Sfoglia per Titolo
Relazioni retoriche, tecniche computazionali e strutture marrative: un nuovo scenario di scambio narrativo ed il nuovo ruolo dell`autore
2001-01-01 Rocchi, Cesare
Release Behavior of Telmisartan/Amlodipine Combination Drug According to Polymer Type
2021-01-01 Been, Suyoung; Choi, Jeongmin; Kim, Pil Yun; Kim, Won Kyung; Bucciarelli, Alessio; Song, Jeong Eun; Khang, Gilson
The relevance of topology in parallel simulation of biological networks
2012-01-01 Mazza, T.; Ballarini, P.; Guido, R.; Prandi, D.
Relevance of well-being, resilience, and health-related quality of life to mental health profiles of European adolescents: results from a cross-sectional analysis of the school-based multinational UPRIGHT project
2022-01-01 Las-Hayas, Carlota; Mateo-Abad, Maider; Vergara, Itziar; Izco-Basurko, Irantzu; González-Pinto, Ana; Gabrielli, Silvia; Mazur, Iwona; Hjemdal, Odin; Gudmundsdottir, Dora Gudrun; Knoop, Hans Henrik; Olafsdottir, Anna Sigríður; Fullaondo, Ane; González, Nerea; Mar-Medina, Javier; Krzyżanowski, Dominik; Morote, Roxanna; Anyan, Frederick; Ledertoug, Mette Marie; Tidmand, Louise; Arnfjord, Unnur Björk; Kaldalons, Ingibjorg; Jonsdottir, Bryndis Jona; de Manuel Keenoy, Esteban; Zorrilla-Martínez, Iñaki; Pérez-Martínez-de-Arrieta, Patricia; Larrañaga, Igor; Carbone, Sara; Rizzi, Silvia; Donisi, Valeria; Pálsdóttir, Hrefna; Ingibergsdóttir, Alda
Relevance Ranking for Translated Texts
2012-01-01 Turchi, Marco; Specia, Lucia; Steinberger, Josef
Reliability and failure analysis in power GaN-HEMTs: An overview
2017-01-01 Meneghini, M.; Rossetto, I.; De Santi, C.; Rampazzo, F.; Tajalli, A.; Barbato, A.; Ruzzarin, M.; Borga, M.; Canato, E.; Zanoni, E.; Meneghesso, G.
Reliability and Power Handling Issues in Ohmic Series and Shunt Capacitive RF MEMS Switches
2006-01-01 S., Catoni; S., Di Nardo; P., Farinelli; Giacomozzi, Flavio; G., Mannocchi; R., Marcelli; Margesin, Benno; P., Mezzanotte; Mulloni, Viviana; R., Sorrentino; F., Vitulli; L., Vietzorreck
Reliability of capacitive RF MEMS switches subjected to repetitive impact cycles at different temperatures
2014-01-01 Barbato, M.; Cester, A.; Mulloni, Viviana; Margesin, Benno; De Pasquale, G.; Soma, A.; Meneghesso, G.
Reliability of MEMS: A perspective on failure mechanisms, improvement solutions and best practices at development level
2015-01-01 Iannacci, Jacopo
Reliability of power devices: Bias-induced threshold voltage instability and dielectric breakdown in GaN MIS-HEMTs
2017-01-01 Meneghesso, G.; Bisi, D.; Rossetto, I.; Ruzzarin, M.; Meneghini, M.; Zanoni, E.
