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Synchrotron radiation total reflection X-ray fluorescence and energy dispersive X-ray fluorescence analysis on AP1(TM) films applied to the analysis of trace elements in metal alloys for the construction of nuclear reactor core components: a comparison,
2001-01-01 Pepponi, Giancarlo; Peter, Wobrauschek; Ferenc, Hegedus; Christina, Streli; N., Zoger; Christoph, Jokubonis; Gerald, Falkenberg; H., Grimmer
Synchrotron radiation-induced total reflection X-ray fluorescence analysis
2010-01-01 Meirer, Florian; A., Singh; Pepponi, Giancarlo; C., Streli; T., Homma; P., Pianetta
Synchrotron radiation-induced TXRF of reactor steel samples,
2001-01-01 Pepponi, Giancarlo; Peter, Wobrauschek; Christina, Streli; N., Zoger; Ferenc, Hegedus
Temporary implementation and testing of a confocal SR-μXRF system for bone analysis at the X-ray Fluorescence beamline at Elettra
2018-01-01 Perneczky, L.; Rauwolf, M.; Ingerle, D.; Eichert, D.; Brigidi, F.; Jark, W.; Bjeoumikhova, S.; Pepponi, G.; Wobrauschek, P.; Streli, C.; Turyanskaya, A.
The fate of nano ZnO and its bulk counterpart in the body of microscopic nematodes: An X-ray spectrometric study
2015-01-01 Zoltán, Sávoly; Günter, Buzanich; Pepponi, Giancarlo; Christina, Streli; Krisztina, Hrács; Péter I., Nagy; Gyula, Záray
The representation of coupling interactions in the Material Properties Open Database (MPOD)
2017-01-01 Fuentes Cobas, Luis E.; Chateigner, Daniel; Fuentes Montero, María E.; Pepponi, Giancarlo; Grazulis, Saulius
The role of incidence angle in the morphology evolution of Ge surfaces irradiated by medium-energy Au ions
2018-01-01 Dell'Anna, Rossana; Iacob, Erica; Barozzi, Mario; Vanzetti, Lia; Hübner, René; Boettger, Roman; Giubertoni, Damiano; Pepponi, Giancarlo
Total Reflection X-ray Fluorescence Analysis (TXRF) using the high flux SAXS camera,
2002-01-01 Peter, Wobrauschek; Christina, Streli; Pepponi, Giancarlo; Alexander, Bergmann; Otto, Glatter
Total reflection X-ray fluorescence analysis of pollen as an indicator for atmospheric pollution
2004-01-01 Pepponi, Giancarlo; Lazzeri, Paolo; N., Coghe; Bersani, Massimo; E., Gottardini; F., Cristofolini; G., Clauser; A., Torboli
Towards space-deployable laser stabilization systems based on vibration-insensitive cubic cavities with crystalline coatings
2024-01-01 Cole, Garrett D.; Koller, Silvio; Greve, Christian; Barwood, Geoffrey P.; Deutsch, Christoph; Gaynor, Paul; Ghulinyan, Mher; Gill, Patrick; Hendricks, Richard; Hill, Ian; Kundermann, Stefan; Le Goff, Roland; Lecomte, Steve; Meier, Christophe; Pepponi, Giancarlo; Schilt, Stéphane; Stenzel, Christian; Sütterlin, Robert; Voss, Kai; Zhukov, Anton
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Synchrotron radiation total reflection X-ray fluorescence and energy dispersive X-ray fluorescence analysis on AP1(TM) films applied to the analysis of trace elements in metal alloys for the construction of nuclear reactor core components: a comparison, | 1-gen-2001 | Pepponi, Giancarlo; Peter, Wobrauschek; Ferenc, Hegedus; Christina, Streli; N., Zoger; Christoph, Jokubonis; Gerald, Falkenberg; H., Grimmer | |
