Demenev, Evgeny
Demenev, Evgeny
MNF
32-Channel Detection Unit for Combined XRF-XRD in Mining Transportable Applications
2020-01-01 Carminati, M.; Amirkhani, A.; Gugiatti, M.; Ferrara, E.; Fiorini, C.; Demenev, E.; Pepponi, G.; Ronchin, S.; Ficorella, F.; Borghi, G.; Zorzi, N.; Borovin, E.; Lutterotti, L.
32-Channel silicon strip detection module for combined X-ray fluorescence spectroscopy and X-ray diffractometry analysis
2022-01-01 Carminati, Marco; Borghi, Giacomo; Demenev, Evgeny; Gugiatti, Matteo; Pepponi, Giancarlo; Crivellari, Michele; Ficorella, Francesco; Ronchin, Sabina; Zorzi, Nicola; Borovin, Evgeny; Lutterotti, Luca; Fiorini, Carlo
A 500 × 500 Pixel Image Sensor with Arbitrary Number of RoIs per Frame and Image Filtering for Center of Mass Estimation
2023-01-01 Gottardi, Massimo; Parmesan, Luca; Tosato, Pietro; Demenev, Evgeny; Manuzzato, Enrico; Gasparini, Leonardo
An innovative architecture for wide band transient monitor on board HERMES nano-satellite constellations
2020-01-01 Fuschino, Fabio; Campana, Riccardo; Labanti, Claudio; Evangelista, Yuri; Fiore, Fabrizio; Gandola, Massimo; Grassi, Marco; Mele, Filippo; Ambrosino, Filippo; Ceraudo, Francesco; Demenev, Evgeny; Fiorini, Mauro; Morgante, Gianluca; Piazzolla, Raffaele; Bertuccio, Giuseppe; Malcovati, Piero; Bellutti, Pierluigi; Borghi, Giacomo; Dilillo, Giuseppe; Feroci, Marco; Ficorella, Francesco; La Rosa, Giovanni; Nogara, Paolo; Pauletta, Giovanni; Picciotto, Antonino; Rashevskaya, Irina; Rashevsky, Alexander; Giuseppe, Sottile; Vacchi, Andrea; Virgilli, Enrico; Zampa, Gianluigi; Zampa, Nicola; Zorzi, Nicola; Chen, Tianxiang; Xu, Yupeng; Gao, Na; Cao, Jiewei; Wang, Lingjun
Arsenic redistribution after solid phase epitaxial regrowth of shallow pre-amorphized silicon layers
2012-01-01 Demenev, Evgeny; Giubertoni, Damiano; Gennaro, Salvatore; Bersani, Massimo; E., Hourdakis; A. G., Nassiopoulou; M. A., Reading; J. A., van den Berg
Calibration correction of ultra low energy SIMS profiles based on MEIS analyses for arsenic shallow implants in silicon
2012-01-01 Demenev, Evgeny; Giubertoni, Damiano; J., van den Berg; M., Reading; Bersani, Massimo
Calibration correction of ultra low energy SIMS profiles based on MEIS analysis of shallow arsenic implants in silicon
2013-01-01 Demenev, Evgeny; Giubertoni, Damiano; M. A., Reading; P., Bailey; T. C. Q., Noakes; Bersani, Massimo; J. A., van den Berg
Characterizing Low-Energy Charged Particles in the Magnetosphere with the LEM CubeSat Spectrometer Project: Detector Concept and Hardware Characterisation
2023-01-01 Nicolaidis, Riccardo; Nozzoli, Francesco; Pepponi, Giancarlo; Bellutti, Pierluigi; Demenev, Evgeny; Follega, Francesco Maria; Iuppa, Roberto; Vilona, Veronica
Columnar nano-void formation on Germanium under Sn+ ion implantation: Ge1-xSnx walls
2014-01-01 Secchi, Maria; Demenev, Evgeny; Giubertoni, Damiano; Vanzetti, Lia Emanuela; Bersani, Massimo
Columnar nano-void formation on Germanium under Sn+ ion implantation: Ge1-xSnx walls
