Canteri, Roberto
Canteri, Roberto
MTSD
A Comparison between Zero and Seven Degree of Tilt Implantation of As+, P+ and BF2+
1990-01-01 C., Bresolin; C., Zaccherini; Anderle, Mariano; Canteri, Roberto
A comparison between zero and seven degrees of tilt implantation of As+, P+ and BF2 +
1990-01-01 Bresolin, C.; Zaccherini, C.; Anderle, M.; Canteri, R.
Acquisizione per immagine nella spettrometria di massa di ioni secondari
1991-01-01 Canteri, Roberto
Adhesion of Staphylococcus Epidermidis to polymer surfaces
2001-01-01 Gottardi, Gloria; M., Anderle; Canteri, Roberto; E., Carli; M. L., Grosello; A., Lui; D., Maniglio; Pasquardini, Laura; Pederzolli, Cecilia; C., Della Volpe; S., Siboni; Speranza, Giorgio
Ambient Gas Induced SiC-like Structures in Edge-Defined Film-Fed Growth Polycrystalline Silicon Samples
1991-01-01 B., Pivac; A., Borghesi; Canteri, Roberto; Anderle, Mariano
Ambient gas-induced SiC-like structures in edge-defined film-fed grown polycrystalline silicon samples
1991-01-01 Pivac, B.; Borghesi, A.; Canteri, R.; Anderle, M.
Amorphous nitrogenated carbon films: Structural modifications induced by thermal annealing
1994-01-01 Freire, F. L. J. r.; C. A., Achete; Gino, Mariotto; Canteri, Roberto
Anomalous Diffusion of Fluorine in Silicon
1992-01-01 S. P., Jeng; T., Ma; Anderle, Mariano; Gary Wayne, Rubloff; Canteri, Roberto
Assessment of a FOUP Conditioning Equipment for Advanced Semiconductor Application
2012-01-01 M., Otto; S., Rioufrays; A., Favre; A., Leibold; R., Altmann; Gennaro, Salvatore; Dell'Anna, Rossana; Canteri, Roberto; L., Pfitzner
Atomic layer deposition of palladium coated TiO2/Si nanopillars: ToF-SIMS, AES and XPS characterization study
2021-01-01 Iatsunskyi, I.; Gottardi, G.; Micheli, V.; Canteri, R.; Coy, E.; Bechelany, M.
BF2 Ion Implantation in Silicon: Effects of the In-Flight Ion Dissociation
1988-01-01 Giuseppe, Queirolo; C., Bresolin; L., Meda; Anderle, Mariano; Canteri, Roberto
BF2+ Ion implantation in silicon
1988-01-01 Queirolo, G.; Bresolin, C.; Meda, L.; Anderle, M.; Canteri, R.
Biofunctional surfaces: A key step for biosensing and medical implants applications
2006-01-01 Pederzolli, Cecilia; Lunelli, Lorenzo; Pasquardini, Laura; Forti, Stefania; Vinante, Michele; Canteri, Roberto; Vanzetti, Lia Emanuela; Anderle, Mariano
Boron and Antimony Codiffusion in Silicon
1991-01-01 Margesin, Benno; Canteri, Roberto; Sandro, Solmi; A., Armigliato; F., Baruffaldi
Boron Ion Implantation through Mo and Mo Silicide Layers for Shallow Junction Formation
1991-01-01 R., Angelucci; Sandro, Solmi; A., Armigliato; S., Guerri; M., Merli; A., Poggi; Canteri, Roberto
Cellular remains in a ~3.42-billion-year-old subseafloor hydrothermal environment
2021-01-01 Cavalazzi, Barbara; Lemelle, Laurence; Simionovici, Alexandre; Cady, Sherry L.; Russell, Michael J.; Bailo, Elena; Canteri, Roberto; Enrico, Emanuele; Manceau, Alain; Maris, Assimo; Salomé, Murielle; Thomassot, Emilie; Bouden, Nordine; Tucoulou, Rémi; Hofmann, Axel
Characterisation of perfluoropolyether-urethane coatings by TOF-SIMS and XPS
2000-01-01 Canteri, Roberto; Speranza, Giorgio; Anderle, Mariano; S., Turri; S., Radice; T., Trombetta
Characterization of Functional Films on Solid Substrates by Tof-Sims
1998-01-01 Canteri, Roberto; Malacarne, Carla; A., Rigo; F., Vianello; L., Zennaro; M., Scarpa; Anderle, Mariano
Chemical characterization of Taq DNA polymerase adsorption on different surfaces
2007-01-01 Canteri, Roberto; Dell'Anna, Rossana; Forti, Stefania; Lunelli, Lorenzo; Pasquardini, Laura; Pederzolli, Cecilia; Potrich, Cristina; Vanzetti, Lia Emanuela; Anderle, Mariano; Diego, Vozzi; Cristina, Zadro; Paolo, Gasparini
Codiffusion of arsenic and boron implanted in silicon
1995-01-01 S., Solmi; S., Valmorri; Canteri, Roberto