| Synchrotron radiation-induced total reflection X-ray fluorescence analysis | 1-gen-2010 | Meirer, Florian; A., Singh; Pepponi, Giancarlo; C., Streli; T., Homma; P., Pianetta | |
| Synchrotron radiation-induced TXRF of reactor steel samples, | 1-gen-2001 | Pepponi, Giancarlo; Peter, Wobrauschek; Christina, Streli; N., Zoger; Ferenc, Hegedus | |
| Temporary implementation and testing of a confocal SR-μXRF system for bone analysis at the X-ray Fluorescence beamline at Elettra | 1-gen-2018 | Perneczky, L.; Rauwolf, M.; Ingerle, D.; Eichert, D.; Brigidi, F.; Jark, W.; Bjeoumikhova, S.; Pepponi, G.; Wobrauschek, P.; Streli, C.; Turyanskaya, A. | |
| The fate of nano ZnO and its bulk counterpart in the body of microscopic nematodes: An X-ray spectrometric study | 1-gen-2015 | Zoltán, Sávoly; Günter, Buzanich; Pepponi, Giancarlo; Christina, Streli; Krisztina, Hrács; Péter I., Nagy; Gyula, Záray | |
| The representation of coupling interactions in the Material Properties Open Database (MPOD) | 1-gen-2017 | Fuentes Cobas, Luis E.; Chateigner, Daniel; Fuentes Montero, María E.; Pepponi, Giancarlo; Grazulis, Saulius | |
| The role of incidence angle in the morphology evolution of Ge surfaces irradiated by medium-energy Au ions | 1-gen-2018 | Dell'Anna, Rossana; Iacob, Erica; Barozzi, Mario; Vanzetti, Lia; Hübner, René; Boettger, Roman; Giubertoni, Damiano; Pepponi, Giancarlo | |
| Total Reflection X-ray Fluorescence Analysis (TXRF) using the high flux SAXS camera, | 1-gen-2002 | Peter, Wobrauschek; Christina, Streli; Pepponi, Giancarlo; Alexander, Bergmann; Otto, Glatter | |
| Total reflection X-ray fluorescence analysis of pollen as an indicator for atmospheric pollution | 1-gen-2004 | Pepponi, Giancarlo; Lazzeri, Paolo; N., Coghe; Bersani, Massimo; E., Gottardini; F., Cristofolini; G., Clauser; A., Torboli | |
| Towards space-deployable laser stabilization systems based on vibration-insensitive cubic cavities with crystalline coatings | 1-gen-2024 | Cole, Garrett D.; Koller, Silvio; Greve, Christian; Barwood, Geoffrey P.; Deutsch, Christoph; Gaynor, Paul; Ghulinyan, Mher; Gill, Patrick; Hendricks, Richard; Hill, Ian; Kundermann, Stefan; Le Goff, Roland; Lecomte, Steve; Meier, Christophe; Pepponi, Giancarlo; Schilt, Stéphane; Stenzel, Christian; Sütterlin, Robert; Voss, Kai; Zhukov, Anton |
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Opzioni
Scopri
Tipologia
- 1 Contributo su Rivista 105
- 1 Contributo su Rivista::1.1 Arti... 105
Data di pubblicazione
- 2020 - 2024 23
- 2010 - 2019 46
- 2001 - 2009 36
Editore
- Elsevier 19
- Wiley 5
- ICDD 2
- Scientific.net 2
- American Institute of Physics 1
- C.I.S.B.A. 1
- Springer 1
- Springer Netherlands 1
Rivista
- SPECTROCHIMICA ACTA, PART B: ATOM... 24
- X-RAY SPECTROMETRY 8
- APPLIED SURFACE SCIENCE 4
- NUCLEAR INSTRUMENTS & METHODS IN ... 4
- ANALYTICAL AND BIOANALYTICAL CHEM... 3
- JOURNAL OF APPLIED PHYSICS 3
- JOURNAL OF INSTRUMENTATION 3
- JOURNAL OF VACUUM SCIENCE & TECHN... 3
- NUCLEAR INSTRUMENTS & METHODS IN ... 3
- POWDER DIFFRACTION 3
Keyword
- silicon 7
- annealing 5
- arsenic 5
- elemental semiconductors 4
- EXAFS 4
- ion implantation 4
- ultra shallow junctions 4
- laser annealing 3
- secondary ion mass spectra 3
- semiconductor doping 3
Lingua
- eng 97
- ita 1
Accesso al fulltext
- no fulltext 100
- restricted 3
- open 2