Bersani, Massimo
Bersani, Massimo
MTSD
A Characterization of Injection, Transport an Excitation Mechanisms in Si-nc based MOS-LEDS
2006-01-01 C., Kompocholis; Pucker, Georg; Bellutti, Pierluigi; Lui, Alberto; Vanzetti, Lia Emanuela; Bersani, Massimo; Anderle, Mariano; S., Prezioso; Z., Gaburro; L., Pavesi
A comparison between mass spectrometry techniques on oxynitrides
1998-01-01 Bersani, Massimo; M., Sbetti; Anderle, Mariano
Activated dopant effect on low energy SIMS depth profiling
2005-01-01 Barozzi, Mario; Giubertoni, Damiano; S., Pederzoli; Anderle, Mariano; Iacob, Erica; Bersani, Massimo
Al-Sn thin film deposited by pulsed laser ablation
2002-01-01 A., Perrone; A., Zocco; H., de Rosa; R., Zimmermann; Bersani, Massimo
An EXAFS Investigation of Arsenic shallow implant activation in silicon after laser sub-melt annealing
2006-01-01 Giubertoni, Damiano; Pepponi, Giancarlo; Bersani, Massimo; Gennaro, Salvatore; F., D`acapito; R., Doherty; M., Foad
An EXAFS investigation of Arsenic shallow implant activation in silicon after laser sub-melt annealing
2006-01-01 Giubertoni, Damiano; Pepponi, Giancarlo; Bersani, Massimo; Gennaro, Salvatore; F., D'Acapito; R., Doherty; M. A., Foad
An experimental/ab-initio study on carbon nanotubes fibers for application in high-performing sporting goods.
2013-01-01 Maria F., Pantano; Vesselin, Shanov; Mark J., Schulz; Fedrizzi, Michele; Iacob, Erica; Bersani, Massimo; Taioli, Simone; Silvio A., Beccara; Pugno, Nicola
Analytical methodology development for Silicon rich oxide chemical physical characterization
2007-01-01 Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Anderle, Mariano; Pucker, Georg; Kompocholis, Constantine
Analytical Methodology Development for Silicon-rich-oxide Chemical and Physical Characterization
2007-01-01 Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Anderle, Mariano; Pucker, Georg; C., Kompocholis
Analytical methodology development for SRO chemical physical characterization
2006-01-01 Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Pucker, Georg; C., Kompocholis
Analytical Techniques for Semiconductor Materials and Process Characterization 6 (ALTECH 09)
2009-01-01 B. O., Kolbesen; C., Claeys; L., Fabry; Bersani, Massimo; Giubertoni, Damiano; Pepponi, Giancarlo
Applicazioni della spettrometria di massa a materiali e tecniche di ultima generazione
2000-01-01 Bersani, Massimo; M., Sbetti; Lazzeri, Paolo; Giubertoni, Damiano; Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Anderle, Mariano
Arsenic redistribution after solid phase epitaxial regrowth of shallow pre-amorphized silicon layers
2012-01-01 Demenev, Evgeny; Giubertoni, Damiano; Gennaro, Salvatore; Bersani, Massimo; E., Hourdakis; A. G., Nassiopoulou; M. A., Reading; J. A., van den Berg
Arsenic shallow depth profiling: accurate quantification in SiO2/Si stack
2004-01-01 Barozzi, Mario; Giubertoni, Damiano; Anderle, Mariano; Bersani, Massimo
Arsenic shallow implant characterization by magnetic sector and time of flight SIMS instruments
2002-01-01 Bersani, Massimo; Lazzeri, Paolo; Giubertoni, Damiano; Barozzi, Mario; Marchi E., Boscolo; Anderle, Mariano
Arsenic Shallow Implant Characterization by Magnetic Sector and TOF-SIMS Instruments
2002-01-01 Giubertoni, Damiano; Barozzi, Mario; Lazzeri, Paolo; Anderle, Mariano; Bersani, Massimo
Arsenic uphill diffusion during shallow junction formation
2006-01-01 M., Ferri; S., Solmi; A., Parisini; Bersani, Massimo; Giubertoni, Damiano; Barozzi, Mario
As ultra shallow depth profiling: comparison between SIMS and MEIS techniques
2004-01-01 Giubertoni, Damiano; Barozzi, Mario; S., Pederzoli; Anderle, Mariano; Bersani, Massimo; J. A., van den Berg; M., Werner
Boron deactivation in preamorphized silicon on insulator: Efficiency of the buried oxide as an interstitial sink
2007-01-01 Justin, Hamilton; K. J., Kirkby; Nick, Cowern; Eric, Collart; Bersani, Massimo; Giubertoni, Damiano; Gennaro, Salvatore; A., Parisini
Boron pile-up phenomena during ultra shallow junction formation
2007-01-01 M., Ferri; Sandro, Solmi; Giubertoni, Damiano; Bersani, Massimo; Justin, Hamilton; Max, Kah; Nick, Cowern; K. J., Kirkby; Eric, Collart
