Modeling varicella and zoster in Europe: can we cope with the current decision paralysis on mass immunization?
2011-01-01 P., Manfredi; A., Melegaro; G., Scalia Tomba; Merler, Stefano; Poletti, Piero
Computing Synthetic contact matrices through modeling of social mixing patterns relevant to infectious disease transmission
2011-01-01 Fumanelli, Laura; Ajelli, Marco; P., Manfredi; A., Vespignani; Merler, Stefano
Simulation models for public health prepareness
2011-01-01 Merler, Stefano; Ajelli, Marco
Contact patterns and transmission of varicella in Europe
2011-01-01 E., Dal Fava; Fumanelli, Laura; Merler, Stefano; L., Marangi; Ajelli, Marco; A., Melegaro; Z., Shkedy; G., Scalia Tomba; C., Rizzo; P., Manfredi
Modelling varicella and zoster in Europe: can we cope with the current decision paralysis on mass immunization?
2011-01-01 Poletti, Piero; P., Manfredi; A., Melegaro; Merler, Stefano; G., Scalia Tomba; Ajelli, Marco
Combined XPS, SIMS and AFM analysis of silicon nano-crystals embedded in silicon oxide layers
2007-01-01 Vanzetti, Lia Emanuela; Barozzi, Mario; Iacob, Erica; Bersani, Massimo; Pucker, Georg; Bellutti, Pierluigi
Surface investigation of archeological glasses by secondary ion mass spectrometry
2005-01-01 S., Pederzoli; Vanzetti, Lia Emanuela; Iacob, Erica; Giubertoni, Damiano; Barozzi, Mario; Lazzeri, Paolo; Bersani, Massimo; Anderle, Mariano; G., Giunta; E., di Paola
Ultra shallow junction analysis for technology nodes beyond 65nm
2005-01-01 Giubertoni, Damiano; Iacob, Erica; Barozzi, Mario; S., Pederzoli; Vanzetti, Lia Emanuela; Anderle, Mariano; Bersani, Massimo
Ultra thin oxynitride profiles by XPS etch-back analyses
2004-01-01 Vanzetti, Lia Emanuela; Iacob, Erica; Barozzi, Mario; Giubertoni, Damiano; Bersani, Massimo; Anderle, Mariano; P., Bacciaglia; B., Crivelli; M. L., Polignano; M. E., Vitali
SIMS analytical conditions optimized to reduce the morphology induced by sputtering with an oblique O2+ beam
2004-01-01 Barozzi, Mario; Giubertoni, Damiano; S., Pederzoli; Iacob, Erica; Bersani, Massimo
Induced roughness during SIMS analysis by low energy Cs+ beam
2004-01-01 Iacob, Erica; Giubertoni, Damiano; Barozzi, Mario; S., Pederzoli; Bersani, Massimo
Chemical and morphological characterization of nanoporous silica low-k dielectrics etched in fluorocarbon plasmas
2004-01-01 Lazzeri, Paolo; Anderle, Mariano; X., Hua; Iacob, Erica; C. K., Inoki; P., Jiang; T. S., Kuan; G. S., Oehrlein
Nanostructures by assembling clusters and molecules from supersonic beams: A novel approach for gas sensing devices
2003-01-01 Toccoli, Tullio; Pallaoro, Alessia; Coppedè, Nicola; Iannotta, Salvatore; E., Barborini; P., Milani; A. M., Taurino; P., Siciliano; Iacob, Erica; Anderle, Mariano
Morphology structure and interfaces in the preparation of films by SUMBE for gas sensing
2003-01-01 Iacob, Erica; Anderle, Mariano; Bersani, Massimo; Coppedè, Nicola; Lazzeri, Paolo; Micheli, Victor; Pallaoro, Alessia; Toccoli, Tullio; Iannotta, Salvatore
Material characterization and the formation of nanoporous PMSSQ low-k dielectrics