2014-01-01 Secchi, Maria; Demenev, Evgeny; Giubertoni, Damiano; Vanzetti, Lia Emanuela; Bersani, Massimo
Combined evaluation of grazing incidence X-ray fluorescence and X-ray reflectivity data for improved profiling of ultra-shallow depth distributions
2014-01-01 D., Ingerle; F., Meirer; Pepponi, Giancarlo; Demenev, Evgeny; Giubertoni, Damiano; P., Wobrauschek; C., Streli
Design, integration, and test of the scientific payloads on-board the HERMES constellation and the SpIRIT mission
2022-01-01 Evangelista, Yuri; Fiore, Fabrizio; Campana, Riccardo; Ceraudo, Francesco; Della Casa, Giovanni; Demenev, Evgeny; Dilillo, Giuseppe; Fiorini, Mauro; Grassi, Marco; Guzman, Alejandro; Hedderman, Paul; Marchesini, Ezequiel J.; Morgante, Gianluca; Mele, Filippo; Nogara, Paolo; Nuti, Alessio; Piazzolla, Raffaele; Pliego Caballero, Samuel; Rashevskaya, Irina; Russo, Francesco; Sottile, Giuseppe; Labanti, Claudio; Baroni, Giulia; Bellutti, Pierluigi; Bertuccio, Giuseppe; Cao, Jiewei; Chen, Tianxiang; Dedolli, Irisa; Feroci, Marco; Fuschino, Fabio; Gandola, Massimo; Gao, Na; Ficorella, Francesco; Malcovati, Piero; Picciotto, Antonino; Rachevski, Alexandre; Santangelo, Andrea; Tenzer, Christoph; Vacchi, Andrea; Wang, Lingjun; Xu, Yupeng; Zampa, Gianluigi; Zampa, Nicola; Zorzi, Nicola
Development of MEMS MOS gas sensors with CMOS compatible PECVD inter-metal passivation
2019-01-01 Bagolini, Alvise; Gaiardo, Andrea; Crivellari, Michele; Demenev, Evgeny; Bartali, Ruben; Picciotto, Antonino; Valt, Matteo; Ficorella, Francesco; Guidi, Vincenzo; Bellutti, Pierluigi
Development of nano-roughness under SIMS ion sputtering of Germanium surfaces
2011-01-01 Iacob, Erica; Barozzi, Mario; Demenev, Evgeny; Gennaro, Salvatore; Giubertoni, Damiano; Bersani, Massimo
Development of nano-roughness under SIMS ion sputtering of germanium surfaces
2013-01-01 Iacob, Erica; Demenev, Evgeny; Giubertoni, Damiano; Barozzi, Mario; Gennaro, Salvatore; Bersani, Massimo
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy
2014-01-01 Secchi, Maria; Demenev, Evgeny; Giubertoni, Damiano; Iacob, Erica; Bersani, Massimo
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy
2014-01-01 Secchi, Maria; Demenev, Evgeny; Giubertoni, Damiano; Iacob, Erica; Bersani, Massimo
Development of nanotopography during SIMS characterization of thin films of Ge1−xSnx alloy
2015-01-01 Secchi, Maria; Demenev, Evgeny; C, ; Colaux, J. L.; Giubertoni, Damiano; Dell'Anna, Rossana; Iacob, Erica; Gwilliam, R. M.; Jeynes, C.; Bersani, Massimo
Dynamic SIMS Application for Characterization of Advanced Doping Schemes in Semiconductors
2013-01-01 Giubertoni, Damiano; Demenev, Evgeny; Meirer, Florian; Bersani, Massimo
Dynamic SIMS Characterization of Ge1-xSnx alloy
2013-01-01 Secchi, Maria; Demenev, Evgeny; Giubertoni, Damiano; Bersani, Massimo
