The continuous upgrades of synchrotron light sources have been pushing the development of more performing energy dispersive X-ray fluorescence spectrometers. To cope with high-brilliance X-ray beams, fluorescence detectors must increase maximum throughput and covered solid angle, keeping ultra low noise performance to attain the required high energy resolution. In this work, we report the results of the ARDESIA-16 spectrometer based on monolithic Silicon Drift Detector (SDD) array, specifically designed to fit the requirements of synchrotron applications. ARDESIA features a finger-like geometry. Experimental results of the ARDESIA detection module showed an average energy resolution at the optimum peaking time equal to 125 eV (FWHM at Mn Kα), a maximum achieved output count rate equal to 17 Mcps and an overall solid angle covered by the detector equal to 0.4 sr. Finally, we report the X-ray fluorescence microscopy (XFM) images measured with an ARDESIA spectrometer at synchrotron beamlines, in particular ID16A at ESRF.
High Rate SDD-Based Spectrometer for Energy-Dispersive X-ray Fluorescence Detection
Borghi, G.;Zorzi, N.;
2022-01-01
Abstract
The continuous upgrades of synchrotron light sources have been pushing the development of more performing energy dispersive X-ray fluorescence spectrometers. To cope with high-brilliance X-ray beams, fluorescence detectors must increase maximum throughput and covered solid angle, keeping ultra low noise performance to attain the required high energy resolution. In this work, we report the results of the ARDESIA-16 spectrometer based on monolithic Silicon Drift Detector (SDD) array, specifically designed to fit the requirements of synchrotron applications. ARDESIA features a finger-like geometry. Experimental results of the ARDESIA detection module showed an average energy resolution at the optimum peaking time equal to 125 eV (FWHM at Mn Kα), a maximum achieved output count rate equal to 17 Mcps and an overall solid angle covered by the detector equal to 0.4 sr. Finally, we report the X-ray fluorescence microscopy (XFM) images measured with an ARDESIA spectrometer at synchrotron beamlines, in particular ID16A at ESRF.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
