Study on the homogeneity of large-size LYSO:Ce crystals for the HEPD-02 electromagnetic calorimeter
2023-01-01 Lega, A.; Follega, F. M.; Gebbia, G.; Iuppa, R.; Nozzoli, F.; Ricci, E.; Rossi, F.; Zuccon, P.
Federated transfer learning: Concept and applications
2021-01-01 Saha, Sudipan; Ahmad, Tahir
Behavioral Analysis of Backdoor Malware Exploiting Heap Overflow Vulnerabilities Using Data Mining and Machine Learning
2023-01-01 Khaliq, Ali Raza; Ullah, Subhan; Ahmad, Tahir; Yadav, Ashish; Majid, M Imran
Food items detection and recognition via multiple deep models
2019-01-01 Khan, Sheema; Ahmad, Kashif; Ahmad, Tahir; Ahmad, Nasir
Randomness testing of non-cryptographic hash functions for real-time hash table based storage and look-up of URLs
2014-01-01 Ahmad, Tahir; Younis, Usman
Digital Reconstructions of Wounded Memories in Kosovo: A Methodological Proposal
2024-01-01 Omenetto, Silvia; Federici, Angelica
Novel Chemoresistive Sensors for Indoor CO2 Monitoring: Validation in an Operational Environment
2024-01-01 Magoni, Marco; Rossi, Arianna; Tralli, Francesco; Bernardoni, Paolo; Fabbri, Barbara; Gaiardo, Andrea; Gherardi, Sandro; Guidi, Vincenzo
A Tuned Lightweight Estimation Algorithm for Low-Cost Phasor Measurement Units
2018-01-01 Tosato, Pietro; Macii, David; Luiso, Mario; Brunelli, Davide; Gallo, Daniele; Landi, Carmine
A Low-Voltage Measurement Testbed for Metrological Characterization of Algorithms for Phasor Measurement Units
2018-01-01 Luiso, Mario; Macii, David; Tosato, Pietro; Brunelli, Davide; Gallo, Daniele; Landi, Carmine
A Radio-Triggered Wireless Sensor Platform Powered by Soil Bacteria
2017-01-01 Brunelli, Davide; Rossi, Maurizio; Tosato, Pietro
Third density and acoustic virial coefficients of helium isotopologues from ab initio calculations
2024-01-01 Binosi, Daniele; Garberoglio, Giovanni; Harvey, Allan H.
Analysis of threshold voltage instabilities in semi-vertical GaN-on-Si FETs
2020-01-01 Mukherjee, K.; Borga, M.; Ruzzarin, M.; De Santi, C.; Stoffels, S.; You, S.; Geens, K.; Liang, H.; Decoutere, S.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Characterization of charge trapping mechanisms in GaN vertical Fin FETs under positive gate bias
2019-01-01 Ruzzarin, M.; De Santi, C.; Chiocchetta, F.; Sun, M.; Palacios, T.; Zanoni, E.; Meneghesso, G.; Meneghini, M.
Degradation of vertical GaN-on-GaN fin transistors: Step-stress and constant voltage experiments
2018-01-01 Ruzzarin, M.; Meneghini, M.; De Santi, C.; Sun, M.; Palacios, T.; Meneghesso, G.; Zanoni, E.
Negative bias-induced threshold voltage instability in GaN-on-Si power HEMTs
2016-01-01 Meneghini, M.; Rossetto, I.; Bisi, D.; Ruzzarin, M.; Van Hove, M.; Stoffels, S.; Wu, T. -L.; Marcon, D.; Decoutere, S.; Meneghesso, G.; Zanoni, E.
Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis
2016-01-01 Rossetto, I.; Meneghini, M.; Rizzato, V.; Ruzzarin, M.; Favaron, A.; Stoffels, S.; Van Hove, M.; Posthuma, N.; Wu, T. -L.; Marcon, D.; Decoutere, S.; Meneghesso, G.; Zanoni, E.
Degradation Mechanisms of GaN HEMTs with p-Type Gate under Forward Gate Bias Overstress
2018-01-01 Ruzzarin, M.; Meneghini, M.; Barbato, A.; Padovan, V.; Haeberlen, O.; Silvestri, M.; Detzel, T.; Meneghesso, G.; Zanoni, E.
