Joint AES (Auger Electron Spectroscopy) and XPS (X-Ray Photoelectron Spectroscopy) measurements on the WC/Ti-6Al-4V system are presented as a part of a study about the effects of N implantation on the adhesion properties of this ceramic/metal couple. The aim is to investigate the atomic redistributions and the interface chemistry associated with N implantation. Under the implantation conditions considered here, W and C are seen to decouple in the interface region: C goes deeper into the substrate with respect to W forming a TiC phase in the thin metal layer facing the ceramic overlayer. Moreover, a TiN phase develops within the layer of the metallic alloy where implanted N atoms are present
Depth-Profiling Via X-Ray Photoemission and Auger Spectroscopies of N+ Implanted Tungsten Carbides Grown on the Ti-6Al-4V Alloy
Bensaada Laidani, Nadhira;Calliari, Lucia;
1998-01-01
Abstract
Joint AES (Auger Electron Spectroscopy) and XPS (X-Ray Photoelectron Spectroscopy) measurements on the WC/Ti-6Al-4V system are presented as a part of a study about the effects of N implantation on the adhesion properties of this ceramic/metal couple. The aim is to investigate the atomic redistributions and the interface chemistry associated with N implantation. Under the implantation conditions considered here, W and C are seen to decouple in the interface region: C goes deeper into the substrate with respect to W forming a TiC phase in the thin metal layer facing the ceramic overlayer. Moreover, a TiN phase develops within the layer of the metallic alloy where implanted N atoms are presentI documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
