Sfoglia per Autore
Visita ispettiva annuale di sorveglianza Accredia
2011-01-01 Iacob, Erica; Bersani, Massimo; Vanzetti, Lia Emanuela; Barozzi, Mario; Giubertoni, Damiano
Quantitative depth profiling of boron and arsenic ultra low energy implants by pulsed rf-GD-ToFMS
2011-01-01 Lara, Lobo; Beatriz, Fernandez; Rosario, Pereiro; Nerea, Bordel; Demenev, Evgeny; Giubertoni, Damiano; Bersani, Massimo; Philipp, Hoenicke; Burkhard, Beckhoff; A., Sanz Medel
High performance n+/p and p+/n germanium diodes at low-temperature activation annealing
2011-01-01 V., Ioannou Sougleridis; S. F., Galata; E., Golias; T., Speliotis; A., Dimoulas; Giubertoni, Damiano; Gennaro, Salvatore; Barozzi, Mario
Characterisation of ultra-shallow disorder profiles and dielectric functions in ion implanted Si
2011-01-01 I., Mohacsi; P., Petrik; M., Fried; T., Lohner; J. A., van den Berg; M. A., Reading; Giubertoni, Damiano; Barozzi, Mario; A., Parisini
Modelling shallow dopant distributions as layered samples for grazing incidence x-ray fluorescence analysis
2012-01-01 Dieter, Ingerle; Pepponi, Giancarlo; Meirer, Florian; Evgeny, Demenev; Giubertoni, Damiano; Christina, Streli
ispettiva di sorveglianza 6-7 giugno 2012.
2012-01-01 Iacob, Erica; Bersani, Massimo; Giubertoni, Damiano; Barozzi, Mario; Vanzetti, Lia Emanuela; Bortolotti, Mauro; Gennaro, Salvatore; Fedrizzi, Michele
Calibration correction of ultra low energy SIMS profiles based on MEIS analyses for arsenic shallow implants in silicon
2012-01-01 Demenev, Evgeny; Giubertoni, Damiano; J., van den Berg; M., Reading; Bersani, Massimo
Nitrogen Implantation and Diffusion in Crystalline Germanium: Implantation Energy, Temperature and Ge Surface Protection Dependence
2012-01-01 D., Skarlatos; Bersani, Massimo; Barozzi, Mario; Giubertoni, Damiano; N. Z., Vouroutzis; V., Ioannou Sougleridis
Arsenic redistribution after solid phase epitaxial regrowth of shallow pre-amorphized silicon layers
2012-01-01 Demenev, Evgeny; Giubertoni, Damiano; Gennaro, Salvatore; Bersani, Massimo; E., Hourdakis; A. G., Nassiopoulou; M. A., Reading; J. A., van den Berg
Formation of arsenic rich silicon oxide under plasma immersion ion implantation and laser annealing
2012-01-01 Meirer, Florian; Demenev, Evgeny; Giubertoni, Damiano; Gennaro, Salvatore; Vanzetti, Lia Emanuela; Pepponi, Giancarlo; Bersani, Massimo; M. A., Sahiner; G., Steinhauser; M. A., Foad; J. C., Woicik; A., Mehta; P., Pianetta
Solid phase epitaxial re-growth of Sn ion implanted germanium thin films
2012-01-01 Giubertoni, Damiano; Demenev, Evgeny; S., Gupta; Jestin, Yoann; Meirer, Florian; Gennaro, Salvatore; Iacob, Erica; Pepponi, Giancarlo; Pucker, Georg; R. M., Gwilliam; C., Jeynes; J. L., Colaux; K. C., Saraswat; Bersani, Massimo
Identification of four-hydrogen complexes in In-rich InxGa1-xN (x>0.4) alloys using photoluminescence, x-ray absorption, and density functional theory
2012-01-01 M., De Luca; G., Pettinari; G., Ciatto; L., Amidani; F., Filippone; A., Polimeni; E., Fonda; F., Boscherini; A., Amore Bonapasta; Giubertoni, Damiano; A., Knübel; V., Lebedev; M., Capizzi
Formation of arsenolite crystals at room temperature after very high dose arsenic implantation in silicon
2012-01-01 Meirer, Florian; Giubertoni, Damiano; Demenev, Evgeny; Vanzetti, Lia Emanuela; Gennaro, Salvatore; Fedrizzi, Michele; Pepponi, Giancarlo; A., Mehta; P., Pianetta; G., Steinhauser; V., Vishwanath; M., Foad; Bersani, Massimo
Dynamic SIMS Characterization of Ge1-xSnx alloy
2013-01-01 Secchi, Maria; Demenev, Evgeny; Giubertoni, Damiano; Bersani, Massimo
SIMS RSFs in silicon for positive secondary ions with O2+ 1keV at 63° incidence sputtering beam and Zalar rotation.