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| A Characterization of Injection, Transport an Excitation Mechanisms in Si-nc based MOS-LEDS | 1-gen-2006 | C., Kompocholis; Pucker, Georg; Bellutti, Pierluigi; Lui, Alberto; Vanzetti, Lia Emanuela; Bersani, Massimo; Anderle, Mariano; S., Prezioso; Z., Gaburro; L., Pavesi | |
| A comparison between mass spectrometry techniques on oxynitrides | 1-gen-1998 | Bersani, Massimo; M., Sbetti; Anderle, Mariano | |
| Activated dopant effect on low energy SIMS depth profiling | 1-gen-2005 | Barozzi, Mario; Giubertoni, Damiano; S., Pederzoli; Anderle, Mariano; Iacob, Erica; Bersani, Massimo | |
| Al-Sn thin film deposited by pulsed laser ablation | 1-gen-2002 | A., Perrone; A., Zocco; H., de Rosa; R., Zimmermann; Bersani, Massimo | |
| An EXAFS Investigation of Arsenic shallow implant activation in silicon after laser sub-melt annealing | 1-gen-2006 | Giubertoni, Damiano; Pepponi, Giancarlo; Bersani, Massimo; Gennaro, Salvatore; F., D`acapito; R., Doherty; M., Foad | |
| An EXAFS investigation of Arsenic shallow implant activation in silicon after laser sub-melt annealing | 1-gen-2006 | Giubertoni, Damiano; Pepponi, Giancarlo; Bersani, Massimo; Gennaro, Salvatore; F., D'Acapito; R., Doherty; M. A., Foad | |
| An experimental/ab-initio study on carbon nanotubes fibers for application in high-performing sporting goods. | 1-gen-2013 | Maria F., Pantano; Vesselin, Shanov; Mark J., Schulz; Fedrizzi, Michele; Iacob, Erica; Bersani, Massimo; Taioli, Simone; Silvio A., Beccara; Pugno, Nicola | |
| Analytical methodology development for Silicon rich oxide chemical physical characterization | 1-gen-2007 | Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Anderle, Mariano; Pucker, Georg; Kompocholis, Constantine | |
| Analytical Methodology Development for Silicon-rich-oxide Chemical and Physical Characterization | 1-gen-2007 | Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Anderle, Mariano; Pucker, Georg; C., Kompocholis | |
| Analytical methodology development for SRO chemical physical characterization | 1-gen-2006 | Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Bersani, Massimo; Pucker, Georg; C., Kompocholis | |
| Analytical Techniques for Semiconductor Materials and Process Characterization 6 (ALTECH 09) | 1-gen-2009 | B. O., Kolbesen; C., Claeys; L., Fabry; Bersani, Massimo; Giubertoni, Damiano; Pepponi, Giancarlo | |
| Applicazioni della spettrometria di massa a materiali e tecniche di ultima generazione | 1-gen-2000 | Bersani, Massimo; M., Sbetti; Lazzeri, Paolo; Giubertoni, Damiano; Barozzi, Mario; Iacob, Erica; Vanzetti, Lia Emanuela; Anderle, Mariano | |
| Arsenic redistribution after solid phase epitaxial regrowth of shallow pre-amorphized silicon layers | 1-gen-2012 | Demenev, Evgeny; Giubertoni, Damiano; Gennaro, Salvatore; Bersani, Massimo; E., Hourdakis; A. G., Nassiopoulou; M. A., Reading; J. A., van den Berg | |
| Arsenic shallow depth profiling: accurate quantification in SiO2/Si stack | 1-gen-2004 | Barozzi, Mario; Giubertoni, Damiano; Anderle, Mariano; Bersani, Massimo | |
| Arsenic shallow implant characterization by magnetic sector and time of flight SIMS instruments | 1-gen-2002 | Bersani, Massimo; Lazzeri, Paolo; Giubertoni, Damiano; Barozzi, Mario; Marchi E., Boscolo; Anderle, Mariano | |
| Arsenic Shallow Implant Characterization by Magnetic Sector and TOF-SIMS Instruments | 1-gen-2002 | Giubertoni, Damiano; Barozzi, Mario; Lazzeri, Paolo; Anderle, Mariano; Bersani, Massimo | |
| Arsenic uphill diffusion during shallow junction formation | 1-gen-2006 | M., Ferri; S., Solmi; A., Parisini; Bersani, Massimo; Giubertoni, Damiano; Barozzi, Mario | |
| As ultra shallow depth profiling: comparison between SIMS and MEIS techniques | 1-gen-2004 | Giubertoni, Damiano; Barozzi, Mario; S., Pederzoli; Anderle, Mariano; Bersani, Massimo; J. A., van den Berg; M., Werner | |
| Boron deactivation in preamorphized silicon on insulator: Efficiency of the buried oxide as an interstitial sink | 1-gen-2007 | Justin, Hamilton; K. J., Kirkby; Nick, Cowern; Eric, Collart; Bersani, Massimo; Giubertoni, Damiano; Gennaro, Salvatore; A., Parisini | |
| Boron pile-up phenomena during ultra shallow junction formation | 1-gen-2007 | M., Ferri; Sandro, Solmi; Giubertoni, Damiano; Bersani, Massimo; Justin, Hamilton; Max, Kah; Nick, Cowern; K. J., Kirkby; Eric, Collart |