IRIS Institutional Research Information System

Lazzeri, Paolo
 Distribuzione geografica
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Continente #
NA - Nord America 2.394
EU - Europa 1.808
AS - Asia 1.255
SA - Sud America 326
AF - Africa 25
Continente sconosciuto - Info sul continente non disponibili 12
Totale 5.820
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Nazione #
US - Stati Uniti d'America 2.335
RU - Federazione Russa 538
SG - Singapore 462
DE - Germania 319
BR - Brasile 280
IN - India 231
CN - Cina 210
SE - Svezia 202
UA - Ucraina 199
IT - Italia 138
HK - Hong Kong 133
FI - Finlandia 125
VN - Vietnam 92
GB - Regno Unito 75
NL - Olanda 64
IE - Irlanda 62
CA - Canada 44
IR - Iran 25
FR - Francia 24
AR - Argentina 17
PL - Polonia 15
BD - Bangladesh 14
JP - Giappone 13
ES - Italia 12
EU - Europa 12
ZA - Sudafrica 12
KR - Corea 11
MX - Messico 11
EC - Ecuador 10
IQ - Iraq 10
TR - Turchia 10
BE - Belgio 8
PK - Pakistan 8
CO - Colombia 7
LT - Lituania 7
CH - Svizzera 5
IL - Israele 5
JO - Giordania 5
SA - Arabia Saudita 5
UZ - Uzbekistan 5
AE - Emirati Arabi Uniti 4
DZ - Algeria 4
SK - Slovacchia (Repubblica Slovacca) 4
AT - Austria 3
CL - Cile 3
UY - Uruguay 3
AM - Armenia 2
BO - Bolivia 2
EG - Egitto 2
GR - Grecia 2
KE - Kenya 2
KZ - Kazakistan 2
MA - Marocco 2
MD - Moldavia 2
PH - Filippine 2
PY - Paraguay 2
TN - Tunisia 2
TT - Trinidad e Tobago 2
TW - Taiwan 2
BG - Bulgaria 1
BW - Botswana 1
CZ - Repubblica Ceca 1
HN - Honduras 1
ID - Indonesia 1
LB - Libano 1
MY - Malesia 1
PA - Panama 1
PE - Perù 1
PT - Portogallo 1
RS - Serbia 1
SY - Repubblica araba siriana 1
VE - Venezuela 1
Totale 5.820
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Città #
Jacksonville 391
Chandler 377
Singapore 307
Ashburn 163
Moscow 138
Hong Kong 133
Boardman 103
Wilmington 99
Dallas 96
Beijing 85
The Dalles 65
Dublin 62
Hefei 57
Dearborn 56
Dong Ket 56
Helsinki 55
Kronberg 54
Munich 53
Trento 38
Woodbridge 38
Los Angeles 33
New York 33
Brooklyn 25
Houston 25
Seattle 25
Toronto 25
Santa Clara 24
Phoenix 21
São Paulo 21
Ann Arbor 20
Ho Chi Minh City 18
Rome 15
Turku 15
Frankfurt am Main 14
Augusta 13
Pune 13
Warsaw 13
Council Bluffs 12
Rio de Janeiro 12
San Mateo 12
Tokyo 11
Norwalk 10
Denver 9
Zanjan 9
Belo Horizonte 8
Brussels 8
Hanoi 8
London 8
Montreal 8
Poplar 8
Redwood City 8
Falkenstein 7
Milan 7
Mountain View 7
Secaucus 7
Shanghai 7
Amsterdam 6
Atlanta 6
Brasília 6
Chennai 6
Owings Mills 6
Portland 6
Amman 5
Auburn Hills 5
Curitiba 5
Falls Church 5
Guayaquil 5
Hamburg 5
Hanover 5
Johannesburg 5
Leawood 5
Manaus 5
Miami 5
Mumbai 5
Saint Petersburg 5
Salvador 5
San Francisco 5
Tashkent 5
Ankara 4
Baghdad 4
Boston 4
Caxias do Sul 4
Istanbul 4
Lahore 4
Quito 4
Stockholm 4
Tianjin 4
Ardabil 3
Baselga di Pinè 3
Berlin 3
Bratislava 3
Buffalo 3
Camaçari 3
Campinas 3
Cape Town 3
Carapicuíba 3
Dhaka 3
Guarulhos 3
Hillsboro 3
Jeddah 3
Totale 3.136
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Nome #
Vitalità e caratterizzazione chimico-fisica dei pollini come indicatori di inquinamento atmosferico 211
D-SIMS and ToF-SIMS quantitative depth profiles comparison on ultra thin oxynitrides 188
Applicazioni della spettrometria di massa a materiali e tecniche di ultima generazione 187
Arsenic shallow implant characterization by magnetic sector and time of flight SIMS instruments 149
Highly sensitive detection of inorganic contamination 142
Arsenic Shallow Implant Characterization by Magnetic Sector and TOF-SIMS Instruments 138
Fabrication by rf-sputtering processing of Er3+ / Yb3+ codoped silica-titania planar waveguides 137
Functional and Chemical Characterization of pollen for environmental quality assessment 134
Caratterizzazione chimica di pollini tramite imaging ToF-SIMS e TXRF per indagini ambientali 131
Damage of ultralow k materials during photoresist mask stripping process 126
Highly Sensitive Detection of Inorganic Contamination 126
Morphology structure and interfaces in the preparation of films by SUMBE for gas sensing 122
Caratterizzazione chimico-fisica e funzionale di pollini per indagini ambientali 120
Thin Film Transformations and Volatile Products in the Formation of Nanoporous Low-K PMSSQ-based Dielectric 120
Chemical and morphological characterization of nanoporous silica low-k dielectrics etched in fluorocarbon plasmas 119
Enhanced spectroscopic properties at 1.5 um in Er3+ / Yb+3 activated silica-titania planar waveguides fabricated by rf-sputtering 118
Caratterizzazione chimico-fisica e funzionale di pollini per indagini ambientali - relazione lavoro 2002 117
