Amorphous InGaZnO (a-IGZO) is a candidate material for thin-film transistors (TFTs) owing to its large electron mobility. The development of high functionality circuits requires accurate and efficient circuit simulation that, in turn, is based on compact physical a-IGZO TFTs models. Here we propose a compact physical-based and analytical model of the drain current of a-IGZO TFTs. The model accounts for both trapped and free charges by means of an effective density of states that accurately approximate the actual a-IGZO density of states in the energy range relevant for the TFT operation. The model is implemented in a circuit simulator and it is validated with the measurements of both coplanar and staggered a-IGZO TFTs fabricated on flexible substrates.

Compact physical model of a-IGZO TFTs for circuit simulation

Ghittorelli, Matteo
;
2017-01-01

Abstract

Amorphous InGaZnO (a-IGZO) is a candidate material for thin-film transistors (TFTs) owing to its large electron mobility. The development of high functionality circuits requires accurate and efficient circuit simulation that, in turn, is based on compact physical a-IGZO TFTs models. Here we propose a compact physical-based and analytical model of the drain current of a-IGZO TFTs. The model accounts for both trapped and free charges by means of an effective density of states that accurately approximate the actual a-IGZO density of states in the energy range relevant for the TFT operation. The model is implemented in a circuit simulator and it is validated with the measurements of both coplanar and staggered a-IGZO TFTs fabricated on flexible substrates.
2017
978-1-5090-5978-2
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11582/313226
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