Image sensors implemented in CMOS technology offer an ideal path towards on-chip integration with processing elements to achieve smart sensors for machine vision applications. This paper presents a test chip containing a set of sensors and the results obtained from experimental measurements on them. A simple n+/p photodiode was first considered. A p+/n configuration where the diode is surrounded by a well region was then examined. The diffusion-well and the well-substrate junctions were used to generate two photocurrents having different spectral responses. A square array of 64x64 p+/n photodiodes all sharing the same well was included to investigate the effect of sensor non uniformity within a chip.
A Test Chip for CMOS Image Sensors
Gottardi, Massimo;Simoni, Andrea;Zorzi, Nicola
1991-01-01
Abstract
Image sensors implemented in CMOS technology offer an ideal path towards on-chip integration with processing elements to achieve smart sensors for machine vision applications. This paper presents a test chip containing a set of sensors and the results obtained from experimental measurements on them. A simple n+/p photodiode was first considered. A p+/n configuration where the diode is surrounded by a well region was then examined. The diffusion-well and the well-substrate junctions were used to generate two photocurrents having different spectral responses. A square array of 64x64 p+/n photodiodes all sharing the same well was included to investigate the effect of sensor non uniformity within a chip.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
