With organic photovoltaic (OPV) technology moving towards commercialisation, high-throughput analytical techniques are required to study the nanoscale morphology of OPV blends. We demonstrate a low-voltage backscattered electron imaging technique in the SEM that combines a solid-state backscattered electron detector with stage biasing to produce a rapid overview of the phase-separated surface morphology of an organic photovoltaic (P3HT:PCBM) blend. Aspects of obtaining the best possible results from the technique are discussed along with the possibility of probing the sub-surface morphology by altering the primary electron beam landing energy.

Application of low-voltage backscattered electron imaging to the mapping of organic photovoltaic blend morphologies

Dapor, Maurizio;
2015

Abstract

With organic photovoltaic (OPV) technology moving towards commercialisation, high-throughput analytical techniques are required to study the nanoscale morphology of OPV blends. We demonstrate a low-voltage backscattered electron imaging technique in the SEM that combines a solid-state backscattered electron detector with stage biasing to produce a rapid overview of the phase-separated surface morphology of an organic photovoltaic (P3HT:PCBM) blend. Aspects of obtaining the best possible results from the technique are discussed along with the possibility of probing the sub-surface morphology by altering the primary electron beam landing energy.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11582/300786
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