Noise properties of porous silicon/single-crystalline silicon structures under exposure to active gases are investigated for the first time. Current-voltage and noise characteristics of samples are measured. The Al/porous silicon/single-crystalline Si/Al sandwich-structures were placed in a special chamber and the influence of adsorption of various gases on low-frequency noise of the samples was revealed. The adsorption changes the dynamics of the interaction of charge carriers with traps, i.e. the noise characteristics of the samples. The results are encouraging for practical applications of porous silicon structures as gas sensors using measurements of low-frequency noise characteristics.

Low-frequency noise in structures with porous silicon in different gas media

Ghulinyan, Mher;
2007

Abstract

Noise properties of porous silicon/single-crystalline silicon structures under exposure to active gases are investigated for the first time. Current-voltage and noise characteristics of samples are measured. The Al/porous silicon/single-crystalline Si/Al sandwich-structures were placed in a special chamber and the influence of adsorption of various gases on low-frequency noise of the samples was revealed. The adsorption changes the dynamics of the interaction of charge carriers with traps, i.e. the noise characteristics of the samples. The results are encouraging for practical applications of porous silicon structures as gas sensors using measurements of low-frequency noise characteristics.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11582/9250
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