Barozzi, Mario
Barozzi, Mario
MTSD
2D Optical Gratings Based on Hexagonal Voids on Transparent Elastomeric Substrate
2018-01-01 Piccolo, Valentina; Chiappini, Andrea; Armellini, Cristina; Barozzi, Mario; Lukowiak, Anna; Sazio, Pier-John; Vaccari, Alessandro; Ferrari, Maurizio; Zonta, Daniele
A very low-energy apparatus for positron scattering on atoms and molecules
2000-01-01 G. P., Karwasz; Barozzi, Mario; Marco, Bettonte; Roberto, Brusa; Antonio, Zecca
Activated dopant effect on low energy SIMS depth profiling
2005-01-01 Barozzi, Mario; Giubertoni, Damiano; S., Pederzoli; Anderle, Mariano; Iacob, Erica; Bersani, Massimo
Analytical methodology development for Silicon rich oxide chemical physical characterization
2007-01-01 Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Anderle, Mariano; Pucker, Georg; Kompocholis, Constantine
Analytical Methodology Development for Silicon-rich-oxide Chemical and Physical Characterization
2007-01-01 Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Anderle, Mariano; Pucker, Georg; C., Kompocholis
Analytical methodology development for SRO chemical physical characterization
2006-01-01 Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Pucker, Georg; C., Kompocholis
Angle resolved XPS for selective characterization of internal and external surface of porous silicon
2017-01-01 Lion, Anna; Bensaada Laidani, Nadhira; Bettotti, Paolo; Piotto, Chiara; Pepponi, Giancarlo; Barozzi, Mario; Scarpa, Marina
Applicazioni della spettrometria di massa a materiali e tecniche di ultima generazione
2000-01-01 Bersani, Massimo; M., Sbetti; Lazzeri, Paolo; Giubertoni, Damiano; Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Anderle, Mariano
Arsenic shallow depth profiling: accurate quantification in SiO2/Si stack
2004-01-01 Barozzi, Mario; Giubertoni, Damiano; Anderle, Mariano; Bersani, Massimo
Arsenic shallow implant characterization by magnetic sector and time of flight SIMS instruments
2002-01-01 Bersani, Massimo; Lazzeri, Paolo; Giubertoni, Damiano; Barozzi, Mario; Marchi E., Boscolo; Anderle, Mariano
Arsenic Shallow Implant Characterization by Magnetic Sector and TOF-SIMS Instruments
2002-01-01 Giubertoni, Damiano; Barozzi, Mario; Lazzeri, Paolo; Anderle, Mariano; Bersani, Massimo
Arsenic uphill diffusion during shallow junction formation
2006-01-01 M., Ferri; S., Solmi; A., Parisini; Bersani, Massimo; Giubertoni, Damiano; Barozzi, Mario
As ultra shallow depth profiling: comparison between SIMS and MEIS techniques
2004-01-01 Giubertoni, Damiano; Barozzi, Mario; S., Pederzoli; Anderle, Mariano; Bersani, Massimo; J. A., van den Berg; M., Werner
Boron Ultra Low Energy SIMS Depth Profiling Improved by Rotating Stage
2006-01-01 Bersani, Massimo; Giubertoni, Damiano; Iacob, Erica; Barozzi, Mario; S., Pederzoli; Vanzetti, Lia Emanuela; M., Anderle
Boron ultra low energy SIMS depth profiling improved by rotating stage
2005-01-01 Giubertoni, Damiano; Iacob, Erica; Barozzi, Mario; S., Pederzoli; Vanzetti, Lia Emanuela; Anderle, Mariano; Bersani, Massimo
Boron ultra shallow SIMS profiles optimization using oblique incidence oxygen beam
2003-01-01 Giubertoni, Damiano; Barozzi, Mario; E., Boscolo; M., Anderle; Bersani, Massimo
Characterisation of ultra-shallow disorder profiles and dielectric functions in ion implanted Si
2011-01-01 I., Mohacsi; P., Petrik; M., Fried; T., Lohner; J. A., van den Berg; M. A., Reading; Giubertoni, Damiano; Barozzi, Mario; A., Parisini
Combined XPS, SIMS and AFM analysis of silicon nano-crystals embedded in silicon oxide layers
2007-01-01 Vanzetti, Lia Emanuela; Barozzi, Mario; Iacob, Erica; Bersani, Massimo; Pucker, Georg; Bellutti, Pierluigi
Combined XPS, SIMS and AFM analysis of silicon nanocrystals embedded in silicon oxide layers
2008-01-01 Vanzetti, Lia Emanuela; Barozzi, Mario; Iacob, Erica; Bersani, Massimo; Pucker, Georg; Bellutti, Pierluigi
Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants
2006-01-01 Giubertoni, Damiano; Bersani, Massimo; Barozzi, Mario; S., Pederzoli; Iacob, Erica; J., van den Berg; M., Werner
