Functional characterization of planar sensors with active edges using laser and X-ray beam scans

We report on the functional characterization of planar sensors with active edges fabricated at Fondazione Bruno Kessler (FBK), Trento, Italy. The measurements here reported were performed by means of laser and X-ray beam scans mainly focusing on the signal efficiency of the edge region of the devices. Results are very encouraging and show very good sensitivity up to few microns away from the device physical edge.



Titolo: Functional characterization of planar sensors with active edges using laser and X-ray beam scans
Autori: 
Povoli, Marco
Bagolini, Alvise
Boscardin, Maurizio
Dalla Betta, Gian Franco
Giacomini, Gabriele
Zorzi, Nicola
mostra contributor esterni 
Data di pubblicazione: 2013
Rivista: 
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT  
Abstract: We report on the functional characterization of planar sensors with active edges fabricated at Fondazione Bruno Kessler (FBK), Trento, Italy. The measurements here reported were performed by means of laser and X-ray beam scans mainly focusing on the signal efficiency of the edge region of the devices. Results are very encouraging and show very good sensitivity up to few microns away from the device physical edge.
Handle: http://hdl.handle.net/11582/115202
Appare nelle tipologie:1.1 Articolo in rivista

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http://hdl.handle.net/11582/115202
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