Advances in Trace Metal Contaminant Analysis by Laser-SNMS 114
Enhanced spectroscopic properties at 1.5 micron in Er3+/Yb3+ -activated silica-titania planar waveguides fabricated by rf-sputtering 114
ToF-SIMS and XPS charcterisation of urban aerosols for pollution studies 108
Characterization of trace metal contaminants on Si by laser-SNMS 108
Advances in trace metal contaminant analysis by laser-SNMS 105
Ultra Shallow Depth Profiling by Secondary Ion Mass Spectrometry Techniques 103
On the photoresist stripping and damage of ultralow k dielectric materials using remote H2- and D2-based discharges 101
Pollen Viability for Air Pollution Bio-Monitoring 100
Application of 118-nm postionization mass spectrometry to the detection of organic compounds on silicon surface 100
The use of spin coated txrf reference samples for TOF-SIMS metal contaminants quantification on silicon wafers 98
ToF-SIMS studies of nanoporous PMSSQ materials: Kinetics and reactions in the processing of low-K dielectrics for ULSI applications 98
ToF-SIMS study of adhesive residuals on device contact pads after wafer taping and backgrinding 98
Plasma-Surface Interactions of Model Polymers for Advanced Photoresists Using C4F8/Ar Discharges and Energetic Ion Beams 95
UNUSUAL FE-RICH FRAMBOIDS from DEVONIAN CARBONATE MOUNDS (HAMAR LAGHDAD RIDGE, MOROCCO) INVESTIGATED BY HR-SEM and ToF-SIMS: FOSSIL OAM-SRB CONSORTIA ANALOGUES? 93
Homogeneity study of traces in pine pollen with SR-μXRF 93
ToF-SIMS quantification of trace metal contaminants on silicon wafer: RSF's evaluation and characterization of wet cleaning processes 92
Investigation of surface modifications of 193 and 248 nm photoresist materials during low-pressure plasma etching 92
UNUSUAL FE-RICH FRAMBOIDS FROM DEVONIAN CARBONATE MOUNDS (SAHARA DESERT, MOROCCO) INVESTIGATED BY HR-SEM AND TOF-SIMS: FOSSIL ANALOGUES OF MOA-SRB CONSORTIA? 91
Porosity- induced effects during C4F8/90% Ar plasma etching of silica-based ultralow-k dielectrics 90
SIMS and ToF-SIMS Quantitative Depth profiles Comparison on Ultra Thin Oxynitrides: Ultimate Depth Resolution Analyses 90
Materials Tranformation and kinetics in the formation of porous low-k polymer dielectrics for advanced interconnect technology 90
Surface investigation of archeological glasses by secondary ion mass spectrometry 88
Quantitative Evaluation of Iron at the Silicon Surface after Wet Cleaning Treatments 87
Influence of crucible material and source alloy composition on thermally evaporated indium tin oxide layers 84
Plasma-surface interactions of nanoporous silica during plasma-based pattern transfer using C4F8 and C4F8 /Ar gas mixtures 84
ToF-SIMS and AFM studies of low-k dielectric etching in fluorocarbon plasmas 82
Interactions of photoresist stripping plasmas with nanoporous organo-silicate ultra low dielectric constant dielectrics 81
SURFACE INVESTIGATIONS OF ARCHAEOLOGICAL GLASSES BY SECONDARY ION MASS SPECTROMETRY 81
Total reflection X-ray fluorescence analysis of pollen as an indicator for atmospheric pollution 80
Material Characterization and the Formation of Nanoporous PMSSQ Low-K Dielectrics 79
Rivelazione di contaminanti metallici su silicio tramite laser-SNMS 74
Studies of plasma surface interactions during short time plasma etching of 193 and 248 nm photoresist materials 74
Er3+ / Yb3+ codoped silica-titania planar waveguides prepared by rf-sputtering 73
Material characterization and the formation of nanoporous PMSSQ low-k dielectrics 73
Quantitative Evaluation of iron at the silicon surface after wet cleaning treatments 72
Integration of Benzocyclobutene Polymers and Silicon Micromachined Structures Using Anisotropic Wet Etching J. Vac. Sci. Technol. B 71
To-F-SIMS and XPS characterization of urban aerosols for pollution studies 67
Tof-Sims and XPS Characterization of urban aerosols for pollution studies 67
ToF-SIMS Study of Adhesive Residuals on Device Contact Pads after Wafer Taping and Backgrinding 65
Totale 5.840
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Categoria #
all - tutte 31.362
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 31.362
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021362 0 0 0 0 0 26 62 10 1 143 33 87
2021/2022230 19 1 7 43 8 5 6 38 21 26 20 36
2022/2023753 16 54 13 129 42 138 12 57 185 61 32 14
2023/2024528 45 13 69 29 29 56 23 80 17 118 0 49
2024/20251.502 11 12 126 52 32 17 77 64 593 183 230 105
2025/20261.086 182 212 243 281 129 39 0 0 0 0 0 0
Totale 5.840