This work presents the latest findings of an ongoing research project where the angular dependence of XRF detection could be exploited for the topographical study of the specimen. It presents the results of a simulation framework and of measurements performed with a new detector system deployed on the TwinMic beamline (Elettra Sincrotrone Trieste, Trieste, Italy).
XRF topography information: Simulations and data from a novel silicon drift detector system
Picciotto, A.;Borghi, G.;Ficorella, F.;Zorzi, N.;Bellutti, P.;
2019-01-01
Abstract
This work presents the latest findings of an ongoing research project where the angular dependence of XRF detection could be exploited for the topographical study of the specimen. It presents the results of a simulation framework and of measurements performed with a new detector system deployed on the TwinMic beamline (Elettra Sincrotrone Trieste, Trieste, Italy).File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.