Degradation Mechanisms of GaN-Based Vertical Devices: A Review
2020-01-01 Meneghini, M.; Fabris, E.; Ruzzarin, M.; De Santi, C.; Nomoto, K.; Hu, Z.; Li, W.; Gao, X.; Jena, D.; Xing, H. G.; Sun, M.; Palacios, T.; Meneghesso, G.; Zanoni, E.
Instability of Dynamic- RON and Threshold Voltage in GaN-on-GaN Vertical Field-Effect Transistors
2017-01-01 Ruzzarin, M.; Meneghini, M.; Bisi, D.; Sun, M.; Palacios, T.; Meneghesso, G.; Zanoni, E.
Evidence of Hot-Electron Degradation in GaN-Based MIS-HEMTs Submitted to High Temperature Constant Source Current Stress
2016-01-01 Ruzzarin, M.; Meneghini, M.; Rossetto, I.; Van Hove, M.; Stoffels, S.; Wu, T. -L.; Decoutere, S.; Meneghesso, G.; Zanoni, E.
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Study on the homogeneity of large-size LYSO:Ce crystals for the HEPD-02 electromagnetic calorimeter | 1-gen-2023 | Lega, A.; Follega, F. M.; Gebbia, G.; Iuppa, R.; Nozzoli, F.; Ricci, E.; Rossi, F.; Zuccon, P. | |
| Federated transfer learning: Concept and applications | 1-gen-2021 | Saha, Sudipan; Ahmad, Tahir | |
| Behavioral Analysis of Backdoor Malware Exploiting Heap Overflow Vulnerabilities Using Data Mining and Machine Learning | 1-gen-2023 | Khaliq, Ali Raza; Ullah, Subhan; Ahmad, Tahir; Yadav, Ashish; Majid, M Imran | |
| Food items detection and recognition via multiple deep models | 1-gen-2019 | Khan, Sheema; Ahmad, Kashif; Ahmad, Tahir; Ahmad, Nasir | |
| Randomness testing of non-cryptographic hash functions for real-time hash table based storage and look-up of URLs | 1-gen-2014 | Ahmad, Tahir; Younis, Usman | |
| Digital Reconstructions of Wounded Memories in Kosovo: A Methodological Proposal | 1-gen-2024 | Omenetto, Silvia; Federici, Angelica | |
| Novel Chemoresistive Sensors for Indoor CO2 Monitoring: Validation in an Operational Environment | 1-gen-2024 | Magoni, Marco; Rossi, Arianna; Tralli, Francesco; Bernardoni, Paolo; Fabbri, Barbara; Gaiardo, Andrea; Gherardi, Sandro; Guidi, Vincenzo | |
| A Tuned Lightweight Estimation Algorithm for Low-Cost Phasor Measurement Units | 1-gen-2018 | Tosato, Pietro; Macii, David; Luiso, Mario; Brunelli, Davide; Gallo, Daniele; Landi, Carmine | |
| A Low-Voltage Measurement Testbed for Metrological Characterization of Algorithms for Phasor Measurement Units | 1-gen-2018 | Luiso, Mario; Macii, David; Tosato, Pietro; Brunelli, Davide; Gallo, Daniele; Landi, Carmine | |
| A Radio-Triggered Wireless Sensor Platform Powered by Soil Bacteria | 1-gen-2017 | Brunelli, Davide; Rossi, Maurizio; Tosato, Pietro | |
| Third density and acoustic virial coefficients of helium isotopologues from ab initio calculations | 1-gen-2024 | Binosi, Daniele; Garberoglio, Giovanni; Harvey, Allan H. | |
| Analysis of threshold voltage instabilities in semi-vertical GaN-on-Si FETs | 1-gen-2020 | Mukherjee, K.; Borga, M.; Ruzzarin, M.; De Santi, C.; Stoffels, S.; You, S.; Geens, K.; Liang, H.; Decoutere, S.; Meneghesso, G.; Zanoni, E.; Meneghini, M. | |
| Characterization of charge trapping mechanisms in GaN vertical Fin FETs under positive gate bias | 1-gen-2019 | Ruzzarin, M.; De Santi, C.; Chiocchetta, F.; Sun, M.; Palacios, T.; Zanoni, E.; Meneghesso, G.; Meneghini, M. | |
