Detailed investigations of sin-on polymethylsilsequioxane (PMSSQ)-based low-K materals were crried out by means of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to identify the reaction kinetics and mechanisms occurring during the manufacturing of nanoporous dielectrics for ULSI applications. Analysis of the static SIMS fingerprints let to the identification of key species related to the PMSSQ loigomers, as well to the observation of features related to ghe initial functionality of the precursor materials. The intensity variations of the key species with thermal curing reveal the polymerization kinetics of the dielectric precursors. In addition, thermal decomposition and volatilization of the polymethylmethacrylate-dimethylaminoethylmethacrylate copolymer (PMMA-co-DMAEMA) porogen was established based on the detection of fragments related to the different moieties of the copolymer molecule. Porogen degradation takes place via cleavage of the DMAEMA co-monomer at low temperature, followed by volatilization of the residual PMMA-enriched polymer upon annealing at higher temperature. Several complementary phenomena occuring during the formation of these complex systems can be evaluated by ToF-SIMS, revealing major features crucial to materials development and the manufacturing of novel low-dielectric-constant (K) dielectrics

ToF-SIMS studies of nanoporous PMSSQ materials: Kinetics and reactions in the processing of low-K dielectrics for ULSI applications

Lazzeri, Paolo;Vanzetti, Lia Emanuela;Anderle, Mariano;Bersani, Massimo;
2004

Abstract

Detailed investigations of sin-on polymethylsilsequioxane (PMSSQ)-based low-K materals were crried out by means of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to identify the reaction kinetics and mechanisms occurring during the manufacturing of nanoporous dielectrics for ULSI applications. Analysis of the static SIMS fingerprints let to the identification of key species related to the PMSSQ loigomers, as well to the observation of features related to ghe initial functionality of the precursor materials. The intensity variations of the key species with thermal curing reveal the polymerization kinetics of the dielectric precursors. In addition, thermal decomposition and volatilization of the polymethylmethacrylate-dimethylaminoethylmethacrylate copolymer (PMMA-co-DMAEMA) porogen was established based on the detection of fragments related to the different moieties of the copolymer molecule. Porogen degradation takes place via cleavage of the DMAEMA co-monomer at low temperature, followed by volatilization of the residual PMMA-enriched polymer upon annealing at higher temperature. Several complementary phenomena occuring during the formation of these complex systems can be evaluated by ToF-SIMS, revealing major features crucial to materials development and the manufacturing of novel low-dielectric-constant (K) dielectrics
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11582/2170
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