2013-01-01 Barozzi, Mario; Giubertoni, Damiano; Iacob, Erica; Bersani, Massimo
Observation of Point defect injection from electrical de-activation of Arsenic ultra-shallow distributions formed by ultra-low energy ion implantation and laser sub-melt annealing
2013-01-01 Demenev, Evgeny; Meirer, Florian; Essa, Z.; Giubertoni, Damiano; Cristiano, F.; Pepponi, Giancarlo; Gennaro, Salvatore; Bersani, Massimo; Foad, M. A.
Evolution of Arsenic nanometric distributions in Silicon under advanced ion implantation and annealing processes
2013-01-01 Demenev, Evgeny; Giubertoni, Damiano
Quality management system and accreditation of measurements in a surface science laboratory. The case study of MiNALab.
2013-01-01 Iacob, Erica; Vanzetti, Lia Emanuela; Gennaro, Salvatore; Pecoraro, F.; Giubertoni, Damiano; Barozzi, Mario; Bortolotti, Mauro; Pepponi, Giancarlo; Fedrizzi, Michele; Bersani, Massimo
Time-dependent observations of arsenic ultra shallow junctions formed by AsH3 Plasma Immersion Ion Implantation and Deposition in Silicon
2013-01-01 Meirer, Florian; Demenev, Evgeny; Giubertoni, Damiano; Gennaro, Salvatore; Vanzetti, Lia Emanuela; Pepponi, Giancarlo; Steinhauser, G.; Vishwanath, V.; Mehta, A.; Pianetta, P.; Bersani, Massimo; Foad, M.
Dynamic SIMS Characterization of Ge1-xSnx alloy
2013-01-01 Secchi, Maria; Demenev, Evgeny; Giubertoni, Damiano; Bersani, Massimo
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Visita ispettiva annuale di sorveglianza Accredia | 1-gen-2011 | Iacob, Erica; Bersani, Massimo; Vanzetti, Lia Emanuela; Barozzi, Mario; Giubertoni, Damiano | |
| Quantitative depth profiling of boron and arsenic ultra low energy implants by pulsed rf-GD-ToFMS | 1-gen-2011 | Lara, Lobo; Beatriz, Fernandez; Rosario, Pereiro; Nerea, Bordel; Demenev, Evgeny; Giubertoni, Damiano; Bersani, Massimo; Philipp, Hoenicke; Burkhard, Beckhoff; A., Sanz Medel | |
| High performance n+/p and p+/n germanium diodes at low-temperature activation annealing | 1-gen-2011 | V., Ioannou Sougleridis; S. F., Galata; E., Golias; T., Speliotis; A., Dimoulas; Giubertoni, Damiano; Gennaro, Salvatore; Barozzi, Mario | |
| Characterisation of ultra-shallow disorder profiles and dielectric functions in ion implanted Si | 1-gen-2011 | I., Mohacsi; P., Petrik; M., Fried; T., Lohner; J. A., van den Berg; M. A., Reading; Giubertoni, Damiano; Barozzi, Mario; A., Parisini | |
| Modelling shallow dopant distributions as layered samples for grazing incidence x-ray fluorescence analysis | 1-gen-2012 | Dieter, Ingerle; Pepponi, Giancarlo; Meirer, Florian; Evgeny, Demenev; Giubertoni, Damiano; Christina, Streli | |
| ispettiva di sorveglianza 6-7 giugno 2012. | 1-gen-2012 | Iacob, Erica; Bersani, Massimo; Giubertoni, Damiano; Barozzi, Mario; Vanzetti, Lia Emanuela; Bortolotti, Mauro; Gennaro, Salvatore; Fedrizzi, Michele | |
| Calibration correction of ultra low energy SIMS profiles based on MEIS analyses for arsenic shallow implants in silicon | 1-gen-2012 | Demenev, Evgeny; Giubertoni, Damiano; J., van den Berg; M., Reading; Bersani, Massimo | |
| Nitrogen Implantation and Diffusion in Crystalline Germanium: Implantation Energy, Temperature and Ge Surface Protection Dependence | 1-gen-2012 | D., Skarlatos; Bersani, Massimo; Barozzi, Mario; Giubertoni, Damiano; N. Z., Vouroutzis; V., Ioannou Sougleridis | |