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| 2D Optical Gratings Based on Hexagonal Voids on Transparent Elastomeric Substrate | 1-gen-2018 | Piccolo, Valentina; Chiappini, Andrea; Armellini, Cristina; Barozzi, Mario; Lukowiak, Anna; Sazio, Pier-John; Vaccari, Alessandro; Ferrari, Maurizio; Zonta, Daniele | |
| A very low-energy apparatus for positron scattering on atoms and molecules | 1-gen-2000 | G. P., Karwasz; Barozzi, Mario; Marco, Bettonte; Roberto, Brusa; Antonio, Zecca | |
| Activated dopant effect on low energy SIMS depth profiling | 1-gen-2005 | Barozzi, Mario; Giubertoni, Damiano; S., Pederzoli; Anderle, Mariano; Iacob, Erica; Bersani, Massimo | |
| Analytical methodology development for Silicon rich oxide chemical physical characterization | 1-gen-2007 | Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Anderle, Mariano; Pucker, Georg; Kompocholis, Constantine | |
| Analytical Methodology Development for Silicon-rich-oxide Chemical and Physical Characterization | 1-gen-2007 | Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Anderle, Mariano; Pucker, Georg; C., Kompocholis | |
| Analytical methodology development for SRO chemical physical characterization | 1-gen-2006 | Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Pucker, Georg; C., Kompocholis | |
| Angle resolved XPS for selective characterization of internal and external surface of porous silicon | 1-gen-2017 | Lion, Anna; Bensaada Laidani, Nadhira; Bettotti, Paolo; Piotto, Chiara; Pepponi, Giancarlo; Barozzi, Mario; Scarpa, Marina | |
| Applicazioni della spettrometria di massa a materiali e tecniche di ultima generazione | 1-gen-2000 | Bersani, Massimo; M., Sbetti; Lazzeri, Paolo; Giubertoni, Damiano; Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Anderle, Mariano | |
| Arsenic shallow depth profiling: accurate quantification in SiO2/Si stack | 1-gen-2004 | Barozzi, Mario; Giubertoni, Damiano; Anderle, Mariano; Bersani, Massimo | |
| Arsenic shallow implant characterization by magnetic sector and time of flight SIMS instruments | 1-gen-2002 | Bersani, Massimo; Lazzeri, Paolo; Giubertoni, Damiano; Barozzi, Mario; Marchi E., Boscolo; Anderle, Mariano | |
| Arsenic Shallow Implant Characterization by Magnetic Sector and TOF-SIMS Instruments | 1-gen-2002 | Giubertoni, Damiano; Barozzi, Mario; Lazzeri, Paolo; Anderle, Mariano; Bersani, Massimo | |
| Arsenic uphill diffusion during shallow junction formation | 1-gen-2006 | M., Ferri; S., Solmi; A., Parisini; Bersani, Massimo; Giubertoni, Damiano; Barozzi, Mario | |
| As ultra shallow depth profiling: comparison between SIMS and MEIS techniques | 1-gen-2004 | Giubertoni, Damiano; Barozzi, Mario; S., Pederzoli; Anderle, Mariano; Bersani, Massimo; J. A., van den Berg; M., Werner | |
| Boron Ultra Low Energy SIMS Depth Profiling Improved by Rotating Stage | 1-gen-2006 | Bersani, Massimo; Giubertoni, Damiano; Iacob, Erica; Barozzi, Mario; S., Pederzoli; Vanzetti, Lia Emanuela; M., Anderle | |
| Boron ultra low energy SIMS depth profiling improved by rotating stage | 1-gen-2005 | Giubertoni, Damiano; Iacob, Erica; Barozzi, Mario; S., Pederzoli; Vanzetti, Lia Emanuela; Anderle, Mariano; Bersani, Massimo | |
| Boron ultra shallow SIMS profiles optimization using oblique incidence oxygen beam | 1-gen-2003 | Giubertoni, Damiano; Barozzi, Mario; E., Boscolo; M., Anderle; Bersani, Massimo | |
| Characterisation of ultra-shallow disorder profiles and dielectric functions in ion implanted Si | 1-gen-2011 | I., Mohacsi; P., Petrik; M., Fried; T., Lohner; J. A., van den Berg; M. A., Reading; Giubertoni, Damiano; Barozzi, Mario; A., Parisini | |
| Combined XPS, SIMS and AFM analysis of silicon nano-crystals embedded in silicon oxide layers | 1-gen-2007 | Vanzetti, Lia Emanuela; Barozzi, Mario; Iacob, Erica; Bersani, Massimo; Pucker, Georg; Bellutti, Pierluigi | |
| Combined XPS, SIMS and AFM analysis of silicon nanocrystals embedded in silicon oxide layers | 1-gen-2008 | Vanzetti, Lia Emanuela; Barozzi, Mario; Iacob, Erica; Bersani, Massimo; Pucker, Georg; Bellutti, Pierluigi | |
| Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants | 1-gen-2006 | Giubertoni, Damiano; Bersani, Massimo; Barozzi, Mario; S., Pederzoli; Iacob, Erica; J., van den Berg; M., Werner |