Pepponi, Giancarlo
Pepponi, Giancarlo
CRS
32-Channel Detection Unit for Combined XRF-XRD in Mining Transportable Applications
2020-01-01 Carminati, M.; Amirkhani, A.; Gugiatti, M.; Ferrara, E.; Fiorini, C.; Demenev, E.; Pepponi, G.; Ronchin, S.; Ficorella, F.; Borghi, G.; Zorzi, N.; Borovin, E.; Lutterotti, L.
32-Channel silicon strip detection module for combined X-ray fluorescence spectroscopy and X-ray diffractometry analysis
2022-01-01 Carminati, Marco; Borghi, Giacomo; Demenev, Evgeny; Gugiatti, Matteo; Pepponi, Giancarlo; Crivellari, Michele; Ficorella, Francesco; Ronchin, Sabina; Zorzi, Nicola; Borovin, Evgeny; Lutterotti, Luca; Fiorini, Carlo
A combined experimental approach to the study of ancient coins and its application the Venetian “sesino”
2019-01-01 Martorelli, D.; Bortolotti, M.; Capris, M.; Lutterotti, L.; Maines, L.; Pepponi, G.; Gialanella, S.
A Compact Current- and Voltage-Mode Model of Antenna-Coupled FET Terahertz Detectors
2021-01-01 Perenzoni, Matteo; Ali, Muhammad; Pepponi, Giancarlo; Guidi, Vincenzo
A Compact Particle Detector for Space-Based Applications: Development of a Low-Energy Module (LEM) for the NUSES Space Mission
2023-01-01 Nicolaidis, Riccardo; Nozzoli, Francesco; Pepponi, Giancarlo
A new collimated multichannel modular detection system based on Silicon Drift Detectors
2023-01-01 Cirrincione, D.; Antonelli, M.; Aquilanti, G.; Bellutti, P.; Bertuccio, G.; Borghi, G.; Cautero, G.; Ficorella, F.; Gandola, M.; Giuressi, D.; Mele, F.; Menk, R. H.; Olivi, L.; Orzan, G.; Pepponi, G.; Picciotto, A.; Rashevskaya, I.; Rachevski, A.; Stebel, L.; Zampa, G.; Zampa, N.; Zorzi, N.; Vacchi, A.
A new method to prepare few-layers of nanoclusters decorated graphene: Nb2O5/graphene and its gas sensing properties
2018-01-01 Gaiardo, Andrea; Laidani, N.; Ullah, H.; Pepponi, G.; Fedrizzi, M.; Guidi, V.; Bellutti, P.; Fabbri, B.; Malagù, C.; Zonta, G.; Landini, N.; Krik, S.; Bartali, R.; Valt, F. Marchetti and M.
A New Method to Prepare Few-Layers of Nanoclusters Decorated Graphene: Nb2O5/Graphene and Its Gas Sensing Properties
2018-01-01 Gaiardo, Andrea; Laidani, Nadhira; Ullah, Hafeez; Pepponi, Giancarlo; Fedrizzi, Michele; Guidi, Vincenzo; Bellutti, Pierluigi; Fabbri, Barbara; Malagù, Cesare; Zonta, Giulia; Landini, Nicolò; Krik, Soufiane; Bartali, Ruben; Marchetti, Francesca; Valt, Matteo
A new spectrometer for grazing incidence X-ray fluorescence for the characterization of Arsenic implants and Hf based high-k layers
2010-01-01 D., Ingerle; Meirer, Florian; N., Zoeger; Pepponi, Giancarlo; Giubertoni, Damiano; G., Steinhauser; P., Wobrauschek; C., Streli
A new SR-TXRF vacuum chamber for ultra-trace analysis at HASYLAB,
2005-01-01 C., Streli; Pepponi, Giancarlo; P., Wobrauschek; C., Jokubonis; G., Falkenberg; G., Zaray
A new technique for the deposition of standard solutions in total reflection X-ray fluorescence spectrometry (TXRF) using pico-droplets generated by inkjet printers and its applicability for aerosol analysis with SR-TXRF
2006-01-01 U., Fittschen; S., Hauschild; M. A., Amberger; G., Lammel; C., Streli; S., Forster; P., Wobrauschek; C., Jokubonis; Pepponi, Giancarlo; G., Falkenberg; J., Broekaert
A new total reflection X-ray fluorescence vacuum chamber with sample changer analysis using a silicon drift detector for chemical analysis
2004-01-01 C., Streli; P., Wobrauschek; Pepponi, Giancarlo; N., Zoeger
A novel total reflection X-ray fluorescence procedure for the direct determination of trace elements in petrochemical products
2011-01-01 A., Cinosi; N., Andriollo; Pepponi, Giancarlo; D., Monticelli