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| A Comparison between Zero and Seven Degree of Tilt Implantation of As+, P+ and BF2+ | 1-gen-1990 | C., Bresolin; C., Zaccherini; Anderle, Mariano; Canteri, Roberto | |
| A comparison between zero and seven degrees of tilt implantation of As+, P+ and BF2 + | 1-gen-1990 | Bresolin, C.; Zaccherini, C.; Anderle, M.; Canteri, R. | |
| Acquisizione per immagine nella spettrometria di massa di ioni secondari | 1-gen-1991 | Canteri, Roberto | |
| Adhesion of Staphylococcus Epidermidis to polymer surfaces | 1-gen-2001 | Gottardi, Gloria; M., Anderle; Canteri, Roberto; E., Carli; M. L., Grosello; A., Lui; D., Maniglio; Pasquardini, Laura; Pederzolli, Cecilia; C., Della Volpe; S., Siboni; Speranza, Giorgio | |
| Ambient Gas Induced SiC-like Structures in Edge-Defined Film-Fed Growth Polycrystalline Silicon Samples | 1-gen-1991 | B., Pivac; A., Borghesi; Canteri, Roberto; Anderle, Mariano | |
| Ambient gas-induced SiC-like structures in edge-defined film-fed grown polycrystalline silicon samples | 1-gen-1991 | Pivac, B.; Borghesi, A.; Canteri, R.; Anderle, M. | |
| Amorphous nitrogenated carbon films: Structural modifications induced by thermal annealing | 1-gen-1994 | Freire, F. L. J. r.; C. A., Achete; Gino, Mariotto; Canteri, Roberto | |
| Anomalous Diffusion of Fluorine in Silicon | 1-gen-1992 | S. P., Jeng; T., Ma; Anderle, Mariano; Gary Wayne, Rubloff; Canteri, Roberto | |
| Assessment of a FOUP Conditioning Equipment for Advanced Semiconductor Application | 1-gen-2012 | M., Otto; S., Rioufrays; A., Favre; A., Leibold; R., Altmann; Gennaro, Salvatore; Dell'Anna, Rossana; Canteri, Roberto; L., Pfitzner | |
| Atomic layer deposition of palladium coated TiO2/Si nanopillars: ToF-SIMS, AES and XPS characterization study | 1-gen-2021 | Iatsunskyi, I.; Gottardi, G.; Micheli, V.; Canteri, R.; Coy, E.; Bechelany, M. | |
| BF2 Ion Implantation in Silicon: Effects of the In-Flight Ion Dissociation | 1-gen-1988 | Giuseppe, Queirolo; C., Bresolin; L., Meda; Anderle, Mariano; Canteri, Roberto | |
| BF2+ Ion implantation in silicon | 1-gen-1988 | Queirolo, G.; Bresolin, C.; Meda, L.; Anderle, M.; Canteri, R. | |
| Biofunctional surfaces: A key step for biosensing and medical implants applications | 1-gen-2006 | Pederzolli, Cecilia; Lunelli, Lorenzo; Pasquardini, Laura; Forti, Stefania; Vinante, Michele; Canteri, Roberto; Vanzetti, Lia Emanuela; Anderle, Mariano | |
| Boron and Antimony Codiffusion in Silicon | 1-gen-1991 | Margesin, Benno; Canteri, Roberto; Sandro, Solmi; A., Armigliato; F., Baruffaldi | |
| Boron Ion Implantation through Mo and Mo Silicide Layers for Shallow Junction Formation | 1-gen-1991 | R., Angelucci; Sandro, Solmi; A., Armigliato; S., Guerri; M., Merli; A., Poggi; Canteri, Roberto | |
| Cellular remains in a ~3.42-billion-year-old subseafloor hydrothermal environment | 1-gen-2021 | Cavalazzi, Barbara; Lemelle, Laurence; Simionovici, Alexandre; Cady, Sherry L.; Russell, Michael J.; Bailo, Elena; Canteri, Roberto; Enrico, Emanuele; Manceau, Alain; Maris, Assimo; Salomé, Murielle; Thomassot, Emilie; Bouden, Nordine; Tucoulou, Rémi; Hofmann, Axel | |
| Characterisation of perfluoropolyether-urethane coatings by TOF-SIMS and XPS | 1-gen-2000 | Canteri, Roberto; Speranza, Giorgio; Anderle, Mariano; S., Turri; S., Radice; T., Trombetta | |
| Characterization of Functional Films on Solid Substrates by Tof-Sims | 1-gen-1998 | Canteri, Roberto; Malacarne, Carla; A., Rigo; F., Vianello; L., Zennaro; M., Scarpa; Anderle, Mariano | |
| Chemical characterization of Taq DNA polymerase adsorption on different surfaces | 1-gen-2007 | Canteri, Roberto; Dell'Anna, Rossana; Forti, Stefania; Lunelli, Lorenzo; Pasquardini, Laura; Pederzolli, Cecilia; Potrich, Cristina; Vanzetti, Lia Emanuela; Anderle, Mariano; Diego, Vozzi; Cristina, Zadro; Paolo, Gasparini | |
| Codiffusion of arsenic and boron implanted in silicon | 1-gen-1995 | S., Solmi; S., Valmorri; Canteri, Roberto |