The fractions of transmitted and absorbed electrons as a function of film thickness when the backscattering fraction has become constant have been described by a very simple model. A numerical simulationhas also been written. The model and the numerical simulation are in agreement with the experimental data of Cosslett and Thomas.
Penetration of an electron beam in a solid material: a simple model and a numerical simulation
Dapor, Maurizio
1989-01-01
Abstract
The fractions of transmitted and absorbed electrons as a function of film thickness when the backscattering fraction has become constant have been described by a very simple model. A numerical simulationhas also been written. The model and the numerical simulation are in agreement with the experimental data of Cosslett and Thomas.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
