Sfoglia per Rivista THIN SOLID FILMS
Ageing effects of thin films prepared by ion beam assisted deposition: a multitechnique characterization
1996-01-01 M. G., Beghi; C. E., Bottani; Calliari, Lucia; M., Bonelli; A., Miotello; P. M., Ossi; J., Kovac; G., Scarel; M., Sancrotti
ALD growth, thermal treatments and characterisation of Al2O3 layers
2008-01-01 Elisa, Ghiraldelli; C., Pelosi; Enos, Gombia; G., Chiavarotti; Vanzetti, Lia Emanuela
Aluminum doped zinc oxide coatings at low temperature by atmospheric pressure plasma jet
2020-01-01 Favaro, M.; Zanazzi, E.; Patelli, A.; Carturan, S.; Ceccato, R.; Mulloni, V.; Bortolotti, M.; Quaranta, A.
Auger line-shape analysis of porous silicon: experiment and theory
1996-01-01 L., Dorigoni; L., Pavesi; O., Bisi; Calliari, Lucia; M., Anderle; S., Ossicini
Carbon effect on the phase structure and the hardness of r.f. sputtered zirconia films
2001-01-01 Bensaada Laidani, Nadhira; Micheli, Victor; Anderle, Mariano
Characterisation of ultra-shallow disorder profiles and dielectric functions in ion implanted Si
2011-01-01 I., Mohacsi; P., Petrik; M., Fried; T., Lohner; J. A., van den Berg; M. A., Reading; Giubertoni, Damiano; Barozzi, Mario; A., Parisini
Characterization of the morphology of titanium and titanium (IV) oxide nanolayers deposited on different substrates by application of grazing incidence X-ray diffraction and X-ray reflectometry techniques
2019-01-01 Stabrawa, I.; Kubala-Kukuś, A.; Banaś, D.; Pepponi, G.; Braziewicz, J.; Pajek, M.; Teodorczyk, M.
Coloration of metallic and/or ceramic surfaces obtained by atomic layer deposited nano-coatings
2016-01-01 Guzman, Luis Alberto; Vettoruzzo, F.; Bensaada Laidani, Nadhira
Comparative analysis of high energy electron diffraction patterns from LB films of Cd- and Pb-stearates
1996-01-01 V., Klechkovskaya; Anderle, Mariano; Renzo, Antolini; Canteri, Roberto; L., Feigin; E., Rakova; N., Stiopina
Depth-Profiling Via X-Ray Photoemission and Auger Spectroscopies of N+ Implanted Tungsten Carbides Grown on the Ti-6Al-4V Alloy
1998-01-01 Bensaada Laidani, Nadhira; C., Dorigoni; Antonio, Miotello; Calliari, Lucia; G., Scarel; M., Sancrotti
E-MRS symposium O: “Synthesis, processing and characterization of nanoscale multifunctional oxide films — IV” May 27–31, 2013, Strasbourg, France
2014-01-01 Zoe H., Barber; Maryline Guilloux, Viry; Magdalena, Nistor; Bensaada Laidani, Nadhira
EMRS Spring Meeting 2017, Symposium T: Synthesis, processing and characterization of nanoscale multi functional oxide films VI held May 22-26, 2017, Strasbourg, France
2018-01-01 Nistor, M; Jedrecy, N; Laidani, N; Weidenkaff, A.
Erbium-activated silica zirconia planar waveguides prepared by sol gel route.
2008-01-01 R. R., Gonçalves; Y., Messaddeq; A., Chiasera; Jestin, Yoann; M., Ferrari; S. J. L., Ribeiro
Experimental study by Secondary Ion Mass Spectrometry focused on the relationship between hardness and sputtering rate in hard coatings
2017-01-01 Onorati, Elena; Iacob, Erica; Bartali, Ruben; Barozzi, Mario; Gennaro, Salvatore; Bersani, Massimo
Formation of BN by nitrogen ion implantation of boron deposits
1984-01-01 L., Guzman; F., Marchetti; Calliari, Lucia; I., Scotoni; F., Ferrari
Hydrogen permeation through a slab sample in the case of high hydrogen concentration
2006-01-01 Dapor, Maurizio; A., Miotello; A., Sabbioni
Influence of intrinsic defects on the electrical and optical properties of TiO 2 :Nb films sputtered at room temperature
2018-01-01 Safeen, Kashif; Micheli, Victor; Bartali, Ruben; Gottardi, Gloria; Safeen, Akif; Ullah, Hafeez; Bensaada Laidani, Nadhira
Interactions of photoresist stripping plasmas with nanoporous organo-silicate ultra low dielectric constant dielectrics
2008-01-01 Lazzeri, Paolo; G. S., Oehrlein; G. J., Stueber; R., Mcgowan; E, Busch; Simone, Pederzoli; C., Jeynes; Bersani, Massimo; A., Anderle
Low-power thick-film gas sensor obtained by a combination of screen printing and micromachining techniques
2001-01-01 D., Vincenzi; M. A., Butturi; M., Stefancich; C., Malagù; V., Guidi; M. C., Carotta; G., Martinelli; Guarnieri, Vittorio; Sebastiano, Brida; Margesin, Benno; Giacomozzi, Flavio; Zen, Mario; Alexey, Vasiliev; Alexandr Viktorovich, Pisliakov
Nano-hardness estimation by means of Ar+ ion etching
2015-01-01 Bartali, Ruben; Micheli, Victor; Gottardi, Gloria; Vaccari, Alessandro; Safeen, Mian Akif; Bensaada Laidani, Nadhira
