Ruzzarin, Maria
 Distribuzione geografica
Continente #
EU - Europa 696
AS - Asia 362
NA - Nord America 347
SA - Sud America 7
AF - Africa 5
Totale 1.417
Nazione #
IT - Italia 450
US - Stati Uniti d'America 328
SG - Singapore 143
HK - Hong Kong 91
CN - Cina 63
DE - Germania 58
FR - Francia 34
CH - Svizzera 25
JP - Giappone 25
KR - Corea 22
CA - Canada 17
RU - Federazione Russa 17
GB - Regno Unito 16
ES - Italia 15
FI - Finlandia 15
NL - Olanda 15
IE - Irlanda 14
BE - Belgio 10
IN - India 8
BR - Brasile 6
CZ - Repubblica Ceca 6
TW - Taiwan 6
AT - Austria 5
DZ - Algeria 4
PL - Polonia 4
SI - Slovenia 4
LT - Lituania 2
SK - Slovacchia (Repubblica Slovacca) 2
AL - Albania 1
AZ - Azerbaigian 1
BG - Bulgaria 1
CR - Costa Rica 1
EC - Ecuador 1
IL - Israele 1
IQ - Iraq 1
LK - Sri Lanka 1
LV - Lettonia 1
MA - Marocco 1
NO - Norvegia 1
PA - Panama 1
Totale 1.417
Città #
Singapore 119
Trento 109
Hong Kong 79
Bologna 37
Milan 33
Ashburn 28
Boardman 23
Santa Clara 21
Chandler 15
Turin 15
Helsinki 13
L’Aquila 13
Dublin 12
Bari 11
Florence 11
Naples 11
Raleigh 11
Beijing 10
Brussels 10
Shanghai 10
Genoa 9
Los Angeles 9
Castello d'Argile 8
Munich 8
Nuremberg 8
Verona 8
Geneva 7
Davis 6
Kronberg 6
Rome 6
Rovereto 6
Sherbrooke 6
Varese 6
Vimercate 6
Yeongdeungpo-gu 6
Aachen 5
Brno 5
Knoxville 5
Miami 5
New York 5
Seocho-gu 5
Bolzano 4
Dijon 4
Ferney-Voltaire 4
Ljubljana 4
Marnaz 4
Marseille 4
Montreal 4
Phoenix 4
Pune 4
Rubano 4
Seoul 4
Shinchiba 4
Vienna 4
Wuxi 4
Yokohama 4
Bellaterra 3
Benevento 3
Bergamo 3
Boydton 3
Cortenuova 3
Cunevo 3
Faenza 3
Ferrara 3
Guangzhou 3
Kolkata 3
Lakewood 3
Lomazzo 3
Madison 3
Massy 3
Padova 3
Sacramento 3
Saint-Genis-Pouilly 3
Sant'Egidio alla Vibrata 3
Suwanee 3
Tokyo 3
Udine 3
Valencia 3
Valperga 3
Xi'an 3
Zalazy 3
Alcoy 2
Amsterdam 2
Avetrana 2
Avezzano 2
Barcelona 2
Botticino 2
Bratislava 2
Campinas 2
Cantù 2
Castenaso 2
Central 2
Charlotte 2
Chavannes 2
Cork 2
Corropoli 2
Dorfen 2
Este 2
Fossano 2
Frankfurt am Main 2
Totale 899
Nome #
Back Side Illuminated SiPM from NIR to NUV light detection 366
NUV-HD SiPMs with Metal-filled Trenches 313
Silicon Photomultipliers technologies for 3D integration 111
3D integration technologies for custom SiPM: From BSI to TSV interconnections 99
3D integration approaches for Silicon Photomultipliers: from backside-illuminated to Through Silicon Via interconnections 53
NUV-HD SiPMs with metal-filled trenches 48
Glass-free SiPMs with Through Silicon Vias for VUV/NUV light detection 42
Timing performance of FBK SiPM NUV-HD-MT technology using LYSO:Ce:Ca crystal 41
Reliability and failure analysis in power GaN-HEMTs: An overview 33
GaN-based MIS-HEMTs: Impact of cascode-mode high temperature source current stress on NBTI shift 31
Negative bias-induced threshold voltage instability in GaN-on-Si power HEMTs 28
Gate Stability and Robustness of In-Situ Oxide GaN Interlayer Based Vertical Trench MOSFETs (OG-FETs) 28
Characterization of charge trapping mechanisms in GaN vertical Fin FETs under positive gate bias 23
Degradation of vertical GaN FETs under gate and drain stress 23
Glass-free SiPMs with Through Silicon Vias for VUV/NUV light detection 22
Reliability of power devices: Bias-induced threshold voltage instability and dielectric breakdown in GaN MIS-HEMTs 21
DIGILOG: A digital-analog SiPM towards 10 ps prompt-photon tagging in TOF-PET 21
Degradation Mechanisms of GaN HEMTs with p-Type Gate under Forward Gate Bias Overstress 20
Analysis of threshold voltage instabilities in semi-vertical GaN-on-Si FETs 19
Degradation of vertical GaN-on-GaN fin transistors: Step-stress and constant voltage experiments 19
Degradation Mechanisms of GaN-Based Vertical Devices: A Review 18
Highly stable threshold voltage in GaN nanowire FETs: The advantages of p-GaN channel/Al2O3gate insulator 17
Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis 17
Instability of Dynamic- RON and Threshold Voltage in GaN-on-GaN Vertical Field-Effect Transistors 14
Positive and negative threshold voltage instabilities in GaN-based transistors 14
Demonstration of UV-Induced Threshold Voltage Instabilities in Vertical GaN Nanowire Array-Based Transistors 14
Evidence of Hot-Electron Degradation in GaN-Based MIS-HEMTs Submitted to High Temperature Constant Source Current Stress 14
Exploration of gate trench module for vertical GaN devices 13
Gate Reliability of p-GaN Gate AlGaN/GaN High Electron Mobility Transistors 12
Totale 1.494
Categoria #
all - tutte 5.764
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 5.764


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/202222 0 0 0 0 0 0 0 0 8 3 3 8
2022/2023197 6 10 2 12 18 7 13 8 45 34 13 29
2023/2024596 31 42 26 29 40 37 51 57 55 46 48 134
2024/2025679 105 88 207 71 47 74 50 37 0 0 0 0
Totale 1.494