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NOTA: è possibile cercare una corrispondenza esatta usando i doppi apici, ad es: "evoluzione della specie". Qualora si cerchi un identificativo, è consigliabile cercarlo in due modi differenti: tra apici con caratteri speciali es: "978-94-6366-274" oppure senza caratteri speciali solo come sequenza numerica: es 978946366274.
Regularized fuzzy neural networks based on nullneurons for problems of classification of patterns
2018-01-01 de Campos Souza, P. V.; de Oliveira, P. F. A.
Regularized neuro-fuzzy AI model to aid score management in Online distance learning forums
2021-01-01 de Campos Souza, Paulo Vitor.; Lughofer, E.; Junio Guimaraes, A.
Reinforcing Traffic Safety by Using CAM to Verify Velocity Accuracy
2021-01-01 De Britto E Silva, Erik; Hadiwardoyo, Seilendria A.; Costa, Cristina Emilia; Marquez-Barja, Johann M.
Reins-MAC: Firefly Inspired Communication Scheduling for Reliable Low-Power Wireless
2018-01-01 Ceriotti, Matteo; Murphy, Amy L.
Relating the strangeness content of the nucleon with the mass shift of the ϕ meson in nuclear matter
2016-01-01 Gubler, Philipp; Ohtani, Keisuke
Relevance Ranking for Translated Texts
2012-01-01 Turchi, Marco; Specia, Lucia; Steinberger, Josef
Reliability and failure analysis in power GaN-HEMTs: An overview
2017-01-01 Meneghini, M.; Rossetto, I.; De Santi, C.; Rampazzo, F.; Tajalli, A.; Barbato, A.; Ruzzarin, M.; Borga, M.; Canato, E.; Zanoni, E.; Meneghesso, G.
Reliability and Power Handling Issues in Ohmic Series and Shunt Capacitive RF MEMS Switches
2006-01-01 S., Catoni; S., Di Nardo; P., Farinelli; Giacomozzi, Flavio; G., Mannocchi; R., Marcelli; Margesin, Benno; P., Mezzanotte; Mulloni, Viviana; R., Sorrentino; F., Vitulli; L., Vietzorreck
Reliability of capacitive RF MEMS switches subjected to repetitive impact cycles at different temperatures
2014-01-01 Barbato, M.; Cester, A.; Mulloni, Viviana; Margesin, Benno; De Pasquale, G.; Soma, A.; Meneghesso, G.
Reliability of power devices: Bias-induced threshold voltage instability and dielectric breakdown in GaN MIS-HEMTs
2017-01-01 Meneghesso, G.; Bisi, D.; Rossetto, I.; Ruzzarin, M.; Meneghini, M.; Zanoni, E.
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Regularized fuzzy neural networks based on nullneurons for problems of classification of patterns | 1-gen-2018 | de Campos Souza, P. V.; de Oliveira, P. F. A. | |
| Regularized neuro-fuzzy AI model to aid score management in Online distance learning forums | 1-gen-2021 | de Campos Souza, Paulo Vitor.; Lughofer, E.; Junio Guimaraes, A. | |
| Reinforcing Traffic Safety by Using CAM to Verify Velocity Accuracy | 1-gen-2021 | De Britto E Silva, Erik; Hadiwardoyo, Seilendria A.; Costa, Cristina Emilia; Marquez-Barja, Johann M. | |
| Reins-MAC: Firefly Inspired Communication Scheduling for Reliable Low-Power Wireless | 1-gen-2018 | Ceriotti, Matteo; Murphy, Amy L. | |
| Relating the strangeness content of the nucleon with the mass shift of the ϕ meson in nuclear matter | 1-gen-2016 | Gubler, Philipp; Ohtani, Keisuke | |
| Relevance Ranking for Translated Texts | 1-gen-2012 | Turchi, Marco; Specia, Lucia; Steinberger, Josef | |
| Reliability and failure analysis in power GaN-HEMTs: An overview | 1-gen-2017 | Meneghini, M.; Rossetto, I.; De Santi, C.; Rampazzo, F.; Tajalli, A.; Barbato, A.; Ruzzarin, M.; Borga, M.; Canato, E.; Zanoni, E.; Meneghesso, G. | |
| Reliability and Power Handling Issues in Ohmic Series and Shunt Capacitive RF MEMS Switches | 1-gen-2006 | S., Catoni; S., Di Nardo; P., Farinelli; Giacomozzi, Flavio; G., Mannocchi; R., Marcelli; Margesin, Benno; P., Mezzanotte; Mulloni, Viviana; R., Sorrentino; F., Vitulli; L., Vietzorreck | |
| Reliability of capacitive RF MEMS switches subjected to repetitive impact cycles at different temperatures | 1-gen-2014 | Barbato, M.; Cester, A.; Mulloni, Viviana; Margesin, Benno; De Pasquale, G.; Soma, A.; Meneghesso, G. | |
| Reliability of power devices: Bias-induced threshold voltage instability and dielectric breakdown in GaN MIS-HEMTs | 1-gen-2017 | Meneghesso, G.; Bisi, D.; Rossetto, I.; Ruzzarin, M.; Meneghini, M.; Zanoni, E. |
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Keyword
- NLP 41
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- silicon radiation detectors 28
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- machine translation 23
- Machine Translation 22
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