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Titolo Data di pubblicazione Autore(i) File
Quantitative SIMS Depth Distribution of Nitrogen in Nitrided Oxide at the SiO2/Si Interface 1-gen-1998 Bersani, Massimo; Fedrizzi, Michele; G., Ferroni; C., Savoia; Anderle, Mariano
Surface Analysis Studies of Bidri Archaeomaterials from the Collection of the British Museum 1-gen-1998 E., Paparazzo; L., Moretto; Bersani, Massimo; Fedrizzi, Michele; Anderle, Mariano
A comparison between mass spectrometry techniques on oxynitrides 1-gen-1998 Bersani, Massimo; M., Sbetti; Anderle, Mariano
Effect of Si on the Electronic Structure of Sputter-Deposited C Films: An Electron Spectrocopy Study 1-gen-1998 Speranza, Giorgio; Bensaada Laidani, Nadhira; Calliari, Lucia; Anderle, Mariano
Surface characterization of biomaterial interfaces 1-gen-1998 Pederzolli, Cecilia; Canteri, Roberto; Fedrizzi, Michele; R., Paradiso; Anderle, Mariano
Dopant Redistribution Analysis in RiSi2/Si Systems by SIMS 1-gen-1998 M., Sbetti; Bersani, Massimo; Fedrizzi, Michele; S. a., Beccara; Anderle, Mariano
Characterization of RTP Oxynitrides by SIMS and XPS Analyses 1-gen-1998 Bersani, Massimo; Vanzetti, Lia Emanuela; M., Sbetti; Anderle, Mariano
Characterisation of RTA Oxynitrides by SIMS and XPS Analyses 1-gen-1998 Bersani, Massimo; Vanzetti, Lia Emanuela; M., Sbetti; Anderle, Mariano
Surface Characterization of Biomaterial Interfaces 1-gen-1998 Pederzolli, Cecilia; Canteri, Roberto; Fedrizzi, Michele; R., Paradiso; Anderle, Mariano
ULSI Technology and Materials: Quantitative Answers by Combined Mass Spectrometry Surface Techniques 1-gen-1998 Bersani, Massimo; Fedrizzi, Michele; M., Sbetti; Anderle, Mariano
Characterization of Carbon and Zirconia Films Deposited on Polycarbonate for Scratch-Proof Coating Applications 1-gen-1998 Bensaada Laidani, Nadhira; Speranza, Giorgio; Alexey, Nefedov; Calliari, Lucia; Anderle, Mariano
Characterization of Functional Films on Solid Substrates by Tof-Sims 1-gen-1998 Canteri, Roberto; Malacarne, Carla; A., Rigo; F., Vianello; L., Zennaro; M., Scarpa; Anderle, Mariano
Caratterizzazione SIMS ToF-SIMS e XPS di Ossidonitruri 1-gen-1998 M., Sbetti; Vanzetti, Lia Emanuela; Bersani, Massimo; Anderle, Mariano
A Study of Physical properties of Vanadium Oxyde-based Gas Sensors 1-gen-1998 R., Rella; P., Siciliano; Vanzetti, Lia Emanuela; Anderle, Mariano; A., Cricenti; R., Generosi; C., Coluzza
Spectroscopic Characterization of Hard Carbon and Carbon-Based Films 1-gen-1998 Bensaada Laidani, Nadhira; Calliari, Lucia; Micheli, Victor; Speranza, Giorgio; Vanzetti, Lia Emanuela; Anderle, Mariano
Study of the discharge gas trapping during thin film growth 1-gen-1999 Anderle, Mariano
Which Colour? 1-gen-1999 Bersani, Massimo; Canteri, Roberto; M., Sbetti; Vanzetti, Lia Emanuela; Anderle, Mariano
A Study of Physical Properties and Gas-surface Interactions of Vanadium Oxide Thin Films 1-gen-1999 R., Rella; P., Siciliano; A., Cricenti; R., Generosi; M., Girasole; Vanzetti, Lia Emanuela; Anderle, Mariano; C., Coluzza
Chemical structure of films grown by AIN laser ablation: an X-ray photoelectron spectroscopy study 1-gen-1999 Bensaada Laidani, Nadhira; Vanzetti, Lia Emanuela; Anderle, Mariano; A., Basillais; C., Boulmer Leborgne; J., Perriere
Joint photoemission and Auger study of the valence band electronic structure of highly oriented pyrofilic graphite 1-gen-1999 Speranza, Giorgio; Calliari, Lucia; A., Santoni; J. C., Lascovich; Anderle, Mariano
Mostrati risultati da 21 a 40 di 200
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