Secchi, Maria

Secchi, Maria  

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Titolo Data di pubblicazione Autore(i) File
Columnar nano-void formation on Germanium under Sn+ ion implantation: Ge1-xSnx walls 1-gen-2014 M.Secchi; E. Demenev; D. Giubertoni; L. Vanzetti; M. Bersani
Columnar nano-void formation on Germanium under Sn+ ion implantation: Ge1-xSnx walls 1-gen-2014 M. Secchi; E. Demenev; D. Giubertoni; L. Vanzetti; M. Bersani
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 1-gen-2014 M. Secchi; E. Demenev; D. Giubertoni; E. Iacob; M. Bersani
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 1-gen-2014 M. Secchi; E. Demenev; D. Giubertoni; E. Iacob; M. Bersani
Development of nanotopography during SIMS characterization of thin films of Ge1−xSnx alloy 1-gen-2015 Secchi, Maria; Demenev, Evgeny; C, ; Colaux, J. L.; Giubertoni, Damiano; Dell'Anna, Rossana; Iacob, Erica; Gwilliam, R. M.; Jeynes, C.; Bersani, Massimo
Dynamic SIMS Characterization of Ge1-xSnx alloy 1-gen-2013 Secchi, Maria; Demenev, Evgeny; Giubertoni, Damiano; Bersani, Massimo
Dynamic SIMS Characterization of Ge1-xSnx alloy 1-gen-2013 Secchi, Maria; Demenev, Evgeny; Giubertoni, Damiano; Bersani, Massimo
GIXRF characterization of thin Ge1-xSnx films 1-gen-2014 Brigidi, Fabio; Secchi, Maria; Demenev, Evgeny; Giubertoni, Damiano; Pepponi, Giancarlo
Nanofabrication of self-organized periodic ripples by ion beam sputtering 1-gen-2016 Iacob, Erica; Dell'Anna, Rossana; Giubertoni, Damiano; Demenev, Evgeny; Secchi, Maria; Böttger, Roman; Pepponi, Giancarlo
Point defect engineering study of phosphorus ion implanted germanium 1-gen-2014 M. A., Razali; Secchi, Maria; Bersani, Massimo; R. M., Gwilliam
Regular nano-void formation on Ge films on Si using Sn ion implantation through silicon nitride caps 1-gen-2013 Giubertoni, Damiano; Secchi, Maria; Gupta, S.; Colaux, J. L.; Meirer, Florian; Demenev, Evgeny; Gwilliam, R.; Jeynes, C.; Parisini, A.; Gennaro, Salvatore; Vanzetti, Lia Emanuela; Iacob, Erica; Bersani, Massimo