Secchi, Maria
 Distribuzione geografica
Continente #
NA - Nord America 452
EU - Europa 300
AS - Asia 86
AF - Africa 2
Continente sconosciuto - Info sul continente non disponibili 1
Totale 841
Nazione #
US - Stati Uniti d'America 450
IT - Italia 68
DE - Germania 45
UA - Ucraina 45
GB - Regno Unito 34
BE - Belgio 30
CN - Cina 25
FI - Finlandia 24
FR - Francia 19
IN - India 19
JP - Giappone 18
SE - Svezia 16
IE - Irlanda 12
VN - Vietnam 11
IL - Israele 5
RU - Federazione Russa 3
TW - Taiwan 3
CA - Canada 2
TN - Tunisia 2
TR - Turchia 2
AT - Austria 1
CH - Svizzera 1
EU - Europa 1
HK - Hong Kong 1
IR - Iran 1
KR - Corea 1
NL - Olanda 1
PL - Polonia 1
Totale 841
Città #
Chandler 103
Jacksonville 77
Ann Arbor 56
Trento 36
Brussels 30
Ashburn 29
Southend 27
Wilmington 16
Helsinki 13
Dublin 12
Kronberg 12
Shanghai 12
Boardman 11
Dong Ket 11
Falls Church 11
Bologna 8
Beijing 7
Augusta 6
Mountain View 6
Pune 6
Redwood City 6
Dearborn 5
Tokyo 5
Woodbridge 5
Phoenix 4
Bolzano 3
Mitsui 3
New York 3
Norwalk 3
San Mateo 3
Secaucus 3
Taipei 3
Bozen 2
Houston 2
Los Angeles 2
Nagoya 2
Radès 2
Rome 2
Seattle 2
Siegen 2
Toronto 2
Verona 2
Ardabil 1
Brooklyn 1
Central District 1
Cernobbio 1
Chengdu 1
Chieti 1
Costa Mesa 1
Diyarbakır 1
Faenza 1
Fayetteville 1
Fuzhou 1
Groot-ammers 1
Guangzhou 1
Huntsville 1
Innsbruck 1
Konya 1
Laion 1
Lausanne 1
Magnago 1
Merano 1
Pergine Valsugana 1
Petilia Policastro 1
Petit-quevilly 1
Polska 1
San Giovanni Bianco 1
Zhengzhou 1
Totale 581
Nome #
Regular nano-void formation on Ge films on Si using Sn ion implantation through silicon nitride caps 133
Dynamic SIMS Characterization of Ge1-xSnx alloy 106
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 86
GIXRF characterization of thin Ge1-xSnx films 78
Columnar nano-void formation on Germanium under Sn+ ion implantation: Ge1-xSnx walls 69
Columnar nano-void formation on Germanium under Sn+ ion implantation: Ge1-xSnx walls 64
Development of nanotopography during SIMS characterization of thin films of Ge1−xSnx alloy 64
Nanofabrication of self-organized periodic ripples by ion beam sputtering 63
Dynamic SIMS Characterization of Ge1-xSnx alloy 61
Point defect engineering study of phosphorus ion implanted germanium 55
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 50
Omnidirectional and broadband photon harvesting in self-organized Ge columnar nanovoids 26
Totale 855
Categoria #
all - tutte 3.434
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 3.434


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2018/201914 0 0 0 0 0 0 0 1 2 2 2 7
2019/2020147 14 13 4 2 14 7 16 2 17 22 25 11
2020/2021157 27 2 15 8 16 2 14 1 5 32 13 22
2021/202286 3 4 3 9 8 9 5 11 6 6 5 17
2022/2023217 7 21 4 45 8 29 2 23 46 12 13 7
2023/2024114 22 8 21 8 20 15 8 12 0 0 0 0
Totale 855