Secchi, Maria
 Distribuzione geografica
Continente #
NA - Nord America 516
EU - Europa 299
AS - Asia 154
AF - Africa 2
Continente sconosciuto - Info sul continente non disponibili 1
Totale 972
Nazione #
US - Stati Uniti d'America 513
IT - Italia 70
DE - Germania 50
UA - Ucraina 45
SG - Singapore 37
GB - Regno Unito 36
CN - Cina 28
FI - Finlandia 26
HK - Hong Kong 25
JP - Giappone 20
FR - Francia 19
IN - India 19
SE - Svezia 16
BE - Belgio 15
IE - Irlanda 12
VN - Vietnam 11
IL - Israele 6
CA - Canada 3
RU - Federazione Russa 3
TW - Taiwan 3
PL - Polonia 2
TN - Tunisia 2
TR - Turchia 2
AL - Albania 1
AT - Austria 1
AZ - Azerbaigian 1
CH - Svizzera 1
EU - Europa 1
HU - Ungheria 1
IR - Iran 1
KR - Corea 1
NL - Olanda 1
Totale 972
Città #
Chandler 103
Jacksonville 77
Ann Arbor 56
Trento 37
Singapore 34
Ashburn 29
Boardman 28
Southend 27
Hong Kong 24
Wilmington 16
Brussels 15
Helsinki 14
Dublin 12
Kronberg 12
Dong Ket 11
Falls Church 11
Santa Clara 10
Shanghai 10
Beijing 8
Bologna 8
Tokyo 7
Augusta 6
Mountain View 6
Pune 6
Redwood City 6
Dearborn 5
Munich 5
Woodbridge 5
Bolzano 4
New York 4
Phoenix 4
Los Angeles 3
Miami 3
Mitsui 3
Norwalk 3
San Mateo 3
Secaucus 3
Taipei 3
Bozen 2
Guangzhou 2
Houston 2
London 2
Nagoya 2
Radès 2
Rome 2
Seattle 2
Shenzhen 2
Siegen 2
Toronto 2
Verona 2
Ardabil 1
Baku 1
Brooklyn 1
Buffalo 1
Central District 1
Cernobbio 1
Chengdu 1
Chieti 1
Clifton 1
Costa Mesa 1
Diyarbakır 1
Espoo 1
Faenza 1
Fayetteville 1
Fuzhou 1
Groot-ammers 1
Huntsville 1
Innsbruck 1
Konya 1
Laion 1
Lausanne 1
Magnago 1
Merano 1
Newark 1
Ottawa 1
Pergine Valsugana 1
Petilia Policastro 1
Petit-quevilly 1
Polska 1
San Giovanni Bianco 1
Sopron 1
Tel Aviv 1
Tirana 1
Warsaw 1
Zhengzhou 1
Totale 680
Nome #
Regular nano-void formation on Ge films on Si using Sn ion implantation through silicon nitride caps 145
Dynamic SIMS Characterization of Ge1-xSnx alloy 121
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 100
GIXRF characterization of thin Ge1-xSnx films 88
Columnar nano-void formation on Germanium under Sn+ ion implantation: Ge1-xSnx walls 85
Development of nanotopography during SIMS characterization of thin films of Ge1−xSnx alloy 85
Nanofabrication of self-organized periodic ripples by ion beam sputtering 76
Columnar nano-void formation on Germanium under Sn+ ion implantation: Ge1-xSnx walls 72
Dynamic SIMS Characterization of Ge1-xSnx alloy 65
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 59
Point defect engineering study of phosphorus ion implanted germanium 56
Omnidirectional and broadband photon harvesting in self-organized Ge columnar nanovoids 34
Totale 986
Categoria #
all - tutte 4.954
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 4.954


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020114 0 0 0 0 14 7 16 2 17 22 25 11
2020/2021157 27 2 15 8 16 2 14 1 5 32 13 22
2021/202286 3 4 3 9 8 9 5 11 6 6 5 17
2022/2023209 7 21 4 45 8 29 2 22 44 10 12 5
2023/2024152 20 7 17 6 19 15 8 12 1 25 2 20
2024/2025101 6 7 68 20 0 0 0 0 0 0 0 0
Totale 986