Dapor, Maurizio

Dapor, Maurizio  

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Risultati 1 - 20 di 139 (tempo di esecuzione: 0.009 secondi).
Titolo Data di pubblicazione Autore(i) File
A comparative study of electron and positron penetration in silicon dioxide 1-gen-2006 Dapor, Maurizio
A comprehensive Monte Carlo calculation of dopant contrast in secondary electron imaging 1-gen-2008 Dapor, Maurizio; Beverley, Inkson; Cornelia, Rodenburg; John, Rodenburg
A Monte Carlo investigation of secondary electron emission from solid targets: Spherical symmetry versus momentum conservation within the classical binary collision model 1-gen-2009 Maurizio Dapor
An analytical approximation of the differential elastic scattering cross-section for electrons in selected oxides 1-gen-2004 Dapor, Maurizio
Analytical transport cross section of medium energy positrons elastically scattered by complex atoms (Z=1-92) 1-gen-1995 Dapor, Maurizio
Angle selective backscattered electron contrast in the low-voltage scanning electron microscope: Simulation and experiment for polymers 1-gen-2016 Wan, Q; Masters, R. C; Lidzey, D; Abrams, K. J; Dapor, Maurizio; Plenderleith, R. A; Rimmer, S; Claeyssens, F; Rodenburg, C.
Anisotropic Approach for Simulating Electron Transport in Layered Materials: Computational and Experimental Study of Highly Oriented Pyrolitic Graphite 1-gen-2018 Azzolini, Martina; Morresi, Tommaso; Abrams, Kerry; Masters, Robert; Stehling, Nicola; Rodenburg, Cornelia; Pugno, Nicola M.; Taioli, Simone; Dapor, Maurizio
Antimateria 1-gen-2001 Dapor, Maurizio; M., Ropele
Application of low-voltage backscattered electron imaging to the mapping of organic photovoltaic blend morphologies 1-gen-2015 Masters, R. C; Wan, Q; Zhou, Y; Sandu, A. M; Dapor, Maurizio; Zhang, H; Lidzey, D. G; Rodenburg, C.
Auger electron spectroscopy and x-ray diffraction studies of Ti-Si layers synthesised by ion implantation 1-gen-1990 S., Vidwans; Arun, Narsale; V., Salvi; A., Rangwala; Luis, Guzman; Fabio, Marchetti; Dapor, Maurizio; Calliari, Lucia
Auger quantitative analysis and preferential sputtering in brass alloys 1-gen-1990 Fabio, Marchetti; Dapor, Maurizio; Stefano, Girardi; M., Cipparrone; P., Tiscione
Backscattered electrons from gold surface films deposited on silicon substrates: a joint experimental and computational investigation to add new potentiality to electron microscopy 1-gen-2013 Dapor, Maurizio; Nicola, Bazzanella; Laura, Toniutti; Antonio, Miotello; Crivellari, Michele; Stefano, Gialanella
Backscattered electrons from surface films deposited on bulk targets: A comparison between computational and experimental results 1-gen-2011 Dapor, Maurizio; Nicola, Bazzanella; Laura, Toniutti; Antonio, Miotello; Stefano, Gialanella
Backscattering of electrons from multilayers 1-gen-1993 Dapor, Maurizio
Backscattering of electrons from selected oxides: MgO, SiO2, and Al2O3 1-gen-1999 Dapor, Maurizio; Antonio, Miotello
Backscattering of electrons from solid targets 1-gen-1990 Dapor, Maurizio
Backscattering of Low Energy Electrons from Carbon Films Deposited on Aluminum: a Monte Carlo Simulation 1-gen-2004 Dapor, Maurizio
Backscattering of Positrons from Solid Targets 1-gen-1998 Dapor, Maurizio; Antonio, Miotello
Canonical transformations for relativistic particles 1-gen-1984 Guido, Cognola; Dapor, Maurizio; Sergio, Zerbini
Caratterizzazione di laminati zincati di produzione industriale 1-gen-1991 L., Fedrizzi; R., Fratesi; G., Biscaglia; G., Roventi; Dapor, Maurizio; P. L., Bonora