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Anomalous Diffusion of Fluorine in Silicon
1992-01-01 S. P., Jeng; T., Ma; Anderle, Mariano; Gary Wayne, Rubloff; Canteri, Roberto
Argon-Hydrogen rf plasma study for carbon film deposition
2004-01-01 Bensaada Laidani, Nadhira; Bartali, Ruben; P., Tosi; Anderle, Mariano
Arsenic shallow depth profiling: accurate quantification in SiO2/Si stack
2004-01-01 Barozzi, Mario; Giubertoni, Damiano; Anderle, Mariano; Bersani, Massimo
Assessment Of Nanocomposite Photonic Systems with X-Ray Photoelectron Spectroscopy
2007-01-01 Minati, Luca; Speranza, Giorgio; Anderle, Mariano; Ferrari, Maurizio; Chiasera, Alessandro; G. C., Righini
BF2 Ion Implantation in Silicon: Effects of the In-Flight Ion Dissociation
1988-01-01 Giuseppe, Queirolo; C., Bresolin; L., Meda; Anderle, Mariano; Canteri, Roberto
Carbon effect on the phase structure and the hardness of r.f. sputtered zirconia films
2001-01-01 Bensaada Laidani, Nadhira; Micheli, Victor; Anderle, Mariano
Carbon film deposition on polyethylene terephtalate by pulsed-plasma technology
2005-01-01 Bensaada Laidani, Nadhira; Bartali, Ruben; Anderle, Mariano; P., Chiggiato; G., Chuste
Characterisation of RTA Oxynitrides by SIMS and XPS Analyses
1998-01-01 Bersani, Massimo; Vanzetti, Lia Emanuela; M., Sbetti; Anderle, Mariano
Characterization of Carbon and Zirconia Films Deposited on Polycarbonate for Scratch-Proof Coating Applications
1998-01-01 Bensaada Laidani, Nadhira; Speranza, Giorgio; Alexey, Nefedov; Calliari, Lucia; Anderle, Mariano
Characterization of rapid Thermal Processing Oxynitrides by SIMS and XPS Analyses
1999-01-01 Bersani, Massimo; Vanzetti, Lia Emanuela; M., Sbetti; Anderle, Mariano
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Anomalous Diffusion of Fluorine in Silicon | 1-gen-1992 | S. P., Jeng; T., Ma; Anderle, Mariano; Gary Wayne, Rubloff; Canteri, Roberto | |
Argon-Hydrogen rf plasma study for carbon film deposition | 1-gen-2004 | Bensaada Laidani, Nadhira; Bartali, Ruben; P., Tosi; Anderle, Mariano | |
Arsenic shallow depth profiling: accurate quantification in SiO2/Si stack | 1-gen-2004 | Barozzi, Mario; Giubertoni, Damiano; Anderle, Mariano; Bersani, Massimo | |
Assessment Of Nanocomposite Photonic Systems with X-Ray Photoelectron Spectroscopy | 1-gen-2007 | Minati, Luca; Speranza, Giorgio; Anderle, Mariano; Ferrari, Maurizio; Chiasera, Alessandro; G. C., Righini | |
BF2 Ion Implantation in Silicon: Effects of the In-Flight Ion Dissociation | 1-gen-1988 | Giuseppe, Queirolo; C., Bresolin; L., Meda; Anderle, Mariano; Canteri, Roberto | |
Carbon effect on the phase structure and the hardness of r.f. sputtered zirconia films | 1-gen-2001 | Bensaada Laidani, Nadhira; Micheli, Victor; Anderle, Mariano | |
Carbon film deposition on polyethylene terephtalate by pulsed-plasma technology | 1-gen-2005 | Bensaada Laidani, Nadhira; Bartali, Ruben; Anderle, Mariano; P., Chiggiato; G., Chuste | |
Characterisation of RTA Oxynitrides by SIMS and XPS Analyses | 1-gen-1998 | Bersani, Massimo; Vanzetti, Lia Emanuela; M., Sbetti; Anderle, Mariano | |
Characterization of Carbon and Zirconia Films Deposited on Polycarbonate for Scratch-Proof Coating Applications | 1-gen-1998 | Bensaada Laidani, Nadhira; Speranza, Giorgio; Alexey, Nefedov; Calliari, Lucia; Anderle, Mariano | |
Characterization of rapid Thermal Processing Oxynitrides by SIMS and XPS Analyses | 1-gen-1999 | Bersani, Massimo; Vanzetti, Lia Emanuela; M., Sbetti; Anderle, Mariano |
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Opzioni
Scopri
Tipologia
- 1 Contributo su Rivista 91
- 1 Contributo su Rivista::1.1 Arti... 91
Data di pubblicazione
- 2010 - 2013 4
- 2000 - 2009 61
- 1990 - 1999 17
- 1984 - 1989 9
Editore
- Elsevier 22
- Wiley 6
- American Institute of Physics 5
- Springer 4
- AVS 3
- American Physical Society 2
- IOP Publishing 2
- ACS Publications 1
- Electrochemical Society 1
- IEEE 1
Rivista
- JOURNAL OF VACUUM SCIENCE & TECHN... 10
- APPLIED SURFACE SCIENCE 8
- DIAMOND AND RELATED MATERIALS 8
- NUCLEAR INSTRUMENTS & METHODS IN ... 6
- SURFACE AND INTERFACE ANALYSIS 6
- THIN SOLID FILMS 4
- APPLIED PHYSICS LETTERS 3
- JOURNAL OF MATERIALS SCIENCE 3
- JOURNAL OF APPLIED PHYSICS 2
- JOURNAL OF PHYSICS. CONDENSED MATTER 2
Keyword
- BIOSUPERFICI 4
- ToF-SIMS 4
- amorphous hydrogenated carbon 3
- hardness 3
- mechanical properties 3
- structure 3
- arsenic implant 2
- carbon 2
- diamond-like carbon 2
- laser ablation 2
Lingua
- eng 80
Accesso al fulltext
- no fulltext 86
- reserved 5