Reliability of RF MEMS capacitive and ohmic switches for space redundancy configurations
2014-01-01 Andrea, Lucibello; Romolo, Marcelli; Emanuela, Proietti; Giancarlo, Bartolucci; Mulloni, Viviana; Margesin, Benno
Reliability of RF MEMS capacitive and ohmic switches for space redundancy configurations
2013-01-01 Lucibello, A.; Marcelli, R.; Proietti, E.; Bartolucci, G.; Mulloni, Viviana; Margesin, Benno
Reliability of RF MEMS switches due to charging effects and their circuital modelling
2010-01-01 Romolo, Marcelli; Giancarlo, Bartolucci; George, Papaioannu; Giorgio De, Angelis; Andrea, Lucibello; Emanuela, Proietti; Margesin, Benno; Giacomozzi, Flavio; François, Deborgies
Reliability of RF MEMS Switches due to Charging Effects and their Circuital Modelling
2009-01-01 Romolo, Marcelli; Giancarlo, Bartolucci; George, Papaioannu; Giorgio De, Angelis; Andrea, Lucibello; Emanuela, Proietti; Margesin, Benno; Giacomozzi, Flavio; François, Deborgies
Reliability of RF-MEMS Series Switches under Low and Medium Power Cycling
2004-01-01 R., Marcelli; G., Minucci; S., Catoni; Margesin, Benno; Giacomozzi, Flavio; G., Mannocchi; F., Vitulli
Reliability test of a RF MEMS varactor based on a double actuation mechanism
2015-01-01 Cazzorla, Alessandro; Farinelli, P.; Sorrentino, R.; Margesin, Benno
Reliable response of RF MEMS LTCC packaged switches after mechanical and thermal stress
2014-01-01 Lucibello, A.; Capoccia, G.; Proietti, E.; Marcelli, R.; Margesin, Benno; Mulloni, Viviana; Giacomozzi, Flavio; Vitulli, F.; Scipioni, M.; Bartolucci, G.
Reliable response of RF MEMS LTCC packaged switches after mechanical and thermal stress
2015-01-01 A., Lucibello; G., Capoccia; E., Proietti; R., Marcelli; Margesin, Benno; Mulloni, Viviana; Giacomozzi, Flavio; F., Vitulli; M., Scipioni; G., Bartolucci
Reliable RF microsystem technologies for space applications
2010-01-01 R., Marcelli; E., Proietti; A., Lucibello; E., De Angelis; G., Bartolucci; F., Quaranta; C., Martucci; A., Persano; G., Mannocchi; S., Di Nardo; D., Pochesci; Margesin, Benno; Giacomozzi, Flavio; F., Casini; P., Farinelli
Relighting Backlight and Spotlight Images using the von Kries Model
2022-01-01 Lecca, Michela
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Relazioni retoriche, tecniche computazionali e strutture marrative: un nuovo scenario di scambio narrativo ed il nuovo ruolo dell`autore | 1-gen-2001 | Rocchi, Cesare | |
| Release Behavior of Telmisartan/Amlodipine Combination Drug According to Polymer Type | 1-gen-2021 | Been, Suyoung; Choi, Jeongmin; Kim, Pil Yun; Kim, Won Kyung; Bucciarelli, Alessio; Song, Jeong Eun; Khang, Gilson | |
| The relevance of topology in parallel simulation of biological networks | 1-gen-2012 | Mazza, T.; Ballarini, P.; Guido, R.; Prandi, D. | |
| Relevance of well-being, resilience, and health-related quality of life to mental health profiles of European adolescents: results from a cross-sectional analysis of the school-based multinational UPRIGHT project | 1-gen-2022 | Las-Hayas, Carlota; Mateo-Abad, Maider; Vergara, Itziar; Izco-Basurko, Irantzu; González-Pinto, Ana; Gabrielli, Silvia; Mazur, Iwona; Hjemdal, Odin; Gudmundsdottir, Dora Gudrun; Knoop, Hans Henrik; Olafsdottir, Anna Sigríður; Fullaondo, Ane; González, Nerea; Mar-Medina, Javier; Krzyżanowski, Dominik; Morote, Roxanna; Anyan, Frederick; Ledertoug, Mette Marie; Tidmand, Louise; Arnfjord, Unnur Björk; Kaldalons, Ingibjorg; Jonsdottir, Bryndis Jona; de Manuel Keenoy, Esteban; Zorrilla-Martínez, Iñaki; Pérez-Martínez-de-Arrieta, Patricia; Larrañaga, Igor; Carbone, Sara; Rizzi, Silvia; Donisi, Valeria; Pálsdóttir, Hrefna; Ingibergsdóttir, Alda | |
