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AFM and Raman study of graphene deposited on silicon surfaces nanostructured by ion beam irradiation
2020-01-01 Dell'Anna, Rossana; Iacob, Erica; Tripathi, Manoj; Dalton, Alan; Böttger, Roman; Pepponi, Giancarlo
An EXAFS Investigation of Arsenic shallow implant activation in silicon after laser sub-melt annealing
2006-01-01 Giubertoni, Damiano; Pepponi, Giancarlo; Bersani, Massimo; Gennaro, Salvatore; F., D`acapito; R., Doherty; M., Foad
Analysis of low Z elements on Si wafer surfaces with synchrotron radiation induced total reflection X-ray fluorescence at SSRL, Beamline 3-3: comparison of droplets with spin coated wafers,
2003-01-01 Christina, Streli; Pepponi, Giancarlo; Peter, Wobrauschek; N., Zoger; P., Pianetta; Katharina, Baur; Siegfried, Pahlke; Laszlo, Fabry; Claus, Mantler; Birgid, Kanngiesser; Wolfgang, Malzer
Analysis of low Z elements on Si wafer surfaces with undulator radiation induced total reflection X-ray fluorescence at the PTB beamline at BESSY II
2003-01-01 Christina, Streli; Pepponi, Giancarlo; Peter, Wobrauschek; B., Beckhoff; G., Ulm; Siegfried, Pahlke; Laszlo, Fably; Thomas, Ehmann; Birgid, Kanngiesser; Wolfgang, Malzer; W., Jark
Analysis of organic contaminants on Si wafers with TXRF-NEXAFS
2003-01-01 Pepponi, Giancarlo; Thomas, Ehmann; Christina, Streli; Laszlo, Fabry; Siegfried, Pahlke; Peter, Wobrauschek; Burkhard, Beckhoff; Gerhard, Ulm
Angle resolved XPS for selective characterization of internal and external surface of porous silicon
2017-01-01 Lion, Anna; Bensaada Laidani, Nadhira; Bettotti, Paolo; Piotto, Chiara; Pepponi, Giancarlo; Barozzi, Mario; Scarpa, Marina
Application of synchrotron-radiation-induced TXRF-XANES for arsenic speciation in cucumber (Cucumis sativus L.) xylem sap
2007-01-01 Meirer, Florian; Pepponi, Giancarlo; Christina, Streli; Peter, Wobrauschek; Viktor Gabor, Mihucz; Gyula, Zaray; Viktoria, Czech; Jose, Broekaert; Ursula, Fittschen; Gerald, Falkenberg
Assessment of chemical species of lead accumulated in tidemarks of human articular cartilage by X-ray absorption near-edge structure analysis
2011-01-01 Meirer, Florian; B., Pemmer; Pepponi, Giancarlo; N., Zoeger; P., Wobrauschek; S., Sprio; A., Tampieri; J., Goettlicher; R., Steininger; S., Mangold; P., Roschger; A., Berzlanovich; J. G., Hofstaetter; C., Streli
Aza-crown-ether functionalized graphene oxide for gas sensing and cation trapping applications
2019-01-01 Valt, M; Fabbri, B; Gaiardo, A; Gherardi, S; Casotti, D; Cruciani, G; Pepponi, G; Vanzetti, L; Iacob, E; Malagù, C; Bellutti, P; Guidi, V
Binder-free nanostructured germanium anode for high resilience lithium-ion battery
2022-01-01 Fugattini, S.; Gulzar, U.; Andreoli, A.; Carbone, L.; Boschetti, M.; Bernardoni, P.; Gjestila, M.; Mangherini, G.; Camattari, R.; Li, T.; Monaco, S.; Ricci, M.; Liang, S.; Giubertoni, D.; Pepponi, G.; Bellutti, P.; Ferroni, M.; Ortolani, L.; Morandi, V.; Vincenzi, D.; Zaccaria, R. Proietti
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| AFM and Raman study of graphene deposited on silicon surfaces nanostructured by ion beam irradiation | 1-gen-2020 | Dell'Anna, Rossana; Iacob, Erica; Tripathi, Manoj; Dalton, Alan; Böttger, Roman; Pepponi, Giancarlo | |
| An EXAFS Investigation of Arsenic shallow implant activation in silicon after laser sub-melt annealing | 1-gen-2006 | Giubertoni, Damiano; Pepponi, Giancarlo; Bersani, Massimo; Gennaro, Salvatore; F., D`acapito; R., Doherty; M., Foad | |
