The permanent degradation introduced in the main electrical parameters of a new optocoupler type is described, as a function of proton fluence and Co-60 total ionizing dose. These results refer to Optoi’s devices assembled in Leadless Chip Carrier packages, coded OIER10 and developed in the framework of an ECI2 project for ESA, aimed at the ESCC component qualification.

Recent Proton and Co60 Radiation Test Data from a Newly Developed European Optocoupler Source for space Application

Ress, Cristina;Collini, Amos;Ficorella, Francesco;
2013-01-01

Abstract

The permanent degradation introduced in the main electrical parameters of a new optocoupler type is described, as a function of proton fluence and Co-60 total ionizing dose. These results refer to Optoi’s devices assembled in Leadless Chip Carrier packages, coded OIER10 and developed in the framework of an ECI2 project for ESA, aimed at the ESCC component qualification.
2013
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11582/207616
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