Charge collection measurements with p-type Magnetic Czochralski silicon single pad detectors

The charge collected from beta source particles in single pad detectors produced on p-type Magnetic Czochralski (MCz) silicon wafers has been measured before and after irradiation with 26MeV protons. After a 1MeV neutron equivalent fluence of 1x10E15 cm-2 the collected charge is reduced to 77% at bias voltages below 900 V. This result is compared with previous results from charge collection measurements.

Titolo: Charge collection measurements with p-type Magnetic Czochralski silicon single pad detectors
Autori: 
Boscardin, Maurizio
Piemonte, Claudio
Zorzi, Nicola
mostra contributor esterni 
Data di pubblicazione: 2007
Rivista: 
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT  
Abstract: The charge collected from beta source particles in single pad detectors produced on p-type Magnetic Czochralski (MCz) silicon wafers has been measured before and after irradiation with 26MeV protons. After a 1MeV neutron equivalent fluence of 1x10E15 cm-2 the collected charge is reduced to 77% at bias voltages below 900 V. This result is compared with previous results from charge collection measurements.
Handle: http://hdl.handle.net/11582/3297
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http://hdl.handle.net/11582/3297
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