| Arsenic redistribution after solid phase epitaxial regrowth of shallow pre-amorphized silicon layers | 1-gen-2012 | Demenev, Evgeny; Giubertoni, Damiano; Gennaro, Salvatore; Bersani, Massimo; E., Hourdakis; A. G., Nassiopoulou; M. A., Reading; J. A., van den Berg | |
| Formation of arsenic rich silicon oxide under plasma immersion ion implantation and laser annealing | 1-gen-2012 | Meirer, Florian; Demenev, Evgeny; Giubertoni, Damiano; Gennaro, Salvatore; Vanzetti, Lia Emanuela; Pepponi, Giancarlo; Bersani, Massimo; M. A., Sahiner; G., Steinhauser; M. A., Foad; J. C., Woicik; A., Mehta; P., Pianetta | |
| Solid phase epitaxial re-growth of Sn ion implanted germanium thin films | 1-gen-2012 | Giubertoni, Damiano; Demenev, Evgeny; S., Gupta; Jestin, Yoann; Meirer, Florian; Gennaro, Salvatore; Iacob, Erica; Pepponi, Giancarlo; Pucker, Georg; R. M., Gwilliam; C., Jeynes; J. L., Colaux; K. C., Saraswat; Bersani, Massimo | |
| Identification of four-hydrogen complexes in In-rich InxGa1-xN (x>0.4) alloys using photoluminescence, x-ray absorption, and density functional theory | 1-gen-2012 | M., De Luca; G., Pettinari; G., Ciatto; L., Amidani; F., Filippone; A., Polimeni; E., Fonda; F., Boscherini; A., Amore Bonapasta; Giubertoni, Damiano; A., Knübel; V., Lebedev; M., Capizzi | |
| Formation of arsenolite crystals at room temperature after very high dose arsenic implantation in silicon | 1-gen-2012 | Meirer, Florian; Giubertoni, Damiano; Demenev, Evgeny; Vanzetti, Lia Emanuela; Gennaro, Salvatore; Fedrizzi, Michele; Pepponi, Giancarlo; A., Mehta; P., Pianetta; G., Steinhauser; V., Vishwanath; M., Foad; Bersani, Massimo | |
| Dynamic SIMS Characterization of Ge1-xSnx alloy | 1-gen-2013 | Secchi, Maria; Demenev, Evgeny; Giubertoni, Damiano; Bersani, Massimo | |
| SIMS RSFs in silicon for positive secondary ions with O2+ 1keV at 63° incidence sputtering beam and Zalar rotation. | 1-gen-2013 | Barozzi, Mario; Giubertoni, Damiano; Iacob, Erica; Bersani, Massimo | |
| Observation of Point defect injection from electrical de-activation of Arsenic ultra-shallow distributions formed by ultra-low energy ion implantation and laser sub-melt annealing | 1-gen-2013 | Demenev, Evgeny; Meirer, Florian; Essa, Z.; Giubertoni, Damiano; Cristiano, F.; Pepponi, Giancarlo; Gennaro, Salvatore; Bersani, Massimo; Foad, M. A. | |
| Evolution of Arsenic nanometric distributions in Silicon under advanced ion implantation and annealing processes | 1-gen-2013 | Demenev, Evgeny; Giubertoni, Damiano | |
| Quality management system and accreditation of measurements in a surface science laboratory. The case study of MiNALab. | 1-gen-2013 | Iacob, Erica; Vanzetti, Lia Emanuela; Gennaro, Salvatore; Pecoraro, F.; Giubertoni, Damiano; Barozzi, Mario; Bortolotti, Mauro; Pepponi, Giancarlo; Fedrizzi, Michele; Bersani, Massimo | |
| Time-dependent observations of arsenic ultra shallow junctions formed by AsH3 Plasma Immersion Ion Implantation and Deposition in Silicon | 1-gen-2013 | Meirer, Florian; Demenev, Evgeny; Giubertoni, Damiano; Gennaro, Salvatore; Vanzetti, Lia Emanuela; Pepponi, Giancarlo; Steinhauser, G.; Vishwanath, V.; Mehta, A.; Pianetta, P.; Bersani, Massimo; Foad, M. | |
| Dynamic SIMS Characterization of Ge1-xSnx alloy | 1-gen-2013 | Secchi, Maria; Demenev, Evgeny; Giubertoni, Damiano; Bersani, Massimo |
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