| Degradation of vertical GaN-on-GaN fin transistors: Step-stress and constant voltage experiments | 1-gen-2018 | Ruzzarin, M.; Meneghini, M.; De Santi, C.; Sun, M.; Palacios, T.; Meneghesso, G.; Zanoni, E. | |
| Negative bias-induced threshold voltage instability in GaN-on-Si power HEMTs | 1-gen-2016 | Meneghini, M.; Rossetto, I.; Bisi, D.; Ruzzarin, M.; Van Hove, M.; Stoffels, S.; Wu, T. -L.; Marcon, D.; Decoutere, S.; Meneghesso, G.; Zanoni, E. | |
| Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis | 1-gen-2016 | Rossetto, I.; Meneghini, M.; Rizzato, V.; Ruzzarin, M.; Favaron, A.; Stoffels, S.; Van Hove, M.; Posthuma, N.; Wu, T. -L.; Marcon, D.; Decoutere, S.; Meneghesso, G.; Zanoni, E. | |
| Degradation Mechanisms of GaN HEMTs with p-Type Gate under Forward Gate Bias Overstress | 1-gen-2018 | Ruzzarin, M.; Meneghini, M.; Barbato, A.; Padovan, V.; Haeberlen, O.; Silvestri, M.; Detzel, T.; Meneghesso, G.; Zanoni, E. | |
| Degradation Mechanisms of GaN-Based Vertical Devices: A Review | 1-gen-2020 | Meneghini, M.; Fabris, E.; Ruzzarin, M.; De Santi, C.; Nomoto, K.; Hu, Z.; Li, W.; Gao, X.; Jena, D.; Xing, H. G.; Sun, M.; Palacios, T.; Meneghesso, G.; Zanoni, E. | |
| Instability of Dynamic- RON and Threshold Voltage in GaN-on-GaN Vertical Field-Effect Transistors | 1-gen-2017 | Ruzzarin, M.; Meneghini, M.; Bisi, D.; Sun, M.; Palacios, T.; Meneghesso, G.; Zanoni, E. | |
| Evidence of Hot-Electron Degradation in GaN-Based MIS-HEMTs Submitted to High Temperature Constant Source Current Stress | 1-gen-2016 | Ruzzarin, M.; Meneghini, M.; Rossetto, I.; Van Hove, M.; Stoffels, S.; Wu, T. -L.; Decoutere, S.; Meneghesso, G.; Zanoni, E. |
Legenda icone
- file ad accesso aperto
- file disponibili sulla rete interna
- file disponibili agli utenti autorizzati
- file disponibili solo agli amministratori
- file sotto embargo
- nessun file disponibile
Scopri
Tipologia
- 1 Contributo su Rivista7480
- 4 Contributo in Atti di Convegno ...1
Data di pubblicazione
- In corso di stampa8
- 2020 - 20241890
- 2010 - 20193428
- 2000 - 20091664
- 1990 - 1999396
- 1980 - 198988
- 1970 - 19797
Editore
- Elsevier267
- IEEE50
- American Institute of Physics37
- Springer37
- Wiley35
- IOP Publishing14
- American Physical Society10
- Blackwell Publishing9
- Società Studi Trentini8
- Taylor and Francis8
Rivista
- NUCLEAR INSTRUMENTS & METHODS IN ...258
- JOURNAL OF HIGH ENERGY PHYSICS113
- JOURNAL OF INSTRUMENTATION112
- SENSORS75
- PHYSICAL REVIEW D73
- PHYSICS LETTERS. SECTION B70
- SCIENTIFIC REPORTS64
- JOURNAL OF APPLIED PHYSICS62
- PHYSICAL REVIEW LETTERS61
- IEEE TRANSACTIONS ON NUCLEAR SCIENCE59
Keyword
- Humans127
- High Energy Physics - Phenomenology58
- Models55
- COVID-1942
- Male41
- silicon41
- Animals37
- Nuclear Theory36
- Female35
- SIMS33
Lingua
- eng5830
- ita557
- fre20
- ger15
- spa4
- dut2
- iba2
- jpn1
- mul1
- por1
Accesso al fulltext
- no fulltext6454
- open511
- restricted292
- reserved209
- partially open13
- embargoed1
- mixed1