IRIS Institutional Research Information System

Ruzzarin, Maria
 Distribuzione geografica
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Continente #
EU - Europa 649
AS - Asia 344
NA - Nord America 329
AF - Africa 5
SA - Sud America 3
Totale 1.330
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Nazione #
IT - Italia 424
US - Stati Uniti d'America 311
SG - Singapore 136
HK - Hong Kong 91
CN - Cina 63
DE - Germania 48
FR - Francia 30
JP - Giappone 25
CH - Svizzera 22
RU - Federazione Russa 17
CA - Canada 16
GB - Regno Unito 16
ES - Italia 15
FI - Finlandia 15
IE - Irlanda 14
KR - Corea 13
NL - Olanda 12
BE - Belgio 10
IN - India 8
CZ - Repubblica Ceca 6
TW - Taiwan 5
AT - Austria 4
DZ - Algeria 4
PL - Polonia 4
SI - Slovenia 4
BR - Brasile 2
LT - Lituania 2
SK - Slovacchia (Repubblica Slovacca) 2
AL - Albania 1
AZ - Azerbaigian 1
BG - Bulgaria 1
CR - Costa Rica 1
EC - Ecuador 1
IL - Israele 1
LK - Sri Lanka 1
LV - Lettonia 1
MA - Marocco 1
NO - Norvegia 1
PA - Panama 1
Totale 1.330
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Città #
Singapore 118
Trento 109
Hong Kong 79
Bologna 36
Milan 33
Ashburn 28
Boardman 23
Santa Clara 21
Chandler 15
Turin 15
Helsinki 13
Dublin 12
Bari 11
Naples 11
Raleigh 11
Beijing 10
Brussels 10
Shanghai 10
Los Angeles 9
Castello d'Argile 8
Genoa 8
Verona 8
Geneva 7
Munich 7
Davis 6
Florence 6
Kronberg 6
Nuremberg 6
Rome 6
Rovereto 6
Sherbrooke 6
Varese 6
Vimercate 6
Aachen 5
Brno 5
Knoxville 5
Miami 5
New York 5
Seocho-gu 5
Bolzano 4
Ferney-Voltaire 4
Ljubljana 4
Marnaz 4
Marseille 4
Montreal 4
Phoenix 4
Pune 4
Rubano 4
Seoul 4
Shinchiba 4
Vienna 4
Wuxi 4
Yokohama 4
Bellaterra 3
Benevento 3
Bergamo 3
Boydton 3
Cortenuova 3
Cunevo 3
Faenza 3
Ferrara 3
Guangzhou 3
Kolkata 3
Lakewood 3
Lomazzo 3
L’Aquila 3
Madison 3
Massy 3
Sacramento 3
Saint-Genis-Pouilly 3
Sant'Egidio alla Vibrata 3
Suwanee 3
Tokyo 3
Udine 3
Valencia 3
Valperga 3
Xi'an 3
Zalazy 3
Alcoy 2
Amsterdam 2
Avetrana 2
Avezzano 2
Barcelona 2
Botticino 2
Bratislava 2
Campinas 2
Cantù 2
Castenaso 2
Central 2
Charlotte 2
Chavannes 2
Cork 2
Corropoli 2
Dorfen 2
Este 2
Fossano 2
Frankfurt am Main 2
Greenwich 2
Grottaglie 2
Hamburg 2
Totale 871
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Nome #
Back Side Illuminated SiPM from NIR to NUV light detection 355
NUV-HD SiPMs with Metal-filled Trenches 288
Silicon Photomultipliers technologies for 3D integration 104
3D integration technologies for custom SiPM: From BSI to TSV interconnections 96
3D integration approaches for Silicon Photomultipliers: from backside-illuminated to Through Silicon Via interconnections 52
NUV-HD SiPMs with metal-filled trenches 42
Glass-free SiPMs with Through Silicon Vias for VUV/NUV light detection 41
Timing performance of FBK SiPM NUV-HD-MT technology using LYSO:Ce:Ca crystal 40
GaN-based MIS-HEMTs: Impact of cascode-mode high temperature source current stress on NBTI shift 30
Reliability and failure analysis in power GaN-HEMTs: An overview 29
Gate Stability and Robustness of In-Situ Oxide GaN Interlayer Based Vertical Trench MOSFETs (OG-FETs) 26
Negative bias-induced threshold voltage instability in GaN-on-Si power HEMTs 25
Degradation of vertical GaN FETs under gate and drain stress 22
Characterization of charge trapping mechanisms in GaN vertical Fin FETs under positive gate bias 21
Glass-free SiPMs with Through Silicon Vias for VUV/NUV light detection 20
Reliability of power devices: Bias-induced threshold voltage instability and dielectric breakdown in GaN MIS-HEMTs 20
DIGILOG: A digital-analog SiPM towards 10 ps prompt-photon tagging in TOF-PET 20
Degradation Mechanisms of GaN HEMTs with p-Type Gate under Forward Gate Bias Overstress 19
Analysis of threshold voltage instabilities in semi-vertical GaN-on-Si FETs 18
Degradation of vertical GaN-on-GaN fin transistors: Step-stress and constant voltage experiments 18
Highly stable threshold voltage in GaN nanowire FETs: The advantages of p-GaN channel/Al2O3gate insulator 17
Degradation Mechanisms of GaN-Based Vertical Devices: A Review 17
Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis 15
Evidence of Hot-Electron Degradation in GaN-Based MIS-HEMTs Submitted to High Temperature Constant Source Current Stress 13
Exploration of gate trench module for vertical GaN devices 12
Instability of Dynamic- RON and Threshold Voltage in GaN-on-GaN Vertical Field-Effect Transistors 12
Positive and negative threshold voltage instabilities in GaN-based transistors 12
Demonstration of UV-Induced Threshold Voltage Instabilities in Vertical GaN Nanowire Array-Based Transistors 12
Gate Reliability of p-GaN Gate AlGaN/GaN High Electron Mobility Transistors 11
Totale 1.407
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Categoria #
all - tutte 5.028
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 5.028
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/202222 0 0 0 0 0 0 0 0 8 3 3 8
2022/2023197 6 10 2 12 18 7 13 8 45 34 13 29
2023/2024596 31 42 26 29 40 37 51 57 55 46 48 134
2024/2025592 105 88 207 71 47 74 0 0 0 0 0 0
Totale 1.407