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Prodotti della tipologia (ordinati per Data di deposito in Decrescente ordine): 381 a 400 di 1.261
Titolo Data di pubblicazione Autore(i) File
Ultra shallow Boron junctions in silicon characterization by secondary ion mass spectrometry and synchrotron radiation grazing incidence x-ray fluorescence techniques 1-gen-2009 Giubertoni, Damiano; P., Hoenicke; B., Beckhoff; Pepponi, Giancarlo; Iacob, Erica; Bersani, Massimo
Multi-technique characterization of arsenic and boron ultra low energy implants in silicon within the ANNA consortium. 1-gen-2009 Giubertoni, Damiano; Pepponi, Giancarlo; B., Beckhoff; P., Hoenicke; Gennaro, Salvatore; Meirer, Florian; D., Ingerle; G., Steinhauser; M., Fried; P., Petrik; A., Parisini; M. A., Reading; C., Streli; J. A., van den Berg; Bersani, Massimo
Ultra low energy Boron ion implants in silicon analyzed by not-oxydizing O2+ bombardment and synchrotron radiation grazing incidence x-ray fluorescence 1-gen-2009 Giubertoni, Damiano; Iacob, Erica; Pepponi, Giancarlo; Bersani, Massimo; Anderle, Mariano; P., Hoenicke; B., Beckhoff
Deactivation of sub-melt laser annealed arsenic ultra shallow junctions in silicon during subsequent thermal treatment 1-gen-2009 Giubertoni, Damiano; Pepponi, Giancarlo; M. A., Sahiner; S. P., Kelty; M., Kah; K. J., Kirkby; Meirer, Florian; Gennaro, Salvatore; R., Doherty; M. A., Foad; J. C., Woicik; C., Streli; Bersani, Massimo; P., Pianetta
Ultra low energy Boron implants in silicon characterization by not-oxidizing secondary ion mass spectrometry analysis and soft-ray grazing incidence x-ray fluorescence techniques. 1-gen-2009 Giubertoni, Damiano; Pepponi, Giancarlo; P., Hoenicke; B., Beckhoff; Iacob, Erica; Gennaro, Salvatore; Bersani, Massimo
RF sputtering of oxide films in Ar and Ar-H2 gas mixtures: role of H incorporation in developing transparent conductive coatings 1-gen-2010 Gottardi, Gloria; Bartali, Ruben; Micheli, Victor; Luciu, Ioana; Bensaada Laidani, Nadhira
Multi-nanolayering Effect on Carbon Films Mechanical Properties and Internal Stress 1-gen-2010 Bensaada Laidani, Nadhira; Bartali, Ruben; Micheli, Victor; Gottardi, Gloria; P., Cheyssac
Robotic Tactile Sensing – Technologies and System 1-gen-2010 Dahiya, Ravinder Singh
Nanoindentation as an investigation tool in thin film technology 1-gen-2010 Bartali, Ruben; Micheli, Victor; Gottardi, Gloria; Bensaada Laidani, Nadhira
CELTIC-Cell Electroporation Technology Integrated Circuit" 1-gen-2008 Lorenzelli, Leandro; Salvatore, Iannotta; Scarpa, Marina; Giorgio, Cellere; Collini, Cristian
TIME CHARACTERIZATION OF CAPACITIVE MEMS RF SWITCHES 1-gen-2004 G., Fontana; F., Pianegiani; D., Petri; Soncini, Giovanni; Giacomozzi, Flavio; Lorenzelli, Leandro; Margesin, Benno; G., Turco
Electro-Mechanical Performance Analysis of RF MEMS Switches 1-gen-2004 Lorenzelli, Leandro; Kamal J., Rangra; Collini, Cristian; Giacomozzi, Flavio; Margesin, Benno; Fernando, Pianegiani
Electrical deactivation of ultra shallow arsenic junction formed by laser sub-melt annealing 1-gen-2007 Giubertoni, Damiano
Ultra-Shallow Junction Depth Profiling 1-gen-2008 Giubertoni, Damiano
An EXAFS investigation of Arsenic shallow implant activation in silicon after laser sub-melt annealing 1-gen-2006 Giubertoni, Damiano; Pepponi, Giancarlo; Bersani, Massimo; Gennaro, Salvatore; F., D'Acapito; R., Doherty; M. A., Foad
Multi-technique analytical approach for the study of electrical deactivation of ultra-shallow arsenic junction formed by laser sub-melt annealing" 1-gen-2007 Giubertoni, Damiano; Pepponi, Giancarlo; Gennaro, Salvatore; Bersani, Massimo; M. A., Foad; R., Doherty; P., Pianetta; J. C., Woicik; M. A., Sahiner
As ultra shallow depth profiling: comparison between SIMS and MEIS techniques 1-gen-2004 Giubertoni, Damiano; Barozzi, Mario; S., Pederzoli; Anderle, Mariano; Bersani, Massimo; J. A., van den Berg; M., Werner
Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants" 1-gen-2005 Giubertoni, Damiano; Bersani, Massimo; Barozzi, Mario; S., Pederzoli; Iacob, Erica; J. A., van den Berg; M., Werner
Ultra shallow junctions: Analytical solutions for 90 nm technology node" 1-gen-2003 Giubertoni, Damiano; Barozzi, Mario; Bersani, Massimo; P., Lazzeri; M., Anderle
A CMOS Vision Sensor with Integrated Analog Processing ICTS 2005 1-gen-2005 Massari, Nicola; Gottardi, Massimo; Simoni, Andrea
Prodotti della tipologia (ordinati per Data di deposito in Decrescente ordine): 381 a 400 di 1.261
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Scopri
Tipologia
  • 5 Altro1261
Autore
  • Merler, Stefano74
  • Ajelli, Marco52
  • Perini, Anna51
  • Serafini, Luciano47
  • Ricci, Francesco44
  • Avesani, Paolo37
  • Bersani, Massimo36
  • Giubertoni, Damiano31
  • Anderle, Mariano28
  • Furlanello, Cesare27
Data di pubblicazione
  • 2020 - 202563
  • 2010 - 2019264
  • 2000 - 2009650
  • 1990 - 1999278
  • 1982 - 19896
Editore
  • Fondazione Civiltà Bresciana2
  • Assindustria Trento1
  • Università degli studi di Trento1
  • Università degli Studi di Trento....1
Keyword
  • SIMS13
  • silicon11
  • speech recognition11
  • agent-oriented software engineering9
  • semantic Web9
  • infrastructure8
  • machine learning8
  • agents7
  • arsenic7
  • Computer Science - Artificial Int...7
Lingua
  • eng871
  • ita308
  • spa3
  • ger2
  • rum1
Accesso al fulltext
  • no fulltext1248
  • open8
  • reserved3
  • restricted2