In this paper, we present a new solar cell design conceived for low–medium concentrator photovoltaic applications. The proposed cell is based on the emitter-wrap-through concept featuring grooved p-doped hole base contacts. The cell is fabricated by realizing an array composed of holes of two alternating doping types obtained by means of a deep reactive ion etching technique. Measurements under 1-sun illumination confirm the advantages of the considered architectures in terms of short-circuit current density and photon collection properties with respect to conventional front- and back-contact solar cells. Three-dimensional numerical simulations, calibrated starting from the measured dark J–V characteristics, are exploited to investigate the performance under concentrated light (maximum efficiency 21.4% at 44 suns) and to understand, especially in the case of highly resistive substrates, the impact of the p-doped holes depth in terms of resistive losses.

Fabrication, Simulation, and Experimental Characterization of EWT Solar Cells With Deep Grooved Base Contact

Paternoster, Giovanni;Bellutti, Pierluigi;Ferrario, Lorenza;
2016-01-01

Abstract

In this paper, we present a new solar cell design conceived for low–medium concentrator photovoltaic applications. The proposed cell is based on the emitter-wrap-through concept featuring grooved p-doped hole base contacts. The cell is fabricated by realizing an array composed of holes of two alternating doping types obtained by means of a deep reactive ion etching technique. Measurements under 1-sun illumination confirm the advantages of the considered architectures in terms of short-circuit current density and photon collection properties with respect to conventional front- and back-contact solar cells. Three-dimensional numerical simulations, calibrated starting from the measured dark J–V characteristics, are exploited to investigate the performance under concentrated light (maximum efficiency 21.4% at 44 suns) and to understand, especially in the case of highly resistive substrates, the impact of the p-doped holes depth in terms of resistive losses.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11582/305677
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