This work reports the results of the measurements using ARDESIA X-ray spectrometer in synchrotron measurements. ARDESIA is an SDD-based, multichannel X-ray spectrometer, optimized for synchrotron applications that require a high-count rate (> 1Mcps/channel) and high-resolution (<130eV of FHWM Mn-Kα line at optimum shaping time, ≤200eV at short shaping times) X-ray fluorescence detection. The main applications of the ARDESIA detector are X-ray fluorescence (XRF) and X-ray absorption fine structure (XAFS) techniques. The detector is based on a monolithic array of 4 SDD with 25mm 2 active area (collimated to 16mm 2 ) each, which optimizes detector solid angle. After the optimization of the 4-channels detection module, the mechanical structure grants cooling, with a double Peltier strategy, vacuum, insulation from the harsh surrounding environment and possibility to place side-by-side several SDD modules to realize a larger number of channels. The detector signals are amplified by a monolithic four-channels CUBE preamplifier chip and processed by digital pulse processors (e.g. XGLab-DANTE, 4-channel XIA DXP-XMAP) to achieve good energy resolution at high count rates. Successful campaign of measurements at the DAΦNE DXR1 soft X-ray beamline in Frascati, Italy and ESRF LISA BM-08 beamline in Grenoble, France, such as XRF measurements in soft x-ray energy range, and long-duration consecutive XAFS measurements using various samples, confirm the qualification and performance of the instrument, in terms of energy resolution, throughput capability, immunity against external disturbances, and stability.

Qualification of ARDESIA SDD X-ray Spectrometer in Synchrotron Measurements

Borghi, G.;Picciotto, A.;Ficorella, F.;Zorzi, N.;
2019

Abstract

This work reports the results of the measurements using ARDESIA X-ray spectrometer in synchrotron measurements. ARDESIA is an SDD-based, multichannel X-ray spectrometer, optimized for synchrotron applications that require a high-count rate (> 1Mcps/channel) and high-resolution (<130eV of FHWM Mn-Kα line at optimum shaping time, ≤200eV at short shaping times) X-ray fluorescence detection. The main applications of the ARDESIA detector are X-ray fluorescence (XRF) and X-ray absorption fine structure (XAFS) techniques. The detector is based on a monolithic array of 4 SDD with 25mm 2 active area (collimated to 16mm 2 ) each, which optimizes detector solid angle. After the optimization of the 4-channels detection module, the mechanical structure grants cooling, with a double Peltier strategy, vacuum, insulation from the harsh surrounding environment and possibility to place side-by-side several SDD modules to realize a larger number of channels. The detector signals are amplified by a monolithic four-channels CUBE preamplifier chip and processed by digital pulse processors (e.g. XGLab-DANTE, 4-channel XIA DXP-XMAP) to achieve good energy resolution at high count rates. Successful campaign of measurements at the DAΦNE DXR1 soft X-ray beamline in Frascati, Italy and ESRF LISA BM-08 beamline in Grenoble, France, such as XRF measurements in soft x-ray energy range, and long-duration consecutive XAFS measurements using various samples, confirm the qualification and performance of the instrument, in terms of energy resolution, throughput capability, immunity against external disturbances, and stability.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11582/319506
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