The fractions of transmitted and absorbed electrons as a function of film thickness when the backscattering fraction has become constant have been described by a very simple model. A numerical simulationhas also been written. The model and the numerical simulation are in agreement with the experimental data of Cosslett and Thomas.

Penetration of an electron beam in a solid material: a simple model and a numerical simulation

Dapor, Maurizio
1989-01-01

Abstract

The fractions of transmitted and absorbed electrons as a function of film thickness when the backscattering fraction has become constant have been described by a very simple model. A numerical simulationhas also been written. The model and the numerical simulation are in agreement with the experimental data of Cosslett and Thomas.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11582/2794
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