A relational database and web-interface to x-ray fluorescence related elemental data
2012-01-01 Pepponi, Giancarlo
AFM and Raman study of graphene deposited on silicon surfaces nanostructured by ion beam irradiation
2020-01-01 Dell'Anna, Rossana; Iacob, Erica; Tripathi, Manoj; Dalton, Alan; Böttger, Roman; Pepponi, Giancarlo
An EXAFS Investigation of Arsenic shallow implant activation in silicon after laser sub-melt annealing
2006-01-01 Giubertoni, Damiano; Pepponi, Giancarlo; Bersani, Massimo; Gennaro, Salvatore; F., D`acapito; R., Doherty; M., Foad
An EXAFS investigation of Arsenic shallow implant activation in silicon after laser sub-melt annealing
2006-01-01 Giubertoni, Damiano; Pepponi, Giancarlo; Bersani, Massimo; Gennaro, Salvatore; F., D'Acapito; R., Doherty; M. A., Foad
Analysis of low Z elements on Si wafer surfaces with synchrotron radiation induced total reflection X-ray fluorescence at SSRL, Beamline 3-3: comparison of droplets with spin coated wafers,
2003-01-01 Christina, Streli; Pepponi, Giancarlo; Peter, Wobrauschek; N., Zoger; P., Pianetta; Katharina, Baur; Siegfried, Pahlke; Laszlo, Fabry; Claus, Mantler; Birgid, Kanngiesser; Wolfgang, Malzer
Analysis of low Z elements on Si wafer surfaces with undulator radiation induced total reflection X-ray fluorescence at the PTB beamline at BESSY II
2003-01-01 Christina, Streli; Pepponi, Giancarlo; Peter, Wobrauschek; B., Beckhoff; G., Ulm; Siegfried, Pahlke; Laszlo, Fably; Thomas, Ehmann; Birgid, Kanngiesser; Wolfgang, Malzer; W., Jark
Analysis of organic contaminants on Si wafers with TXRF-NEXAFS
2003-01-01 Pepponi, Giancarlo; Thomas, Ehmann; Christina, Streli; Laszlo, Fabry; Siegfried, Pahlke; Peter, Wobrauschek; Burkhard, Beckhoff; Gerhard, Ulm
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| 32-Channel Detection Unit for Combined XRF-XRD in Mining Transportable Applications | 1-gen-2020 | Carminati, M.; Amirkhani, A.; Gugiatti, M.; Ferrara, E.; Fiorini, C.; Demenev, E.; Pepponi, G.; Ronchin, S.; Ficorella, F.; Borghi, G.; Zorzi, N.; Borovin, E.; Lutterotti, L. | |
| 32-Channel silicon strip detection module for combined X-ray fluorescence spectroscopy and X-ray diffractometry analysis | 1-gen-2022 | Carminati, Marco; Borghi, Giacomo; Demenev, Evgeny; Gugiatti, Matteo; Pepponi, Giancarlo; Crivellari, Michele; Ficorella, Francesco; Ronchin, Sabina; Zorzi, Nicola; Borovin, Evgeny; Lutterotti, Luca; Fiorini, Carlo | |
| A combined experimental approach to the study of ancient coins and its application the Venetian “sesino” | 1-gen-2019 | Martorelli, D.; Bortolotti, M.; Capris, M.; Lutterotti, L.; Maines, L.; Pepponi, G.; Gialanella, S. | |
| A Compact Current- and Voltage-Mode Model of Antenna-Coupled FET Terahertz Detectors | 1-gen-2021 | Perenzoni, Matteo; Ali, Muhammad; Pepponi, Giancarlo; Guidi, Vincenzo | |
| A Compact Particle Detector for Space-Based Applications: Development of a Low-Energy Module (LEM) for the NUSES Space Mission | 1-gen-2023 | Nicolaidis, Riccardo; Nozzoli, Francesco; Pepponi, Giancarlo | |
| A new collimated multichannel modular detection system based on Silicon Drift Detectors | 1-gen-2023 | Cirrincione, D.; Antonelli, M.; Aquilanti, G.; Bellutti, P.; Bertuccio, G.; Borghi, G.; Cautero, G.; Ficorella, F.; Gandola, M.; Giuressi, D.; Mele, F.; Menk, R. H.; Olivi, L.; Orzan, G.; Pepponi, G.; Picciotto, A.; Rashevskaya, I.; Rachevski, A.; Stebel, L.; Zampa, G.; Zampa, N.; Zorzi, N.; Vacchi, A. | |
| A new method to prepare few-layers of nanoclusters decorated graphene: Nb2O5/graphene and its gas sensing properties | 1-gen-2018 | Gaiardo, Andrea; Laidani, N.; Ullah, H.; Pepponi, G.; Fedrizzi, M.; Guidi, V.; Bellutti, P.; Fabbri, B.; Malagù, C.; Zonta, G.; Landini, N.; Krik, S.; Bartali, R.; Valt, F. Marchetti and M. | |