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| 32-Channel Detection Unit for Combined XRF-XRD in Mining Transportable Applications | 1-gen-2020 | Carminati, M.; Amirkhani, A.; Gugiatti, M.; Ferrara, E.; Fiorini, C.; Demenev, E.; Pepponi, G.; Ronchin, S.; Ficorella, F.; Borghi, G.; Zorzi, N.; Borovin, E.; Lutterotti, L. | |
| 32-Channel silicon strip detection module for combined X-ray fluorescence spectroscopy and X-ray diffractometry analysis | 1-gen-2022 | Carminati, Marco; Borghi, Giacomo; Demenev, Evgeny; Gugiatti, Matteo; Pepponi, Giancarlo; Crivellari, Michele; Ficorella, Francesco; Ronchin, Sabina; Zorzi, Nicola; Borovin, Evgeny; Lutterotti, Luca; Fiorini, Carlo | |
| A 500 × 500 Pixel Image Sensor with Arbitrary Number of RoIs per Frame and Image Filtering for Center of Mass Estimation | 1-gen-2023 | Gottardi, Massimo; Parmesan, Luca; Tosato, Pietro; Demenev, Evgeny; Manuzzato, Enrico; Gasparini, Leonardo | |
| An innovative architecture for wide band transient monitor on board HERMES nano-satellite constellations | 1-gen-2020 | Fuschino, Fabio; Campana, Riccardo; Labanti, Claudio; Evangelista, Yuri; Fiore, Fabrizio; Gandola, Massimo; Grassi, Marco; Mele, Filippo; Ambrosino, Filippo; Ceraudo, Francesco; Demenev, Evgeny; Fiorini, Mauro; Morgante, Gianluca; Piazzolla, Raffaele; Bertuccio, Giuseppe; Malcovati, Piero; Bellutti, Pierluigi; Borghi, Giacomo; Dilillo, Giuseppe; Feroci, Marco; Ficorella, Francesco; La Rosa, Giovanni; Nogara, Paolo; Pauletta, Giovanni; Picciotto, Antonino; Rashevskaya, Irina; Rashevsky, Alexander; Giuseppe, Sottile; Vacchi, Andrea; Virgilli, Enrico; Zampa, Gianluigi; Zampa, Nicola; Zorzi, Nicola; Chen, Tianxiang; Xu, Yupeng; Gao, Na; Cao, Jiewei; Wang, Lingjun | |
| Arsenic redistribution after solid phase epitaxial regrowth of shallow pre-amorphized silicon layers | 1-gen-2012 | Demenev, Evgeny; Giubertoni, Damiano; Gennaro, Salvatore; Bersani, Massimo; E., Hourdakis; A. G., Nassiopoulou; M. A., Reading; J. A., van den Berg | |
| Calibration correction of ultra low energy SIMS profiles based on MEIS analyses for arsenic shallow implants in silicon | 1-gen-2012 | Demenev, Evgeny; Giubertoni, Damiano; J., van den Berg; M., Reading; Bersani, Massimo | |
| Calibration correction of ultra low energy SIMS profiles based on MEIS analysis of shallow arsenic implants in silicon | 1-gen-2013 | Demenev, Evgeny; Giubertoni, Damiano; M. A., Reading; P., Bailey; T. C. Q., Noakes; Bersani, Massimo; J. A., van den Berg | |
| Characterizing Low-Energy Charged Particles in the Magnetosphere with the LEM CubeSat Spectrometer Project: Detector Concept and Hardware Characterisation | 1-gen-2023 | Nicolaidis, Riccardo; Nozzoli, Francesco; Pepponi, Giancarlo; Bellutti, Pierluigi; Demenev, Evgeny; Follega, Francesco Maria; Iuppa, Roberto; Vilona, Veronica | |
| Columnar nano-void formation on Germanium under Sn+ ion implantation: Ge1-xSnx walls | 1-gen-2014 | Secchi, Maria; Demenev, Evgeny; Giubertoni, Damiano; Vanzetti, Lia Emanuela; Bersani, Massimo | |