2003-01-01 Lazzeri, Paolo; Vanzetti, Lia Emanuela; Iacob, Erica; Bersani, Massimo; Anderle, Mariano; J. J., Park; Z. Lin R. M., Briber; G. W., Rubloff; R. D., Miller
Nitrided Silicon-Silicon Dioxide Interface: Electrical And Physico-Chemical Characterization By Complementary Surface Analysis Techniques
2002-01-01 Vanzetti, Lia Emanuela; Iacob, Erica; Barozzi, Mario; Giubertoni, Damiano; Bersani, Massimo; Anderle, Mariano; P., Bacciaglia; B., Crivelli; M. L., Polignano; M. E., Vitali
Arsenic Shallow Implant Characterization by Magnetic Sector and TOF-SIMS Instruments
2002-01-01 Giubertoni, Damiano; Barozzi, Mario; Lazzeri, Paolo; Anderle, Mariano; Bersani, Massimo
Tof-Sims and XPS Characterization of urban aerosols for pollution studies
2001-01-01 Lazzeri, Paolo; G., Clauser; Lui, Alberto; Iacob, Erica; G., Tonidandel; Anderle, Mariano
D-Sims and TOF-SIMS quantitative depth profiles on ultra thin oxinitrides
2001-01-01 Bersani, Massimo; Giubertoni, Damiano; Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Anderle, Mariano; P., Lazzeri; B., Crivelli; F., Zanderigo
The Micro-District: Strategies for Energy Positive Buildings and Communities
2011-01-01 Crema, Luigi
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Modeling varicella and zoster in Europe: can we cope with the current decision paralysis on mass immunization? | 1-gen-2011 | P., Manfredi; A., Melegaro; G., Scalia Tomba; Merler, Stefano; Poletti, Piero | |
Computing Synthetic contact matrices through modeling of social mixing patterns relevant to infectious disease transmission | 1-gen-2011 | Fumanelli, Laura; Ajelli, Marco; P., Manfredi; A., Vespignani; Merler, Stefano | |
Simulation models for public health prepareness | 1-gen-2011 | Merler, Stefano; Ajelli, Marco | |
Contact patterns and transmission of varicella in Europe | 1-gen-2011 | E., Dal Fava; Fumanelli, Laura; Merler, Stefano; L., Marangi; Ajelli, Marco; A., Melegaro; Z., Shkedy; G., Scalia Tomba; C., Rizzo; P., Manfredi | |
Modelling varicella and zoster in Europe: can we cope with the current decision paralysis on mass immunization? | 1-gen-2011 | Poletti, Piero; P., Manfredi; A., Melegaro; Merler, Stefano; G., Scalia Tomba; Ajelli, Marco | |
Combined XPS, SIMS and AFM analysis of silicon nano-crystals embedded in silicon oxide layers | 1-gen-2007 | Vanzetti, Lia Emanuela; Barozzi, Mario; Iacob, Erica; Bersani, Massimo; Pucker, Georg; Bellutti, Pierluigi | |
Surface investigation of archeological glasses by secondary ion mass spectrometry | 1-gen-2005 | S., Pederzoli; Vanzetti, Lia Emanuela; Iacob, Erica; Giubertoni, Damiano; Barozzi, Mario; Lazzeri, Paolo; Bersani, Massimo; Anderle, Mariano; G., Giunta; E., di Paola | |
Ultra shallow junction analysis for technology nodes beyond 65nm | 1-gen-2005 | Giubertoni, Damiano; Iacob, Erica; Barozzi, Mario; S., Pederzoli; Vanzetti, Lia Emanuela; Anderle, Mariano; Bersani, Massimo | |
Ultra thin oxynitride profiles by XPS etch-back analyses | 1-gen-2004 | Vanzetti, Lia Emanuela; Iacob, Erica; Barozzi, Mario; Giubertoni, Damiano; Bersani, Massimo; Anderle, Mariano; P., Bacciaglia; B., Crivelli; M. L., Polignano; M. E., Vitali | |
