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Mostrati risultati da 81 a 100 di 151
Titolo Data di pubblicazione Autore(i) File
A comprehensive Monte Carlo calculation of dopant contrast in secondary electron imaging 1-gen-2008 Dapor, Maurizio; Beverley, Inkson; Cornelia, Rodenburg; John, Rodenburg
SURPRISES: when ab initio meets statistics in extended systems 1-gen-2009 Taioli, Simone; Stefano, Simonucci; Dapor, Maurizio
Mixed ab initio quantum mechanical and Monte Carlo calculations of secondary emission from SiO2 nanoclusters 1-gen-2009 Taioli, Simone; Stefano, Simonucci; Calliari, Lucia; Filippi, Massimiliano; Dapor, Maurizio
A Monte Carlo investigation of secondary electron emission from solid targets: Spherical symmetry versus momentum conservation within the classical binary collision model 1-gen-2009 Dapor, Maurizio
The Effect of Oxide Overlayers on Secondary Electron Dopant Mapping 1-gen-2009 Dapor, Maurizio; Mark, Jepson; Beverley, Inkson; Cornelia, Rodenburg
ENERGY SELECTIVE SECONDARY ELECTRON DETECTION A SOLUTION TO SITE SPECIFIC SEM DOPANT MAPPING 1-gen-2010 C., Rodenburg; M. A. E., Jepson; E. G. T., Bosch; Dapor, Maurizio
Laser-driven acceleration of protons from hydrogenated annealed silicon targets 1-gen-2010 Picciotto, Antonino; D., Margarone; J., Krasa; A., Velyhan; Serra, Enrico; Bellutti, Pierluigi; Scarduelli, Giorgina; Calliari, Lucia; E., Krousky; B., Rus; Dapor, Maurizio
A novel Monte Carlo simulation code for linewidth measurement in critical dimension scanning electron microscopy 1-gen-2010 Alexander, Koschik; Mauro, Ciappa; Stephan, Holzer; Dapor, Maurizio; Wolfgang, Fichtner
Electron spectroscopies and inelastic processes in nanoclusters and solids: Theory and experiment 1-gen-2010 Taioli, Simone; Stefano, Simonucci; Calliari, Lucia; Dapor, Maurizio
Monte Carlo modeling in the low-energy domain of the secondary electron emission of polymethylmethacrylate for critical-dimension scanning electron microscopy 1-gen-2010 Dapor, Maurizio; M., Ciappa; W., Fichtner
Energy selective scanning electron microscopy to reduce the effect of contamination layers on scanning electron microscope dopant mapping 1-gen-2010 C., Rodenburg; M. A. E., Jepson; E. G. T., Bosch; Dapor, Maurizio
Modeling secondary electron images for linewidth measurement by critical dimension scanning electron microscopy 1-gen-2010 Mauro, Ciappa; Alexander, Koschik; Dapor, Maurizio; Wolfgang, Fichtner
Relatività e meccanica quantistica relativistica 1-gen-2011 Dapor, Maurizio
Comparison between Energy Straggling Strategy and Continuous Slowing Down Approximation in Monte Carlo Simulation of Secondary Electron Emission of Insulating Materials 1-gen-2011 Dapor, Maurizio
Reducing Hydrogen Permeation through Metals 1-gen-2011 Dapor, Maurizio; A., Miotello
Comparison between Monte Carlo and experimental aluminum and silicon electron energy loss spectra 1-gen-2011 Dapor, Maurizio; Calliari, Lucia; Scarduelli, Giorgina
Backscattered electrons from surface films deposited on bulk targets: A comparison between computational and experimental results 1-gen-2011 Dapor, Maurizio; Nicola, Bazzanella; Laura, Toniutti; Antonio, Miotello; Stefano, Gialanella
Secondary electron emission yield calculation performed using two different Monte Carlo strategies 1-gen-2011 Dapor, Maurizio
Monte Carlo Simulation of Secondary Electron Emission from Dielectric Targets 1-gen-2012 Dapor, Maurizio
Energy loss of electrons backscattered from solids: measured and calculated spectra for Al and Si 1-gen-2012 Dapor, Maurizio; Calliari, Lucia; Sergey, Fanchenko
Mostrati risultati da 81 a 100 di 151
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