We report the experimental characterization of porous silicon free-standing coupled microcavities. We have grown free-standing structures of up to 109 stacked layers. Free-standing structures are interesting because reflectance spectra can be measured on both sides of the samples. The comparison of reflectance spectra from the front and back side indicates that the porous silicon anodization process has a natural drift along the growth direction. However, we demonstrate that this drift can be compensated, showing a homogeneous structure of ten coupled microcavities, in which all ten resonance peaks are resolved in both transmission and reflection measurements.

Porous silicon Free-standing coupled microcavities

Ghulinyan, Mher;
2003-01-01

Abstract

We report the experimental characterization of porous silicon free-standing coupled microcavities. We have grown free-standing structures of up to 109 stacked layers. Free-standing structures are interesting because reflectance spectra can be measured on both sides of the samples. The comparison of reflectance spectra from the front and back side indicates that the porous silicon anodization process has a natural drift along the growth direction. However, we demonstrate that this drift can be compensated, showing a homogeneous structure of ten coupled microcavities, in which all ten resonance peaks are resolved in both transmission and reflection measurements.
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11582/20529
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
social impact