| Analysis of low Z elements on Si wafer surfaces with synchrotron radiation induced total reflection X-ray fluorescence at SSRL, Beamline 3-3: comparison of droplets with spin coated wafers, | 1-gen-2003 | Christina, Streli; Pepponi, Giancarlo; Peter, Wobrauschek; N., Zoger; P., Pianetta; Katharina, Baur; Siegfried, Pahlke; Laszlo, Fabry; Claus, Mantler; Birgid, Kanngiesser; Wolfgang, Malzer | |
| Analysis of low Z elements on Si wafer surfaces with undulator radiation induced total reflection X-ray fluorescence at the PTB beamline at BESSY II | 1-gen-2003 | Christina, Streli; Pepponi, Giancarlo; Peter, Wobrauschek; B., Beckhoff; G., Ulm; Siegfried, Pahlke; Laszlo, Fably; Thomas, Ehmann; Birgid, Kanngiesser; Wolfgang, Malzer; W., Jark | |
| Analysis of organic contaminants on Si wafers with TXRF-NEXAFS | 1-gen-2003 | Pepponi, Giancarlo; Thomas, Ehmann; Christina, Streli; Laszlo, Fabry; Siegfried, Pahlke; Peter, Wobrauschek; Burkhard, Beckhoff; Gerhard, Ulm | |
| Angle resolved XPS for selective characterization of internal and external surface of porous silicon | 1-gen-2017 | Lion, Anna; Bensaada Laidani, Nadhira; Bettotti, Paolo; Piotto, Chiara; Pepponi, Giancarlo; Barozzi, Mario; Scarpa, Marina | |
| Application of synchrotron-radiation-induced TXRF-XANES for arsenic speciation in cucumber (Cucumis sativus L.) xylem sap | 1-gen-2007 | Meirer, Florian; Pepponi, Giancarlo; Christina, Streli; Peter, Wobrauschek; Viktor Gabor, Mihucz; Gyula, Zaray; Viktoria, Czech; Jose, Broekaert; Ursula, Fittschen; Gerald, Falkenberg | |
| Assessment of chemical species of lead accumulated in tidemarks of human articular cartilage by X-ray absorption near-edge structure analysis | 1-gen-2011 | Meirer, Florian; B., Pemmer; Pepponi, Giancarlo; N., Zoeger; P., Wobrauschek; S., Sprio; A., Tampieri; J., Goettlicher; R., Steininger; S., Mangold; P., Roschger; A., Berzlanovich; J. G., Hofstaetter; C., Streli | |
| Aza-crown-ether functionalized graphene oxide for gas sensing and cation trapping applications | 1-gen-2019 | Valt, M; Fabbri, B; Gaiardo, A; Gherardi, S; Casotti, D; Cruciani, G; Pepponi, G; Vanzetti, L; Iacob, E; Malagù, C; Bellutti, P; Guidi, V | |
| Binder-free nanostructured germanium anode for high resilience lithium-ion battery | 1-gen-2022 | Fugattini, S.; Gulzar, U.; Andreoli, A.; Carbone, L.; Boschetti, M.; Bernardoni, P.; Gjestila, M.; Mangherini, G.; Camattari, R.; Li, T.; Monaco, S.; Ricci, M.; Liang, S.; Giubertoni, D.; Pepponi, G.; Bellutti, P.; Ferroni, M.; Ortolani, L.; Morandi, V.; Vincenzi, D.; Zaccaria, R. Proietti |
Legenda icone
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Opzioni
Scopri
Tipologia
- 1 Contributo su Rivista 105
- 1 Contributo su Rivista::1.1 Arti... 105
Data di pubblicazione
- 2020 - 2024 23
- 2010 - 2019 46
- 2001 - 2009 36
Editore
- Elsevier 19
- Wiley 5
- ICDD 2
- Scientific.net 2
- American Institute of Physics 1
- C.I.S.B.A. 1
- Springer 1
- Springer Netherlands 1
Rivista
- SPECTROCHIMICA ACTA, PART B: ATOM... 24
- X-RAY SPECTROMETRY 8
- APPLIED SURFACE SCIENCE 4
- NUCLEAR INSTRUMENTS & METHODS IN ... 4
- ANALYTICAL AND BIOANALYTICAL CHEM... 3
- JOURNAL OF APPLIED PHYSICS 3
- JOURNAL OF INSTRUMENTATION 3
- JOURNAL OF VACUUM SCIENCE & TECHN... 3
- NUCLEAR INSTRUMENTS & METHODS IN ... 3
- POWDER DIFFRACTION 3
Keyword
- silicon 7
- annealing 5
- arsenic 5
- elemental semiconductors 4
- EXAFS 4
- ion implantation 4
- ultra shallow junctions 4
- laser annealing 3
- secondary ion mass spectra 3
- semiconductor doping 3
Lingua
- eng 97
- ita 1
Accesso al fulltext
- no fulltext 100
- restricted 3
- open 2