| Columnar nano-void formation on Germanium under Sn+ ion implantation: Ge1-xSnx walls | 1-gen-2014 | Secchi, Maria; Demenev, Evgeny; Giubertoni, Damiano; Vanzetti, Lia Emanuela; Bersani, Massimo | |
| Combined evaluation of grazing incidence X-ray fluorescence and X-ray reflectivity data for improved profiling of ultra-shallow depth distributions | 1-gen-2014 | D., Ingerle; F., Meirer; Pepponi, Giancarlo; Demenev, Evgeny; Giubertoni, Damiano; P., Wobrauschek; C., Streli | |
| Design, integration, and test of the scientific payloads on-board the HERMES constellation and the SpIRIT mission | 1-gen-2022 | Evangelista, Yuri; Fiore, Fabrizio; Campana, Riccardo; Ceraudo, Francesco; Della Casa, Giovanni; Demenev, Evgeny; Dilillo, Giuseppe; Fiorini, Mauro; Grassi, Marco; Guzman, Alejandro; Hedderman, Paul; Marchesini, Ezequiel J.; Morgante, Gianluca; Mele, Filippo; Nogara, Paolo; Nuti, Alessio; Piazzolla, Raffaele; Pliego Caballero, Samuel; Rashevskaya, Irina; Russo, Francesco; Sottile, Giuseppe; Labanti, Claudio; Baroni, Giulia; Bellutti, Pierluigi; Bertuccio, Giuseppe; Cao, Jiewei; Chen, Tianxiang; Dedolli, Irisa; Feroci, Marco; Fuschino, Fabio; Gandola, Massimo; Gao, Na; Ficorella, Francesco; Malcovati, Piero; Picciotto, Antonino; Rachevski, Alexandre; Santangelo, Andrea; Tenzer, Christoph; Vacchi, Andrea; Wang, Lingjun; Xu, Yupeng; Zampa, Gianluigi; Zampa, Nicola; Zorzi, Nicola | |
| Development of MEMS MOS gas sensors with CMOS compatible PECVD inter-metal passivation | 1-gen-2019 | Bagolini, Alvise; Gaiardo, Andrea; Crivellari, Michele; Demenev, Evgeny; Bartali, Ruben; Picciotto, Antonino; Valt, Matteo; Ficorella, Francesco; Guidi, Vincenzo; Bellutti, Pierluigi | |
| Development of nano-roughness under SIMS ion sputtering of Germanium surfaces | 1-gen-2011 | Iacob, Erica; Barozzi, Mario; Demenev, Evgeny; Gennaro, Salvatore; Giubertoni, Damiano; Bersani, Massimo | |
| Development of nano-roughness under SIMS ion sputtering of germanium surfaces | 1-gen-2013 | Iacob, Erica; Demenev, Evgeny; Giubertoni, Damiano; Barozzi, Mario; Gennaro, Salvatore; Bersani, Massimo | |
| Development of nano-topography during SIMS characterization of Ge1-xSnx alloy | 1-gen-2014 | Secchi, Maria; Demenev, Evgeny; Giubertoni, Damiano; Iacob, Erica; Bersani, Massimo | |
| Development of nano-topography during SIMS characterization of Ge1-xSnx alloy | 1-gen-2014 | Secchi, Maria; Demenev, Evgeny; Giubertoni, Damiano; Iacob, Erica; Bersani, Massimo | |
| Development of nanotopography during SIMS characterization of thin films of Ge1−xSnx alloy | 1-gen-2015 | Secchi, Maria; Demenev, Evgeny; C, ; Colaux, J. L.; Giubertoni, Damiano; Dell'Anna, Rossana; Iacob, Erica; Gwilliam, R. M.; Jeynes, C.; Bersani, Massimo | |
| Dynamic SIMS Application for Characterization of Advanced Doping Schemes in Semiconductors | 1-gen-2013 | Giubertoni, Damiano; Demenev, Evgeny; Meirer, Florian; Bersani, Massimo | |
| Dynamic SIMS Characterization of Ge1-xSnx alloy | 1-gen-2013 | Secchi, Maria; Demenev, Evgeny; Giubertoni, Damiano; Bersani, Massimo |