Time resolved electro-optic measurements in strained silicon racetrack resonators

In this paper, we report on time resolved electro-optic measurements in strained silicon resonators. Strain is induced by applying a mechanical deformation to the device. It is demonstrated that the linear electro-optic effect vanishes when the applied voltage modulation varies much faster than the free carrier lifetime, and that this occurs independently on the level of the applied stress. This demonstrates that, at frequencies which lie below the free carrier recombination rate, the electro-optic modulation is caused...