Bersani, Massimo

Bersani, Massimo  

MTSD  

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Risultati 1 - 20 di 249 (tempo di esecuzione: 0.025 secondi).
Titolo Data di pubblicazione Autore(i) File
A Characterization of Injection, Transport an Excitation Mechanisms in Si-nc based MOS-LEDS 1-gen-2006 C., Kompocholis; Pucker, Georg; Bellutti, Pierluigi; Lui, Alberto; Vanzetti, Lia Emanuela; Bersani, Massimo; Anderle, Mariano; S., Prezioso; Z., Gaburro; L., Pavesi
A comparison between mass spectrometry techniques on oxynitrides 1-gen-1998 Bersani, Massimo; M., Sbetti; Anderle, Mariano
Activated dopant effect on low energy SIMS depth profiling 1-gen-2005 Barozzi, Mario; Giubertoni, Damiano; S., Pederzoli; Anderle, Mariano; Iacob, Erica; Bersani, Massimo
Al-Sn thin film deposited by pulsed laser ablation 1-gen-2002 A., Perrone; A., Zocco; H., de Rosa; R., Zimmermann; Bersani, Massimo
An EXAFS investigation of Arsenic shallow implant activation in silicon after laser sub-melt annealing 1-gen-2006 Giubertoni, Damiano; Pepponi, Giancarlo; Bersani, Massimo; Gennaro, Salvatore; F., D'Acapito; R., Doherty; M. A., Foad
An EXAFS Investigation of Arsenic shallow implant activation in silicon after laser sub-melt annealing 1-gen-2006 Giubertoni, Damiano; Pepponi, Giancarlo; Bersani, Massimo; Gennaro, Salvatore; F., D`acapito; R., Doherty; M., Foad
An experimental/ab-initio study on carbon nanotubes fibers for application in high-performing sporting goods. 1-gen-2013 Maria F., Pantano; Vesselin, Shanov; Mark J., Schulz; Fedrizzi, Michele; Iacob, Erica; Bersani, Massimo; Taioli, Simone; Silvio A., Beccara; Pugno, Nicola
Analytical methodology development for Silicon rich oxide chemical physical characterization 1-gen-2007 Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Anderle, Mariano; Pucker, Georg; Kompocholis, Constantine
Analytical Methodology Development for Silicon-rich-oxide Chemical and Physical Characterization 1-gen-2007 Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Anderle, Mariano; Pucker, Georg; C., Kompocholis
Analytical methodology development for SRO chemical physical characterization 1-gen-2006 Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Pucker, Georg; C., Kompocholis
Analytical Techniques for Semiconductor Materials and Process Characterization 6 (ALTECH 09) 1-gen-2009 B. O., Kolbesen; C., Claeys; L., Fabry; Bersani, Massimo; Giubertoni, Damiano; Pepponi, Giancarlo
Applicazioni della spettrometria di massa a materiali e tecniche di ultima generazione 1-gen-2000 Bersani, Massimo; M., Sbetti; Lazzeri, Paolo; Giubertoni, Damiano; Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Anderle, Mariano
Arsenic redistribution after solid phase epitaxial regrowth of shallow pre-amorphized silicon layers 1-gen-2012 Demenev, Evgeny; Giubertoni, Damiano; Gennaro, Salvatore; Bersani, Massimo; E., Hourdakis; A. G., Nassiopoulou; M. A., Reading; J. A., van den Berg
Arsenic shallow depth profiling: accurate quantification in SiO2/Si stack 1-gen-2004 Barozzi, Mario; Giubertoni, Damiano; Anderle, Mariano; Bersani, Massimo
Arsenic shallow implant characterization by magnetic sector and time of flight SIMS instruments 1-gen-2002 Bersani, Massimo; Lazzeri, Paolo; Giubertoni, Damiano; Barozzi, Mario; Marchi E., Boscolo; Anderle, Mariano
Arsenic Shallow Implant Characterization by Magnetic Sector and TOF-SIMS Instruments 1-gen-2002 Giubertoni, Damiano; Barozzi, Mario; Lazzeri, Paolo; Anderle, Mariano; Bersani, Massimo
Arsenic uphill diffusion during shallow junction formation 1-gen-2006 M., Ferri; S., Solmi; A., Parisini; Bersani, Massimo; Giubertoni, Damiano; Barozzi, Mario
As ultra shallow depth profiling: comparison between SIMS and MEIS techniques 1-gen-2004 Giubertoni, Damiano; Barozzi, Mario; S., Pederzoli; Anderle, Mariano; Bersani, Massimo; J. A., van den Berg; M., Werner
Biodegradable Plastics for a Green Future 1-gen-2024 Bersani, Massimo
Boron deactivation in preamorphized silicon on insulator: Efficiency of the buried oxide as an interstitial sink 1-gen-2007 Justin, Hamilton; K. J., Kirkby; Nick, Cowern; Eric, Collart; Bersani, Massimo; Giubertoni, Damiano; Gennaro, Salvatore; A., Parisini