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Ageing effects of thin films prepared by ion beam assisted deposition: a multitechnique characterization | 1-gen-1996 | M. G., Beghi; C. E., Bottani; Calliari, Lucia; M., Bonelli; A., Miotello; P. M., Ossi; J., Kovac; G., Scarel; M., Sancrotti | |
ALD growth, thermal treatments and characterisation of Al2O3 layers | 1-gen-2008 | Elisa, Ghiraldelli; C., Pelosi; Enos, Gombia; G., Chiavarotti; Vanzetti, Lia Emanuela | |
Aluminum doped zinc oxide coatings at low temperature by atmospheric pressure plasma jet | 1-gen-2020 | Favaro, M.; Zanazzi, E.; Patelli, A.; Carturan, S.; Ceccato, R.; Mulloni, V.; Bortolotti, M.; Quaranta, A. | |
Auger line-shape analysis of porous silicon: experiment and theory | 1-gen-1996 | L., Dorigoni; L., Pavesi; O., Bisi; Calliari, Lucia; M., Anderle; S., Ossicini | |
Carbon effect on the phase structure and the hardness of r.f. sputtered zirconia films | 1-gen-2001 | Bensaada Laidani, Nadhira; Micheli, Victor; Anderle, Mariano | |
Characterisation of ultra-shallow disorder profiles and dielectric functions in ion implanted Si | 1-gen-2011 | I., Mohacsi; P., Petrik; M., Fried; T., Lohner; J. A., van den Berg; M. A., Reading; Giubertoni, Damiano; Barozzi, Mario; A., Parisini | |
Characterization of the morphology of titanium and titanium (IV) oxide nanolayers deposited on different substrates by application of grazing incidence X-ray diffraction and X-ray reflectometry techniques | 1-gen-2019 | Stabrawa, I.; Kubala-Kukuś, A.; Banaś, D.; Pepponi, G.; Braziewicz, J.; Pajek, M.; Teodorczyk, M. | |
Coloration of metallic and/or ceramic surfaces obtained by atomic layer deposited nano-coatings | 1-gen-2016 | Guzman, Luis Alberto; Vettoruzzo, F.; Bensaada Laidani, Nadhira | |
Comparative analysis of high energy electron diffraction patterns from LB films of Cd- and Pb-stearates | 1-gen-1996 | V., Klechkovskaya; Anderle, Mariano; Renzo, Antolini; Canteri, Roberto; L., Feigin; E., Rakova; N., Stiopina | |
Depth-Profiling Via X-Ray Photoemission and Auger Spectroscopies of N+ Implanted Tungsten Carbides Grown on the Ti-6Al-4V Alloy | 1-gen-1998 | Bensaada Laidani, Nadhira; C., Dorigoni; Antonio, Miotello; Calliari, Lucia; G., Scarel; M., Sancrotti | |
E-MRS symposium O: “Synthesis, processing and characterization of nanoscale multifunctional oxide films — IV” May 27–31, 2013, Strasbourg, France | 1-gen-2014 | Zoe H., Barber; Maryline Guilloux, Viry; Magdalena, Nistor; Bensaada Laidani, Nadhira | |
EMRS Spring Meeting 2017, Symposium T: Synthesis, processing and characterization of nanoscale multi functional oxide films VI held May 22-26, 2017, Strasbourg, France | 1-gen-2018 | Nistor, M; Jedrecy, N; Laidani, N; Weidenkaff, A. | |
Erbium-activated silica zirconia planar waveguides prepared by sol gel route. | 1-gen-2008 | R. R., Gonçalves; Y., Messaddeq; A., Chiasera; Jestin, Yoann; M., Ferrari; S. J. L., Ribeiro | |
Experimental study by Secondary Ion Mass Spectrometry focused on the relationship between hardness and sputtering rate in hard coatings | 1-gen-2017 | Onorati, Elena; Iacob, Erica; Bartali, Ruben; Barozzi, Mario; Gennaro, Salvatore; Bersani, Massimo | |
Formation of BN by nitrogen ion implantation of boron deposits | 1-gen-1984 | L., Guzman; F., Marchetti; Calliari, Lucia; I., Scotoni; F., Ferrari | |
Hydrogen permeation through a slab sample in the case of high hydrogen concentration | 1-gen-2006 | Dapor, Maurizio; A., Miotello; A., Sabbioni | |
Influence of intrinsic defects on the electrical and optical properties of TiO 2 :Nb films sputtered at room temperature | 1-gen-2018 | Safeen, Kashif; Micheli, Victor; Bartali, Ruben; Gottardi, Gloria; Safeen, Akif; Ullah, Hafeez; Bensaada Laidani, Nadhira | |
Interactions of photoresist stripping plasmas with nanoporous organo-silicate ultra low dielectric constant dielectrics | 1-gen-2008 | Lazzeri, Paolo; G. S., Oehrlein; G. J., Stueber; R., Mcgowan; E, Busch; Simone, Pederzoli; C., Jeynes; Bersani, Massimo; A., Anderle | |
Low-power thick-film gas sensor obtained by a combination of screen printing and micromachining techniques | 1-gen-2001 | D., Vincenzi; M. A., Butturi; M., Stefancich; C., Malagù; V., Guidi; M. C., Carotta; G., Martinelli; Guarnieri, Vittorio; Sebastiano, Brida; Margesin, Benno; Giacomozzi, Flavio; Zen, Mario; Alexey, Vasiliev; Alexandr Viktorovich, Pisliakov | |
Nano-hardness estimation by means of Ar+ ion etching | 1-gen-2015 | Bartali, Ruben; Micheli, Victor; Gottardi, Gloria; Vaccari, Alessandro; Safeen, Mian Akif; Bensaada Laidani, Nadhira |
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