| A New Method to Prepare Few-Layers of Nanoclusters Decorated Graphene: Nb2O5/Graphene and Its Gas Sensing Properties | 1-gen-2018 | Gaiardo, Andrea; Laidani, Nadhira; Ullah, Hafeez; Pepponi, Giancarlo; Fedrizzi, Michele; Guidi, Vincenzo; Bellutti, Pierluigi; Fabbri, Barbara; Malagù, Cesare; Zonta, Giulia; Landini, Nicolò; Krik, Soufiane; Bartali, Ruben; Marchetti, Francesca; Valt, Matteo | |
| A new spectrometer for grazing incidence X-ray fluorescence for the characterization of Arsenic implants and Hf based high-k layers | 1-gen-2010 | D., Ingerle; Meirer, Florian; N., Zoeger; Pepponi, Giancarlo; Giubertoni, Damiano; G., Steinhauser; P., Wobrauschek; C., Streli | |
| A new SR-TXRF vacuum chamber for ultra-trace analysis at HASYLAB, | 1-gen-2005 | C., Streli; Pepponi, Giancarlo; P., Wobrauschek; C., Jokubonis; G., Falkenberg; G., Zaray | |
| A new technique for the deposition of standard solutions in total reflection X-ray fluorescence spectrometry (TXRF) using pico-droplets generated by inkjet printers and its applicability for aerosol analysis with SR-TXRF | 1-gen-2006 | U., Fittschen; S., Hauschild; M. A., Amberger; G., Lammel; C., Streli; S., Forster; P., Wobrauschek; C., Jokubonis; Pepponi, Giancarlo; G., Falkenberg; J., Broekaert | |
| A new total reflection X-ray fluorescence vacuum chamber with sample changer analysis using a silicon drift detector for chemical analysis | 1-gen-2004 | C., Streli; P., Wobrauschek; Pepponi, Giancarlo; N., Zoeger | |
| A novel total reflection X-ray fluorescence procedure for the direct determination of trace elements in petrochemical products | 1-gen-2011 | A., Cinosi; N., Andriollo; Pepponi, Giancarlo; D., Monticelli | |
| A relational database and web-interface to x-ray fluorescence related elemental data | 1-gen-2012 | Pepponi, Giancarlo | |
| AFM and Raman study of graphene deposited on silicon surfaces nanostructured by ion beam irradiation | 1-gen-2020 | Dell'Anna, Rossana; Iacob, Erica; Tripathi, Manoj; Dalton, Alan; Böttger, Roman; Pepponi, Giancarlo | |
| An EXAFS Investigation of Arsenic shallow implant activation in silicon after laser sub-melt annealing | 1-gen-2006 | Giubertoni, Damiano; Pepponi, Giancarlo; Bersani, Massimo; Gennaro, Salvatore; F., D`acapito; R., Doherty; M., Foad | |
| An EXAFS investigation of Arsenic shallow implant activation in silicon after laser sub-melt annealing | 1-gen-2006 | Giubertoni, Damiano; Pepponi, Giancarlo; Bersani, Massimo; Gennaro, Salvatore; F., D'Acapito; R., Doherty; M. A., Foad | |
| Analysis of low Z elements on Si wafer surfaces with synchrotron radiation induced total reflection X-ray fluorescence at SSRL, Beamline 3-3: comparison of droplets with spin coated wafers, | 1-gen-2003 | Christina, Streli; Pepponi, Giancarlo; Peter, Wobrauschek; N., Zoger; P., Pianetta; Katharina, Baur; Siegfried, Pahlke; Laszlo, Fabry; Claus, Mantler; Birgid, Kanngiesser; Wolfgang, Malzer | |
| Analysis of low Z elements on Si wafer surfaces with undulator radiation induced total reflection X-ray fluorescence at the PTB beamline at BESSY II | 1-gen-2003 | Christina, Streli; Pepponi, Giancarlo; Peter, Wobrauschek; B., Beckhoff; G., Ulm; Siegfried, Pahlke; Laszlo, Fably; Thomas, Ehmann; Birgid, Kanngiesser; Wolfgang, Malzer; W., Jark | |
| Analysis of organic contaminants on Si wafers with TXRF-NEXAFS | 1-gen-2003 | Pepponi, Giancarlo; Thomas, Ehmann; Christina, Streli; Laszlo, Fabry; Siegfried, Pahlke; Peter, Wobrauschek; Burkhard, Beckhoff; Gerhard, Ulm |