| Relevance Ranking for Translated Texts | 1-gen-2012 | Turchi, Marco; Specia, Lucia; Steinberger, Josef | |
| Reliability and failure analysis in power GaN-HEMTs: An overview | 1-gen-2017 | Meneghini, M.; Rossetto, I.; De Santi, C.; Rampazzo, F.; Tajalli, A.; Barbato, A.; Ruzzarin, M.; Borga, M.; Canato, E.; Zanoni, E.; Meneghesso, G. | |
| Reliability and Power Handling Issues in Ohmic Series and Shunt Capacitive RF MEMS Switches | 1-gen-2006 | S., Catoni; S., Di Nardo; P., Farinelli; Giacomozzi, Flavio; G., Mannocchi; R., Marcelli; Margesin, Benno; P., Mezzanotte; Mulloni, Viviana; R., Sorrentino; F., Vitulli; L., Vietzorreck | |
| Reliability of capacitive RF MEMS switches subjected to repetitive impact cycles at different temperatures | 1-gen-2014 | Barbato, M.; Cester, A.; Mulloni, Viviana; Margesin, Benno; De Pasquale, G.; Soma, A.; Meneghesso, G. | |
| Reliability of MEMS: A perspective on failure mechanisms, improvement solutions and best practices at development level | 1-gen-2015 | Iannacci, Jacopo | |
| Reliability of power devices: Bias-induced threshold voltage instability and dielectric breakdown in GaN MIS-HEMTs | 1-gen-2017 | Meneghesso, G.; Bisi, D.; Rossetto, I.; Ruzzarin, M.; Meneghini, M.; Zanoni, E. | |
| Reliability of RF MEMS capacitive and ohmic switches for space redundancy configurations | 1-gen-2014 | Andrea, Lucibello; Romolo, Marcelli; Emanuela, Proietti; Giancarlo, Bartolucci; Mulloni, Viviana; Margesin, Benno | |
| Reliability of RF MEMS capacitive and ohmic switches for space redundancy configurations | 1-gen-2013 | Lucibello, A.; Marcelli, R.; Proietti, E.; Bartolucci, G.; Mulloni, Viviana; Margesin, Benno | |
| Reliability of RF MEMS switches due to charging effects and their circuital modelling | 1-gen-2010 | Romolo, Marcelli; Giancarlo, Bartolucci; George, Papaioannu; Giorgio De, Angelis; Andrea, Lucibello; Emanuela, Proietti; Margesin, Benno; Giacomozzi, Flavio; François, Deborgies | |
| Reliability of RF MEMS Switches due to Charging Effects and their Circuital Modelling | 1-gen-2009 | Romolo, Marcelli; Giancarlo, Bartolucci; George, Papaioannu; Giorgio De, Angelis; Andrea, Lucibello; Emanuela, Proietti; Margesin, Benno; Giacomozzi, Flavio; François, Deborgies | |
| Reliability of RF-MEMS Series Switches under Low and Medium Power Cycling | 1-gen-2004 | R., Marcelli; G., Minucci; S., Catoni; Margesin, Benno; Giacomozzi, Flavio; G., Mannocchi; F., Vitulli | |
| Reliability test of a RF MEMS varactor based on a double actuation mechanism | 1-gen-2015 | Cazzorla, Alessandro; Farinelli, P.; Sorrentino, R.; Margesin, Benno | |
| Reliable response of RF MEMS LTCC packaged switches after mechanical and thermal stress | 1-gen-2014 | Lucibello, A.; Capoccia, G.; Proietti, E.; Marcelli, R.; Margesin, Benno; Mulloni, Viviana; Giacomozzi, Flavio; Vitulli, F.; Scipioni, M.; Bartolucci, G. | |
| Reliable response of RF MEMS LTCC packaged switches after mechanical and thermal stress | 1-gen-2015 | A., Lucibello; G., Capoccia; E., Proietti; R., Marcelli; Margesin, Benno; Mulloni, Viviana; Giacomozzi, Flavio; F., Vitulli; M., Scipioni; G., Bartolucci | |
| Reliable RF microsystem technologies for space applications | 1-gen-2010 | R., Marcelli; E., Proietti; A., Lucibello; E., De Angelis; G., Bartolucci; F., Quaranta; C., Martucci; A., Persano; G., Mannocchi; S., Di Nardo; D., Pochesci; Margesin, Benno; Giacomozzi, Flavio; F., Casini; P., Farinelli | |
| Relighting Backlight and Spotlight Images using the von Kries Model | 1-gen-2022 | Lecca, Michela |
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