0 0 0 0 0 0 0
Totale 9.555