We report here the results of the electrical characterization of 3D-DDTC diode samples in virgin conditions and after exposition to reactor’s neutrons with a fluence of 10^15 neq · cm^−2. CV and IV measurements before irradiation have been employed to calibrate a commercial TCAD simulation tool, which has been then used to reproduce the effects of radiation damage in the detector. Simulation results are compared to post irradiation measurements. A systematic study of the effects of the positive oxide charge on the breakdown behaviour reveals a non-monotonic trend which causes the VBR to remain almost unchanged compared to measured pre-irradiation values.
Simulations and Electrical Characterization of Double-side Double Type Column 3D Detectors
Boscardin, Maurizio;Dalla Betta, Gian Franco;Giacomini, Gabriele;Povoli, Marco;Ronchin, Sabina;Vianello, Elisa;
2011-01-01
Abstract
We report here the results of the electrical characterization of 3D-DDTC diode samples in virgin conditions and after exposition to reactor’s neutrons with a fluence of 10^15 neq · cm^−2. CV and IV measurements before irradiation have been employed to calibrate a commercial TCAD simulation tool, which has been then used to reproduce the effects of radiation damage in the detector. Simulation results are compared to post irradiation measurements. A systematic study of the effects of the positive oxide charge on the breakdown behaviour reveals a non-monotonic trend which causes the VBR to remain almost unchanged compared to measured pre-irradiation values.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
