Since 2006, FBK and Optoi (an Italian SME dealing with Optoelectronics and Microelectonics) launched a joint research activity for a specific request formulated by CNES (the French Space Agency). Such development was centred on the development of an 8-channel monolithic silicon phototransistor array for optical encoders to be used in space applications. Other two R&D activities followed with CNES based on progressively encouraging results and a crescendo in the device reliability; now this development is currently funded by ESA, in the framework of the European Component Initiative (phase 3). The final target is the inclusion inclusion into the European Preferred Part List (EPPL), based on a complete radiation campaign and subsequent ESCC evaluation. This paper reports the main aspects on the manufacture of the component, together with the most representative electro-optical performances and reliability figures.

Development of a monolithic silicon phototransistor array for optical encoders used in harsh environment and aerospace applications

Bellutti, Pierluigi;Collini, Amos;Ficorella, Francesco;Giacomini, Gabriele;
2014

Abstract

Since 2006, FBK and Optoi (an Italian SME dealing with Optoelectronics and Microelectonics) launched a joint research activity for a specific request formulated by CNES (the French Space Agency). Such development was centred on the development of an 8-channel monolithic silicon phototransistor array for optical encoders to be used in space applications. Other two R&D activities followed with CNES based on progressively encouraging results and a crescendo in the device reliability; now this development is currently funded by ESA, in the framework of the European Component Initiative (phase 3). The final target is the inclusion inclusion into the European Preferred Part List (EPPL), based on a complete radiation campaign and subsequent ESCC evaluation. This paper reports the main aspects on the manufacture of the component, together with the most representative electro-optical performances and reliability figures.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11582/258820
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