We report measurements of angle-resolved light scattering in porous silicon films. Scattering rings were observed, and their aperture allowed to measure optical birefringence. These values are confirmed with other techniques. We study birefringence changes when pores are filled with liquids, after thermal annealing, and when the porous silicon layer is chemically etched in HF for different times. A decrease of optical anisotropy was observed in all cases.
Scattering rings as tool for birefringence measurements in porous silicon
Ghulinyan, Mher;
2003-01-01
Abstract
We report measurements of angle-resolved light scattering in porous silicon films. Scattering rings were observed, and their aperture allowed to measure optical birefringence. These values are confirmed with other techniques. We study birefringence changes when pores are filled with liquids, after thermal annealing, and when the porous silicon layer is chemically etched in HF for different times. A decrease of optical anisotropy was observed in all cases.File in questo prodotto:
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