Secchi, Maria
 Distribuzione geografica
Continente #
NA - Nord America 468
EU - Europa 287
AS - Asia 114
AF - Africa 2
Continente sconosciuto - Info sul continente non disponibili 1
Totale 872
Nazione #
US - Stati Uniti d'America 466
IT - Italia 70
DE - Germania 45
UA - Ucraina 45
GB - Regno Unito 34
CN - Cina 24
FI - Finlandia 24
HK - Hong Kong 23
FR - Francia 19
IN - India 19
JP - Giappone 18
SE - Svezia 16
BE - Belgio 15
IE - Irlanda 12
VN - Vietnam 11
SG - Singapore 7
IL - Israele 5
RU - Federazione Russa 3
TW - Taiwan 3
CA - Canada 2
TN - Tunisia 2
TR - Turchia 2
AT - Austria 1
CH - Svizzera 1
EU - Europa 1
IR - Iran 1
KR - Corea 1
NL - Olanda 1
PL - Polonia 1
Totale 872
Città #
Chandler 103
Jacksonville 77
Ann Arbor 56
Trento 37
Ashburn 29
Southend 27
Boardman 22
Hong Kong 22
Wilmington 16
Brussels 15
Helsinki 13
Dublin 12
Kronberg 12
Dong Ket 11
Falls Church 11
Shanghai 10
Beijing 8
Bologna 8
Augusta 6
Mountain View 6
Pune 6
Redwood City 6
Dearborn 5
Tokyo 5
Woodbridge 5
Bolzano 4
Phoenix 4
Singapore 4
Los Angeles 3
Mitsui 3
New York 3
Norwalk 3
San Mateo 3
Secaucus 3
Taipei 3
Bozen 2
Houston 2
Nagoya 2
Radès 2
Rome 2
Seattle 2
Siegen 2
Toronto 2
Verona 2
Ardabil 1
Brooklyn 1
Central District 1
Cernobbio 1
Chengdu 1
Chieti 1
Clifton 1
Costa Mesa 1
Diyarbakır 1
Faenza 1
Fayetteville 1
Fuzhou 1
Groot-ammers 1
Guangzhou 1
Huntsville 1
Innsbruck 1
Konya 1
Laion 1
Lausanne 1
Magnago 1
Merano 1
Pergine Valsugana 1
Petilia Policastro 1
Petit-quevilly 1
Polska 1
San Giovanni Bianco 1
Zhengzhou 1
Totale 606
Nome #
Regular nano-void formation on Ge films on Si using Sn ion implantation through silicon nitride caps 133
Dynamic SIMS Characterization of Ge1-xSnx alloy 110
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 91
GIXRF characterization of thin Ge1-xSnx films 81
Columnar nano-void formation on Germanium under Sn+ ion implantation: Ge1-xSnx walls 72
Development of nanotopography during SIMS characterization of thin films of Ge1−xSnx alloy 70
Columnar nano-void formation on Germanium under Sn+ ion implantation: Ge1-xSnx walls 65
Nanofabrication of self-organized periodic ripples by ion beam sputtering 65
Dynamic SIMS Characterization of Ge1-xSnx alloy 61
Point defect engineering study of phosphorus ion implanted germanium 54
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 52
Omnidirectional and broadband photon harvesting in self-organized Ge columnar nanovoids 32
Totale 886
Categoria #
all - tutte 4.243
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 4.243


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020147 14 13 4 2 14 7 16 2 17 22 25 11
2020/2021157 27 2 15 8 16 2 14 1 5 32 13 22
2021/202286 3 4 3 9 8 9 5 11 6 6 5 17
2022/2023209 7 21 4 45 8 29 2 22 44 10 12 5
2023/2024152 20 7 17 6 19 15 8 12 1 25 2 20
2024/20251 1 0 0 0 0 0 0 0 0 0 0 0
Totale 886