Secchi, Maria
 Distribuzione geografica
Continente #
NA - Nord America 513
EU - Europa 294
AS - Asia 147
AF - Africa 2
Continente sconosciuto - Info sul continente non disponibili 1
Totale 957
Nazione #
US - Stati Uniti d'America 510
IT - Italia 70
DE - Germania 45
UA - Ucraina 45
GB - Regno Unito 36
SG - Singapore 30
CN - Cina 28
FI - Finlandia 26
HK - Hong Kong 25
JP - Giappone 20
FR - Francia 19
IN - India 19
SE - Svezia 16
BE - Belgio 15
IE - Irlanda 12
VN - Vietnam 11
IL - Israele 6
CA - Canada 3
RU - Federazione Russa 3
TW - Taiwan 3
PL - Polonia 2
TN - Tunisia 2
TR - Turchia 2
AL - Albania 1
AT - Austria 1
AZ - Azerbaigian 1
CH - Svizzera 1
EU - Europa 1
HU - Ungheria 1
IR - Iran 1
KR - Corea 1
NL - Olanda 1
Totale 957
Città #
Chandler 103
Jacksonville 77
Ann Arbor 56
Trento 37
Ashburn 29
Boardman 28
Singapore 27
Southend 27
Hong Kong 24
Wilmington 16
Brussels 15
Helsinki 14
Dublin 12
Kronberg 12
Dong Ket 11
Falls Church 11
Santa Clara 10
Shanghai 10
Beijing 8
Bologna 8
Tokyo 7
Augusta 6
Mountain View 6
Pune 6
Redwood City 6
Dearborn 5
Woodbridge 5
Bolzano 4
Phoenix 4
Los Angeles 3
Miami 3
Mitsui 3
New York 3
Norwalk 3
San Mateo 3
Secaucus 3
Taipei 3
Bozen 2
Guangzhou 2
Houston 2
London 2
Nagoya 2
Radès 2
Rome 2
Seattle 2
Shenzhen 2
Siegen 2
Toronto 2
Verona 2
Ardabil 1
Baku 1
Brooklyn 1
Buffalo 1
Central District 1
Cernobbio 1
Chengdu 1
Chieti 1
Clifton 1
Costa Mesa 1
Diyarbakır 1
Espoo 1
Faenza 1
Fayetteville 1
Fuzhou 1
Groot-ammers 1
Huntsville 1
Innsbruck 1
Konya 1
Laion 1
Lausanne 1
Magnago 1
Merano 1
Newark 1
Ottawa 1
Pergine Valsugana 1
Petilia Policastro 1
Petit-quevilly 1
Polska 1
San Giovanni Bianco 1
Sopron 1
Tel Aviv 1
Tirana 1
Warsaw 1
Zhengzhou 1
Totale 667
Nome #
Regular nano-void formation on Ge films on Si using Sn ion implantation through silicon nitride caps 144
Dynamic SIMS Characterization of Ge1-xSnx alloy 120
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 100
GIXRF characterization of thin Ge1-xSnx films 87
Columnar nano-void formation on Germanium under Sn+ ion implantation: Ge1-xSnx walls 83
Development of nanotopography during SIMS characterization of thin films of Ge1−xSnx alloy 83
Nanofabrication of self-organized periodic ripples by ion beam sputtering 75
Columnar nano-void formation on Germanium under Sn+ ion implantation: Ge1-xSnx walls 70
Dynamic SIMS Characterization of Ge1-xSnx alloy 64
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 57
Point defect engineering study of phosphorus ion implanted germanium 55
Omnidirectional and broadband photon harvesting in self-organized Ge columnar nanovoids 33
Totale 971
Categoria #
all - tutte 4.765
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 4.765


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020116 0 0 0 2 14 7 16 2 17 22 25 11
2020/2021157 27 2 15 8 16 2 14 1 5 32 13 22
2021/202286 3 4 3 9 8 9 5 11 6 6 5 17
2022/2023209 7 21 4 45 8 29 2 22 44 10 12 5
2023/2024152 20 7 17 6 19 15 8 12 1 25 2 20
2024/202586 6 7 68 5 0 0 0 0 0 0 0 0
Totale 971