The permanent degradation introduced in the main electrical parameters of a newly developed European optocoupler type is described, as a function of proton fluences and Co-60 total ionizing dose. Optoi’s devices assembled in Leadless Chip Carrier packages, coded OIER10 are being developed in the framework of an ECI project for ESA, aimed at the ESCC evaluation of Optoi optocouplers. The first analyses of the recent irradiation results show a good behavior of the parts under proton and gamma irradiation.

Recent Proton and Co60 Radiation Test Data from a newly developed European Optocoupler source for space application

Ress, Cristina;Collini, Amos;Ficorella, Francesco;
2013

Abstract

The permanent degradation introduced in the main electrical parameters of a newly developed European optocoupler type is described, as a function of proton fluences and Co-60 total ionizing dose. Optoi’s devices assembled in Leadless Chip Carrier packages, coded OIER10 are being developed in the framework of an ECI project for ESA, aimed at the ESCC evaluation of Optoi optocouplers. The first analyses of the recent irradiation results show a good behavior of the parts under proton and gamma irradiation.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11582/207015
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