SIMS analytical conditions optimized to reduce the morphology induced by sputtering with an oblique O2+ beam | 1-gen-2004 | Barozzi, Mario; Giubertoni, Damiano; S., Pederzoli; Iacob, Erica; Bersani, Massimo | |
Induced roughness during SIMS analysis by low energy Cs+ beam | 1-gen-2004 | Iacob, Erica; Giubertoni, Damiano; Barozzi, Mario; S., Pederzoli; Bersani, Massimo | |
Chemical and morphological characterization of nanoporous silica low-k dielectrics etched in fluorocarbon plasmas | 1-gen-2004 | Lazzeri, Paolo; Anderle, Mariano; X., Hua; Iacob, Erica; C. K., Inoki; P., Jiang; T. S., Kuan; G. S., Oehrlein | |
Nanostructures by assembling clusters and molecules from supersonic beams: A novel approach for gas sensing devices | 1-gen-2003 | Toccoli, Tullio; Pallaoro, Alessia; Coppedè, Nicola; Iannotta, Salvatore; E., Barborini; P., Milani; A. M., Taurino; P., Siciliano; Iacob, Erica; Anderle, Mariano | |
Morphology structure and interfaces in the preparation of films by SUMBE for gas sensing | 1-gen-2003 | Iacob, Erica; Anderle, Mariano; Bersani, Massimo; Coppedè, Nicola; Lazzeri, Paolo; Micheli, Victor; Pallaoro, Alessia; Toccoli, Tullio; Iannotta, Salvatore | |
Material characterization and the formation of nanoporous PMSSQ low-k dielectrics | 1-gen-2003 | Lazzeri, Paolo; Vanzetti, Lia Emanuela; Iacob, Erica; Bersani, Massimo; Anderle, Mariano; J. J., Park; Z. Lin R. M., Briber; G. W., Rubloff; R. D., Miller | |
Nitrided Silicon-Silicon Dioxide Interface: Electrical And Physico-Chemical Characterization By Complementary Surface Analysis Techniques | 1-gen-2002 | Vanzetti, Lia Emanuela; Iacob, Erica; Barozzi, Mario; Giubertoni, Damiano; Bersani, Massimo; Anderle, Mariano; P., Bacciaglia; B., Crivelli; M. L., Polignano; M. E., Vitali | |
Arsenic Shallow Implant Characterization by Magnetic Sector and TOF-SIMS Instruments | 1-gen-2002 | Giubertoni, Damiano; Barozzi, Mario; Lazzeri, Paolo; Anderle, Mariano; Bersani, Massimo | |
Tof-Sims and XPS Characterization of urban aerosols for pollution studies | 1-gen-2001 | Lazzeri, Paolo; G., Clauser; Lui, Alberto; Iacob, Erica; G., Tonidandel; Anderle, Mariano | |
D-Sims and TOF-SIMS quantitative depth profiles on ultra thin oxinitrides | 1-gen-2001 | Bersani, Massimo; Giubertoni, Damiano; Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Anderle, Mariano; P., Lazzeri; B., Crivelli; F., Zanderigo | |
The Micro-District: Strategies for Energy Positive Buildings and Communities | 1-gen-2011 | Crema, Luigi |
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Tipologia
- 5 Altro1252
Data di pubblicazione
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- 2000 - 2009650
- 1990 - 1999278
- 1982 - 19896
Editore
- Fondazione Civiltà Bresciana2
- Assindustria Trento1
- Università degli studi di Trento1
- Università degli Studi di Trento....1
Keyword
- SIMS13
- silicon11
- speech recognition11
- agent-oriented software engineering9
- semantic Web9
- infrastructure8
- machine learning8
- agents7
- arsenic7
- multiagent system7
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- eng866
- ita307
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- rum1
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