The multiple reflection method of Schmidt has been developed to study the general case of backscattering of electrons from multilayers. Exact expressions have been given for the absorption, backscattering, and transmission of electrons impinging on multilayers which reduce to previously deduced equations concerning supported and unsupported thin films.

Backscattering of electrons from multilayers

Dapor, Maurizio
1993

Abstract

The multiple reflection method of Schmidt has been developed to study the general case of backscattering of electrons from multilayers. Exact expressions have been given for the absorption, backscattering, and transmission of electrons impinging on multilayers which reduce to previously deduced equations concerning supported and unsupported thin films.
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11582/2802
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
social impact